JPH03150440A - Inspection method for hermetically sealed container - Google Patents
Inspection method for hermetically sealed containerInfo
- Publication number
- JPH03150440A JPH03150440A JP28938189A JP28938189A JPH03150440A JP H03150440 A JPH03150440 A JP H03150440A JP 28938189 A JP28938189 A JP 28938189A JP 28938189 A JP28938189 A JP 28938189A JP H03150440 A JPH03150440 A JP H03150440A
- Authority
- JP
- Japan
- Prior art keywords
- container
- sealed
- pinhole
- contact
- contents
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000007789 sealing Methods 0.000 claims description 29
- 239000004033 plastic Substances 0.000 abstract description 18
- 235000013305 food Nutrition 0.000 abstract description 11
- 235000015203 fruit juice Nutrition 0.000 abstract description 3
- 239000004020 conductor Substances 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 24
- 230000007547 defect Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000007788 liquid Substances 0.000 description 5
- 238000007796 conventional method Methods 0.000 description 4
- 239000004677 Nylon Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 229920001778 nylon Polymers 0.000 description 3
- 239000002985 plastic film Substances 0.000 description 3
- 229920006255 plastic film Polymers 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- 239000005025 cast polypropylene Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 235000011850 desserts Nutrition 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- -1 polypropylene Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 1
- PDYXSJSAMVACOH-UHFFFAOYSA-N [Cu].[Zn].[Sn] Chemical compound [Cu].[Zn].[Sn] PDYXSJSAMVACOH-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011344 liquid material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000000813 microbial effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002991 molded plastic Substances 0.000 description 1
- 239000012785 packaging film Substances 0.000 description 1
- 229920006280 packaging film Polymers 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Examining Or Testing Airtightness (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、導電性内容物が充填されてプラスチックフィ
ルム等の蓋材により密封される容器における密封部の密
封不良(ピンホール等)を検査する方法に関し、特にデ
ザートや果汁飲料等の液体状かつ導電性の食品が充填さ
れる密封容器の検査に利用できる。[Detailed Description of the Invention] [Industrial Application Field] The present invention is for inspecting sealing defects (pinholes, etc.) in the sealed portion of containers filled with conductive contents and sealed with a lid material such as a plastic film. This method can be particularly used to inspect sealed containers filled with liquid and conductive foods such as desserts and fruit juice drinks.
従来より、内容物が充填されてプラスチックフィルム等
の蓋材で密封包装されるプラスチック製成形容器は、様
々な分野で利用されている。特に内容物の保存に要求さ
れる物性、例えば水蒸気やガスの遮断性等の物性を与え
ることができ、また大量生産に適し経済的であるため、
デザートや果汁飲料等の食品の容器として広範に利用さ
れている。BACKGROUND ART Conventionally, molded plastic containers that are filled with contents and sealed and packaged with a lid material such as a plastic film have been used in various fields. In particular, it can provide the physical properties required for preserving the contents, such as water vapor and gas barrier properties, and is economical and suitable for mass production.
Widely used as containers for foods such as desserts and fruit juice drinks.
このようなプラスチック容器にピンホールが存在すると
、内容物の微生物汚染や液体等の内容物の漏洩等の問題
が生じるため、従来よりピンホールの有無を検査するピ
ンホール検査が行われてぃる。特に、ピンホールは蓋材
と容器とのシール部分つまり密封部に生じることが多い
ため、この密封部のピンホール検査は重要な品質管理項
目となっている。If pinholes exist in such plastic containers, problems such as microbial contamination of the contents and leakage of liquid and other contents may occur, so pinhole inspections have traditionally been carried out to check for the presence of pinholes. . In particular, since pinholes often occur in the sealing area between the lid and the container, pinhole inspection in the sealing area is an important quality control item.
このピンホール検査を行う従来技術として、密封包装を
試験する方法(特公昭50−6998号公報)がある。As a conventional technique for performing this pinhole inspection, there is a method of testing sealed packaging (Japanese Patent Publication No. 1983-6998).
