JPH0339682A - Sampling device for high-level radioactive material - Google Patents
Sampling device for high-level radioactive materialInfo
- Publication number
- JPH0339682A JPH0339682A JP17329489A JP17329489A JPH0339682A JP H0339682 A JPH0339682 A JP H0339682A JP 17329489 A JP17329489 A JP 17329489A JP 17329489 A JP17329489 A JP 17329489A JP H0339682 A JPH0339682 A JP H0339682A
- Authority
- JP
- Japan
- Prior art keywords
- piping
- nozzle
- collection
- pipe
- valve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005070 sampling Methods 0.000 title claims abstract description 20
- 239000012857 radioactive material Substances 0.000 title claims description 9
- 238000010926 purge Methods 0.000 claims abstract description 18
- 230000000694 effects Effects 0.000 abstract description 5
- 239000007789 gas Substances 0.000 description 18
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 4
- 239000000428 dust Substances 0.000 description 4
- 229910052740 iodine Inorganic materials 0.000 description 4
- 239000011630 iodine Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 239000000941 radioactive substance Substances 0.000 description 1
Landscapes
- Measurement Of Radiation (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
この発明は、原子力発電所等で使用され、事故時に放出
される排ガス中の放射能を監視するために塵埃やヨウ素
を集塵する高濃度放射性物質試料採取装置に関するもの
である。[Detailed Description of the Invention] [Industrial Application Field] This invention is used in nuclear power plants, etc., to collect dust and iodine at high concentrations in order to monitor radioactivity in exhaust gas released in the event of an accident. This relates to a radioactive material sample collection device.
[従来の技術]
第2図、第3図は、従来の高濃度放射性物質試料採取装
置を示し、第2図において、装置本体(1〉に、循環用
配管(2)、パージ用配管(3)および循環用配管(2
〉よりAa、46部で分岐された捕集用配管(4〉が配
管されており、循環用配管(2)および捕集用配管(4
)はそれぞれポンプ(5)、<6)に接続されている。[Prior Art] Fig. 2 and Fig. 3 show a conventional high-concentration radioactive material sampling device. ) and circulation piping (2
A collection pipe (4) branched at 46 parts is installed from Aa, and a collection pipe (4) is connected to the circulation pipe (2) and the collection pipe (4).
) are connected to pumps (5), <6), respectively.
捕集用配管(4)には、ここを通るガス中の塵埃やヨウ
素を採取する試料採取器(7)および採取用ガス流量調
節弁(8)が介挿されている。循環用配管(2)および
パージ用配管〈3〉にはそれぞれ入口遮断用バルブ〈9
〉および(10)が設けられている。A sample collector (7) for collecting dust and iodine in the gas passing therethrough and a sampling gas flow rate control valve (8) are inserted into the collection pipe (4). The circulation piping (2) and the purge piping (3) are each equipped with an inlet shutoff valve (9).
> and (10) are provided.
(11)はパージガス清浄用フィルタである。循環用配
管(2)の吸気側および排気側には、外部配管との取合
用フランジ(12)および(13)がそれぞれ取f寸け
ち九ている。なお、図中の矢印はサンプルガスの流れの
方向を示し、矢印Bはサンプリング時、矢印Cはパージ
時の流れの方向である。(11) is a purge gas cleaning filter. Flanges (12) and (13) for connection with external piping are provided on the intake side and the exhaust side of the circulation piping (2), respectively, with dimensions f. Note that the arrows in the figure indicate the flow direction of the sample gas, with arrow B indicating the flow direction during sampling, and arrow C indicating the flow direction during purging.
第3図は、第2図における^a、^b部の詳細を示し、
捕集用配管(4〉の先端はノズル(14)となっている
。Figure 3 shows details of parts ^a and ^b in Figure 2,
The tip of the collection pipe (4>) is a nozzle (14).
次に動作について説明する。サンプリング時、試料ガス
はフランジ(12〉によって外部配管と接続された循環
用配管(2)内へ循環用ポンプ(5〉によって吸入され
、開放となったバルブ(9〉を通過して本体〈1〉内を
循環した後、フランジ(13)によって接続された外部
配管へ排気される。この循環用配管(2〉は、外部サン
プルガス中の塵埃やヨウ素の状態が結露および沈澱作用
等の影響により変化することなく試料採取器(7)内へ
サンプリングできるよう、大流量を流す必要がある。Next, the operation will be explained. During sampling, the sample gas is sucked into the circulation pipe (2) connected to the external pipe by the flange (12>) by the circulation pump (5>), passes through the opened valve (9>), and then flows into the main body <1>. After circulating within the sample gas, it is exhausted to the external piping connected by the flange (13).This circulation piping (2) is used to detect dust and iodine in the external sample gas due to the effects of condensation and precipitation. A high flow rate is required to allow sampling into the sampler (7) without change.
