JPH0311621A - Heat treatment apparatus for semiconductor wafer - Google Patents
Heat treatment apparatus for semiconductor waferInfo
- Publication number
- JPH0311621A JPH0311621A JP14724189A JP14724189A JPH0311621A JP H0311621 A JPH0311621 A JP H0311621A JP 14724189 A JP14724189 A JP 14724189A JP 14724189 A JP14724189 A JP 14724189A JP H0311621 A JPH0311621 A JP H0311621A
- Authority
- JP
- Japan
- Prior art keywords
- reaction tube
- boat
- reaction
- semiconductor wafer
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 47
- 238000010438 heat treatment Methods 0.000 title claims abstract description 21
- 235000012431 wafers Nutrition 0.000 claims abstract description 45
- 239000007789 gas Substances 0.000 abstract description 23
- 239000012495 reaction gas Substances 0.000 abstract description 7
- 239000011261 inert gas Substances 0.000 description 10
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 239000002699 waste material Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体製造工程に使用する半導体ウェハ熱処理
装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor wafer heat treatment apparatus used in a semiconductor manufacturing process.
半導体製造工程において、半導体ウェハを高温に維持さ
れた反応管内に挿入し、反応ガスを反応管内に流して熱
処理する工程がある。2. Description of the Related Art In semiconductor manufacturing processes, there is a step in which a semiconductor wafer is inserted into a reaction tube maintained at a high temperature, and a reaction gas is flowed into the reaction tube to perform heat treatment.
従来、この種の縦型の熱処理装置は、以下の構成及び動
作機能を備えていた。すなわち、反応管はヒーター内に
設置されて高温に加熱され、反応管内には不活性ガスが
流入されている。Conventionally, this type of vertical heat treatment apparatus has the following configuration and operating functions. That is, the reaction tube is placed in a heater and heated to a high temperature, and an inert gas is flowed into the reaction tube.
次に、半導体ウェハを水平かつ平行に収納したボートを
反応管内に挿入する。挿入後、反応管内のガスを不活性
ガスから反応ガスに切換えて流入させ、半導体ウェハは
熱処理される。所定処理時間経過後、反応ガスから不活
性ガスに再度切換えられ、半導体ウェハが収納されたボ
ートは搬出される。Next, a boat containing semiconductor wafers horizontally and in parallel is inserted into the reaction tube. After insertion, the gas in the reaction tube is switched from an inert gas to a reaction gas, and the semiconductor wafer is heat-treated. After a predetermined processing time has elapsed, the reactive gas is switched again to an inert gas, and the boat containing the semiconductor wafers is taken out.
従来の熱処理装置を図を用いて説明する。第3図はその
構成概要を示す断面図である。A conventional heat treatment apparatus will be explained using figures. FIG. 3 is a cross-sectional view showing an outline of its configuration.
半導体ウェハ]はボー1−2内に水平かつ平行に収納さ
れ、ボート2は断熱キャップ3上に搭載され、断熱キャ
ップ3は上下駆動機構部4と連結されている。反応管5
はヒーター6内に固定されている。Semiconductor wafers] are housed horizontally and in parallel in the boat 1-2, the boat 2 is mounted on a heat insulating cap 3, and the heat insulating cap 3 is connected to a vertical drive mechanism section 4. Reaction tube 5
is fixed inside the heater 6.
ガス配管13は、ヒータ−6内部を反応管5の側面に沿
って反応管5の頭部に接続され、カスユニット10にて
不活性ガスと反応ガスとが切換えられ、圧力及び流量を
調整されたガスは、ガス配管13を通り反応管5内部に
流入する。反応管5には排気配管14が接続され、反応
管5内部のガスは排気配管14を通り排気される。The gas pipe 13 is connected inside the heater 6 to the head of the reaction tube 5 along the side surface of the reaction tube 5, and the inert gas and reaction gas are switched in the gas unit 10, and the pressure and flow rate are adjusted. The gas flows into the reaction tube 5 through the gas pipe 13. An exhaust pipe 14 is connected to the reaction tube 5, and the gas inside the reaction tube 5 is exhausted through the exhaust pipe 14.