この方法は、絶縁性包装被膜で密封包装された食品に高
周波電圧を印加して、電極および食品間で形成される容
量リアクタンスの差による閃絡電流を検知してピンホー
ルを検査する方法であり、いわゆる高周波スパーク法と
呼ばれているものである。This method applies a high-frequency voltage to the food hermetically packaged with an insulating packaging film, detects flash current caused by the difference in capacitive reactance between the electrode and the food, and inspects for pinholes. This is the so-called high-frequency spark method.
また、この高周波スパーク法を内容物が充填された密封
容器のピンホール検査に応用した装置として、密封食品
におけるピンホール等の検出装置(特開昭62−707
25号公報)がある。この検出装置は、第6図に示すよ
うに、絶縁性の容器61内に食品62を挿入後、容器開
口63を絶縁性フィルム64でシールして形成した密封
食品65の上方からフィルム64にブラシ状の電極66
を接触させ、かつ容器61の底面にアース電極67を接
触させ、画電極66゜67間に高周波電圧発生源68で
高周波電圧を印加し、ピンホールが存在すればそこに閃
絡が生じるようにして、この閃絡による電流変化を高周
波電流検出器69で検知してピンホールを検出するもの
である。In addition, as a device applying this high-frequency spark method to pinhole inspection in sealed containers filled with contents, we have developed a device for detecting pinholes in sealed foods (Japanese Patent Laid-Open No. 62-707
Publication No. 25). As shown in FIG. 6, in this detection device, after a food 62 is inserted into an insulating container 61, a sealed food 65 is formed by sealing a container opening 63 with an insulating film 64. shaped electrode 66
and the ground electrode 67 is brought into contact with the bottom of the container 61, and a high frequency voltage is applied between the picture electrodes 66 and 67 by a high frequency voltage source 68, so that if there is a pinhole, a flashover will occur there. The pinhole is detected by detecting the current change due to this flash fault with a high frequency current detector 69.
しかしながら、いずれの方法や装置においても、食品が
包装材料に完全に密着、あるいは容器61に充満されて
容器61およびフィルム64に密着されていない場合に
は、第6図に示すように、空気等の気層部71が形成さ
れることになる。この気層部71は絶縁層となるため、
フィルム64にピンホールが存在していても閃絡が生じ
ず、ピンホール検査を行うことができないという問題が
ある。However, in either method or device, if the food is not completely adhered to the packaging material or the container 61 is filled and the food is not adhered to the container 61 and the film 64, as shown in FIG. An air layer 71 is formed. Since this gas layer portion 71 becomes an insulating layer,
Even if there are pinholes in the film 64, there is a problem in that no flashover occurs and pinhole inspection cannot be performed.
本発明の目的は、内部に気層部を含む密封容器であって
も、その密封不良の検査を確実に行える密封容器の検査
方法を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a method for inspecting a sealed container that can reliably inspect for poor sealing even if the container includes an air layer inside.
〔課題を解決するための手段]
本発明の密封容器の検査方法は、導電性内容物が充填さ
れかつ開口部が蓋材により密封された容器の検査方法で
あって、前記容器を傾けて導電性内容物が前記蓋材に接
するようにし、この密封部と前記容器の導電性内容物が
接触する部分との間に高周波電圧を印加し、その際の電
流値および/または電圧値の変化により前記密封部のピ
ンホール等の密封不良を検査することを特徴とする。[Means for Solving the Problems] A method for inspecting a sealed container of the present invention is a method for inspecting a container filled with a conductive content and having an opening sealed with a lid, the container being tilted to conduct conductivity. A high frequency voltage is applied between this sealing part and the part of the container that the conductive contents contact, and the change in the current value and/or voltage value at that time causes the conductive contents to contact the lid material. The present invention is characterized in that the sealing portion is inspected for sealing defects such as pinholes.
また、検査にあたっては、前記容器をその底面に直交す
る回転軸で回転させながら行うことが好ましい。In addition, it is preferable to perform the inspection while rotating the container about a rotating shaft perpendicular to the bottom surface of the container.
ここで、前記蓋材および容器としてはプラスチックや紙
等の絶縁性を有する部材が利用できる。Here, as the lid material and the container, an insulating member such as plastic or paper can be used.