一方、試料ガスの一部は循環用配管(2〉のAa部より
分岐した捕集用配管(4〉内へ、捕集用ポンプ(6〉を
動作することにより吸入され、流量調節弁(8)を調節
することによって必要量の試料ガスを試料採取器(7〉
内に通過させ、同ガス中の塵埃やヨウ素を試料採取器(
7)で捕集する。その後、補修済みのガスはAb部で循
環経路内へ戻る。この補修用配管(4)は、サンプリン
グに必要な量のみ流すので特に高濃度放射性ガスにおい
ては、採取器内の放射線量をハンドリングできる量に抑
制するためにも少流量を流す必要がある。On the other hand, a part of the sample gas is sucked into the collection pipe (4>) branched from the Aa section of the circulation pipe (2> by operating the collection pump (6>), and is sucked into the collection pipe (4>) branched from the Aa section of the circulation pipe (2> ) to obtain the required amount of sample gas from the sampler (7).
The sample collector (
Collect in 7). Thereafter, the repaired gas returns to the circulation path at the Ab section. This repair piping (4) allows only the amount necessary for sampling to flow, so especially for highly concentrated radioactive gases, it is necessary to flow a small flow rate in order to suppress the radiation dose in the sampling device to a manageable amount.
ところが、^a、^b部の分岐部は、試料ガス内の状態
を変化させないようにガスを分岐させるために、循環用
配管(2〉内ガスと同様の高速で捕集用配管〈4〉へ吸
入する必要がある。そのため、分岐部の捕集用配管(4
〉の先端部は開口面積を小さくしたノズル〈14〉とし
ている。However, in order to branch the gas so as not to change the state inside the sample gas, the branching parts of parts ^a and ^b are connected to circulation piping (2> collection piping <4> at the same high speed as the internal gas). Therefore, the collection pipe (4
The tip of the nozzle <14> has a small opening area.
また、サンプリング後、配管内に残されたガス中の塵埃
やヨウ素は、次回サンプリング時の測定誤差を生じさせ
るため、パージを行う必要がある。Further, after sampling, dust and iodine in the gas remaining in the pipes will cause measurement errors during the next sampling, so it is necessary to purge the pipes.
このパージは、バルブ(9)を閉じ、バルブ(10〉を
開にし、ポンプ(5) 、 (8)を動作することによ
り、パージエアフィルタ(11〉によって清浄化された
室内空気を循環用、捕集用配管(2)、(4)に流して
行う。This purge is performed by closing the valve (9), opening the valve (10>, and operating the pumps (5) and (8) to circulate and capture indoor air that has been purified by the purge air filter (11). This is done by flowing it into the collection pipes (2) and (4).
[発明が解決しようとする課題]
従来の高濃度放射性物質試料採取装置は以上のように構
成されているので、ノズル部の開口面積を非常に小さく
しなければならなため、パージの際、流速を上げること
ができず、捕集用配管(4〉内のパージ効果が低いとい
う問題があった。[Problem to be solved by the invention] Since the conventional high-concentration radioactive material sampling device is configured as described above, the opening area of the nozzle part must be made very small, so the flow rate is low during purging. There was a problem that the purging effect in the collection pipe (4) was low.
この発明は上記のような問題点を解消するためになされ
たもので、サンプリング時は、ノズルにより等速吸引が
可能で、一方、パージ時は、流速を高めることができる
高濃度放射性物質試料採取装置を得ることを目的とする
。This invention was made to solve the above-mentioned problems. During sampling, a nozzle enables uniform suction, while during purging, high-concentration radioactive material samples can be collected by increasing the flow rate. The purpose is to obtain equipment.
[課題を解決するための手段]
この発明に係る高濃度放射性物質試料採取装置は、ノズ
ル部にバイパス配管を設けたものである。[Means for Solving the Problems] A highly concentrated radioactive material sample collection device according to the present invention is provided with a bypass pipe in the nozzle portion.
[作 用]
この発明においては、バイパス配管は、サンプル時には
同配管に設置したバルブを閉としてノズル部を通してサ
ンプリングを行うが、パージ時は、バルブを開として捕
集用配管内の流速を上げることにより、捕集用配管内に
残された放射性物質をより効果的に吹き飛ばすことがで
きる。[Function] In the present invention, when sampling the bypass piping, the valve installed in the piping is closed and sampling is performed through the nozzle part, but when purging, the valve is opened to increase the flow rate in the collection piping. This makes it possible to more effectively blow away radioactive substances left inside the collection pipe.
[実施例]
第1図はこの発明の一実施例を示し、循環用配管(2〉
と捕集用配管(4〉の分岐部に、バイパスバルブ(16
〉を有するバイパス配管(15)が接続されている。[Example] Figure 1 shows an example of the present invention, in which circulation piping (2)
A bypass valve (16) is installed at the branch of the collection pipe (4).