ここでボート2、断熱キャップ3、反応管5、カス配管
13は、高温における不純物拡散を防止゛するため、高
純度の石英等を材料としているのが一般的である。Here, the boat 2, the heat insulating cap 3, the reaction tube 5, and the waste pipe 13 are generally made of high-purity quartz or the like in order to prevent impurity diffusion at high temperatures.
半導体ウェハ1はポート2内に刻まれた溝に等間隔に収
納され、ボート2は断熱キャップ3上に搭載される。反
応管5内部はヒーター6により高温に加熱され、且つカ
スユニット10により圧力及び流量の調整された不活性
カスがカス配管1Bを通り反応管5内に流入され、不活
性ガスにて充満されている。Semiconductor wafers 1 are housed at regular intervals in grooves cut into ports 2, and boat 2 is mounted on a heat insulating cap 3. The inside of the reaction tube 5 is heated to a high temperature by the heater 6, and the inert dregs whose pressure and flow rate are adjusted by the dregs unit 10 flows into the reaction tube 5 through the dregs pipe 1B, and is filled with inert gas. There is.
次いで半導体ウェハ1、ボート2、断熱キャップ3は、
ボー1−上下駆動機横部4の上昇動作により反応管5内
に挿入され、高温に加熱される。挿入後、カスユニット
10にて圧力及び流量の調整された反応カスか反応管5
内に流入され、熱処理が行われる。所定時間経過後、再
度ガスユニット10にて不活性カスに切換えられ、反応
ガスは排気配管14を通り反応管5外に排出される。そ
して、半導体ウェハ1、ボート2、断熱キャップ3は、
ホーl−上下駆動機構部4の下降動作により下降し、下
降後、常温に冷却されて熱処理は終了する。Next, the semiconductor wafer 1, boat 2, and insulation cap 3 are
The bow 1 is inserted into the reaction tube 5 by the upward movement of the horizontal portion 4 of the vertical drive machine, and is heated to a high temperature. After insertion, the reaction mass or reaction tube 5 whose pressure and flow rate are adjusted in the mass unit 10
heat treatment is carried out. After a predetermined period of time has elapsed, the gas is switched to inert gas again in the gas unit 10, and the reaction gas is discharged to the outside of the reaction tube 5 through the exhaust pipe 14. The semiconductor wafer 1, boat 2, and insulation cap 3 are
The hole L is lowered by the lowering operation of the vertical drive mechanism 4, and after lowering, it is cooled to room temperature and the heat treatment is completed.
上述した従来の半導体ウェハ熱処理装置は、半導体ウェ
ハの反応管内への挿入時に周囲雰囲気と隔離されていな
いため、反応管内に周囲雰囲気を巻き込み、加熱中の半
導体ウェハと周囲雰囲気中の反応ガスとが反応し、制御
困難な熱処理が行われる。In the conventional semiconductor wafer heat treatment apparatus described above, the semiconductor wafer is not isolated from the surrounding atmosphere when it is inserted into the reaction tube, so the surrounding atmosphere is drawn into the reaction tube, and the semiconductor wafer being heated and the reaction gas in the surrounding atmosphere are mixed. reaction, resulting in heat treatment that is difficult to control.
又、反応管口から反応管内部への温度変化が大きい構造
てあり、半導体ウェハは急激な温度変化に脆弱なためボ
ート」1下動作を遅くする必要かあり、そのためポート
内の上部と下部の熱履歴か大きく異なるという問題があ
る。In addition, the structure has a large temperature change from the reaction tube opening to the inside of the reaction tube, and since semiconductor wafers are vulnerable to sudden temperature changes, it is necessary to slow down the bottom operation of the boat. There is a problem that the thermal history is significantly different.
更に、反応管からの半導体ウェハ搬出時に、周囲雰囲気
中に高温の半導体ウェハがさらされるため、周囲雰囲気
中の反応ガスと半導体ウェハとか反応してしまうという
欠点がある。Furthermore, since the high-temperature semiconductor wafer is exposed to the surrounding atmosphere when the semiconductor wafer is taken out of the reaction tube, there is a drawback that the semiconductor wafer reacts with the reaction gas in the surrounding atmosphere.
従来の熱処理装置では、上記問題点の対策として、半導
体ウェハ及びポート搬入用時に不活性カスの流量を多く
していたが、反応管内の温度分布を悪くするという問題
があった。In conventional heat treatment apparatuses, as a countermeasure to the above-mentioned problems, the flow rate of inert scum is increased when carrying in semiconductor wafers and ports, but this has the problem of worsening the temperature distribution within the reaction tube.
