JPH03235352A - Imprinting device - Google Patents
Imprinting deviceInfo
- Publication number
- JPH03235352A JPH03235352A JP2967590A JP2967590A JPH03235352A JP H03235352 A JPH03235352 A JP H03235352A JP 2967590 A JP2967590 A JP 2967590A JP 2967590 A JP2967590 A JP 2967590A JP H03235352 A JPH03235352 A JP H03235352A
- Authority
- JP
- Japan
- Prior art keywords
- section
- imprinting
- imprinted
- stamping
- quality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 abstract description 13
- 230000002950 deficient Effects 0.000 abstract description 12
- 238000010438 heat treatment Methods 0.000 abstract 1
- 238000007639 printing Methods 0.000 description 5
- 230000007547 defect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000005096 rolling process Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔概 要〕
ICパッケージ等に型式等を捺印する自動捺印機に関し
、捺印品質の向上を目的とし、自動捺印機において、同
一被捺印物に対して複数回の捺印を可能とする捺印機構
部と、捺印結果の良否を検査する捺印検査機構部と、該
捺印検査機構部の判定結果のフィードバックにより同一
被捺印物への捺印回数を制御する制御部とを具備して成
るように構成する。[Detailed Description of the Invention] [Summary] Regarding an automatic stamping machine that stamps the model number etc. on IC packages, etc., for the purpose of improving the stamping quality, the automatic stamping machine stamps the same stamped object multiple times. a stamp inspection mechanism section that inspects the quality of the stamping results; and a control section that controls the number of stampings on the same object by feedback of the judgment results of the stamp inspection mechanism section. Configure it so that it becomes
本発明は、ICパッケージ等に型式等を捺印する自動捺
印機に関する。TECHNICAL FIELD The present invention relates to an automatic stamping machine that stamps a type etc. on an IC package or the like.
従来より、ICパッケージ等の半導体装置には、パッケ
ージ表面に、その型式、社名、製造ロフト番号等が捺印
されているが、その捺印にカスレ、欠は等の欠陥が生ず
ることがある。これらの欠陥は半導体装置の機能には何
ら関係はないが、単体で出荷する場合、ユーザからの苦
情があるため、不良品は手直しする必要があり、その手
直し工数が無視できないため、この対策が要求されてい
る。Conventionally, semiconductor devices such as IC packages have their model, company name, manufacturing loft number, etc. stamped on the surface of the package, but defects such as scratches and chips may occur in the stamps. These defects have nothing to do with the functionality of the semiconductor device, but when shipped as a single unit, defective products must be reworked due to complaints from users, and the number of man-hours required for rework cannot be ignored, so this countermeasure is necessary. requested.
従来のICパッケージ等に型式等を捺印する方法として
は、(a)オフセット・ロール方式、(b)凸版(活字
)方式、(C)オフセット平面方式、(d)オフセット
・パッド方式等が用いられている。Conventional methods for stamping model numbers on IC packages, etc. include (a) offset roll method, (b) letterpress method, (C) offset plane method, and (d) offset pad method. ing.
第3図(a)はオフセット・ロール方式を示しており、
版胴1はオフセットロール2を介して被捺印物3に捺印
するようになっている。第3図(b)は凸版方式を示し
ており、活字4を有する活字台5を上下させて被捺印物
3に捺印する。第3図(C)はオフセット平面方式を示
しており、版6から平面のパッド7に転写し、このパッ
ド7で被捺印物3に捺印する。第3図(d)はオフセッ
ト・パッド方式を示しており、版6から曲面のパッド8
に転写し、これを被捺印物3に押圧して捺印するように
なっている。Figure 3(a) shows the offset roll method,
The plate cylinder 1 is designed to stamp a stamp onto a material 3 via an offset roll 2. FIG. 3(b) shows a letterpress method, in which a type stand 5 having type characters 4 is moved up and down to imprint on the object 3 to be imprinted. FIG. 3(C) shows an offset plane method, in which the image is transferred from the plate 6 to a plane pad 7, and this pad 7 is used to stamp the object 3 to be stamped. FIG. 3(d) shows the offset pad method, in which the curved pad 8 is moved from the plate 6.
The image is transferred onto the object 3 to be stamped, and the stamp is pressed onto the object 3 to be stamped.
上記従来の捺印方式において、第3図(a)。 FIG. 3(a) shows the conventional sealing method described above.