また、前記密封部には、ブラシ状の電極を接触させて高
周波電圧を印加し、この電極によりピンホール等の密封
不良を検出することが好ましい。Further, it is preferable that a brush-like electrode be brought into contact with the sealing portion to apply a high frequency voltage, and that a sealing defect such as a pinhole is detected by this electrode.
さらに、前記容器の底面または側面の導電性内容物が接
触する部分には、接触面積の大きなアース電極が接触さ
れ、このアース電極により高周波電圧が印加されること
が好ましい。Furthermore, it is preferable that a ground electrode with a large contact area is brought into contact with the bottom or side surface of the container that is in contact with the conductive contents, and a high frequency voltage is applied by this ground electrode.
また、導電性内容物としては、導電性を有する液体状の
ものが利用できる。Further, as the conductive content, a liquid material having conductivity can be used.
このような本発明においては、密封容器を傾斜させて導
電性内容物を蓋材と容器との密封部に接触させ、この密
封部と前記容器の導電性内容物が接触する部分との間に
高周波電圧を印加する。ここで、電圧が印加されている
密封部にピンホール等の密封不良が存在すると、密封部
および容器間にピンホールおよび導電性内容物を介して
電気回路が形成される。この際、密封部には導電性内容
物が接触しているため、気層部により前記電気回路が絶
縁されることがなく、電流あるいは電圧の変化が測定さ
れてピンホールが確実に検知される。In the present invention, the sealed container is tilted to bring the conductive contents into contact with the sealing portion between the lid and the container, and there is a gap between the sealed portion and the portion of the container where the conductive contents contact. Apply high frequency voltage. Here, if a sealing defect such as a pinhole exists in the sealed portion to which voltage is applied, an electric circuit is formed between the sealed portion and the container via the pinhole and the conductive contents. At this time, since the conductive contents are in contact with the sealed part, the electrical circuit is not insulated by the air layer, and changes in current or voltage are measured and pinholes are reliably detected. .
すなわち、本発明は、容器内に気層部があっても容器を
傾斜させることで、高周波電圧が印加される密封部と導
電性内容物との間から気層部を無くし、よって気層部に
よる絶縁層がないため、ピンホールの有無のみで電気回
路が断続されてピンホールが確実に検出され、これらに
より前記目的が達成される。That is, even if there is an air layer inside the container, the present invention eliminates the air layer from between the sealed portion to which a high frequency voltage is applied and the conductive contents by tilting the container. Since there is no insulating layer, the electrical circuit is interrupted only by the presence or absence of the pinhole, and the pinhole is reliably detected, thereby achieving the above objective.
以下、本発明の一実施例を図面に基づいて説明する。 Hereinafter, one embodiment of the present invention will be described based on the drawings.
第1図には、本発明に基づいてプラスチック容器のピン
ホール検査を行う検査システム1が示されている。FIG. 1 shows an inspection system 1 for pinhole inspection of plastic containers according to the present invention.
検査システムlは、検査対象であるプラスチック容器2
に高周波電圧を印加してピンホール検査を行うものであ
る。このプラスチック容器2は、絶縁性を有するプラス
チック、例えばポリプロピレン等を原料として、例えば
、第2図に示すような寸法の庭付円筒状に成形される。The inspection system 1 is a plastic container 2 to be inspected.
Pinhole inspection is performed by applying a high-frequency voltage to the pinhole. The plastic container 2 is made of an insulating plastic, such as polypropylene, and is formed into a cylindrical shape having dimensions as shown in FIG. 2, for example.
このプラスチック容器2の開口部にはフランジ3が形成
され、このフランジ3には、絶縁性を有するプラスチッ
クフィルム、例えばナイロン(NY)およびキャストポ
リプロピレン(CP P)が積層されたトップフィルム
4がヒートシール等で接着されている。従って、容器2
内部は液体状の導電性内容物5が充填された状態でトッ
プフィルム4により密封され、このフィルム4と容器2
とが接着されるフランジ3部分により密封部6が構成さ
れる。A flange 3 is formed at the opening of the plastic container 2, and a top film 4 laminated with an insulating plastic film such as nylon (NY) and cast polypropylene (CPP) is heat-sealed onto the flange 3. It is attached with etc. Therefore, container 2
The inside is filled with a liquid conductive content 5 and sealed with a top film 4, and this film 4 and the container 2
A sealing portion 6 is constituted by the flange 3 portion to which the flange 3 and the flange 3 are bonded.
