JPH0318788B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to an electronic switching test system, and more particularly to an electronic switching testing system that efficiently uses a testing electronic switch.

(b) Technical background Electronic exchanges have a variety of functions ranging from switching services to maintenance operations, and operate under complex operating conditions. As is well known, the various functions of an electronic exchange are realized by system files (including station data, etc.) stored in the electronic exchange as a storage program. Therefore, in testing electronic switching equipment, not only the hardware part but also the system file (software) is an important test target, but in order to thoroughly test the functions of such electronic switching equipment, a number of tests are required. It is necessary to set the test procedure and test condition data for each test item in the test electronic exchange and operate the test target function. Therefore, it is essential to efficiently share the electronic exchange for testing in a large number of tests in order to improve the efficiency of testing of such electronic exchanges. In some cases, it may be necessary to repeat a certain test item under the same conditions in order to reproduce a failure phenomenon.

(c) Prior art and problems In the past, this type of test procedure and test condition data for test electronic exchanges were inputted one by one from a typewriter device attached to the test electronic exchanger, so it was difficult to actually perform the test operation. It took a lot of time to get started. In addition, since various data indicating the test results were output to the typewriter device or printer device attached to the test electronic exchange, a considerable amount of time was consumed even after the actual test operation was completed. During that time, the test electronic exchanges could not be used for other test items, so the efficiency of using the test electronic exchanges was extremely low, resulting in a significant loss of test work efficiency. Furthermore, when repeating a specific test item under the same conditions, it is necessary to re-enter all test procedures and test condition data, which not only consumes a great deal of labor, but also requires the ability to faithfully reproduce the same conditions. It was difficult to do so, and the reliability of the test results was compromised.

(d) Purpose of the Invention The purpose of the present invention is to eliminate the drawbacks of the conventional electronic exchange testing system as described above, to improve the efficiency of use of the electronic exchange for testing as much as possible, and to improve the efficiency of testing work and the reliability of test results. The aim is to realize a means to improve the quality of life.

(e) Structure of the Invention The purpose is to input test procedures and test data for testing system files stored in a storage program type electronic exchange, test electronic exchanges in which the system files are stored, and to input test result data. one or more terminal devices for outputting, a storage device for storing the system files, test procedures, test condition data, and test result data; and a storage device for controlling the terminal devices in a time-sharing manner, the system files, test procedures,
a processor for inputting and outputting test condition data and test result data, and for high-speed transfer of the system file, test procedure, test condition data, and test result data between the storage device and a central control device of the test electronic exchange; This can be achieved by having the following.

