JPH0318762A - Storage structure for probe for measurement of digital multimeter - Google Patents

Storage structure for probe for measurement of digital multimeter

Info

Publication number
JPH0318762A
JPH0318762A JP15349989A JP15349989A JPH0318762A JP H0318762 A JPH0318762 A JP H0318762A JP 15349989 A JP15349989 A JP 15349989A JP 15349989 A JP15349989 A JP 15349989A JP H0318762 A JPH0318762 A JP H0318762A
Authority
JP
Japan
Prior art keywords
measurement
probe
main body
electric circuit
measurement probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15349989A
Other languages
Japanese (ja)
Inventor
Takao Ikeda
池田 孝男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP15349989A priority Critical patent/JPH0318762A/en
Publication of JPH0318762A publication Critical patent/JPH0318762A/en
Pending legal-status Critical Current

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  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE:To improve the carrying and storing performance by storing the probe for measurement adjacently to a DMM main body. CONSTITUTION:The DMM main body 10 has the probe 13 for measurement inserted into its input terminal hole 11 for measurement, the tip of the probe 13 is brought into contact with an electric circuit, and the detected analog value of the electric circuit is converted by the main body 10 into the digital quantity of electricity, which is displayed. Further, the probe 13 is set adjacently to the main body 10 after the measurement to constitute a probe winding part 14 having inversive structure. The probe 13 is taken up after the measurement by inverting the winding part 14 adjacently to the main body 10.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はデジタルマルチメーターの測定用プローブ収納
構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a measuring probe storage structure for a digital multimeter.

[従来の技術] 従来の技術は第3図に示すようにゲイジクルマルチメー
ター(以下D,  M.  M.  と称す)本体10
と測定用プローブ13は、それぞれが別部品として構成
され、測定する時点においてD.  M.  Mの測定
用入力端子穴11に、測定用プローブ13を挿入し、測
定用プローブ13の先端で電気回路に接触し、検出した
電気回路のアナログ電気量をD.  M.  M本体1
0でディジタル電気量に変換して表示をする構成となっ
ている。また、前述の構成とは別に、第4図に示すよう
に、D,  M.  M本体10の測定用入力端子穴を
省略し、D.  M.  M本体回路12に、直接測定
用プロープ13のDM.  M本体接続側を電気的に接
続をして測定用ブロープ13の先端で電気回路に接触し
、検出した電気回路のアナログ電気量をD.  M. 
 M本体10でディジタル電気量に変換して表示をする
構成となっているものもある。また、前述の従来技術に
おいてD.  M.  Mの測定用入力端子穴11に測
定用プローブ13を挿入し測定用プローブ13の先端で
電気回路に接触し、検出した電気回路のアナログ電気量
をD.  M.  M本体でディジタル電気量に変換し
て、表示をする構成ではD.  M.  M本体10と
測定用ブローブ13は測定動作として見た場合、測定時
点においてD,  M.  M本体10と測定用プロー
ブ13を用意してD.  M.  Mの測定用入力端子
穴に測定用プローブを挿入し、測定用プローブの先端で
電気回路に接触し、電気量を測定するという一連の動作
がある。また、測定終了後はD.  M.  M本体1
0から測定用プローブ13を抜去し、それぞれを保管す
る手段をとついる。また、D.  M.  M本体10
の測定用入力端子穴を省略し、D.  M.  M本体
回路12に直接測定用プローブ13のD.  M.  
M本体接続側を電気的に接続をして測定用プローブの先
端で電気回路に接触し、検出した電気回路のアナログ電
気量をD.  M.  M本体10でディジタル電気量
に変換して表示をする構成では、測,定用プローブ13
の先端で電気回路に接触し、電気量を測定するという一
連の動作がある。また測定終了後はD.  M.  M
本体10に測定用プローブ13を巻き付けるか、そのま
ま長い測定用プローブ13をブラブラさせたまま保管す
る手段、あるいは他に用意された収納ケースに↓ 保管する手段をとついる。
[Prior art] As shown in FIG.
and the measurement probe 13 are each constructed as separate parts, and the D. M. The measurement probe 13 is inserted into the measurement input terminal hole 11 of the D. M. M body 1
The configuration is such that when the value is 0, it is converted into a digital quantity of electricity and displayed. In addition to the above configuration, as shown in FIG. 4, D, M. The measurement input terminal hole of the M main body 10 is omitted, and the D. M. DM of the direct measurement probe 13 is connected to the M main circuit 12. Connect the main body connection side of M electrically, touch the electric circuit with the tip of the measurement probe 13, and measure the detected analog electrical quantity of the electric circuit. M.
Some devices have a configuration in which the M main body 10 converts it into a digital quantity of electricity and displays it. Furthermore, in the prior art described above, D. M. The measurement probe 13 is inserted into the measurement input terminal hole 11 of the D. M. In a configuration where the M main body converts it into a digital quantity of electricity and displays it, D. M. When viewed as a measurement operation, the M main body 10 and the measuring probe 13 are connected to D, M. Prepare the M main body 10 and the measurement probe 13, and use the D. M. There is a series of operations in which a measurement probe is inserted into the measurement input terminal hole of M, the tip of the measurement probe contacts an electric circuit, and the amount of electricity is measured. Also, after the measurement is completed, D. M. M body 1
The measurement probes 13 are removed from 0, and a means is taken to store them. Also, D. M. M body 10
The measurement input terminal hole of D. M. Direct measurement probe 13 D. M.
Connect the M main body connection side electrically, touch the electric circuit with the tip of the measurement probe, and measure the analog electrical quantity of the electric circuit detected by D. M. In the configuration in which the M main body 10 converts into a digital quantity of electricity and displays it, the measurement probe 13
There is a series of operations in which the tip touches an electrical circuit and measures the amount of electricity. Also, after the measurement is completed, D. M. M
The measuring probe 13 is wound around the main body 10, the long measuring probe 13 is stored as it is, or the measuring probe 13 is stored in a storage case prepared elsewhere.

[発明が解決しようとする課題および目的]しかし、前
述の従来技術において、第3図の測定用プローブ13の
先端で電気回路に接触し、検出した電気回路のアナログ
電気量をD.  M.  M本体でディジタル電気量に
変換して表示をする構成となっている場合、測定終了後
はD.  M,  M本体10から測定用プロープ13
を抜去し、それぞれを保管する手段をとるため、常にD
.  M.  M本体10と測定用プローブ13は同じ
場所に保管しなければ測定機能を実現しえないという欠
点を有している。また、第4図のD.  M.  M本
体l○の測定用入力端子穴を省略しD.  M.  M
本体回路12に直接測定用ブローブl3のD.  M.
  M本体接続側を電気的に接続をして測定用プロープ
13の先端で電気回路に接触し、検出した電気回路のア
ナログ電気量をD.  M.  M本体10でディジタ
ル電気量に変換して表示をする構成となっている場合、
測定終了後はD.  M.  M本体10に測定用に巻
き付けたり、そのまま長い測定用プローブ13をブラプ
ラさせたまま保管しなければならず、測定用ブローブ1
3の収納するところが無いために、D.M.  M本体
10の保管性、携帯性が悪くなるという問題を有してい
る。そこで本発明はこの様な問題点を一挙に解決するも
ので、その目的とするところはD,  M.  Mにお
いてD.  M.  M本体に隣接して測定用プローブ
が収納された、携帯性、保管性に優れたD,  M. 
 Mを提供することにある。
[Problems and Objects to be Solved by the Invention] However, in the prior art described above, the tip of the measuring probe 13 shown in FIG. M. If the configuration is such that the M main unit converts it into a digital quantity of electricity and displays it, after the measurement is completed, the D. M, measurement probe 13 from M main body 10
In order to take measures to remove and store each
.. M. The M main body 10 and the measurement probe 13 have the disadvantage that the measurement function cannot be realized unless they are stored in the same location. Also, D. M. The input terminal hole for measurement on the M main body l○ is omitted, and the D. M. M
Direct measurement probe l3 D. M.
Connect the main body connection side of M electrically, touch the electric circuit with the tip of the measurement probe 13, and measure the detected analog electrical quantity of the electric circuit. M. If the configuration is such that the M main body 10 converts it into a digital quantity of electricity and displays it,
After the measurement is completed, D. M. It is necessary to wrap the long measuring probe 13 around the M main body 10 for measurement or store it with the long measuring probe 13 hanging loosely.
Because there is no place to store item 3, D. M. There is a problem that the storage and portability of the M main body 10 are deteriorated. Therefore, the present invention aims to solve these problems all at once, and its purpose is to solve D, M. D in M. M. D, M.M. has a measurement probe stored adjacent to the main body, making it easy to carry and store.
The goal is to provide M.

