JPH03119749U - - Google Patents

Info

Publication number
JPH03119749U
JPH03119749U JP2855190U JP2855190U JPH03119749U JP H03119749 U JPH03119749 U JP H03119749U JP 2855190 U JP2855190 U JP 2855190U JP 2855190 U JP2855190 U JP 2855190U JP H03119749 U JPH03119749 U JP H03119749U
Authority
JP
Japan
Prior art keywords
sample cell
particle size
size distribution
diffraction
scattered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2855190U
Other languages
English (en)
Japanese (ja)
Other versions
JP2526862Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990028551U priority Critical patent/JP2526862Y2/ja
Publication of JPH03119749U publication Critical patent/JPH03119749U/ja
Application granted granted Critical
Publication of JP2526862Y2 publication Critical patent/JP2526862Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1990028551U 1990-03-19 1990-03-19 光回折、散乱式粒度分布測定装置 Expired - Fee Related JP2526862Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990028551U JP2526862Y2 (ja) 1990-03-19 1990-03-19 光回折、散乱式粒度分布測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990028551U JP2526862Y2 (ja) 1990-03-19 1990-03-19 光回折、散乱式粒度分布測定装置

Publications (2)

Publication Number Publication Date
JPH03119749U true JPH03119749U (fr) 1991-12-10
JP2526862Y2 JP2526862Y2 (ja) 1997-02-26

Family

ID=31531346

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990028551U Expired - Fee Related JP2526862Y2 (ja) 1990-03-19 1990-03-19 光回折、散乱式粒度分布測定装置

Country Status (1)

Country Link
JP (1) JP2526862Y2 (fr)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5682543U (fr) * 1979-11-15 1981-07-03
JPS6293747U (fr) * 1985-12-02 1987-06-15

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5682543U (fr) * 1979-11-15 1981-07-03
JPS6293747U (fr) * 1985-12-02 1987-06-15

Also Published As

Publication number Publication date
JP2526862Y2 (ja) 1997-02-26

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees