JPH03195938A - Optical equipment alignment measuring apparatus - Google Patents
Optical equipment alignment measuring apparatusInfo
- Publication number
- JPH03195938A JPH03195938A JP1337473A JP33747389A JPH03195938A JP H03195938 A JPH03195938 A JP H03195938A JP 1337473 A JP1337473 A JP 1337473A JP 33747389 A JP33747389 A JP 33747389A JP H03195938 A JPH03195938 A JP H03195938A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- alignment
- optical equipment
- room temperature
- low temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 29
- 239000004065 semiconductor Substances 0.000 claims abstract description 10
- 102100027340 Slit homolog 2 protein Human genes 0.000 abstract description 4
- 101710133576 Slit homolog 2 protein Proteins 0.000 abstract description 4
- 238000005259 measurement Methods 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は人工衛星搭載用光学機器の室温時と低温時の変
化を地上において計測し、光学機器のアライメント調整
を行うための光学機器アライメント計測装置に関する。[Detailed Description of the Invention] [Field of Industrial Application] The present invention is an optical equipment alignment measurement method for measuring changes in the room temperature and low temperature of optical equipment mounted on an artificial satellite on the ground and adjusting the alignment of the optical equipment. Regarding equipment.
従来、この種の光学機器アライメント計測装置は、室温
環境で光学機器のアライメントを調整し、その後低温用
アライメント検出器を取り付けて、スペースチャンバー
内で低温環境での光学機器のアライメント調整を行なっ
ていた。Conventionally, this type of optical instrument alignment measurement device adjusted the alignment of the optical instrument in a room temperature environment, then attached a low temperature alignment detector and adjusted the alignment of the optical instrument in the low temperature environment in a space chamber. .
上述した従来の光学機器アライメト計測装置は、室温環
境と低温環境で光学機器のコンフィギユレーションを変
えるために、温度変化に供なう光学機器アライメント変
動量を正確に測定することが困難となる欠点がある。The conventional optical instrument alignment measuring device described above changes the configuration of the optical instrument between room temperature and low temperature environments, making it difficult to accurately measure the amount of variation in optical instrument alignment due to temperature changes. There are drawbacks.
本発明の光学機器アライメント計測装置は、人工衛星に
搭載される光学機器の室温から低温時におけるアライメ
ント調整を行うための光学機器アライメント計測１装置
において、室温から低温度まで作動する赤外半導体検出
器を前記光学機器に取り付けて、所定の温度変化と気圧
変化を与えるテスト槽内における前記光学機器の温度変
動によるアライメント変化量を測定する。The optical equipment alignment measuring device of the present invention is an optical equipment alignment measuring device for performing alignment adjustment between room temperature and low temperature of optical equipment mounted on an artificial satellite, and includes an infrared semiconductor detector that operates from room temperature to low temperature. is attached to the optical equipment, and the amount of alignment change due to temperature fluctuations of the optical equipment in a test tank in which predetermined temperature and pressure changes are applied is measured.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第１図は本発明の一実施例の構成図である。第１図の実
施例は、光学機器に対して光を照射する光源１、光軸を
設定するスリット２、赤外半導体検出器３、人工衛星本
体内の光検出装置である光学機器４、赤外半導体検出器
３の計測器５、温度可変装置、真空排気弁７から構成さ
れる。本実施例の動作は室温から低温度領域で作動可能
な赤外半導体検出器３を光学機器４に固定し、温度可変
装置６の内部を排気弁７を通して真空に排気した後、排
気弁７を閉じる。この状態で、第１段階として温度可変
装置６により室温環境温度に設定し、光源１からの光を
スリット２を通して赤外半導体検出器３で受光し、室温
時のアライメントを測定する０次いで温度可変装置６に
より低温環境を作り、同様な測定を行なう、この室温と
低温時におけるアライメントの変動量が計測器４により
第２図の特性図に示すように、△ｊで評価できる。FIG. 1 is a block diagram of an embodiment of the present invention. The embodiment shown in FIG. 1 includes a light source 1 that irradiates light to an optical device, a slit 2 that sets an optical axis, an infrared semiconductor detector 3, an optical device 4 that is a light detection device inside the satellite body, and a slit 2 that sets an optical axis. It consists of a measuring device 5 of an external semiconductor detector 3, a temperature variable device, and a vacuum exhaust valve 7. The operation of this embodiment is to fix an infrared semiconductor detector 3 that can operate in a temperature range from room temperature to a low temperature range to an optical device 4, evacuate the inside of the temperature variable device 6 to a vacuum through an exhaust valve 7, and then close the exhaust valve 7. close. In this state, as a first step, the room temperature is set by the temperature variable device 6, and the light from the light source 1 is received by the infrared semiconductor detector 3 through the slit 2, and the alignment at room temperature is measured. A low-temperature environment is created by the device 6, and similar measurements are made.The amount of variation in alignment between the room temperature and the low temperature can be evaluated by the measuring device 4 as Δj, as shown in the characteristic diagram of FIG.