(c)、 (d)に示した方式は被捺印物へオフセッ
トゴムが面接触するものであり、パッケージ内部の半導
体チップに静電気障害を与えるという問題がある。また
第3図(b)に示す凸版方式は大パッケージへの対応上
、活字面の平面出しが難がしく、パッケージ捺印面と活
字面の平行度が出ていないと活字が片当りして捺印が不
良になる。また、活字様式に比較的左右され、活字の接
触面積が一定せず、安定した捺印が困難である。また活
字から被捺印面へのインク転移のコントロールに難がし
い点があり、文字の線の中央がインクの移りが悪く中抜
けする等の問題がある。In the methods shown in (c) and (d), the offset rubber is in surface contact with the object to be printed, and there is a problem in that it causes electrostatic damage to the semiconductor chip inside the package. In addition, in the letterpress method shown in Figure 3(b), in order to accommodate large packages, it is difficult to make the type surface flat, and if the package printing surface and the type surface are not parallel, the type will hit unevenly and the stamp will be printed. becomes defective. In addition, it is relatively dependent on the printing style, and the contact area of the printing characters is not constant, making stable imprinting difficult. In addition, it is difficult to control the transfer of ink from the printed characters to the surface to be printed, and there are problems such as poor ink transfer in the center of the character line, resulting in hollow spots.
本発明は上記従来の問題点に鑑み、捺印品質の向上を可
能とした自動捺印装置を提供することを目的とする。SUMMARY OF THE INVENTION In view of the above-mentioned conventional problems, it is an object of the present invention to provide an automatic stamping device that can improve the quality of stamping.
上記目的を達成するために本発明の捺印装置では、自動
捺印機において、同一被捺印物10に対して複数回の捺
印を可能とする捺印機構i13と、捺印結果の良否を検
査する捺印検査機構部16と、該捺印検査機構部16の
判定結果のフィードバックにより同一被捺印物10への
捺印回数を制御する制御部17とを具備して成ることを
特徴とする。In order to achieve the above object, the stamping device of the present invention includes a stamping mechanism i13 that enables multiple stamping on the same stamped object 10, and a stamping inspection mechanism that inspects the quality of the stamping result. 16, and a control section 17 that controls the number of times of stamping on the same object to be stamped 10 based on feedback of the determination result of the stamp inspection mechanism section 16.
捺印検査機構部16により捺印結果を検査し、不良と判
定された被捺印物10には、再度捺印を行なうことによ
り良品率を向上することができる。The stamping result is inspected by the stamping inspection mechanism section 16, and the stamping object 10 determined to be defective is stamped again, thereby improving the quality of products.
第1図は本発明の実施例を示す図である。 FIG. 1 is a diagram showing an embodiment of the present invention.
同図において、10は被捺印物(例えばICパッケージ
)、11は搬送装置であり、該搬送装置11はパルスモ
ータ等の駆動装置12で駆動され、被捺印物10を矢印
六方向から断続して搬送するようになっており、正・逆
転が可能である。また13は捺印機構部であり、該捺印
機構部13は搬送装置11の途中に設けられ、該搬送装
置で送られ、該捺印機構部13の真下で停止した被捺印
物10に、活字14を有する活字台15を上下に作動し
て型式、社名、製造ロット番号等を捺印する。また16
は捺印検査機構部であり、該捺印検査機構部16は前記
捺印機構部13と並んで配置され、画像認識装置を内蔵
して被捺印物10に捺印された捺印18の良否を判定す
る。In the figure, 10 is an object to be imprinted (for example, an IC package), and 11 is a conveyance device.The conveyance device 11 is driven by a drive device 12 such as a pulse motor, and the object to be imprinted 10 is moved intermittently from six directions of arrows. It is designed to be transported and can be moved forward or backward. Reference numeral 13 denotes a stamping mechanism section, and the stamping mechanism section 13 is provided in the middle of the conveying device 11, and type letters 14 are placed on the object 10 to be stamped, which is sent by the conveying device and stopped right below the stamping mechanism section 13. The model, company name, manufacturing lot number, etc. are stamped by moving the type stand 15 up and down. 16 again
1 is a seal inspection mechanism section, and the seal inspection mechanism section 16 is disposed in parallel with the stamp mechanism section 13, and has an image recognition device built therein to determine the quality of the stamp 18 stamped on the object 10 to be stamped.
また17は制御部であり、該制御部17は、搬送装置の
駆動モータ12、捺印機構部13、及び捺印検査機構部
16に接続している。Further, 17 is a control section, and the control section 17 is connected to the drive motor 12 of the conveyance device, the stamp mechanism section 13, and the stamp inspection mechanism section 16.
このように構成された本実施例の動作を第2図に示すフ
ローチャート及び第1図により説明する。The operation of this embodiment configured in this way will be explained with reference to the flowchart shown in FIG. 2 and FIG. 1.