又、他の対策として、反応管内を低温の状態にして半導
体ウェハを挿入し、挿入完了後加熱し、規定温度到達後
、不活性ガスから反応ガスに切換え、一定処理時間経過
後、再び低温の状態にして半導体ウェハを搬出する動作
を行っているが、熱処理時間が非常に長くなる問題があ
った。In addition, as another countermeasure, the inside of the reaction tube is kept at a low temperature, the semiconductor wafer is inserted, and after the insertion is completed, the semiconductor wafer is heated, and after the specified temperature is reached, the inert gas is switched to the reactive gas, and after a certain processing time has passed, the semiconductor wafer is inserted again into the low temperature state. Although the semiconductor wafer is transported out of the wafer in the same state, there is a problem in that the heat treatment time is extremely long.
本発明は、半導体ウェハを収納したボートを搭載して上
下し縦型反応管へのボートの挿入搬出を行なうボート上
下駆動機構を備えた半導体ウェハ熱処理装置において、
前記反応管を上下させヒーター内に出し入れする反応管
上下駆動機構と、前記反応管を降下させて前記ホード及
び半導体ウェハを密閉し反応管内部を真空引きする真空
ポンプとを設けた半導体ウェハ熱処理装置である。The present invention provides a semiconductor wafer heat processing apparatus equipped with a boat vertical drive mechanism that carries a boat containing semiconductor wafers up and down, and inserts and unloads the boat into a vertical reaction tube.
A semiconductor wafer heat treatment apparatus provided with a reaction tube vertical drive mechanism that moves the reaction tube up and down to take it in and out of a heater, and a vacuum pump that lowers the reaction tube, seals the hoard and semiconductor wafer, and evacuates the inside of the reaction tube. It is.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例の構成を示す断面図である。FIG. 1 is a sectional view showing the configuration of an embodiment of the present invention.
半導体ウェハ1はボーl〜2に水平かつ平行に収納され
、ボート2は断熱キャップ3」二に搭載され、断熱キャ
ップ3はホード」二下駆動機構部4と連結されている。The semiconductor wafers 1 are stored horizontally and parallelly in the bowls 1 to 2, the boats 2 are mounted on a heat insulating cap 3, and the heat insulating cap 3 is connected to a lower drive mechanism 4 in the hoard.
断熱キャップ3には、ガスをボー1〜2の上部に導くイ
ンジェクター8と、インジェクター8にカスを導くガス
配管つと、排気配管1]とが接続されている。カス配管
9には、ガスの切換え、流量及び圧力の調整を行うカス
ユニット10が接続されている。排気配管]1には、真
空ポンプ12が接続されている。The heat insulating cap 3 is connected to an injector 8 that guides gas to the upper part of the bows 1 and 2, a gas pipe that guides waste to the injector 8, and an exhaust pipe 1]. A waste unit 10 is connected to the waste pipe 9 for switching gas and adjusting flow rate and pressure. A vacuum pump 12 is connected to the exhaust pipe 1.
ガス配管9及び排気配管]0は、断熱キャップ3が上下
動するため、断熱キャップ3の下部分で伸縮するように
なっている。反応管5は、反応管上下駆動機構部7によ
りヒータ−6内部に挿入され、又、ボート2を覆う操上
下動する。Gas piping 9 and exhaust piping] 0 is designed to expand and contract at the lower part of the insulation cap 3 because the insulation cap 3 moves up and down. The reaction tube 5 is inserted into the heater 6 by a reaction tube vertical drive mechanism 7, and is moved up and down to cover the boat 2.
第2図(a)、(b)、(C)は本発明の一実施例の動
作図である。FIGS. 2(a), 2(b), and 2(C) are operational diagrams of an embodiment of the present invention.
図(a)に示すように、反応管5は反応管上下駆動機構
部7により押し上げられ、ヒーター6内に収納されてい
る。断熱キャップ3はボート上下駆動機構部4により下
降しており、半導体ウェハ1が等間隔に整然とボート2
に収納され、ボート2は断熱キャップ3上に搭載されて
いる。As shown in Figure (a), the reaction tube 5 is pushed up by the reaction tube vertical drive mechanism 7 and housed in the heater 6. The heat insulating cap 3 is lowered by the boat vertical drive mechanism 4, and the semiconductor wafers 1 are placed on the boat 2 in an orderly manner at equal intervals.
