JPH03123272U - - Google Patents

Info

Publication number
JPH03123272U
JPH03123272U JP3380390U JP3380390U JPH03123272U JP H03123272 U JPH03123272 U JP H03123272U JP 3380390 U JP3380390 U JP 3380390U JP 3380390 U JP3380390 U JP 3380390U JP H03123272 U JPH03123272 U JP H03123272U
Authority
JP
Japan
Prior art keywords
lead
electronic component
probe
testing device
characteristic testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3380390U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3380390U priority Critical patent/JPH03123272U/ja
Publication of JPH03123272U publication Critical patent/JPH03123272U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図と第２図は本考案に係る特性検査装置の
一実施例を示す要部の側面図と正面図、第３図と
第４図は本考案に係る特性検査装置の他の実施例
を示す斜視図とその磁界発生手段の他の具体例を
示す斜視図、第５図と第６図は従来の特性検査装
置の一具体例を示す要部の側面図とケルビン接触
に係る測子の斜視図である。 １……電子部品、２……リード、７，１１……
テーブル、８，１２……測子、９，１３，１４，
１７，１８……ガイド手段（磁界発生手段）。 1 and 2 are side and front views of essential parts showing one embodiment of the characteristic testing device according to the present invention, and FIGS. 3 and 4 are other embodiments of the characteristic testing device according to the present invention. FIG. 5 and FIG. 6 are side views of essential parts of a specific example of a conventional characteristic testing device and a probe related to Kelvin contact. FIG. 1...Electronic component, 2...Lead, 7,11...
Table, 8, 12...Member, 9, 13, 14,
17, 18... Guide means (magnetic field generating means).

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] テーブル上に載置されたリード付き電子部品の
リードに上方から当接する測子と、上記測子を電
子部品のリード上にガイドするガイド手段とを具
備したことを特徴とする特性検査装置。 A characteristic testing device comprising: a probe that abuts from above a lead of an electronic component with a lead placed on a table; and a guide means that guides the probe onto the lead of the electronic component.
JP3380390U 1990-03-29 1990-03-29 Pending JPH03123272U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3380390U JPH03123272U (en) 1990-03-29 1990-03-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3380390U JPH03123272U (en) 1990-03-29 1990-03-29

Publications (1)

Publication Number Publication Date
JPH03123272U true JPH03123272U (en) 1991-12-16

Family

ID=31537746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3380390U Pending JPH03123272U (en) 1990-03-29 1990-03-29

Country Status (1)

Country Link
JP (1) JPH03123272U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006068156A1 (en) * 2004-12-22 2006-06-29 Opto System Co., Ltd. Kelvin probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006068156A1 (en) * 2004-12-22 2006-06-29 Opto System Co., Ltd. Kelvin probe

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