JPH03255302A - Detecting apparatus for pattern - Google Patents

Detecting apparatus for pattern

Info

Publication number
JPH03255302A
JPH03255302A JP5329290A JP5329290A JPH03255302A JP H03255302 A JPH03255302 A JP H03255302A JP 5329290 A JP5329290 A JP 5329290A JP 5329290 A JP5329290 A JP 5329290A JP H03255302 A JPH03255302 A JP H03255302A
Authority
JP
Japan
Prior art keywords
insulator
image
detected
picture elements
abnormality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5329290A
Other languages
Japanese (ja)
Inventor
Yasushi Yagi
康史 八木
Shinjiro Kawato
慎二郎 川戸
Toshio Takenaka
俊夫 竹中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5329290A priority Critical patent/JPH03255302A/en
Publication of JPH03255302A publication Critical patent/JPH03255302A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To detect the abnormality of a body to be inspected automatically and to reduce the capacity of memories by projecting the picture-element components of an input-image signal in both X and Y directions, counting the components, obtaining the characteristic amounts, and detecting and judging the abnormality of the body to be detected. CONSTITUTION:A moving robot 1 is moved to a specified position. The image of an insulator 3 is picked up with a camera 2. The binary-coded data are inputted into an image input means 4 of a pattern detecting apparatus 20. Differentiation is performed in a directive differentiating circuit 5. The concentration gradient of the insulator 3 in the direction of the water drip shed is detected, and the direction components are obtained. The results of the differentiations in the upper and lower directions are expressed as the directional differentiated signals in the directions of X, Y and Z. With respect to the picture elements wherein the absolute values of the differentiated values are higher than a specified threshold value, the numbers of the picture elements in the direction perpendicular to the water drip shed are counted in counting means 6 separately for the positive and negative values. Then a projection step is performed. The region whose number of the picture elements is larger than the specified threshold value is detected as the candidate region for the object of the insulator 3. The width, height, central position and constituent picture elements of the insulator region are computed based on the projection data in a processor 9. The characteristic amounts are compared with reference values stored in a memory means 8 in an abnormality detecting means 7. Thus the intended insulator 3 can be detected.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、移動ロボットに搭載したカメラを変電所な
どの所定位置まで移動し、設備などの巡視点検をするた
めのパターン検出装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a pattern detection device for moving a camera mounted on a mobile robot to a predetermined location such as a substation and performing a tour inspection of equipment. be.

[従来の技術] 第9図(a)、(b)は、例えば昭晃堂、昭和62年6
月9日発行「画像処理ハンドブック」(ページ613−
615)に示された従来の複合型部分パターンマツチン
グ法と呼ばれる認識方法による2値映像パターン及び部
分パターンの説明図である。このパターン検出方法は、
対象とする2値パターンの中から特徴的な部分パターン
P+。
[Prior art] Figures 9 (a) and (b) are, for example, published by Shokodo, 1986 6.
“Image Processing Handbook” (Page 613-
FIG. 615) is an explanatory diagram of a binary image pattern and a partial pattern by a recognition method called a conventional composite partial pattern matching method shown in FIG. This pattern detection method is
A characteristic partial pattern P+ among the target binary patterns.

p、、p、・・・・・・を選び、予め計算機内に記憶し
ておく。そして対象が視野内に入ると計算機はその部分
パターンと標準パターンとを比較し、画面中で最もよく
一致した点の位置座標を求める。こうして求めたPI、
P2の座標から計算される距離d+□と角度θ1□が、
対象物体の幾何学的関係と一致するとP+、P2ともに
正常に計算されたと判断する。
Select p, , p, . . . and store them in the computer in advance. When the object comes within the field of view, the computer compares the partial pattern with the standard pattern and determines the positional coordinates of the point on the screen that best matches. The PI obtained in this way,
The distance d+□ and angle θ1□ calculated from the coordinates of P2 are
If it matches the geometrical relationship of the target object, it is determined that both P+ and P2 have been calculated correctly.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来のパターン検圧装置は、以上のように構成されてい
るので、対象物までの距離が変化し、たり、画像中での
対象物に大きさの変化が見られたりすると標準パターン
と検査時の部分パターンとの間でマツチングが困難とな
り、正確な位置合わせができないと言う課題があった。
Conventional pattern pressure detection devices are configured as described above, so if the distance to the object changes or the size of the object changes in the image, the standard pattern and the inspection time change. There was a problem in that it was difficult to match the pattern with the partial pattern, and accurate positioning could not be achieved.