(f) Embodiment of the invention An embodiment of the invention will be described below with reference to the drawings. The drawing is a diagram illustrating an electronic switching test system according to an embodiment of the present invention. In the figure, network NW, central controller CC, and main memory
The test electronic exchange TEX equipped with MM includes a plurality of terminal devices T, a processor CPU, a storage device MEM, a pseudo terminal device CG, and a high-speed transfer device.
An electronic exchange test system consisting of a TRF and an additional console control unit CSC is installed. The processor CPU controls each terminal device T in a time-sharing manner, and collects test procedure and test condition data related to system files or various test items that are input in parallel from each terminal device T and stored in the test electronic exchange TEX. and stores it in the storage device MEM. In addition, the system file will not be input to the test electronic exchange TEX until all parts of the system file to be stored in the test electronic exchange TEX have been stored in the storage device MEM, and all test procedures and test For test items for which condition data has not been inputted, the test electronic exchange TEX is not required to perform any operation. At the start of the test, the test electronic exchanger
If the TEX has not stored the system file, the processor CPU sends the system file stored in the storage device MEM to the test electronic exchange TEX via the high-speed transfer device TRF, and stores it in the main memory of the test electronic exchange TEX. Store it in the device MM. System file is test electronic exchange TEX
For test items for which all test procedures and test condition data have been input, the processor CPU transfers the data to the central control unit CC of the test electronic exchange TEX via the high-speed transfer device TRF. Transfer test condition data at high speed and
Electronic exchange according to the test procedure entered into the CPU
Controls TEX and starts test operation for the corresponding test item. Note that when the processor CPU receives the same control signal from the additional console CNS, it sends the same control signal to the central controller via the additional console controller CSC.
By inputting data to CC, it is also possible to test the initial program load function, program specific address stop function, flip-flop group control function, etc. provided by the central controller CC as part of the test items. Furthermore, the processor CPU controls the pseudo terminal device CG according to the required test conditions, and applies a pseudo load to the network NW of the test electronic exchange TEX. When the test electronic exchange TEX completes the test operation for the relevant test item, the central controller CC collects various test result data stored in the main memory device MM, etc., and transfers it to the high-speed transfer device.
It is transferred at high speed to the processor CPU via TRF and is freed from the corresponding test item. The processor CPU temporarily stores the received test result data in the storage device MEM, performs necessary analysis, and outputs the results to the terminal device T in charge of the relevant test item. In addition, the processor CPU stores other system files (including station data, etc.) or test procedure and test condition data regarding other test items from the terminal device T in parallel with the test operation for specific test items of the test electronic exchange TEX. Performs input to device MM, analysis of test results, and output to terminal device T. In addition, the system file, test procedure, and test condition data once input can be stored in the storage device MEM, and the same test items can be repeated using the system file, test procedure, and test condition data under the same conditions. It is also possible to faithfully reproduce the test. Furthermore, test items can be easily performed by changing part of the test procedure or test condition data stored in the storage device MEM.

As is clear from the above description, according to this embodiment, the test procedure and test condition data for system files or various test items are input in parallel from the terminal device T controlled by the processor CPU through time sharing, and the entire system After inputting all or all test procedures and test condition data into the test electronic exchange TEX, the file is transferred at high speed to the test electronic exchange TEX, and the test result data is also transferred to the test electronic exchange TEX upon completion of the test. TEX is a test electronic exchange for each test item because it is transferred at high speed from TEX to the processor CPU.
The usage time is greatly reduced as only the actual test operation is performed, and it can efficiently operate in parallel with multiple system files, input of test procedure and test condition data of test items, and analysis and output of test result data. becomes. In addition, once system files, test procedures, and test condition data are input, they are stored in the storage device MEM, making it possible to faithfully reproduce tests under the same conditions. The input operation from the terminal device T when performing a test item with a partially changed version is greatly simplified. Furthermore, analysis of test result data is also possible using the processor CPU, making it possible to improve test efficiency and reliability of test results.

The drawings are merely one embodiment of the present invention; for example, the configuration of the electronic exchange test system and the configuration of the test electronic exchange TEX are not limited to those shown in the drawings, and many other modifications may be made. However, the effects of the present invention do not change in either case.

(g) Effects of the Invention As described above, according to the present invention, the usage efficiency of the test electronic exchange is greatly improved, and the system file,
The input of test procedure and test condition data, as well as the analysis and output of test results, are also improved, and it is expected that the efficiency and reliability of testing work will be greatly improved.

[Brief explanation of drawings]

The drawing is a diagram illustrating an electronic switching test system according to an embodiment of the present invention. In the figure, CC is the central control unit, CG is the pseudo terminal device, CNS is the additional console, CPU is the processor, CSC is the additional console control device, MEM is the storage device, MM is the main storage device, NW is the network, and T is the terminal. Equipment, TEX is a test electronic exchange,
TRF stands for high-speed transfer equipment, and TYP stands for typewriter equipment.

Claims (1)

[Scope of Claims] 1. System files stored in a storage program type electronic exchange, test procedures and test data for testing a test electronic exchange that stores the system files, and test result data are output 1. a storage device that stores the system file, test procedure, test condition data, and test result data; and a storage device that controls the terminal device in a time sharing manner and stores the system file between the storage device and the storage device. , input and output test procedures, test condition data, and test result data, and transmit the system files, test procedures, test condition data, and test result data between the storage device and the central control device of the test electronic exchange at high speed. An electronic exchange test system comprising: a processor for transmitting data;