なお、このプラスチック容器2には、内容物5が充満さ
れてはおらず、一部に空気等の気層部7が形成されると
ともに、検査時には略垂直に傾斜されて気層部7が上方
に位置する状態とされる。Note that this plastic container 2 is not filled with the contents 5, and an air layer 7 of air or the like is formed in a part thereof, and at the time of inspection, it is tilted approximately vertically so that the air layer 7 is raised upward. It is said to be in a state where it is located.
一方、検査システム1は、第1図に示すように、高周波
電圧発生検出装置10を備えている。この発生検出装置
lOは、高周波電圧発生源11、保安抵抗12および高
周波電流検出器13を備えている。On the other hand, the inspection system 1 includes a high frequency voltage generation and detection device 10, as shown in FIG. This generation/detection device 1O includes a high frequency voltage generation source 11, a safety resistor 12, and a high frequency current detector 13.
この発生検出装置10には、高周波電圧発生源11によ
り高周波電圧が印加されるアース電極20および検知部
30が接続されている。A ground electrode 20 to which a high frequency voltage is applied by a high frequency voltage generation source 11 and a detection section 30 are connected to this generation detection device 10 .
アース電極20は、導電性を有する金属、好ましくは亜
鉛銅スズ合金か銅を用いてプラスチック容器2の底部形
状と同型に形成されて容器2に嵌合され、かつモータ2
1を有する容器回転手段22で回転可能とされている。The ground electrode 20 is made of a conductive metal, preferably a zinc-copper-tin alloy or copper, and is formed to have the same shape as the bottom of the plastic container 2, and is fitted into the container 2.
It is possible to rotate the container by means of a container rotation means 22 having a container rotating means 22 having a diameter of 1.
従って、アース電極20の回転に伴い、プラスチック容
器2は底面に直交する略水平な回転軸を中心に回転され
る。Therefore, as the ground electrode 20 rotates, the plastic container 2 is rotated about a substantially horizontal rotation axis perpendicular to the bottom surface.
一方、検知部30は、導電性を有する金属、好ましくは
銅製による線径φ0.5mm以下のブラシ状の電極31
で構成され、第3図にも示すように、容器2の回転軸に
直交する方向から導電性内容物5が接している密封部6
に接触されている。従って、容器2の回転に伴い、検知
部30が接触する密封部6が順次移動して密封部6の全
周が検査される。On the other hand, the detection unit 30 includes a brush-like electrode 31 made of a conductive metal, preferably copper, and having a wire diameter of 0.5 mm or less.
As shown in FIG.
has been contacted. Therefore, as the container 2 rotates, the sealing part 6 that the detection part 30 contacts moves sequentially, and the entire circumference of the sealing part 6 is inspected.
このように構成された本実施例においては、次に示すよ
うな手順でプラスチック容器2のピンホール検査を行う
。In this embodiment configured as described above, the pinhole inspection of the plastic container 2 is performed in the following procedure.
まず、容器2を略直交方向に傾斜させるとともに、容器
2の底部にアース電極20を嵌合し、かつ導電性内容物
5が接する密封部6に検知部30を接触させる。First, the container 2 is tilted in a substantially orthogonal direction, the ground electrode 20 is fitted to the bottom of the container 2, and the detection part 30 is brought into contact with the sealed part 6 that the conductive contents 5 are in contact with.
次に、高周波電圧発生検出装置lOの高周波電圧発生源
11によりアース電極20および検知部30間に高周波
電圧を印加するとともに、容器回転手段22によりアー
ス電極20を介して容器2を1回転させる。Next, a high frequency voltage is applied between the ground electrode 20 and the detection section 30 by the high frequency voltage generation source 11 of the high frequency voltage generation and detection device IO, and the container 2 is rotated once via the ground electrode 20 by the container rotating means 22.
ここで、検知部30が接触している密封部6が完全に密
封されている場合には、容器2およびトップフィルム4
は絶縁性のプラスチックより形成されているため、検知
部30と導電性内容物5とは電気的に接続されず、電気
回路が形成されないため、高周波電流検出器13では電
流が検出されない。Here, if the sealing part 6 that the detection part 30 is in contact with is completely sealed, the container 2 and the top film 4
Since it is made of insulating plastic, the detection part 30 and the conductive content 5 are not electrically connected and no electric circuit is formed, so the high frequency current detector 13 does not detect current.
