JPH03188349A - Fluorescent x-ray analyzer - Google Patents

Fluorescent x-ray analyzer

Info

Publication number
JPH03188349A
JPH03188349A JP1328690A JP32869089A JPH03188349A JP H03188349 A JPH03188349 A JP H03188349A JP 1328690 A JP1328690 A JP 1328690A JP 32869089 A JP32869089 A JP 32869089A JP H03188349 A JPH03188349 A JP H03188349A
Authority
JP
Japan
Prior art keywords
sample
turntable
vacuum chamber
main body
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1328690A
Other languages
Japanese (ja)
Other versions
JPH067094B2 (en
Inventor
Yoshio Inoue
井上 良男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1328690A priority Critical patent/JPH067094B2/en
Publication of JPH03188349A publication Critical patent/JPH03188349A/en
Publication of JPH067094B2 publication Critical patent/JPH067094B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to preform efficient analysis by constituting an analyzer with the main body case of the analyzer, a vacuum chamber for projecting X rays, a sample inserting hole, a turntable, a receiving stage which is also used for sealing the sample inserting hole and a lift mechanism. CONSTITUTION:A sample 12 is loaded in a recess part 11 of a turntable 5 which is exposed from a main body case 1 of an analyzer. The sample 12 is brought into the main body case of the analyzer by rotating the turntable 5. The sample 12 which has reached the specified taking-out position is lifted up with a lift mechanism 14. The sample is loaded into a sample inserting hole 6 of a vacuum chamber 4. At the same time, the sample inserting hole 6 is sealed with a receiving stage 15. The inside of the vacuum chamber 4 is evacuated, and X rays are applied. The sample 12 whose analysis is completed is returned to the turntable 5 again. A new sample is sent into the taking-out position by one-pitch turn of the turntable 5. The sample loading and the X-ray projection are performed by the same procedure.

Description

【発明の詳細な説明】 (産業上の利用分野) この発明は、試料にX線を照射し、これにより励起され
て試料から放出される蛍光X線を分光分析する蛍光X線
分析装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to a fluorescent X-ray analyzer that irradiates a sample with X-rays and spectrally analyzes fluorescent X-rays excited by the X-rays and emitted from the sample.

(従来の技術) 一般に、蛍光X線分析装置は、多種の試料の元素をオン
ラインで分析するために使用されることがある。このよ
うな多くの試料を効率良く分析するために、従来のもの
では、装置本体の外部に露出して配設したターンテーブ
ルに多数の試料を装填し、このターンテーブルの所定位
相の試料をスイングアームによって装置本体内に取り込
んで内装したX線照射用の真空室に搬入装填する型式の
ものや、装置本体内に設けた真空チェンバ内にターンテ
ーブルを配備し、真空チェンバ内でターンテーブル上の
所定位置の試料をそれぞれX線照射部位まで持ち上げる
型式のものが提供されている。
(Prior Art) In general, an X-ray fluorescence analyzer is sometimes used to analyze elements of various types of samples online. In order to efficiently analyze such a large number of samples, conventional methods load a large number of samples onto a turntable exposed outside the device body, and swing the samples at a predetermined phase of the turntable. There are models that are carried into the equipment body by an arm and loaded into the internal vacuum chamber for X-ray irradiation, and there are also models that have a turntable installed in the vacuum chamber installed inside the equipment body, and are loaded onto the turntable inside the vacuum chamber. A type is provided in which each sample at a predetermined position is lifted to the X-ray irradiation site.

(発明が解決しようとする課題) しかしながら、前者のスイングアーム搬送型式のものは
、装置本体内の真空室内に1個の試料だけを装填するの
で、真空室内の容積を小さくでき、したがって所定の真
空度に達するまで短時間で真空排気できる利点があるも
のの、試料搬入搬出用のスイングアーム機構自体が複雑
で、大きな作動用スペースを要して大型化する。しかも
、試料搬送距離が長いために搬送に時間がかかっていた
(Problem to be Solved by the Invention) However, in the former swing arm transport type, only one sample is loaded into the vacuum chamber within the apparatus main body, so the volume of the vacuum chamber can be reduced, and therefore a predetermined vacuum can be achieved. Although it has the advantage of being able to evacuate in a short period of time until reaching the desired temperature, the swing arm mechanism itself for loading and unloading the sample is complex, requires a large operating space, and is large in size. Moreover, since the sample has to be transported over a long distance, it takes time to transport the sample.

