JPH0335488U - - Google Patents

Info

Publication number

JPH0335488U

JPH0335488U JP9559489U JP9559489U JPH0335488U JP H0335488 U JPH0335488 U JP H0335488U JP 9559489 U JP9559489 U JP 9559489U JP 9559489 U JP9559489 U JP 9559489U JP H0335488 U JPH0335488 U JP H0335488U

Authority

JP

Japan

Prior art keywords

integrated circuit

test station

dut

dut measurement

comparator

Prior art date

1989-08-14

Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Pending

Links

• Espacenet
• Global Dossier
• Discuss

• 238000012360 testing method Methods 0.000 claims description 7
• 238000005259 measurement Methods 0.000 claims description 3
• 238000010586 diagram Methods 0.000 description 3