〔発明の効果〕
以上説明したように、本発明は室温がら低温度領域で作
動する赤外半導体検出器を用いることにより、室温環境
及び低温環境において光学機器のコンフィギユレーショ
ンを変化させることなく、アライメントの温度ヒステリ
シスが測定できる効果がある。[Effects of the Invention] As explained above, the present invention uses an infrared semiconductor detector that operates in the room temperature to low temperature range, so that the configuration of the optical equipment can be used in room temperature and low temperature environments without changing the configuration. , which has the effect of measuring alignment temperature hysteresis.
第１図は本発明の一実施例の構成図、第２図は本実施例
を適用して計測した特性図である。
１・・・光源、２・・・スリット、３・・・赤外半導体
検出器、４・・・光学機器、５・・・計測器、６・・・
温度可変装置７・・・真空排気弁。FIG. 1 is a configuration diagram of an embodiment of the present invention, and FIG. 2 is a characteristic diagram measured by applying this embodiment. DESCRIPTION OF SYMBOLS 1... Light source, 2... Slit, 3... Infrared semiconductor detector, 4... Optical instrument, 5... Measuring instrument, 6...
Temperature variable device 7...vacuum exhaust valve.
Claims (1)
るアライメント調整を行うための光学機器アライメント
計測装置において、室温から低温度まで作動する赤外半
導体検出器を前記光学機器に取り付けて、所定の温度変
化と気圧変化を与えるテスト槽内における前記光学機器
の温度変動によるアライメント変化量を測定することを
特徴とする光学機器アライメント計測装置。In an optical equipment alignment measuring device for performing alignment adjustment of optical equipment mounted on an artificial satellite at room temperature to low temperature, an infrared semiconductor detector that operates from room temperature to low temperature is attached to the optical equipment to adjust the alignment at a predetermined temperature. An optical equipment alignment measuring device characterized by measuring the amount of alignment change due to temperature fluctuation of the optical equipment in a test tank which gives a change in temperature and a change in air pressure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1337473A JPH03195938A (en) | 1989-12-25 | 1989-12-25 | Optical equipment alignment measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1337473A JPH03195938A (en) | 1989-12-25 | 1989-12-25 | Optical equipment alignment measuring apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03195938A true JPH03195938A (en) | 1991-08-27 |
Family
ID=18308975
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1337473A Pending JPH03195938A (en) | 1989-12-25 | 1989-12-25 | Optical equipment alignment measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03195938A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105241632A (en) * | 2015-08-24 | 2016-01-13 | 马瑞利汽车零部件(芜湖)有限公司 | Bulb assembly and burning detection device of car lights |
| RU185059U1 (en) * | 2018-07-16 | 2018-11-19 | Акционерное общество "Научно-производственное объединение "Государственный институт прикладной оптики" (АО "НПО ГИПО") | STAND OF MEASUREMENT OF PARAMETERS OF HEAT AND VISION CHANNELS |
-
1989
- 1989-12-25 JP JP1337473A patent/JPH03195938A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105241632A (en) * | 2015-08-24 | 2016-01-13 | 马瑞利汽车零部件(芜湖)有限公司 | Bulb assembly and burning detection device of car lights |
| RU185059U1 (en) * | 2018-07-16 | 2018-11-19 | Акционерное общество "Научно-производственное объединение "Государственный институт прикладной оптики" (АО "НПО ГИПО") | STAND OF MEASUREMENT OF PARAMETERS OF HEAT AND VISION CHANNELS |
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