また、搬送時間の短縮のためにスイング速度を大きくす
ると、スイング中に試料が脱落するので、搬送速度を大
きくすることは自ずから制限があった。
Furthermore, if the swing speed is increased to shorten the transport time, the sample will fall off during the swing, so there is a natural limit to increasing the transport speed.

また、後者の真空チェンバ内にターンテーブルを設置し
た型式のものは、試料搬入搬出時の上記不具合はないも
のの、真空チェンバが大型であるために、所要の真空度
に達っするまでの真空排気時間が長くなり、また、ター
ンテーブルの所定試料装填数に満たない少数の試料分析
時にも真空チェンバ全体の排気を行わねばならないので
無駄が多く、また、−旦排気してしまうと途中で試料の
追加が容易に出来ない等の不具合があった。
In addition, although the latter model with a turntable installed inside the vacuum chamber does not have the above-mentioned problems when loading and unloading the sample, the vacuum chamber is large and requires evacuation until the required degree of vacuum is reached. In addition, even when analyzing a small number of samples that are less than the predetermined number of samples loaded on the turntable, the entire vacuum chamber must be evacuated, which is wasteful. There were some problems such as not being able to add files easily.

本発明は、従来型式に見られた上記不具合を解消し、試
料数に関係なく能率的な分析を行うことができる蛍光X
線分析装置を提供することを目的とする。
The present invention solves the above-mentioned problems found in the conventional type, and enables efficient analysis regardless of the number of samples.
The purpose is to provide a line analysis device.

(課題を解決するための手段) 本発明は、上記目的を達成するため、次の構成を採る。(Means for solving problems) In order to achieve the above object, the present invention adopts the following configuration.

すなわち、本発明の蛍光X線分析装置では、装置本体ケ
ース内に設置したX線照射用の真空室を備え、この真空
室の下面には試料挿入孔が形成され、また、前記真空室
の下方にはターンテーブルが回転可能に設けられ、この
ターンテーブルの外周縁部に所定のピッチで試料挿入孔
が形成され、このターンテーブルの下側には、このター
ンテーブルよりも大径の固定円形テーブルが該ターンテ
ーブルと同心に設けられ、この固定円形テーブルの前記
鉛直軸との交点位置には前記試料挿入孔の大きさに略合
致する大きさの円形孔が形成される一方、前記円形孔の
直下には、前記円形孔よりも小径で前記試料挿入孔の封
止を兼ねる受台を備えたリフト機構が前記鉛直軸の軸方
向に沿って上下動可能に設けられている構成とした。
That is, the fluorescent X-ray analyzer of the present invention includes a vacuum chamber for X-ray irradiation installed in the device main body case, a sample insertion hole is formed in the lower surface of the vacuum chamber, and a sample insertion hole is formed in the lower surface of the vacuum chamber. is equipped with a rotatable turntable, sample insertion holes are formed at a predetermined pitch on the outer periphery of the turntable, and a fixed circular table with a larger diameter than the turntable is installed below the turntable. is provided concentrically with the turntable, and a circular hole having a size that approximately matches the size of the sample insertion hole is formed at the intersection of the fixed circular table with the vertical axis. Directly below, a lift mechanism including a pedestal having a diameter smaller than the circular hole and also serving as a seal for the sample insertion hole was provided so as to be movable up and down along the axial direction of the vertical axis.

(作用) 上記構成によると、装置本体ケースから外部に露出した
ターンテーブルの凹部に試料を装填して、ターンテーブ
ルの回転によって試料を装置本体ケース内に持ち込み、
所定の取り出し部位に至った試料をリフト機構によって
持ち上げて真空室の試料挿入孔に装填するとともに、試
料挿入孔を受台で封止し、真空室を排気した後、X線照
射を行う。
(Function) According to the above configuration, the sample is loaded into the recess of the turntable exposed to the outside from the device main body case, and the sample is brought into the device main body case by rotation of the turntable.
The sample that has reached a predetermined extraction site is lifted by a lift mechanism and loaded into the sample insertion hole of the vacuum chamber, the sample insertion hole is sealed with a pedestal, the vacuum chamber is evacuated, and then X-ray irradiation is performed.