さらに多くの標準パターンを画像データとして記憶装置
に格納しておかなければならず、大容量のメモリを必要
とする等の課題があった。
Furthermore, many standard patterns must be stored in the storage device as image data, which poses problems such as requiring a large capacity memory.

この発明は、上記のような課題を解消するためになされ
たもので、画像中での対象物の大きさに変化のある場合
にも容易に適用することができるとともに、対象につい
ての記憶容量が少なくて済むパターン検出装置を得るこ
とを目的とする。
This invention was made to solve the above-mentioned problems, and can be easily applied even when the size of an object in an image changes, and the storage capacity for the object can be reduced. An object of the present invention is to obtain a pattern detection device that requires less.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係るパターン検出装置は、被検査物体を視覚
装置で撮像し、その画像信号を量子化する画像入力手段
と、その画像信号の各画素において予め定められた方向
の濃度勾配を求める濃度勾配検出″手段と、前記濃度勾
配の方向成分の絶対値が一定量上の画素についてX、Y
方向に投影して計数手段で該画素を計数し、その計数値
の中から特徴量を求める情報処理手段と、前記特徴量を
予め計測して記憶装置に格納した基準値との差が容認範
囲内か否かを判断する異常検出手段とを備え、被検査物
体の異常を自動的に検出するようにしたものである。
The pattern detection device according to the present invention includes an image input means for capturing an image of an object to be inspected with a visual device and quantizing the image signal, and a density gradient for obtaining a density gradient in a predetermined direction in each pixel of the image signal. detecting means, and X, Y detection means for pixels whose absolute value of the direction component of the density gradient is above a certain amount.
The difference between the information processing means that projects the pixels in the direction, counts the pixels using the counting means, and calculates the feature amount from the counted value, and the reference value that measures the feature amount in advance and stores it in the storage device is within an acceptable range. The apparatus is equipped with an abnormality detection means for determining whether or not the object is within the range of the object to be inspected.

〔作用〕[Effect]

この発明におけるパターン検出装置は視覚装置で撮像し
た入力画像信号より、一定方向に濃度勾配を持つ画素成
分をX、Y両方向に投影して計数することにより特徴量
を求め、基準値と比較することによって被検査物体の異
常検出判断を行うので、被検査物体の特徴量が強調され
、画像中の対象物に大きさの変化があっても確実に対応
する。
The pattern detection device according to the present invention obtains a feature amount by projecting and counting pixel components having a density gradient in a certain direction in both the X and Y directions from an input image signal captured by a visual device, and compares it with a reference value. Since the abnormality detection judgment of the object to be inspected is made using the method, the feature amount of the object to be inspected is emphasized, and even if there is a change in the size of the object in the image, it is reliably handled.

[発明の実施例1 以下、この発明の一実施例を図について説明する。第1
図は、この発明が適用されている実際の状況を説明する
ための説明図であり、図において、1は移動用ロボット
、2は視覚装置としてのカメラ、3は例えば被検出物体
の碍子である。
[Embodiment 1 of the Invention Hereinafter, an embodiment of the present invention will be described with reference to the drawings. 1st
The figure is an explanatory diagram for explaining an actual situation in which the present invention is applied. In the figure, 1 is a mobile robot, 2 is a camera as a visual device, and 3 is an insulator of an object to be detected, for example. .

次に動作について説明する。まず、変電所や発電所等に
おいて、設備の保守点検を自動的に行う場合には、移動
ロボット1が検査場所の定位置まで移動し、碍子3をカ
メラ2で撮影する。外観検査をする時には、碍子3と他
の構造物とを区別して画像中より対象物のみを検出する
Next, the operation will be explained. First, when automatically performing maintenance and inspection of equipment at a substation, power plant, etc., the mobile robot 1 moves to a predetermined position at the inspection location and photographs the insulator 3 with the camera 2. When performing an external appearance inspection, only the target object is detected from the image by distinguishing between the insulator 3 and other structures.

