JPH0333380U - - Google Patents
Info
- Publication number
- JPH0333380U JPH0333380U JP9444089U JP9444089U JPH0333380U JP H0333380 U JPH0333380 U JP H0333380U JP 9444089 U JP9444089 U JP 9444089U JP 9444089 U JP9444089 U JP 9444089U JP H0333380 U JPH0333380 U JP H0333380U
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- sample
- temperature characteristics
- temperature
- support member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003989 dielectric material Substances 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000002347 injection Methods 0.000 claims description 3
- 239000007924 injection Substances 0.000 claims description 3
- 239000004020 conductor Substances 0.000 claims description 2
- 239000000463 material Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Description
第1図は本考案に係る誘電体材料の温度特性測
定装置の一実施例の縦断面図、第2図は第1図の
誘電体材料の温度特性測定装置に使用される試料
誘電体の支持部材の斜視図、第3図は本考案に係
る誘電体材料の温度特性測定装置のいま一つの実
施例の要部説明図、第4図は誘電体材料の温度特
性測定装置の構成を示すブロツク図、第5図は従
来の誘電体材料の温度特性測定装置の縦断面図、
第6図は第5図の誘電体材料の温度特性測定装置
により温度特性が測定される試料誘電体とその支
持部材の斜視図である。
2……導体空胴ケース、4……試料誘電体、5
……入力用コネクタ、6……出力用コネクタ、7
……ネツトワークアナライザ、8……コネクタ、
9……加熱用高周波注入装置、11……温度特性
測定装置、12……支持部材、13……支持棒、
14……リング状部、15……支持棒。
FIG. 1 is a vertical cross-sectional view of an embodiment of the temperature characteristic measuring device for dielectric materials according to the present invention, and FIG. 2 is a support for a sample dielectric used in the device for measuring temperature characteristics of dielectric materials shown in FIG. A perspective view of the members, FIG. 3 is an explanatory diagram of the main part of another embodiment of the device for measuring temperature characteristics of dielectric material according to the present invention, and FIG. 4 is a block diagram showing the configuration of the device for measuring temperature characteristics of dielectric material. Figure 5 is a vertical cross-sectional view of a conventional temperature characteristic measuring device for dielectric materials.
FIG. 6 is a perspective view of a sample dielectric whose temperature characteristics are measured by the dielectric material temperature characteristic measuring device of FIG. 5 and its support member. 2... Conductor cavity case, 4... Sample dielectric, 5
...Input connector, 6...Output connector, 7
...Network analyzer, 8...Connector,
9... High frequency injection device for heating, 11... Temperature characteristic measuring device, 12... Support member, 13... Support rod,
14...Ring-shaped part, 15...Support rod.
Claims (1)
内部にて低誘電率材料からなる支持部材により温
度特性を測定する試料誘電体を支持し、加熱用高
周波注入装置より上記試料誘電体に高周波を注入
し、その温度を上昇させて上記試料誘電体の温度
特性を測定するようにした誘電体共振器の温度特
性測定装置であつて、 上記支持部材は複数本の支持棒を備え、これら
支持棒の各先端部にて上記試料誘電体を支持する
ようにしたことを特徴とする誘電体材料の温度特
性測定装置。[Scope of Claim for Utility Model Registration] A heating high-frequency injection device comprising a conductor cavity case, in which a sample dielectric whose temperature characteristics are to be measured is supported by a support member made of a low dielectric constant material, and a heating high-frequency injection device. The temperature characteristic measuring device for a dielectric resonator is configured to measure the temperature characteristics of the sample dielectric by injecting high frequency waves into the sample dielectric and increasing its temperature, wherein the support member includes a plurality of support members. 1. An apparatus for measuring temperature characteristics of a dielectric material, comprising support rods, each of which supports the sample dielectric at its tip.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9444089U JPH0333380U (en) | 1989-08-10 | 1989-08-10 | |
US07/550,161 US5119034A (en) | 1989-07-12 | 1990-07-09 | Method of measuring dielectric material constants and measuring device employed therefor |
GB9015226A GB2234826B (en) | 1989-07-12 | 1990-07-11 | Method of measuring dielectric material constants and measuring device employed therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9444089U JPH0333380U (en) | 1989-08-10 | 1989-08-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0333380U true JPH0333380U (en) | 1991-04-02 |
Family
ID=31643766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9444089U Pending JPH0333380U (en) | 1989-07-12 | 1989-08-10 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0333380U (en) |
-
1989
- 1989-08-10 JP JP9444089U patent/JPH0333380U/ja active Pending
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