分析の完了した試料は再びターンテーブルに戻し、ター
ンテーブルの1ピッチ回転によって新しい試料を取り出
し部位に送り込み、同様な手順で試料装填およびX線照
射を行う。
The analyzed sample is returned to the turntable, and a new sample is sent to the extraction site by one pitch rotation of the turntable, and sample loading and X-ray irradiation are performed in the same manner.

このような操作をターンテーブルの定ピツチ回転ごとに
行って試料を1個ずつ分析してターンテーブルに回収し
、再び装置本体外にまで送り出された試料はターンテー
ブルより取り出し、必要に応じて新しい試料を供給する
This operation is performed every time the turntable rotates at a fixed pitch, and the samples are analyzed one by one and collected on the turntable.The samples that have been sent out of the device body are taken out from the turntable and replaced with new ones as necessary. Supply the sample.

(実施例) 第1図に本発明に係る蛍光X線分析装置の実施例の縦断
面図である。
(Example) FIG. 1 is a longitudinal sectional view of an example of the fluorescent X-ray analyzer according to the present invention.

この実施例の蛍光X線分析装置は、箱状に構成された装
置本体ケースlの上半部内に、X線管2、分光器3など
の分析用機器を備えた真空室4が設けられ、この真空室
4の中央下部には上下に貫通する試料挿入孔6が形成さ
れるとともに、この試料挿入孔6と真空室4との間には
、両者間を連通および遮断するシャッター7が設けられ
ている。
The fluorescent X-ray analyzer of this embodiment is provided with a vacuum chamber 4 equipped with analysis equipment such as an X-ray tube 2 and a spectrometer 3 in the upper half of the device main body case L, which has a box-like structure. A sample insertion hole 6 that penetrates vertically is formed in the lower center of the vacuum chamber 4, and a shutter 7 is provided between the sample insertion hole 6 and the vacuum chamber 4 to communicate with and block the two. ing.

また、試料挿入孔6の下端部は、下拡がりテーパー状に
開口され、その内面に密封用の0リング8が装着されて
いる。
The lower end of the sample insertion hole 6 is opened in a tapered shape that widens downward, and a sealing O-ring 8 is attached to the inner surface of the opening.

一方、装置本体ケース1の下半部には試料搬入搬出用の
ターンテーブル5が縦軸心Pを中心に回転可能に設けら
れている。このターンテーブル5は、その略半分が試料
挿入孔6を上下に通る鉛直軸と交差する位置まで装置本
体ケース1内に入り込んでおり、ターンテーブル5の他
の略半部は装置本体ケース1の外側に露出するように配
置されている。また、このターンテーブル5の下側には
、このターンテーブル5よりも大径の固定円形テーブル
9が設けられ、この固定円形テーブル9が装置本体ケー
ス1の下半部に固定されている。さらに、固定円形テー
ブル9の下部にはステッピングモータ10が取り付けら
れ、このステッピングモータ10の回転軸が縦軸心Pと
同心に配置されるとともに、固定円形テーブル9を貫通
してターンテーブル5に固定されている。ターンテーブ
ル5の外周縁部には略半円形に形成された試料搬送用の
凹部11が周方向に沿って一部ピッチで形成されている
。そして、この凹部11に短円柱形状の試料12を装填
することにより固定円形テーブル9上に載置される。ま
た、固定円形テーブル9の前記真空室4の試料挿入孔6
を上下に通る鉛直軸と交差する位置には、該位置を中心
として前記凹部11の曲単に合致する大きさの円形孔1
3が形成されている。
On the other hand, in the lower half of the apparatus main body case 1, a turntable 5 for loading and unloading the sample is provided so as to be rotatable about the vertical axis P. Approximately half of this turntable 5 is inserted into the apparatus main body case 1 to a position where it intersects the vertical axis passing vertically through the sample insertion hole 6, and the other approximately half of the turntable 5 is inside the apparatus main body case 1. It is placed so that it is exposed to the outside. Further, a fixed circular table 9 having a larger diameter than the turntable 5 is provided below the turntable 5, and the fixed circular table 9 is fixed to the lower half of the device main body case 1. Further, a stepping motor 10 is attached to the lower part of the fixed circular table 9, and the rotating shaft of this stepping motor 10 is arranged concentrically with the vertical axis P, and is fixed to the turntable 5 through the fixed circular table 9. has been done. At the outer peripheral edge of the turntable 5, approximately semicircular recesses 11 for transporting the sample are formed at partial pitches along the circumferential direction. A short cylindrical sample 12 is loaded into the recess 11 and placed on the fixed circular table 9. Further, the sample insertion hole 6 of the vacuum chamber 4 of the fixed circular table 9
A circular hole 1 having a size that matches the curve of the recess 11 with the center at the position intersecting the vertical axis passing vertically.
3 is formed.