一方、容器2の回転に伴い、検知部30がピンホール等
の密封不良を有する密封部6に接触した場合には、この
ピンホール等により検知部30と導電性内容物5とが電
気的に接続されて電気回路が形成されるため、電流検出
器13において電流が検出される。On the other hand, when the detection part 30 comes into contact with the sealing part 6 having a sealing defect such as a pinhole as the container 2 rotates, the detection part 30 and the conductive contents 5 are electrically connected due to the pinhole or the like. Since they are connected to form an electric circuit, current is detected by the current detector 13.
従って、電流検出器13における検出電流の有無により
、密封部6のピンホール等の密封不良が検出される。Therefore, a sealing defect such as a pinhole in the sealing portion 6 is detected based on the presence or absence of a detection current in the current detector 13.
このような本実施例によれば、次のような効果がある。According to this embodiment, the following effects can be obtained.
0
すなわち、プラスチック容器2内に気層部7を有してい
ても、容器2を傾斜させることで導電性内容物5を密封
部6に接触させることができ、このため密封部6にピン
ホールが存在する場合において、検知部30と導電性内
容物5との間に気層部7による絶縁層か形成されないの
で、電気回路が形成されてピンホールによる電流を確実
に検出することができる。0 In other words, even if the plastic container 2 has an air layer 7, the conductive contents 5 can be brought into contact with the sealing part 6 by tilting the container 2, and therefore a pinhole can be formed in the sealing part 6. , an insulating layer due to the gas layer 7 is not formed between the detection unit 30 and the conductive content 5, so an electric circuit is formed and the current due to the pinhole can be reliably detected.
つまり、本実施例によれば、ピンホールがあっても気層
部7の絶縁層により電気回路が形成されないといった不
都合がなく、電流検出器13における検出電流はピンホ
ールの有無によってのみ影響されるため、ピンホールを
確実に検出することができる。In other words, according to this embodiment, even if there is a pinhole, there is no inconvenience that an electric circuit is not formed by the insulating layer of the air layer 7, and the detected current in the current detector 13 is affected only by the presence or absence of the pinhole. Therefore, pinholes can be detected reliably.
また、容器回転手段22により容器2を回転させている
ので、検知部30を固定した状態で密封部6の全周を検
査することができ、検査作業を容易かつ短時間で行うこ
とができる。Further, since the container 2 is rotated by the container rotation means 22, the entire circumference of the sealed portion 6 can be inspected with the detection section 30 fixed, and the inspection work can be performed easily and in a short time.
なお、本発明は前記実施例の構成等に限らず、本発明の
目的を達成できる範囲の変形は本発明にI
含まれるものである。Note that the present invention is not limited to the configurations of the above-mentioned embodiments, and the present invention includes modifications within a range that can achieve the object of the present invention.
例えば、前記実施例では、容器2を略垂直に傾斜させて
検査を行っていたが、例えば、第4図に示すように、ト
ップフィルム4側を斜め下方に向けて傾斜させ、全ての
密封部6が導電性内容物5に接するようにして検査を行
ってもよい。この場合には、全ての密封部6か内容物5
に接しているため、容器2を回転させずに検知部30を
移動して検査することもできる。For example, in the above embodiment, the container 2 was inspected by tilting it approximately vertically. For example, as shown in FIG. 4, by tilting the top film 4 side diagonally downward, all the sealed parts The inspection may be performed with the conductive contents 5 being in contact with the conductive contents 5. In this case, all sealed parts 6 or contents 5
Since the container 2 is in contact with the container 2, the detection section 30 can be moved and inspected without rotating the container 2.
要するに、本発明においては、密封部6の少なくとも一
部に導電性内容物5が接するように容器2を傾斜し、こ
の内容物5が接している密封部6に検知部30を接触さ
せればよく、その傾斜角度は実施にあたって適宜設定す
ればよい。In short, in the present invention, if the container 2 is tilted so that the conductive contents 5 are in contact with at least a portion of the sealed portion 6, and the detection portion 30 is brought into contact with the sealed portion 6 that is in contact with the contents 5, The inclination angle may be appropriately set in practice.
