JPH0321788U - - Google Patents

Info

Publication number
JPH0321788U
JPH0321788U JP8165089U JP8165089U JPH0321788U JP H0321788 U JPH0321788 U JP H0321788U JP 8165089 U JP8165089 U JP 8165089U JP 8165089 U JP8165089 U JP 8165089U JP H0321788 U JPH0321788 U JP H0321788U
Authority
JP
Japan
Prior art keywords
test
side inclined
inclined chute
positioning
removal means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8165089U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0740226Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8165089U priority Critical patent/JPH0740226Y2/ja
Publication of JPH0321788U publication Critical patent/JPH0321788U/ja
Application granted granted Critical
Publication of JPH0740226Y2 publication Critical patent/JPH0740226Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP8165089U 1989-07-13 1989-07-13 アナログｉｃの試験測定装置 Expired - Lifetime JPH0740226Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8165089U JPH0740226Y2 (ja) 1989-07-13 1989-07-13 アナログｉｃの試験測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8165089U JPH0740226Y2 (ja) 1989-07-13 1989-07-13 アナログｉｃの試験測定装置

Publications (2)

Publication Number Publication Date
JPH0321788U true JPH0321788U (enrdf_load_stackoverflow) 1991-03-05
JPH0740226Y2 JPH0740226Y2 (ja) 1995-09-13

Family

ID=31627775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8165089U Expired - Lifetime JPH0740226Y2 (ja) 1989-07-13 1989-07-13 アナログｉｃの試験測定装置

Country Status (1)

Country Link
JP (1) JPH0740226Y2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102540038A (zh) * 2010-12-27 2012-07-04 苏州晶能科技有限公司 一种全自动led光源模块的分选测试设备及其分选测试方法

Also Published As

Publication number Publication date
JPH0740226Y2 (ja) 1995-09-13

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