第2図は5この発明を構成するためのハードウェアの一
実施例を示すブロック図で、図において、4はカメラ2
の出力を取込む画像入力手段、5は対象物の映像から濃
度勾配を検出する濃度勾配検出手段としての方向性微分
回路、6は計数手段、7は対象物が正常か否かを判断す
る異常検出手段、8は記憶手段、9は情報処理手段とし
てのプロセッサCPUである。
FIG. 2 is a block diagram showing an embodiment of hardware for configuring this invention. In the figure, 4 is a camera 2.
5 is a directional differentiation circuit as a concentration gradient detection means for detecting a concentration gradient from an image of the object; 6 is a counting means; 7 is an abnormality for determining whether the object is normal or not. A detection means, 8 a storage means, and 9 a processor CPU serving as an information processing means.

最初に移動ロボット1は所定の位置まで移動する。そし
て、検査対象の碍子3をカメラ2で撮像し、ディジタル
の画像入力データをパターン検出装置20の画像入力手
段4に取込む(ステップ5TI)。第4図は入力画像の
一例であり、被検出物体の碍子以外に他の背景構造物を
含む入力画像が現われる。その入力画像より碍子3のヒ
ダ方向(図では上方から下方に)の濃度勾配を検出して
方向成分を抽出するために、一方向性を持った方向性微
分回路5で第5図に示すように微分処理を行う(ステッ
プ5T2)、例えばヒダが水平な場合には、第6図(C
)の様な空間微分オペレータを用いる。この微分オペレ
ータはヒダ等のエツジの正負方向成分を検出できればよ
い。第6図の場合、(A)のハツチングは対象物の画像
を表わす。Xi、Yl、Zlの位置における上、下方向
の微分処理結果は、各々、同図(B)のX2.Y2、Z
2の方向性微分回路の電気信号で表わされる。対象物の
水平エツジ部で信号レベルが大きくなり、濃度勾配は信
号の符号で表わしている。
First, the mobile robot 1 moves to a predetermined position. Then, the insulator 3 to be inspected is imaged by the camera 2, and digital image input data is taken into the image input means 4 of the pattern detection device 20 (step 5TI). FIG. 4 is an example of an input image, in which an input image containing background structures other than the insulator of the object to be detected appears. In order to detect the density gradient in the direction of the folds of the insulator 3 (from top to bottom in the figure) from the input image and extract the directional component, a directional differentiation circuit 5 with unidirectionality is used as shown in FIG. (Step 5T2). For example, when the folds are horizontal, Fig. 6 (C
) is used. This differential operator only needs to be able to detect positive and negative direction components of edges such as folds. In the case of FIG. 6, the hatching in (A) represents the image of the object. The results of differential processing in the upward and downward directions at the positions of Xi, Yl, and Zl are respectively shown in X2. Y2, Z
It is expressed as an electric signal of a directional differential circuit of 2. The signal level increases at the horizontal edges of the object, and the density gradient is represented by the sign of the signal.

従って、方向性微分回路5は、正負方向成分を検出可能
なオペレータであればよい(ステップ5T3)。この微
分画像に対し、微分値の絶対値が所定のしきい値以上の
画素について、正負別々にヒダと垂直な方向の画素数を
計数手段6によって計数する。
Therefore, the directional differentiation circuit 5 only needs to be an operator capable of detecting positive and negative direction components (step 5T3). With respect to this differential image, the counting means 6 counts the number of pixels in the direction perpendicular to the folds, separately for positive and negative pixels, for pixels for which the absolute value of the differential value is greater than or equal to a predetermined threshold.

第7図(a)、(b)は、計数された周期バターン軸方
向の投影データである。この投影データに対し、画素計
数値nが所定のしきい値78以上の領域を碍子3の水平
方向の対象物候補領域としてR,、R2,R,・・・・
・・を検出する(ステップST4,5T5)。
FIGS. 7(a) and 7(b) are projection data of the counted periodic patterns in the axial direction. For this projection data, an area where the pixel count value n is equal to or greater than a predetermined threshold value 78 is designated as a horizontal target object candidate area of the insulator 3, R,, R2, R,...
... is detected (steps ST4, 5T5).