また、容器2を回転させる容器回転手段22としては、
前記実施例のように容器2の底部に嵌合されるアース電
極20を回転させるものに限らず、例えば、アース電極
20を板状に形成し、容器2をトップフィルム4側から
アース電極20に押しつけて回転させる押え治具等を用
いてもよく、その構成2
は任意である。Further, as the container rotation means 22 for rotating the container 2,
The method is not limited to rotating the earth electrode 20 fitted to the bottom of the container 2 as in the above embodiment, but for example, the earth electrode 20 may be formed into a plate shape, and the container 2 may be connected to the earth electrode 20 from the top film 4 side. A holding jig or the like that presses and rotates may be used, and the configuration 2 is arbitrary.
さらに、検査対象となる容器2は、前記実施例のものに
限らず、例えは、第5図に示すように、密封部6の先端
か折曲された被せ蓋状の密封方式を採用した容器50の
検査にも利用できる。特に、この被せ蓋状の容器50で
は、従来のようにフィルム4の上方から電極66を接触
させる方法では、折曲された密封部6に電極66を接触
させることが困難なため、ピンホール検査を行えないが
、本発明では、密封部6に容器50の側方から検知部3
0を接触させることができるため、第5図に示すように
電極31のブラシ形状として折曲方向に合ったものなど
を適宜選択することができ、よってピンホール検査を確
実に行うことができる。Furthermore, the container 2 to be inspected is not limited to the one in the above embodiment, but for example, as shown in FIG. It can also be used for 50 tests. In particular, with this cover-like container 50, pinhole inspection is difficult because it is difficult to contact the electrode 66 with the bent sealing part 6 using the conventional method of contacting the electrode 66 from above the film 4. However, in the present invention, the detection part 3 is inserted into the sealing part 6 from the side of the container 50.
0 can be brought into contact with the electrode 31, as shown in FIG. 5, the brush shape of the electrode 31 can be appropriately selected to match the bending direction, and pinhole inspection can therefore be performed reliably.
また、前記実施例では、高周波電流検出器13で検出さ
れる電流の変化によりピンホールを検出していたが、電
圧を測定してその変化により検出してもよいし、電流お
よび電圧の両方を測定して検出してもよく、これらは実
施にあたって適宜設定すればよい。Furthermore, in the embodiment described above, pinholes were detected by changes in the current detected by the high-frequency current detector 13, but they may also be detected by measuring voltage and detecting the changes, or by detecting both current and voltage. It may be detected by measurement, and these may be set appropriately in implementation.
3
さらに、前記実施例では、プラスチック製の容器2と蓋
材であるフィルム4とを用いていたが、本発明の容器お
よび蓋材はプラスチックに限らず紙等でもよく、要する
に絶縁性のものであれば利用できる。3 Furthermore, in the above embodiment, a plastic container 2 and a film 4 as a lid material were used, but the container and lid material of the present invention are not limited to plastic, but may also be paper or the like, and in short, they are insulating. You can use it if you have it.
また、導電性内容物5としては、液体に限らず、液体お
よび固体を混合したものでもよく、要するに容器2を傾
斜させたときに密封部6に接触可能な内容物5であれば
よい。さらに、この内容物5は、食品に限らず、導電性
の他の物質も適用できる。Further, the conductive content 5 is not limited to a liquid, and may be a mixture of a liquid and a solid.In short, the conductive content 5 may be any content 5 that can come into contact with the sealing portion 6 when the container 2 is tilted. Furthermore, this content 5 is not limited to foods, but can also be applied to other conductive substances.
次に、本発明の検査システム1を用いた実験結果につい
て説明する。Next, experimental results using the inspection system 1 of the present invention will be explained.
この実験は、検査対象の容器として、第2図に示す寸法
および形状で厚みが0.8 mmのポリプロピレン製の
容器2を用いたものである。この容器2の容量は65c
cであり、導電性内容物5として2%食塩水を55cc
つまり85%の充填を行った。In this experiment, a polypropylene container 2 having the dimensions and shape shown in FIG. 2 and a thickness of 0.8 mm was used as the container to be inspected. The capacity of this container 2 is 65c
c, and 55 cc of 2% saline as the conductive content 5
In other words, 85% filling was performed.