The boat 2 is mounted on a heat insulating cap 3.
次に、図(b′)に示すように、反応管5は反応管上下
駆動機構部7の下降動作により半導体ウェハ1及びボー
ト2を覆い、反応管5内は密閉状態となる。その後に真
空ポンプ12を動作させ、反応管5内部を真空状態にす
る。Next, as shown in Figure (b'), the reaction tube 5 covers the semiconductor wafer 1 and the boat 2 by the downward movement of the reaction tube vertical drive mechanism section 7, and the inside of the reaction tube 5 becomes sealed. Thereafter, the vacuum pump 12 is operated to bring the inside of the reaction tube 5 into a vacuum state.
次に、図(c)に示すように、反応管上下駆動機構部7
及びボート上下駆動機構部4の連動する上昇動作により
、反応管5は内部を真空状態にしたままヒーター6内に
挿入される。そして、ガス配管9を通り不活性ガスが反
応管5内に流入し、半導体ウェハ1−及びホード2は加
熱される。Next, as shown in Figure (c), the reaction tube vertical drive mechanism section 7
The reaction tube 5 is inserted into the heater 6 while the inside thereof is kept in a vacuum state by the interlocking upward movement of the boat vertical drive mechanism section 4. Then, an inert gas flows into the reaction tube 5 through the gas pipe 9, and the semiconductor wafer 1- and hoard 2 are heated.
次に、不活性ガスは反応ガスに切換えられ、熱処理が行
われる。所定時間経過後、再度真空ポンプ12を動作さ
せ、反応管5内を真空状態にし、挿入時と反対に反応管
上下駆動機構部7とボート上下駆動機構部4とは連動し
て下降し、反応管5内に不活性ガスを流入し、冷却する
。Next, the inert gas is switched to a reactive gas and heat treatment is performed. After a predetermined period of time has elapsed, the vacuum pump 12 is operated again to create a vacuum inside the reaction tube 5, and the reaction tube vertical drive mechanism 7 and the boat vertical drive mechanism 4 move down in conjunction with each other, opposite to the time of insertion, and the reaction begins. Inert gas is introduced into the tube 5 for cooling.
最後に、反応管5のみが反応管上下駆動機構部7の上昇
動作によりヒーター6内に挿入され、半導体ウェハ1及
びボー1−2は断熱キャップ3より取り出される。Finally, only the reaction tube 5 is inserted into the heater 6 by the upward movement of the reaction tube vertical drive mechanism 7, and the semiconductor wafer 1 and the board 1-2 are taken out from the heat insulating cap 3.
以上説明したように本発明は、半導体ウェハを加熱する
前に反応管を下降させて半導体ウェハを覆い、反応管内
を密閉真空状態にすることによって半導体ウェハ加熱時
の周囲雰囲気の混入はなくなり、反応はヒーター内の規
定温度時間にのみ行われる。As explained above, in the present invention, before heating the semiconductor wafer, the reaction tube is lowered to cover the semiconductor wafer and the inside of the reaction tube is brought into a sealed vacuum state, thereby eliminating the mixing of the surrounding atmosphere when heating the semiconductor wafer and causing the reaction to occur. is carried out only during the specified temperature time in the heater.
又、周囲雰囲気の混入の問題がないため、半導体ウェハ
のヒーター内への挿入搬出速度を速くすることができ、
ボート内上下間の熱履歴の差を少なくすることができる
。In addition, since there is no problem of contamination with the surrounding atmosphere, the speed at which semiconductor wafers are inserted into and taken out of the heater can be increased.
The difference in thermal history between the upper and lower parts of the boat can be reduced.
以上のように反応がヒーター内のみで行われ、ボート内
の上下間熱履歴差を少なくする熱処理を可能としたため
、良質で且つばらつきのない半導体ウェハの熱処理がで
きる効果がある。As described above, the reaction is carried out only within the heater, making it possible to perform heat treatment that reduces the difference in thermal history between the upper and lower parts of the boat, thereby making it possible to heat-treat semiconductor wafers of high quality and without variation.