次に、前記各々の対象物候補領域R,,R,。Next, each of the object candidate regions R,,R,.

R3・・・・・・内についてヒダ方向の画素数を計数し
第2図に示すように投影処理を行い(ステップ5T6)
、その画素数が所定のしきい値78以上の領域を碍子の
対象物候補領域として検出する。さらに、前記、第7図
と第8図の2つの投影データより碍子領域の輻W(R,
)、高さH1中心位置(x、y)、構成画素Sをプロセ
ッサ9により算出する(ステップ5T7)。これらの特
徴量を予め計測して記憶手段8に格納してある基準値と
異常検出手段7で比較することによってパターン固定を
行い、目的とする碍子3の検出を行う(ステップ5T8
)。
The number of pixels in the fold direction is counted for the inside of R3, and projection processing is performed as shown in FIG. 2 (step 5T6).
, an area where the number of pixels is equal to or greater than a predetermined threshold value of 78 is detected as an insulator object candidate area. Furthermore, from the two projection data shown in FIGS. 7 and 8, the radius W(R,
), the height H1 center position (x, y), and the constituent pixels S are calculated by the processor 9 (step 5T7). These feature quantities are measured in advance and compared with reference values stored in the storage means 8 by the abnormality detection means 7 to fix the pattern and detect the target insulator 3 (step 5T8).
).

基準値との比較は(1)式に示すように各々の特徴量と
基準値との差が所定の容認範囲内であれば、目的とする
碍子は検出されたものとする。又、容認した範囲外の場
合に異常と判定して異常信号を出力する(ステップ5T
9)。
In the comparison with the reference value, as shown in equation (1), if the difference between each feature amount and the reference value is within a predetermined acceptable range, it is assumed that the target insulator has been detected. Also, if it is outside the accepted range, it is determined to be abnormal and an abnormal signal is output (step 5T).
9).

但し、WX1△W:幅Wの基準値と容認範囲HK、△H
:Hの基準値と容認範囲 SX、△S:幅Sの基準値と容認範囲 abc :絶対値 また、評価値としては、碍子の存在候補領域内における
物体占有密度ρ=s/ (WXH)や領域の縦横比W/
Hを用いてもよく上記実施例と同様の効果を奏する。
However, WX1△W: Standard value of width W and acceptable range HK, △H
: Reference value of H and acceptable range SX, △S: Reference value of width S and acceptable range abc : Absolute value Also, as an evaluation value, the density of object occupancy in the insulator existence candidate area ρ=s/(WXH) Area aspect ratio W/
H may also be used to produce the same effect as in the above embodiment.

