JPH03127266U - - Google Patents
Info
- Publication number
- JPH03127266U JPH03127266U JP1990035558U JP3555890U JPH03127266U JP H03127266 U JPH03127266 U JP H03127266U JP 1990035558 U JP1990035558 U JP 1990035558U JP 3555890 U JP3555890 U JP 3555890U JP H03127266 U JPH03127266 U JP H03127266U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- plunger
- biasing spring
- buffer member
- locking part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 8
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990035558U JPH0733165Y2 (ja) | 1990-04-02 | 1990-04-02 | コンタクトプローブ |
| GB9106773A GB2243727B (en) | 1990-04-02 | 1991-04-02 | Contact probe in electric conductivity tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990035558U JPH0733165Y2 (ja) | 1990-04-02 | 1990-04-02 | コンタクトプローブ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03127266U true JPH03127266U (US20100056889A1-20100304-C00004.png) | 1991-12-20 |
| JPH0733165Y2 JPH0733165Y2 (ja) | 1995-07-31 |
Family
ID=12445065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990035558U Expired - Lifetime JPH0733165Y2 (ja) | 1990-04-02 | 1990-04-02 | コンタクトプローブ |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPH0733165Y2 (US20100056889A1-20100304-C00004.png) |
| GB (1) | GB2243727B (US20100056889A1-20100304-C00004.png) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE29519413U1 (de) * | 1995-12-07 | 1996-01-25 | TSK Prüfsysteme GmbH, 32457 Porta Westfalica | Prüfstift |
| US5781023A (en) * | 1997-01-31 | 1998-07-14 | Delware Capital Formation, Inc. | Hollow plunger test probe |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2169153B (en) * | 1984-12-28 | 1988-08-03 | Sumitomo Wall Systems Ltd | Connector terminal examination device |
| US4897043A (en) * | 1986-06-23 | 1990-01-30 | Feinmetall Gmbh | Resilient contact pin |
| US4935696A (en) * | 1987-04-16 | 1990-06-19 | Teradyne, Inc. | Test pin assembly for circuit board tester |
-
1990
- 1990-04-02 JP JP1990035558U patent/JPH0733165Y2/ja not_active Expired - Lifetime
-
1991
- 1991-04-02 GB GB9106773A patent/GB2243727B/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| GB2243727B (en) | 1994-07-13 |
| GB9106773D0 (en) | 1991-05-22 |
| JPH0733165Y2 (ja) | 1995-07-31 |
| GB2243727A (en) | 1991-11-06 |