【図面の簡単な説明】
第1図は本発明の一実施例を示す断面図、第2図(a)
、(b)、(c)はその動作図、第3図は従来の熱処理
装置を示す断面図である。
1・・半導体ウェハ、2・・・ボート、3・・・断熱キ
ャップ、4・・・ボート上下駆動機構部、5・・・反応
管、6・・・ヒーター、7・・・反応管上下駆動機構部
、8・・インジェクター、9・・・ガス配管、10・・
・ガスユニット、11・・・排気配管、12・・・真空
ポンプ、13・・・ガス配管、14・・・排気配管。[Brief Description of the Drawings] Fig. 1 is a sectional view showing an embodiment of the present invention, Fig. 2(a)
, (b) and (c) are operational diagrams thereof, and FIG. 3 is a sectional view showing a conventional heat treatment apparatus. DESCRIPTION OF SYMBOLS 1...Semiconductor wafer, 2...Boat, 3...Insulating cap, 4...Boat vertical drive mechanism section, 5...Reaction tube, 6...Heater, 7...Reaction tube vertical drive Mechanism section, 8... Injector, 9... Gas piping, 10...
- Gas unit, 11... Exhaust piping, 12... Vacuum pump, 13... Gas piping, 14... Exhaust piping.
Claims (1)
応管へのボートの挿入搬出を行なうボート上下駆動機構
を備えた半導体ウェハ熱処理装置において、前記反応管
を上下させヒーター内に出し入れする反応管上下駆動機
構と、前記反応管を降下させて前記ボート及び半導体ウ
ェハを密閉し反応管内部を真空引きする真空ポンプとを
設けたことを特徴とする半導体ウェハ熱処理装置。In a semiconductor wafer heat treatment apparatus equipped with a boat vertical drive mechanism that carries a boat containing semiconductor wafers and moves the boat up and down to insert and take out the boat into and out of a vertical reaction tube, a reaction tube that moves the reaction tube up and down to take it in and out of a heater. 1. A semiconductor wafer heat treatment apparatus, comprising: a vertical drive mechanism; and a vacuum pump that lowers the reaction tube, seals the boat and the semiconductor wafer, and evacuates the inside of the reaction tube.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14724189A JPH0311621A (en) | 1989-06-08 | 1989-06-08 | Heat treatment apparatus for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14724189A JPH0311621A (en) | 1989-06-08 | 1989-06-08 | Heat treatment apparatus for semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0311621A true JPH0311621A (en) | 1991-01-18 |
Family
ID=15425771
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14724189A Pending JPH0311621A (en) | 1989-06-08 | 1989-06-08 | Heat treatment apparatus for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0311621A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005197373A (en) * | 2004-01-05 | 2005-07-21 | Hitachi Kokusai Electric Inc | Substrate treatment device |
JP2005526370A (en) * | 2001-05-14 | 2005-09-02 | セムコ エンジニアリング エス.アー. | Method and apparatus for doping, diffusion and oxidation of silicon wafers under reduced pressure |
EP1976329A2 (en) | 2007-03-26 | 2008-10-01 | Funai Electric Co., Ltd. | Connector substrate and speaker input terminal connection structure |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62122123A (en) * | 1985-11-21 | 1987-06-03 | Toshiba Corp | Vertical type thermal treatment equipment |
JPS6381920A (en) * | 1986-09-26 | 1988-04-12 | Hitachi Ltd | Processing equipment |
-
1989
- 1989-06-08 JP JP14724189A patent/JPH0311621A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62122123A (en) * | 1985-11-21 | 1987-06-03 | Toshiba Corp | Vertical type thermal treatment equipment |
JPS6381920A (en) * | 1986-09-26 | 1988-04-12 | Hitachi Ltd | Processing equipment |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005526370A (en) * | 2001-05-14 | 2005-09-02 | セムコ エンジニアリング エス.アー. | Method and apparatus for doping, diffusion and oxidation of silicon wafers under reduced pressure |
JP2005197373A (en) * | 2004-01-05 | 2005-07-21 | Hitachi Kokusai Electric Inc | Substrate treatment device |
EP1976329A2 (en) | 2007-03-26 | 2008-10-01 | Funai Electric Co., Ltd. | Connector substrate and speaker input terminal connection structure |
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