[課題を解決するための手段〕 上記課題を解決するために、本発明の測定用プローブ収
納構造は、D,  M.  M本体に隣接して測定用グ
ローブが収納されることを特徴とする。
[Means for Solving the Problems] In order to solve the above problems, the measurement probe housing structure of the present invention includes D, M. It is characterized in that a measuring glove is stored adjacent to the M main body.

[作 用] 本発明は、D.  M.  M本体に隣接して測定用ブ
ロープが収納される測定用ブロープ収納構造を構成する
ことにより、電気量の測定終了後速やかに測定用プロー
ブがD.  M,  M本体に隣接して収納でき、優れ
た携帯性と保管性が実現できる。
[Function] The present invention is based on D. M. By configuring the measurement probe storage structure in which the measurement probe is stored adjacent to the M main body, the measurement probe can be stored in the D. M, can be stored adjacent to the M main body, providing excellent portability and storage.

[実施例コ 以下に本発明の実施例を図面にもとすいて説明する。[Example code] Embodiments of the present invention will be described below with reference to the drawings.

第3図において、D.  M.  Hの本体IOにはD
.M.  Mの測定用入力端子穴11に測定用プローブ
13を挿入し、測定用1ローブL3の先端で電気回路に
接触し、検出した電気回路のアナログ電気量をD.  
M.  M本体10でディジタル電気量に変換して表示
をする構成と、また第4図のD.  M.M本体10の
測定用入力端子穴を省略し、D.  M.M本体回路1
2に直接、測定用プローブ13のD.M.  M本体接
続側を電気的に接続をして測定用ブロープ13の先端で
電気回路に接触し、検出した電気回路のアナログ電気量
をD,  M.  M本体10後に測定用プローブ13
をD.  M.  M本体10に隣接して、町倒構造を
有した測定用プローブ巻取部14を構成している。測定
用プローブ13は電気量の測定終了後、D.  M. 
 M本体10に隣接して可倒構造を有した測定用プロー
ブ巻取部14を倒立させそこに測定用プローブ13を巻
き取っていく。倒立させた巻取部14は、巻き取られる
時にかかる力に対しては、充分耐えられるストッパー構
造15を形成している。測定用プローブ13が巻き取ら
れた後、測定用プローブ13は巻取部の上に形成された
ホルダ一部16に固定される。
In FIG. 3, D. M. D in main body IO of H
.. M. The measurement probe 13 is inserted into the measurement input terminal hole 11 of the D.
M. A configuration in which the M main body 10 converts it into a digital quantity of electricity and displays it, and D. M. The measurement input terminal hole of the M main body 10 is omitted, and the D. M. M main circuit 1
D.2 of the measurement probe 13 directly. M. Connect the main body connection side of M electrically, touch the electric circuit with the tip of the measuring probe 13, and measure the detected analog electrical quantity of the electric circuit. Measuring probe 13 after M main body 10
D. M. Adjacent to the M main body 10, a measurement probe winding section 14 having a vertical structure is configured. After the measuring probe 13 finishes measuring the amount of electricity, D. M.
A measuring probe winding section 14 having a foldable structure is placed in an inverted position adjacent to the M main body 10, and the measuring probe 13 is wound there. The inverted winding section 14 forms a stopper structure 15 that can sufficiently withstand the force applied when winding up. After the measuring probe 13 is wound up, the measuring probe 13 is fixed in a holder part 16 formed on the winding part.

測定用プローブ13は電気量測定前に測定用プローブ1
3をホルダ16から外し、その後測定用プローブ13を
巻取部14から巻戻す。倒立した巻取部l4は、電気量
測定中はD.  M.  〜f本体■0側と平行になる
ように倒しておくことができる。
The measurement probe 13 is connected to the measurement probe 1 before measuring the electrical quantity.
3 from the holder 16, and then the measuring probe 13 is unwound from the winding section 14. The inverted winding unit l4 is placed in the D. M. ~f Main body ■ It can be tilted so that it is parallel to the 0 side.