また、トップフィルム4は、ナイロンが15μかつキャ
ストポリプロピレンが60μの厚さで積層さ4
れたフィルムを用いた。The top film 4 used was a film in which nylon was laminated to a thickness of 15 μm and cast polypropylene was laminated to a thickness of 60 μm.
さらに、高周波電圧発生検出装置IOとして、ニラカミ
測(掬製H8E型(名称、卓上ピンホールインスベクタ
ー)を用いた。この検出装置10は、電圧を0〜15K
Vに可変可能であり、電流検出の有無をランプで表示す
るものである。Further, as the high frequency voltage generation and detection device IO, a Nirakami sensor (Kiki H8E model (name: desktop pinhole instrument)) was used.
It can be varied to V, and the presence or absence of current detection is indicated by a lamp.
このような容器2を用いて第1図に示す本発明方法と第
6図に示す従来方法とにおいて、3KVの高周波電圧を
印加した際の実験結果を表−1に示す。Table 1 shows the experimental results when a high frequency voltage of 3 KV was applied using such a container 2 in the method of the present invention shown in FIG. 1 and the conventional method shown in FIG.
この表−1から判るように、従来の方法では検知できな
い15μ、50μの孔を本発明の方法によれば検知する
ことができた。As can be seen from Table 1, the method of the present invention was able to detect holes of 15μ and 50μ that could not be detected using conventional methods.
従って、本発明の密封容器の検査方法による検査が有効
であることが判る。Therefore, it can be seen that the inspection by the sealed container inspection method of the present invention is effective.
このような本発明によれば、内部に気層部を含む密封容
器であっても、密封不良の検査を確実に行うことができ
るという効果がある。According to the present invention, even if the container is a sealed container that includes an air layer inside, it is possible to reliably test for a seal failure.
第1図は本発明の一実施例を示す概略側面図、第2図は
プラスチック容器を示す断面図、第3図は前記実施例の
概略正面図、第4図および第5図はそれぞれ本発明の変
形例を示す概略図、第6図は従来例を示す概略図である
。
1・・・検査システム、2・・・プラスチック容器、3
・・・フランジ、4・・・トップフィルム、5・・・導
電性内容物、6・・・密封部、7・・・気層部、10・
・・高周波電圧発生検出装置、20・・・アース電極、
22・・・容器回転手段、30・・・検知部、31・・
・電極。FIG. 1 is a schematic side view showing an embodiment of the present invention, FIG. 2 is a cross-sectional view showing a plastic container, FIG. 3 is a schematic front view of the embodiment, and FIGS. 4 and 5 are each a diagram showing the invention. FIG. 6 is a schematic diagram showing a modification of the conventional example. 1... Inspection system, 2... Plastic container, 3
... flange, 4 ... top film, 5 ... conductive content, 6 ... sealing part, 7 ... air layer part, 10.
...High frequency voltage generation and detection device, 20... Earth electrode,
22... Container rotation means, 30... Detection unit, 31...
·electrode.
Claims (2)
密封された容器の検査方法であって、前記容器を傾けて
導電性内容物が前記蓋材および容器の密封部に接するよ
うにし、当該密封部と前記容器の導電性内容物が接触す
る部分との間に高周波電圧を印加し、その際の電流値お
よび/または電圧値の変化により前記密封部の密封不良
を検査することを特徴とする密封容器の検査方法。(1) A method for inspecting a container filled with conductive contents and having an opening sealed with a lid, the container being tilted so that the conductive contents come into contact with the lid and the sealed portion of the container. , applying a high frequency voltage between the sealing part and the part where the conductive contents of the container come into contact, and inspecting the sealing failure of the sealing part by the change in the current value and/or voltage value at that time. Features a sealed container inspection method.
