JPH03285884A - Silicon carbide jig - Google Patents

Silicon carbide jig

Info

Publication number
JPH03285884A
JPH03285884A JP2087976A JP8797690A JPH03285884A JP H03285884 A JPH03285884 A JP H03285884A JP 2087976 A JP2087976 A JP 2087976A JP 8797690 A JP8797690 A JP 8797690A JP H03285884 A JPH03285884 A JP H03285884A
Authority
JP
Japan
Prior art keywords
silicon carbide
jig
silicon nitride
pipe
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2087976A
Other languages
Japanese (ja)
Inventor
Seiichi Iwamatsu
誠一 岩松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2087976A priority Critical patent/JPH03285884A/en
Publication of JPH03285884A publication Critical patent/JPH03285884A/en
Pending legal-status Critical Current

Links

Landscapes

  • Ceramic Products (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To carry out the high temp. heat treatment for semiconductor, etc., without being contaminated by heavy metal by coating at least the inner surface or all surfaces of pipe or jig consisting of silicon carbide with silicon nitride. CONSTITUTION:At least the inner surface of a silicon carbide pipe used for heat treatment of semiconductor or all surfaces of a silicon carbide jig are coated with silicon nitride. This silicon nitride coating is formed on a surface by the thermochemical reaction carried out in such a way that a pipe or jig is heated on which gaseous silane or gaseous ammonia is passed. This material of silicon nitride has an excellent barrier effect against the dispersion of heavy metal contaminants and, by using the pipe or the jig having this effect, a semi conductor wafer is treated at high temp. for a long period without the contami nation due to heavy metals.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体の加熱処理用の炭化硅素管及び炭化硅素
治具の表面保護材に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a surface protection material for silicon carbide tubes and silicon carbide jigs for heat treatment of semiconductors.

[従来の技術] 従来、1200℃以上の半導体の加熱処理には炭化硅素
管や炭化硅素治具が熱変形を起さないと云う事にて、用
いられるのが通例であった。
[Prior Art] Conventionally, silicon carbide tubes and silicon carbide jigs have been commonly used for heat treatment of semiconductors at temperatures of 1200° C. or higher because they do not cause thermal deformation.

[発明が解決しようとする課題] しかし、上記従来技術によると、炭化硅素管は炭化硅素
管の外部に設置されるムライト管やカンタル・ヒーター
からの重金属不純物の拡散や、炭化珪素管自体や炭化硅
素治具自体の含有せる重金属不純物の拡散により、加熱
処理する半導体としてのシリコン半導体等へのこれら重
金属不純物汚染が防止出来ないと云う課題があった。
[Problems to be Solved by the Invention] However, according to the above-mentioned prior art, silicon carbide tubes suffer from the diffusion of heavy metal impurities from the mullite tubes and Kanthal heaters installed outside the silicon carbide tubes, and from the silicon carbide tube itself and carbide. There has been a problem in that due to the diffusion of heavy metal impurities contained in the silicon jig itself, it is impossible to prevent contamination of silicon semiconductors and the like as semiconductors to be heat-treated with these heavy metal impurities.

本発明は、かかる従来技術の課題を解決する為の炭化硅
素治具に新しい表面保護材を構成する事を目的とする。
The object of the present invention is to provide a new surface protection material for a silicon carbide jig in order to solve the problems of the prior art.

[課題を解決するための手段] 上記課題を解決する為に、本発明は炭化硅素治具に関し
、少(とも一部表面か、あるいは全表面を窒化硅素材で
被覆する手段をとる〇 [実施例コ 以下、実施例により本発明を詳述する。
[Means for Solving the Problems] In order to solve the above problems, the present invention relates to a silicon carbide jig, and takes measures to cover at least a portion of the surface or the entire surface with a silicon nitride material. EXAMPLES The present invention will now be explained in detail with reference to Examples.

いま、長さ2 m 、内径9インチ、肉厚5咽程度の炭
化硅素管の外部をカンタル・ヒーターで加熱しながら、
前記炭化硅素管のガス導入口からシラン争ガスとアンモ
ニア・ガスを導入する事により内壁に1mm厚程鹿の窒
化硅素材を熱化学反応により形成する事ができる。又、
前記炭化硅素管を反応管と見なし、該反応管内に炭化硅
素ボート等の炭化硅素治具を挿入すれば、これら炭化硅
素治具表面に窒化硅素材を被覆することもできる。尚、
窒化硅素材の形成方法は上記の如きCvD(化学蒸着)
法による他プラズマOVDやスパッタ法等を用いる事も
できる。
Now, while heating the outside of a silicon carbide tube with a length of 2 m, an inner diameter of 9 inches, and a wall thickness of about 5 mm, using a Kanthal heater,
By introducing silane gas and ammonia gas through the gas inlet of the silicon carbide tube, a 1 mm thick silicon nitride material can be formed on the inner wall by thermochemical reaction. or,
If the silicon carbide tube is regarded as a reaction tube and a silicon carbide jig such as a silicon carbide boat is inserted into the reaction tube, the surface of the silicon carbide jig can be coated with a silicon nitride material. still,
The method of forming the silicon nitride material is CvD (chemical vapor deposition) as described above.
In addition to the method, plasma OVD, sputtering, etc. can also be used.

