JPH03128842U - - Google Patents

Info

Publication number
JPH03128842U
JPH03128842U JP40009890U JP40009890U JPH03128842U JP H03128842 U JPH03128842 U JP H03128842U JP 40009890 U JP40009890 U JP 40009890U JP 40009890 U JP40009890 U JP 40009890U JP H03128842 U JPH03128842 U JP H03128842U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP40009890U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPH03128842U publication Critical patent/JPH03128842U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3148—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12723—Self check capacity; automatic, periodic step of checking
JP40009890U 1989-12-06 1990-12-05 Pending JPH03128842U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893940386 DE3940386A1 (en) 1989-12-06 1989-12-06 Film-like foil transmission measuring system - uses photodiode detectors whose outputs pass via controlled potentiometers and amplifiers to micro-controller

Publications (1)

Publication Number Publication Date
JPH03128842U true JPH03128842U (en) 1991-12-25

Family

ID=6394946

Family Applications (1)

Application Number Title Priority Date Filing Date
JP40009890U Pending JPH03128842U (en) 1989-12-06 1990-12-05

Country Status (2)

Country Link
JP (1) JPH03128842U (en)
DE (1) DE3940386A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100511367B1 (en) * 2003-05-12 2005-08-30 주식회사 넥스필 System and Method for Measuring Transmittances of Special Coating Film According to Wavelength

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10045645A1 (en) * 2000-09-15 2002-03-28 Bayerische Motoren Werke Ag Quality control device for thermoformed plastic parts
DE10326992A1 (en) * 2003-06-12 2005-01-05 Hänsch, Dirk, Dr. Light transmission measurement instrument for determining the transmission properties of plastic that is to be laser-welded, has an LED light source that transmits light through a sample or reference to a light sensor
JP2021005805A (en) * 2019-06-26 2021-01-14 パナソニックＩｐマネジメント株式会社 Photoelectric sensor, method of measuring resin transmittance in laser resin welding, laser resin welding method, laser processing equipment

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60209122A (en) * 1984-03-29 1985-10-21 Fujitsu Ltd Multispectral optical device
JPS6189543A (en) * 1984-09-24 1986-05-07 コルモーゲン　テクノロジイズ　コーポレイシヨン Method and device for measuring dual beam spectral transmittance
JPS6254129A (en) * 1985-09-03 1987-03-09 Seiko Epson Corp Ultraviolet ray detector
JPH01287669A (en) * 1988-05-16 1989-11-20 Fuji Photo Film Co Ltd Photometric device for picture forming device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2705865A1 (en) * 1977-02-11 1978-08-17 Wolfhart Dr Med Weede Spectacle lens light transmission or absorption measurement - determines photocurrent with object in light path and displays it as percentage of current without object
DE3535515A1 (en) * 1985-10-04 1987-04-09 Pantuc Ing Buero METHOD AND DEVICE FOR ON-LINE MEASUREMENT OF TRANSMISSION OR REFLECTION ON MOVING OBJECTS IN THE AREA OF DETECTABLE ELECTROMAGNETIC RADIATION

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60209122A (en) * 1984-03-29 1985-10-21 Fujitsu Ltd Multispectral optical device
JPS6189543A (en) * 1984-09-24 1986-05-07 コルモーゲン　テクノロジイズ　コーポレイシヨン Method and device for measuring dual beam spectral transmittance
JPS6254129A (en) * 1985-09-03 1987-03-09 Seiko Epson Corp Ultraviolet ray detector
JPH01287669A (en) * 1988-05-16 1989-11-20 Fuji Photo Film Co Ltd Photometric device for picture forming device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100511367B1 (en) * 2003-05-12 2005-08-30 주식회사 넥스필 System and Method for Measuring Transmittances of Special Coating Film According to Wavelength

Also Published As

Publication number Publication date
DE3940386A1 (en) 1991-06-13

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