底面に直交する軸を中心に回転させながら前記検査を行
うことを特徴とする密封容器の検査方法。(2) A method for inspecting a sealed container according to claim 1, characterized in that the inspection is carried out while rotating the container around an axis perpendicular to its bottom surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1289381A JP2799361B2 (en) | 1989-11-06 | 1989-11-06 | Inspection method of sealed container |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1289381A JP2799361B2 (en) | 1989-11-06 | 1989-11-06 | Inspection method of sealed container |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03150440A true JPH03150440A (en) | 1991-06-26 |
JP2799361B2 JP2799361B2 (en) | 1998-09-17 |
Family
ID=17742482
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1289381A Expired - Fee Related JP2799361B2 (en) | 1989-11-06 | 1989-11-06 | Inspection method of sealed container |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2799361B2 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002189021A (en) * | 2000-12-22 | 2002-07-05 | Nihon Tetra Pak Kk | Quality inspection apparatus |
JP2002243702A (en) * | 2001-02-19 | 2002-08-28 | Nisshin Denshi Kogyo Kk | Equipment for inspecting pin hole |
US6634216B1 (en) * | 1998-07-10 | 2003-10-21 | Joven Denki Kabushiki Kaisha | Inspection method for sealed package |
JP2008510999A (en) * | 2004-08-26 | 2008-04-10 | ダイヤモンド マシン ワークス, インク. | Carrier line orientation self-rotating high voltage leakage detection system and method |
JP2009236505A (en) * | 2008-03-26 | 2009-10-15 | Daiwa Can Co Ltd | Method for inspecting faulty sealing in container |
JP2010060440A (en) * | 2008-09-04 | 2010-03-18 | Daiwa Can Co Ltd | Method for inspecting seal failure of container |
CN109174688A (en) * | 2018-09-04 | 2019-01-11 | 湖南正中制药机械有限公司 | A kind of Flat plastic bottle electronics leak detection system |
KR102469325B1 (en) * | 2022-06-13 | 2022-11-22 | 주식회사 이앤비솔루션 | Device for leak test |
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JPS5184687A (en) * | 1975-01-24 | 1976-07-24 | Densoku Kogyo Kk | DODENSEINONAKAMIOJUSURUMIT SUPUYOKINO PINHOORUTONOKENSAHOHOOYOBISOCHI |
JPS63101728A (en) * | 1986-10-20 | 1988-05-06 | Nikka Densoku Kk | Pinhole presence inspector for sealed packed body |
-
1989
- 1989-11-06 JP JP1289381A patent/JP2799361B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5184687A (en) * | 1975-01-24 | 1976-07-24 | Densoku Kogyo Kk | DODENSEINONAKAMIOJUSURUMIT SUPUYOKINO PINHOORUTONOKENSAHOHOOYOBISOCHI |
JPS63101728A (en) * | 1986-10-20 | 1988-05-06 | Nikka Densoku Kk | Pinhole presence inspector for sealed packed body |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6634216B1 (en) * | 1998-07-10 | 2003-10-21 | Joven Denki Kabushiki Kaisha | Inspection method for sealed package |
JP2002189021A (en) * | 2000-12-22 | 2002-07-05 | Nihon Tetra Pak Kk | Quality inspection apparatus |
JP2002243702A (en) * | 2001-02-19 | 2002-08-28 | Nisshin Denshi Kogyo Kk | Equipment for inspecting pin hole |
JP2008510999A (en) * | 2004-08-26 | 2008-04-10 | ダイヤモンド マシン ワークス, インク. | Carrier line orientation self-rotating high voltage leakage detection system and method |
JP2009236505A (en) * | 2008-03-26 | 2009-10-15 | Daiwa Can Co Ltd | Method for inspecting faulty sealing in container |
JP2010060440A (en) * | 2008-09-04 | 2010-03-18 | Daiwa Can Co Ltd | Method for inspecting seal failure of container |
CN109174688A (en) * | 2018-09-04 | 2019-01-11 | 湖南正中制药机械有限公司 | A kind of Flat plastic bottle electronics leak detection system |
CN109174688B (en) * | 2018-09-04 | 2024-01-02 | 湖南正中制药机械有限公司 | Plastic flat bottle electronic leakage detection system |
KR102469325B1 (en) * | 2022-06-13 | 2022-11-22 | 주식회사 이앤비솔루션 | Device for leak test |
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---|---|
JP2799361B2 (en) | 1998-09-17 |
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