JPH03122415U - - Google Patents

Info

Publication number
JPH03122415U
JPH03122415U JP3100990U JP3100990U JPH03122415U JP H03122415 U JPH03122415 U JP H03122415U JP 3100990 U JP3100990 U JP 3100990U JP 3100990 U JP3100990 U JP 3100990U JP H03122415 U JPH03122415 U JP H03122415U
Authority
JP
Japan
Prior art keywords
micro
molded object
observed image
faces
switching means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3100990U
Other languages
Japanese (ja)
Other versions
JPH073320Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3100990U priority Critical patent/JPH073320Y2/en
Publication of JPH03122415U publication Critical patent/JPH03122415U/ja
Application granted granted Critical
Publication of JPH073320Y2 publication Critical patent/JPH073320Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Microscoopes, Condenser (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案の一実施例の一部を切欠いて
示す側面図、第2図は第1図示の第2のミラーの
斜視図、第3図aおよびbはそれぞれ、TABテ
ープの表面および裏面の観察像の説明図、第4図
はTABテープの一例を示す平面図、第5図は表
裏面の観察像の関係を明らかにするために検査対
象物として想定した長方体の斜視図、第6図aお
よびbはそれぞれ、第5図示の長方体の表面およ
び裏面の観察像の説明図、第7図はこの考案の一
実施例におけるスライド機構を示す平面図、第8
図はそのフローテイングベースを示す断面図、第
9図は第8図の−線に沿う断面図、第10図
は第8図の−線に沿う断面図、第11図は第
7図示のX−Y軸テーブルの固定機構部を示す縦
断面図、第12図はそのX−Y軸テーブルの固定
機構部を分解して示す縦断面図である。 1……顕微鏡台、2……X−Y軸テーブル、3
……テーブルベース、6……顕微鏡、10……T
ABテープ(微細成形物)、22……第4のミラ
ー(切換手段)。
FIG. 1 is a partially cutaway side view of an embodiment of the invention, FIG. 2 is a perspective view of the second mirror shown in FIG. 3, and FIGS. An explanatory diagram of an observed image of the back side, Fig. 4 is a plan view showing an example of a TAB tape, and Fig. 5 is a perspective view of a rectangular body assumed as an object to be inspected to clarify the relationship between observed images of the front and back sides. , FIGS. 6a and 6b are explanatory diagrams of observed images of the front and back surfaces of the rectangular body shown in FIG.
The figure is a sectional view showing the floating base, FIG. 9 is a sectional view taken along the - line in FIG. 8, FIG. 10 is a sectional view taken along the - line in FIG. 8, and FIG. 11 is a sectional view taken along the - A vertical sectional view showing the fixing mechanism of the Y-axis table; FIG. 12 is an exploded longitudinal sectional view showing the fixing mechanism of the X-Y-axis table. 1...Microscope table, 2...X-Y axis table, 3
...Table base, 6...Microscope, 10...T
AB tape (fine molded product), 22... fourth mirror (switching means).

Claims (1)

【実用新案登録請求の範囲】 微細成形物の表裏両面を光学的に検査する検査
装置において、 微細成形物の表面と対向し、該微細成形物の表
面の観察像を取り出す第1の光学系と、 前記微細成形物の裏面と対向し、前記微細成形
物の裏面の観察像を、前記微細成形物の表面の観
察像と上下左右の位置関係を一致させて取り出す
第2の光学系と、 前記第1および第2の光学系のいずれか一方か
らの光出力を選択的に取り出す切換手段と、 該切換手段から取り出された光出力を受光して
検査に供する手段と を具備してなることを特徴とする微細成形物の表
裏面検査装置。
[Claims for Utility Model Registration] An inspection device for optically inspecting both the front and back surfaces of a micro-molded object, comprising: a first optical system that faces the surface of the micro-molded object and takes out an observed image of the surface of the micro-molded object; , a second optical system that faces the back surface of the micro-molded object and takes out an observed image of the back surface of the micro-molded object while matching the vertical and horizontal positional relationship with the observed image of the surface of the micro-molded object; A switching means for selectively extracting the optical output from either one of the first and second optical systems, and a means for receiving the optical output extracted from the switching means and providing it for inspection. Features: A device for inspecting the front and back surfaces of fine molded products.
JP3100990U 1990-03-28 1990-03-28 Front and back surface inspection equipment for fine molded products Expired - Lifetime JPH073320Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3100990U JPH073320Y2 (en) 1990-03-28 1990-03-28 Front and back surface inspection equipment for fine molded products

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3100990U JPH073320Y2 (en) 1990-03-28 1990-03-28 Front and back surface inspection equipment for fine molded products

Publications (2)

Publication Number Publication Date
JPH03122415U true JPH03122415U (en) 1991-12-13
JPH073320Y2 JPH073320Y2 (en) 1995-01-30

Family

ID=31533736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3100990U Expired - Lifetime JPH073320Y2 (en) 1990-03-28 1990-03-28 Front and back surface inspection equipment for fine molded products

Country Status (1)

Country Link
JP (1) JPH073320Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105749A (en) * 2004-10-05 2006-04-20 Shindenshi Corp Visual inspection device of surface mounting base board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105749A (en) * 2004-10-05 2006-04-20 Shindenshi Corp Visual inspection device of surface mounting base board

Also Published As

Publication number Publication date
JPH073320Y2 (en) 1995-01-30

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