この円形孔13の下方に試料持ち上げ用のリフト機構1
4が設けられている。リフト機構14は、前記円形孔1
3よりも小径でかつ円形孔13と同心に配置されたた円
盤状の受台15と、これを支持するラック軸16と、こ
のラック軸16を昇降駆動するモータ17とからなる。
A lift mechanism 1 for lifting the sample is provided below this circular hole 13.
4 are provided. The lift mechanism 14 includes the circular hole 1
It consists of a disc-shaped pedestal 15 having a diameter smaller than that of 3 and arranged concentrically with the circular hole 13, a rack shaft 16 that supports the pedestal 15, and a motor 17 that drives the rack shaft 16 up and down.

なお、22はラック軸I6の下端に設けた検知片、23
.24は上下−組みのフォトインクラブタであり、フォ
トインタラプタ23.24が検知片22を検知すること
により、受台15の昇降ストロークが制御される。
In addition, 22 is a detection piece provided at the lower end of the rack shaft I6, and 23
.. Reference numeral 24 designates an upper and lower pair of photointerrupters, and the vertical stroke of the pedestal 15 is controlled by the photointerrupters 23 and 24 detecting the detection piece 22.

次に、上記構成を有する蛍光X線分析装置における試料
12の充填操作の動作を説明する。
Next, the operation of filling the sample 12 in the X-ray fluorescence analyzer having the above configuration will be described.

分析に際しては、装置本体ケースlの外部に露出したタ
ーンテーブル5の凹部11を介して固定円形テーブル9
上に試料12を載置しつつ、ステッピングモータIOに
よりターンテーブル5を1ピツチずつ回転させて、試料
12を装置本体ケース1内に送り込んでいく。
During analysis, the fixed circular table 9 is inserted through the recess 11 of the turntable 5 exposed outside the device main body case l.
With the sample 12 placed on top, the turntable 5 is rotated one pitch at a time by the stepping motor IO, and the sample 12 is fed into the apparatus main body case 1.

所要の試料I2が円形孔13内で待機していた受台15
上に乗りかかると、モータ17が起動されてラック軸1
6が回転し、これによって受台15が円形孔13を通っ
て上昇する。これに伴なって試料I2が試料挿入孔6に
挿入されるとともに、受台15の拡がり状のテーパー外
周面が試料挿入孔6のテーパー開口に押し付けられるた
め、この受台15によって試料挿入孔6がOリング8を
介して下方から密封される。その際、シャッター7は閉
じている。
The pedestal 15 where the required sample I2 was waiting inside the circular hole 13
When you sit on the top, the motor 17 is started and the rack shaft 1
6 rotates, which causes the pedestal 15 to rise through the circular hole 13. Along with this, the sample I2 is inserted into the sample insertion hole 6, and the expanding tapered outer peripheral surface of the pedestal 15 is pressed against the tapered opening of the sample insertion hole 6. is sealed from below via an O-ring 8. At this time, the shutter 7 is closed.

シャッター7よりも上部は、前回の操作で既に真空のま
まに保持しているので、試料挿入孔6内の空気を図示省
略した真空ポンプで排気して、内部を真空状態にした後
、シャッター7を開き、X線管2からX線を照射して、
試料12から出た放出された蛍光X線を分光器3に導い
て分光する。
The area above the shutter 7 has already been kept in a vacuum state in the previous operation, so the air inside the sample insertion hole 6 is evacuated using a vacuum pump (not shown) to create a vacuum inside the shutter 7. Open it, irradiate X-rays from X-ray tube 2,
Fluorescent X-rays emitted from the sample 12 are guided to a spectrometer 3 for spectroscopy.

