JPH0330873U - - Google Patents

Info

Publication number
JPH0330873U
JPH0330873U JP9191189U JP9191189U JPH0330873U JP H0330873 U JPH0330873 U JP H0330873U JP 9191189 U JP9191189 U JP 9191189U JP 9191189 U JP9191189 U JP 9191189U JP H0330873 U JPH0330873 U JP H0330873U
Authority
JP
Japan
Prior art keywords
semiconductor device
lead terminal
inspection apparatus
product storage
measures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9191189U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9191189U priority Critical patent/JPH0330873U/ja
Publication of JPH0330873U publication Critical patent/JPH0330873U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP9191189U 1989-08-03 1989-08-03 Pending JPH0330873U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9191189U JPH0330873U (enrdf_load_stackoverflow) 1989-08-03 1989-08-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9191189U JPH0330873U (enrdf_load_stackoverflow) 1989-08-03 1989-08-03

Publications (1)

Publication Number Publication Date
JPH0330873U true JPH0330873U (enrdf_load_stackoverflow) 1991-03-26

Family

ID=31641370

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9191189U Pending JPH0330873U (enrdf_load_stackoverflow) 1989-08-03 1989-08-03

Country Status (1)

Country Link
JP (1) JPH0330873U (enrdf_load_stackoverflow)

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