更に、窒化硅素材表面や窒化珪素材下面に酸化硅素材を
形成しても良い事は云うまでもない。
Furthermore, it goes without saying that a silicon oxide material may be formed on the surface of the silicon nitride material or on the bottom surface of the silicon nitride material.

窒化硅素材は重金属不純物の反応炉内や治具からの拡散
を防止するすぐれた障壁効果を有して居り、本発明によ
る反応管と治具を用いてシリコン半導体ウェーハを12
00℃以上で長時間熱処理しても、重金属汚染の指標で
あるライフ、タイムの劣化は来たさないと云う作用があ
る。
Silicon nitride material has an excellent barrier effect to prevent heavy metal impurities from diffusing inside the reactor and from the jig.
Even if heat treated at 00° C. or higher for a long time, life and time, which are indicators of heavy metal contamination, will not deteriorate.

「発明の効果コ 本発明により重金属汚染の無い半導体の高温熱処理が可
能となる効果がある。
``Effects of the Invention The present invention has the effect of enabling high-temperature heat treatment of semiconductors without heavy metal contamination.

以上that's all

Claims (1)

【特許請求の範囲】[Claims]  少なくとも内面を窒化硅素で被覆した管又は全表面を
窒化硅素で被覆した治具となす事を特徴とする炭化硅素
治具。
A silicon carbide jig characterized in that it is a tube whose at least the inner surface is coated with silicon nitride or a jig whose entire surface is coated with silicon nitride.
JP2087976A 1990-04-02 1990-04-02 Silicon carbide jig Pending JPH03285884A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2087976A JPH03285884A (en) 1990-04-02 1990-04-02 Silicon carbide jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2087976A JPH03285884A (en) 1990-04-02 1990-04-02 Silicon carbide jig

Publications (1)

Publication Number Publication Date
JPH03285884A true JPH03285884A (en) 1991-12-17

Family

ID=13929865

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2087976A Pending JPH03285884A (en) 1990-04-02 1990-04-02 Silicon carbide jig

Country Status (1)

Country Link
JP (1) JPH03285884A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0713245A3 (en) * 1994-11-17 1996-09-04 Shinetsu Handotai Kk A heat treatment jig for semiconductor wafers and a method for treating a surface of the same
JP2010225999A (en) * 2009-03-25 2010-10-07 Showa Denko Kk Method of manufacturing compound semiconductor, method of manufacturing compound semiconductor light emitting element, compound semiconductor manufacturing device, and tool for manufacturing compound semiconductor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0713245A3 (en) * 1994-11-17 1996-09-04 Shinetsu Handotai Kk A heat treatment jig for semiconductor wafers and a method for treating a surface of the same
US5759426A (en) * 1994-11-17 1998-06-02 Shin-Etsu Handotai Co., Ltd. Heat treatment jig for semiconductor wafers and a method for treating a surface of the same
JP2010225999A (en) * 2009-03-25 2010-10-07 Showa Denko Kk Method of manufacturing compound semiconductor, method of manufacturing compound semiconductor light emitting element, compound semiconductor manufacturing device, and tool for manufacturing compound semiconductor

Similar Documents

Publication Publication Date Title
US5456757A (en) Susceptor for vapor deposition
US6187102B1 (en) Thermal treatment apparatus
US5131842A (en) Corrosion resistant thermal treating apparatus
JP2010255103A (en) Treatment device
JP2001247965A (en) Protective film, treating equipment for semiconductor wafer and method for depositing thin film diamond film
JP2000223432A (en) Thermal treatment apparatus
JPH03285884A (en) Silicon carbide jig
JPS6157222A (en) Apparatus for purifying noxious substance containing halogen
JP3578258B2 (en) Heat treatment equipment
JP2002153726A (en) Exhaust gas treatment device
JPH08124869A (en) Vertical heat treating apparatus
JP2000252273A (en) Semiconductor manufacturing equipment
JP2581955B2 (en) Heat treatment equipment for semiconductor devices
JP3625741B2 (en) Heat treatment apparatus and method
JP3779348B2 (en) High purity furnace for graphite members
JPH0817746A (en) Heater
JP4434334B2 (en) CVD apparatus and film forming method
JP4373723B2 (en) Cylinder type vapor phase growth equipment
JP2000306856A (en) Semiconductor manufacturing apparatus
JPH03291917A (en) Heat-treating equipment
JP2686465B2 (en) Heat treatment equipment
JPH03208334A (en) Manufacturing device for semiconductor
JP2990670B2 (en) Gas inlet pipe for vertical semiconductor heat treatment furnace
JP3133961B2 (en) Corrosion resistant member, method of using the same, and method of manufacturing the same
JP5190436B2 (en) Processing apparatus, film forming method, and processing method