分析が完了すると、シャッター7を閉じて真空室4内と
試料挿入孔6との連通を断ち、試料挿入孔6をリークし
て大気にもどした後、受台15を元のターンテーブル高
さまで下降する。
When the analysis is completed, the shutter 7 is closed to cut off the communication between the inside of the vacuum chamber 4 and the sample insertion hole 6, and after the sample insertion hole 6 is leaked and returned to the atmosphere, the pedestal 15 is lowered to the original height of the turntable. do.

以上の動作で一つの試料12に対する分析操作が完了す
るので、以後は、ターンテーブル5の1ピツチ回動に伴
って上記操作を順次繰り返す。
The analysis operation for one sample 12 is completed with the above operations, and henceforth, the above operations are sequentially repeated as the turntable 5 rotates one pitch.

なお、上記操作において、分析後にシャッター7を閉じ
て真空室4内の真空を維持しておくことで、次回の分析
に要する時間が短縮化される。
In addition, in the above operation, by closing the shutter 7 after the analysis to maintain the vacuum in the vacuum chamber 4, the time required for the next analysis is shortened.

ところで、試料12の半径は、ターンテーブル5の凹部
11の曲率半径よりも小さいものが用いられるので、タ
ーンテーブル5が回転する際に試料12が凹部11の曲
率中心よりも回転方向4表逆方向に角度θ分だけ偏位し
た状態で送られることになる。したがって、試料12が
固定円形テーブル9に形成された円形孔I3まで送られ
てきて、第3図に示すように、試料12の中心が円形孔
13の中心と一致した時点では、ターンテーブル5の凹
部11の曲率中心は、円形孔I3の中心から所定角θだ
け回転方向にオーバーランしていることになる。このた
め、この状態で受台15が上昇するとターンテーブル5
に当接してその上昇が不能となる。そこで、このターン
テーブル5のオーバーランを次のようにして修正する。
By the way, since the radius of the sample 12 is smaller than the radius of curvature of the recess 11 of the turntable 5, when the turntable 5 rotates, the sample 12 is rotated in the opposite direction than the center of curvature of the recess 11. It will be sent in a state where it is deviated by an angle θ. Therefore, when the sample 12 is sent to the circular hole I3 formed in the fixed circular table 9 and the center of the sample 12 coincides with the center of the circular hole 13 as shown in FIG. The center of curvature of the recess 11 overruns the center of the circular hole I3 by a predetermined angle θ in the rotational direction. Therefore, if the pedestal 15 rises in this state, the turntable 5
It comes into contact with and becomes unable to rise. Therefore, this overrun of the turntable 5 is corrected as follows.

つまり、ターンテーブル5の下面には、各凹部11の曲
率中心と縦軸心Pとを結ぶ線上の内側には試料12の戻
し用割り出しピン18aが、外側に試料12の送り用割
り出しピン18bがそれぞれ下方に向けて突出され、ま
た、凹部11の曲率中心と縦軸心Pとを結ぶ一つの線上
にはターンテーブル5の回転量の基準を決めるための原
点出しピン19が下方に向けて突出されている。一方、
固定円形テーブル9上には、円形孔13の中心と縦軸心
Pとを結ぶ線上の戻し用割り出しピン18aが横切る交
点位置に試料12の戻し検出用のフォトインタラプタ2
0が設けられ、また、円形孔13の中心と縦軸心Pとを
結ぶ線上から所定角θだけ試料送り方向に先行した位置
で、かつ、送り用割り出しピン18bが横切る交点位置
に試料12の送り検出用のフォトインタラプタ21が設
けられており、さらに、円形孔13の中心と縦軸心Pと
を結ぶ線上から所定角θだけ試料送り方向とは逆方向に
戻った位置で、かつ、原点出しピン19が横切る交点位
置に原点検出用のフォトインタラプタ22が設けられて
いる。
That is, on the lower surface of the turntable 5, an index pin 18a for returning the sample 12 is located on the inside on a line connecting the center of curvature of each recess 11 and the vertical axis P, and an index pin 18b for feeding the sample 12 is located on the outside. They each protrude downward, and on a line connecting the center of curvature of the recess 11 and the vertical axis P, an origin pin 19 for determining the reference amount of rotation of the turntable 5 protrudes downward. has been done. on the other hand,
On the fixed circular table 9, there is a photointerrupter 2 for detecting the return of the sample 12 at the intersection of the return indexing pin 18a on the line connecting the center of the circular hole 13 and the vertical axis P.
0 is provided, and the sample 12 is placed at a position ahead in the sample feeding direction by a predetermined angle θ from the line connecting the center of the circular hole 13 and the vertical axis P, and at an intersection point crossed by the feeding index pin 18b. A photointerrupter 21 for detecting feed is provided, and furthermore, a photointerrupter 21 is provided for detecting feed, and further, a photointerrupter 21 is provided at a position that is returned by a predetermined angle θ in the opposite direction to the sample feed direction from the line connecting the center of the circular hole 13 and the vertical axis P, and is located at the origin. A photointerrupter 22 for detecting the origin is provided at the intersection point where the output pins 19 cross.