[発明の効果コ 以上述べたように本発明によれば、D.  M.  M
の測定用人力端子穴に測定用グローブを挿入し、測定用
プローブの先端で電気回路に接触し、検出した電気回路
のアナログ電気量をD.  M.  M本体ディジタル
電気量に変換して表示をする構成においては測定終了後
にD.  M.  M本体から測定用プローブを抜去し
、それぞれを保管する手段をとる必要がなくなり、常に
D,  M.  M本体と測定用プローブは不離一体の
ため、保管性が向上するとり)った効果を有する。また
D.  M.  M本体の測定用人力端子穴を省略し、
D.  M.  M本体回路に直接測定用プローブのD
.  M.  M本体接続側を電気的に接続をして測定
用プローブの先端で電気回路に接触し、検出した電気回
路のアナログ電気量をD.M.  M本体でディジタル
電気量に変換して表示をする構成においては測定終了後
に、D.  M.  M本体に測定用に巻き付けたりそ
のまま長い測定用ブローブをブラブラさせたまま保管す
る必要が無く、携帯性、保管性が向上するといった効果
を有する。
[Effects of the Invention] As described above, according to the present invention, D. M. M
Insert a measuring glove into the measurement terminal hole of the D.D., touch the electric circuit with the tip of the measurement probe, and measure the detected analog electrical quantity of the electric circuit. M. In a configuration where the M main body is converted into a digital electrical quantity and displayed, the D. M. There is no need to remove the measurement probes from the M main body and take measures to store them. Since the M main body and the measuring probe are inseparable, it has the effect of improving storage efficiency. Also D. M. Omit the manual terminal hole for measurement on the M body,
D. M. D of the measurement probe directly to the M main circuit
.. M. Connect the main body connection side of M electrically, touch the electric circuit with the tip of the measuring probe, and measure the detected analog electrical quantity of the electric circuit. M. In a configuration where the D. M. There is no need to wrap the long measuring probe around the M body for measurement or store it with the long measuring probe hanging around as it is, and it has the effect of improving portability and storability.

いずれにし゛Cも、D,  M.  M本体に隣接して
測定用プローブが収納される測定用プローブ収納構造を
構成することにより、電気量の測定終了後に速やかに測
定用グローブがD.  M.  M本体に隣接して収納
でき、優れた携帯性と保管性を持つD.  MMが実現
できる。
In any case, C, D, M. By configuring the measurement probe storage structure in which the measurement probe is stored adjacent to the M main body, the measurement glove can be quickly stored in the D. M. D.M can be stored adjacent to the main body and has excellent portability and storage. MM can be realized.

第3図は従来の構成図を示す。FIG. 3 shows a conventional configuration diagram.

第4図は従来の構成図を示す。FIG. 4 shows a conventional configuration diagram.

1 0 11 1 2 1 3 1 4 15 工6 D.  M.  M本体 D.  M.  M本体の測定用入力端子穴D.  M
.  M本体回路 測定用プローブ 巻取部 ストッパー構造 ホルダ一部 以上
1 0 11 1 2 1 3 1 4 15 Eng 6 D. M. M body D. M. Measurement input terminal hole D. M
.. M body circuit measurement probe winding part stopper structure holder part or more

Claims (1)

【特許請求の範囲】[Claims] 電圧抵抗など電気量を測定するディジタルマルチメータ
ーにおいて測定用プローブが該D.M.M本体に隣接し
て収納されることを特徴とするディジタルマルチメータ
ーの測定用プローブ収納構造。
In a digital multimeter that measures electrical quantities such as voltage resistance, the measuring probe is connected to the D. M. A measurement probe storage structure for a digital multimeter, characterized in that it is stored adjacent to the M main body.
JP15349989A 1989-06-15 1989-06-15 Storage structure for probe for measurement of digital multimeter Pending JPH0318762A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15349989A JPH0318762A (en) 1989-06-15 1989-06-15 Storage structure for probe for measurement of digital multimeter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15349989A JPH0318762A (en) 1989-06-15 1989-06-15 Storage structure for probe for measurement of digital multimeter

Publications (1)

Publication Number Publication Date
JPH0318762A true JPH0318762A (en) 1991-01-28

Family

ID=15563898

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15349989A Pending JPH0318762A (en) 1989-06-15 1989-06-15 Storage structure for probe for measurement of digital multimeter

Country Status (1)

Country Link
JP (1) JPH0318762A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110514887A (en) * 2018-05-22 2019-11-29 日置电机株式会社 Portable type measuring appliance
KR20190133103A (en) 2018-05-22 2019-12-02 히오끼 덴끼 가부시끼가이샤 Portable measuring instrument

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110514887A (en) * 2018-05-22 2019-11-29 日置电机株式会社 Portable type measuring appliance
KR20190133103A (en) 2018-05-22 2019-12-02 히오끼 덴끼 가부시끼가이샤 Portable measuring instrument

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