先ず■捺印開始指示により制御部17は駆動装置12に
より搬送装置11を駆動させ被捺印物10を捺印機構部
13に搬送する。■捺印機構部13は、その直下に来た
被捺印物10に捺印する。次いで捺印された被捺印物1
0は■捺印検査機構部16に送られ、ここで捺印18の
良否を検査される。■この検査で良と判定されたものは
■インクを加熱キュアされ0次工程に送られる。■で不
良と判定されたものがある場合は制御部17は駆動装置
12を逆転させ搬送装置11上の不良品を捺印機構部1
3の直下に戻し、再度捺印するように指示する。■同時
に捺印回数をカウントする。捺印機構部13で再度捺印
された被捺印物10は再度捺印検査機構部16で検査さ
れる。First, in response to an instruction to start stamping, the control section 17 causes the drive device 12 to drive the conveying device 11 to convey the object to be stamped 10 to the stamping mechanism section 13 . (2) The stamping mechanism section 13 stamps the stamped object 10 that comes directly below it. Next, the stamped object 1
0 is sent to the stamp inspection mechanism section 16, where the quality of the stamp 18 is inspected. ■If the ink is judged to be good in this inspection, ■the ink is heated and cured and sent to the 0th stage process. If any item is determined to be defective in step (3), the control unit 17 reverses the driving device 12 and transfers the defective item on the conveyor 11 to the marking mechanism unit 1.
Instruct them to put it back directly under 3 and stamp it again. ■Count the number of stamps at the same time. The stamped object 10 that has been stamped again by the stamping mechanism section 13 is inspected again by the stamp inspection mechanism section 16.
この場合も良品はキニアを経て次工程へ送られるが、不
良品は再度捺印・検査が繰返される。繰返し数は予め指
定しておき、所定の繰返し数nを繰返しても良品となら
ないものは■保留とする。このように不良品は繰返し捺
印されることによりインク転移の悪い被捺印物にも鮮明
な捺印ができる。In this case as well, good products are sent to the next process via Kinnear, but defective products are stamped and inspected again. The number of repetitions is specified in advance, and if the product does not turn out to be a good product even after repeating the predetermined number of repetitions n, it is put on hold. In this way, by repeatedly marking defective products, clear markings can be made even on objects with poor ink transfer.
また捺印障害(不良)である切れ字、かすれなども正常
に戻すことができる。さらに被捺印物であるパッケージ
材とインクの相性の悪いような場合でも対応が可能とな
り、量産化を円滑にすることができる。In addition, printing defects (defects) such as cut-off characters and blurred characters can be restored to normal. Furthermore, it is possible to deal with cases where the ink is not compatible with the packaging material that is to be printed, and mass production can be facilitated.
以上説明した様に、本発明によれば、捺印不良のものを
自動的に繰返し捺印することにより印字品質を向上し不
良率を低減することが可能となる。As explained above, according to the present invention, it is possible to improve the print quality and reduce the defective rate by automatically repeatedly printing defective markings.
第1図は本発明の実施例を示す図、
第2図は本発明の実施例の動作フローチャート図、
第3図は従来のICパッケージ等への捺印に用いられる
捺印方式を示す図である。
図において、
10は被捺印物、
11は搬送装置、
12は駆動装置、
13は捺印機構部、
14は活字、
15は活字台、
16は捺印検査機構部、
17は制御部、
18は捺印
を示す。FIG. 1 is a diagram showing an embodiment of the present invention, FIG. 2 is an operational flowchart of the embodiment of the present invention, and FIG. 3 is a diagram showing a conventional marking method used for stamping on IC packages and the like. In the figure, 10 is an object to be stamped, 11 is a transport device, 12 is a drive device, 13 is a stamping mechanism section, 14 is a type, 15 is a type stand, 16 is a stamp inspection mechanism section, 17 is a control section, and 18 is a stamping section. show.
Claims (1)
る捺印機構部(13)と、捺印結果の良否を検査する捺
印検査機構部(16)と、該捺印検査機構部(16)の
判定結果のフィードバックにより同一被捺印物(10)
への捺印回数を制御する制御部(17)とを具備して成
ることを特徴とする捺印装置。[Claims] 1. In an automatic stamping machine, a stamping mechanism section (13) that enables multiple stamping on the same stamped object (10), and a stamping inspection mechanism section that inspects the quality of the stamping results. (16) and the same stamped object (10) by feedback of the judgment result of the stamp inspection mechanism section (16).
A stamping device comprising: a control section (17) for controlling the number of times stamping is performed on the stamping device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2967590A JPH03235352A (en) | 1990-02-13 | 1990-02-13 | Imprinting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2967590A JPH03235352A (en) | 1990-02-13 | 1990-02-13 | Imprinting device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03235352A true JPH03235352A (en) | 1991-10-21 |
Family
ID=12282689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2967590A Pending JPH03235352A (en) | 1990-02-13 | 1990-02-13 | Imprinting device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03235352A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0736901A1 (en) * | 1995-04-05 | 1996-10-09 | Texas Instruments Incorporated | Multiple colour marking of integrated circuit packages |
-
1990
- 1990-02-13 JP JP2967590A patent/JPH03235352A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0736901A1 (en) * | 1995-04-05 | 1996-10-09 | Texas Instruments Incorporated | Multiple colour marking of integrated circuit packages |
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