したがって、送り検出用のフォトインタラプタ21が送
り用割り出しピンtabを検知するまでターンテーブル
5を回転させると、第3図に示すように試料12は受台
15の中心上に送り込まれるが、ターンテーブル5の凹
部11の曲率中心は、円形孔13の中心から所定角θだ
け試料送り方向にオーバーランしている。このため、送
り検出用のフォトインタラプタ21で送り用割り出しピ
ン18bが検知されると、次に、戻し検出用フォトイン
タラプタ20が戻し用割り出しピン18aを検知するま
でターンテーブル5を第3図の状態から反時計回りに逆
転することで第2図に示すように凹部11が円形孔13
に合致するので、リフト機構14における受台15の昇
降が可能となる。
Therefore, when the turntable 5 is rotated until the feed detection photo interrupter 21 detects the feed index pin tab, the sample 12 is fed onto the center of the pedestal 15 as shown in FIG. The center of curvature of the recess 11 of No. 5 overruns the center of the circular hole 13 by a predetermined angle θ in the sample feeding direction. Therefore, when the feed index pin 18b is detected by the feed detection photo interrupter 21, the turntable 5 is kept in the state shown in FIG. 3 until the return detection photo interrupter 20 detects the return index pin 18a. 2, the concave portion 11 becomes the circular hole 13 as shown in FIG.
, the pedestal 15 in the lift mechanism 14 can be raised and lowered.

なお、第4図に示すように、各試料12をそれぞれ皿状
の受台15に載置し、この受台15の半径をターンテー
ブル5の凹部11の曲率半径と一致させておけば、上記
のようにターンテーブル5を逆転修正する必要はなく、
単に定ピッチ送りだけをすればよい。また、この場合、
ターンテーブル5の周部に形成する凹部11は円形孔と
して実施することもできる。
As shown in FIG. 4, if each sample 12 is placed on a dish-shaped pedestal 15 and the radius of this pedestal 15 is matched with the radius of curvature of the recess 11 of the turntable 5, the above There is no need to reversely correct the turntable 5 as in
It is sufficient to simply perform constant pitch feeding. Also, in this case,
The recess 11 formed in the circumference of the turntable 5 can also be implemented as a circular hole.

(発明の効果) 本発明によれば、次の効果が得られる。(Effect of the invention) According to the present invention, the following effects can be obtained.

(1)真空室に試料を1個ずつ供給装填することができ
るので、スイングアーム方式と同様に真空室内の容積が
小さなものでよく、このため、真空室内が所要の真空度
に達するまでの排気に要する時間を短くできる。また、
真空室への試料搬入搬出がターンテーブルを用いた短距
離の係止搬送であるために、搬送途中での試料脱落のお
それがなく、搬送速度を充分大きくすることができ、排
気時間が短いことと相まって、処理サイクルの短い能率
的な分析を行うことができる。
(1) Since samples can be fed and loaded into the vacuum chamber one by one, the volume of the vacuum chamber can be small, similar to the swing arm method. The time required can be shortened. Also,
Since the sample is transported in and out of the vacuum chamber by short-distance locked transport using a turntable, there is no risk of the sample falling off during transport, the transport speed can be sufficiently high, and the evacuation time is short. Combined with this, it is possible to perform efficient analysis with a short processing cycle.