また、本実施例では、碍子の検出について説明したが、
階段、梯子、電線等のように同一方向成分がくりかえす
物体であれば同様に適用することができる。
Furthermore, in this embodiment, the detection of the insulator was explained.
The same method can be applied to objects that have repeating components in the same direction, such as stairs, ladders, and electric wires.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明によれば、撮像された被検査物体
の画像信号を取込む画像入力手段と、その画像信号から
一定方向の濃度勾配を求める濃度勾配検出手段と、その
濃度勾配をX、Y方向に投影して画素を計数し特徴量を
求める情報処理手段と、その特徴量と基準値と比較して
被検査物体の異常を検出する異常検出手段とをもって装
置を構成したので、画像中での大きさの変化にも容易に
適用でき、パターン検出の適用範囲の拡大と検出の信頼
性が向上する効果がある。又、多(の標準パターンを持
つ必要がなくなり、メモリ容量が少なくてすむため小形
、安価となる効果がある。
As described above, according to the present invention, there is an image input means for taking in an image signal of a photographed object to be inspected, a density gradient detection means for calculating a density gradient in a certain direction from the image signal, and The apparatus is configured with an information processing means that calculates feature quantities by counting pixels by projecting in the Y direction, and an abnormality detection means that detects abnormalities in the object to be inspected by comparing the feature quantities with a reference value. It can be easily applied to changes in the size of patterns, and has the effect of expanding the applicable range of pattern detection and improving detection reliability. In addition, there is no need to have multiple standard patterns, and the memory capacity is small, resulting in a smaller size and lower cost.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、この発明の一実施例を示す応用例の説明図、
第2図はこの発明の一実施例によるハードウェアの構成
を示すブロック図、第3図は、被検出物体を検出するた
めの手順を示すフローチャート、第4図は入力画像の説
明図、第5図は方向性微分画像の説明図、第6図は水平
エツジ成分を検出する微分オペレータと波形の説明図、
第7図は第5図の画像を垂直方向に画素数を計数した投
影データ特性図、第8図は水平方向への投影データとパ
ターン検出のための評価値の説明図、第9図は従来のパ
ターン検出方法の説明図である。 図において、2はカメラ(視覚装置)、4は画像入力手
段、5は方向性微分回路(濃度勾配検出手段)、6は計
数手段、7は異常検出手段、8は記憶手段、9はプロセ
ッサ(情報処理手段)である。 なお、図中、同一符号は同一、又は相当部分を示す。
FIG. 1 is an explanatory diagram of an application example showing an embodiment of the present invention;
FIG. 2 is a block diagram showing a hardware configuration according to an embodiment of the present invention, FIG. 3 is a flowchart showing a procedure for detecting an object to be detected, FIG. 4 is an explanatory diagram of an input image, and FIG. The figure is an explanatory diagram of the directional differential image, and Figure 6 is an explanatory diagram of the differential operator and waveform for detecting horizontal edge components.
Figure 7 is a projection data characteristic diagram that counts the number of pixels in the vertical direction of the image in Figure 5, Figure 8 is an explanatory diagram of horizontal projection data and evaluation values for pattern detection, and Figure 9 is a conventional diagram. FIG. 2 is an explanatory diagram of a pattern detection method. In the figure, 2 is a camera (visual device), 4 is an image input means, 5 is a directional differentiation circuit (concentration gradient detection means), 6 is a counting means, 7 is an abnormality detection means, 8 is a storage means, and 9 is a processor ( information processing means). In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 一方向性成分を繰り返される被検査物体を視覚装置によ
って撮像し、その画像信号を量子化する画像入力手段と
、前記画像信号の各画素における濃度勾配の予め決めら
れた方向の成分を求める濃度勾配検出手段と、前記濃度
勾配の方向成分の絶対値が一定量上の画素についてX、
Y方向に投影する計数手段で該画素を計数し、その計数
値の中から特徴量を求める情報処理手段と、前記特徴量
及び予め計測して記憶手段に格納してある基準値との差
が容認範囲内か否かを検出する異常検出手段とを備えた
パターン検出装置。
an image input means for capturing an image of an object to be inspected in which a unidirectional component is repeated by a visual device and quantizing the image signal; and a concentration gradient for determining a component in a predetermined direction of the concentration gradient at each pixel of the image signal. a detection means;
An information processing means that counts the pixels using a counting means that projects in the Y direction and calculates a feature quantity from the counted value, and a difference between the feature quantity and a reference value that has been measured in advance and stored in a storage means. A pattern detection device comprising an abnormality detection means for detecting whether or not it is within an acceptable range.
JP5329290A 1990-03-05 1990-03-05 Detecting apparatus for pattern Pending JPH03255302A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5329290A JPH03255302A (en) 1990-03-05 1990-03-05 Detecting apparatus for pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5329290A JPH03255302A (en) 1990-03-05 1990-03-05 Detecting apparatus for pattern

Publications (1)

Publication Number Publication Date
JPH03255302A true JPH03255302A (en) 1991-11-14

Family

ID=12938651

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JPH03255302A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
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CN108010019A (en) * 2017-11-29 2018-05-08 国网电力科学研究院武汉南瑞有限责任公司 One kind is based on the defects of adaptively cutting single insulator detection method
JP2018521406A (en) * 2015-06-15 2018-08-02 ドネクル System and method for automatically inspecting a surface

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018521406A (en) * 2015-06-15 2018-08-02 ドネクル System and method for automatically inspecting a surface
CN108010019A (en) * 2017-11-29 2018-05-08 国网电力科学研究院武汉南瑞有限责任公司 One kind is based on the defects of adaptively cutting single insulator detection method
CN108010019B (en) * 2017-11-29 2022-03-25 国网电力科学研究院武汉南瑞有限责任公司 Defect detection method based on self-adaptive cutting of single insulator

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