JPH0327343U - - Google Patents
Info
- Publication number
- JPH0327343U JPH0327343U JP8741489U JP8741489U JPH0327343U JP H0327343 U JPH0327343 U JP H0327343U JP 8741489 U JP8741489 U JP 8741489U JP 8741489 U JP8741489 U JP 8741489U JP H0327343 U JPH0327343 U JP H0327343U
- Authority
- JP
- Japan
- Prior art keywords
- plate glass
- defect
- light
- screen
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000005357 flat glass Substances 0.000 claims description 8
- 230000007547 defect Effects 0.000 claims 4
- 238000001514 detection method Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8741489U JPH0327343U (de) | 1989-07-27 | 1989-07-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8741489U JPH0327343U (de) | 1989-07-27 | 1989-07-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0327343U true JPH0327343U (de) | 1991-03-19 |
Family
ID=31637060
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8741489U Pending JPH0327343U (de) | 1989-07-27 | 1989-07-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0327343U (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011523701A (ja) * | 2008-05-19 | 2011-08-18 | セミシスコ・カンパニー・リミテッド | 基板の品質検査装置及びその検査方法 |
-
1989
- 1989-07-27 JP JP8741489U patent/JPH0327343U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011523701A (ja) * | 2008-05-19 | 2011-08-18 | セミシスコ・カンパニー・リミテッド | 基板の品質検査装置及びその検査方法 |