(2)ターンテーブルの一部を装置本体外に露出させで
あるので、試料の取り出しや追加を容易に行なえる。
(2) Since a part of the turntable is exposed outside the main body of the apparatus, it is easy to take out and add samples.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る蛍光X線分析装置の縦断側面図、
第2図はターンテーブル部の平面図、第3図は試料の定
ピッチ送り完了時点の平面図、第4図は変形例の縦断面
図である。 1・・・装置本体、4・・・真空室、5・・・ターンテ
ーブル、6・・・試料挿入孔、9・・・固定円形テーブ
ル、ll・・・凹部、12・・・試料、13・・・円形
孔、14・・・す。 フト機構。
FIG. 1 is a longitudinal side view of the fluorescent X-ray analyzer according to the present invention;
FIG. 2 is a plan view of the turntable section, FIG. 3 is a plan view at the time when feeding of the sample at a fixed pitch is completed, and FIG. 4 is a longitudinal sectional view of a modified example. DESCRIPTION OF SYMBOLS 1... Apparatus main body, 4... Vacuum chamber, 5... Turntable, 6... Sample insertion hole, 9... Fixed circular table, ll... Recessed part, 12... Sample, 13 ...Circular hole, 14... foot mechanism.

Claims (1)

【特許請求の範囲】[Claims] (1)装置本体ケース内に設置したX線照射用の真空室
を備え、この真空室の下面には試料挿入孔が形成され、
また、前記真空室の下方にはターンテーブルが回転可能
に設けられ、このターンテーブルの外周縁部に所定のピ
ッチで試料挿入孔が形成され、このターンテーブルの下
側には、このターンテーブルよりも大径の固定円形テー
ブルが該ターンテーブルと同心に設けられ、この固定円
形テーブルの前記鉛直軸との交点位置には前記試料挿入
孔の大きさに略合致する大きさの円形孔が形成される一
方、 前記円形孔の直下には、前記円形孔よりも小径で前記試
料挿入孔の封止を兼ねる受台を備えたリフト機構が前記
鉛直軸の軸方向に沿って上下動可能に設けられているこ
とを特徴とする蛍光X線分析装置。
(1) A vacuum chamber for X-ray irradiation is installed inside the main body case of the device, and a sample insertion hole is formed on the bottom surface of this vacuum chamber.
Further, a turntable is rotatably provided below the vacuum chamber, and sample insertion holes are formed at a predetermined pitch on the outer peripheral edge of the turntable. A fixed circular table with a large diameter is provided concentrically with the turntable, and a circular hole having a size that approximately matches the size of the sample insertion hole is formed at the intersection of the fixed circular table with the vertical axis. On the other hand, directly below the circular hole, a lift mechanism is provided that is movable up and down along the axial direction of the vertical axis and includes a pedestal that has a smaller diameter than the circular hole and also serves as a seal for the sample insertion hole. A fluorescent X-ray analyzer characterized by:
JP1328690A 1989-12-18 1989-12-18 X-ray fluorescence analyzer Expired - Lifetime JPH067094B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1328690A JPH067094B2 (en) 1989-12-18 1989-12-18 X-ray fluorescence analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1328690A JPH067094B2 (en) 1989-12-18 1989-12-18 X-ray fluorescence analyzer

Publications (2)

Publication Number Publication Date
JPH03188349A true JPH03188349A (en) 1991-08-16
JPH067094B2 JPH067094B2 (en) 1994-01-26

Family

ID=18213082

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1328690A Expired - Lifetime JPH067094B2 (en) 1989-12-18 1989-12-18 X-ray fluorescence analyzer

Country Status (1)

Country Link
JP (1) JPH067094B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007093599A (en) * 2005-09-28 2007-04-12 Fei Co Cluster tool for microscopic processing of sample
WO2020044399A1 (en) * 2018-08-27 2020-03-05 株式会社島津製作所 X-ray analysis device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007093599A (en) * 2005-09-28 2007-04-12 Fei Co Cluster tool for microscopic processing of sample
WO2020044399A1 (en) * 2018-08-27 2020-03-05 株式会社島津製作所 X-ray analysis device
TWI725511B (en) * 2018-08-27 2021-04-21 日商島津製作所股份有限公司 X-ray analysis device
JPWO2020044399A1 (en) * 2018-08-27 2021-08-10 株式会社島津製作所 X-ray analyzer

Also Published As

Publication number Publication date
JPH067094B2 (en) 1994-01-26

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