> is connected to the bypass pipe (15).
その池の構成は第2図と同様である。The configuration of the pond is similar to that shown in Figure 2.
以上の構成により、サンプリング時、循環用配管(2)
内を高速で流れる試料ガスは、ノズル(14)部では同
速で捕集用配管(4)へ吸入されるが、ノズル(14)
部通過後は管路が広がり低速となる。(この際は、バイ
パスバルブ(16〉は閉じている。〉−方、パージ時は
、バイパスバルブ(16)を開き、ノズル(14〉を通
過しなくても循環用配管(2〉内のガ2スは、捕集用配
管(4〉へ流入することができるため、ノズル〈14〉
による圧力損失を受けることがなく、捕集用配管(4)
内も高速でパージエアを流すことができる。With the above configuration, during sampling, the circulation piping (2)
The sample gas flowing at high speed inside the nozzle (14) is sucked into the collection pipe (4) at the same speed;
After passing through the section, the pipe widens and the speed becomes low. (In this case, the bypass valve (16) is closed.) On the other hand, when purging, the bypass valve (16) is opened and the gas in the circulation piping (2) does not pass through the nozzle (14). Since the 2s can flow into the collection pipe (4), the nozzle (14)
Collection piping (4)
Purge air can also flow inside at high speed.
また、上記実施例では高濃度放射性物質試料を採取する
場合について説明したが、低濃度であっても、サンプリ
ングを循環用、捕集用等2経路に分岐して行い、その流
量が異なる場合は、同様の効果を奏する。In addition, in the above embodiment, the case of collecting a highly concentrated radioactive material sample was explained, but even if the concentration is low, sampling is performed by dividing into two routes such as circulation and collection, and if the flow rates are different, , has the same effect.
[発明の効果]
以上のように、この発明によれば、ノズル部にバイパス
配管を設けたので、捕集用配管内のパ−ジがより効果的
に行えるため、精度の高いサンプリングができる。[Effects of the Invention] As described above, according to the present invention, since the bypass piping is provided in the nozzle portion, the inside of the collection piping can be purged more effectively, so that highly accurate sampling can be performed.
第1図はこの発明の一実施例の要部配管図、第2図は従
来の高濃度放射性物質試料採取装置の回路図、第3図は
第2図の一部の配管図である。
(2)・・循環用配管、(4〉・・捕集用配管、(7)
・・試料採取器、(14)・・ノズル、(15)・・バ
イパス配管、〈16〉・・バイパスバルブ。
なお、各図中、同一符号は同−又は相当部分を示す。
代 理 人 曾 我 道 類15
.1でイハ゛スE’lFFIG. 1 is a piping diagram of a main part of an embodiment of the present invention, FIG. 2 is a circuit diagram of a conventional highly concentrated radioactive material sample collection device, and FIG. 3 is a piping diagram of a part of FIG. 2. (2)...Circulation piping, (4>...Collection piping, (7)
... Sample collector, (14) ... Nozzle, (15) ... Bypass piping, <16> ... Bypass valve. In each figure, the same reference numerals indicate the same or corresponding parts. Agent Zeng Ga Dao Class 15
.. 1 is high E'IF
Claims (1)
循環用配管から分岐し弁を介して大気に開放されている
パージ用配管と、前記循環用配管からノズルを介して分
岐、合流し試料採取器が介挿されている捕集用配管とを
備え、さらに、前記循環用配管と前記捕集用配管との分
岐部にバイパス配管を設けて前記捕集用配管のパージ流
量を増大させた高濃度放射性物質試料採取装置。A circulation pipe that circulates sample gas by a pump, a purge pipe that branches from this circulation pipe and is open to the atmosphere via a valve, and a sample collector that branches and joins from the circulation pipe via a nozzle. and a collection pipe in which a collection pipe is inserted, and a bypass pipe is provided at a branch part between the circulation pipe and the collection pipe to increase the purge flow rate of the collection pipe. Radioactive material sampling device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17329489A JPH0339682A (en) | 1989-07-05 | 1989-07-05 | Sampling device for high-level radioactive material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17329489A JPH0339682A (en) | 1989-07-05 | 1989-07-05 | Sampling device for high-level radioactive material |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0339682A true JPH0339682A (en) | 1991-02-20 |
Family
ID=15957777
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17329489A Pending JPH0339682A (en) | 1989-07-05 | 1989-07-05 | Sampling device for high-level radioactive material |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0339682A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011252756A (en) * | 2010-06-01 | 2011-12-15 | Mitsubishi Electric Corp | Radiation measuring apparatus |
-
1989
- 1989-07-05 JP JP17329489A patent/JPH0339682A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011252756A (en) * | 2010-06-01 | 2011-12-15 | Mitsubishi Electric Corp | Radiation measuring apparatus |
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