JPH03110355U - - Google Patents

Info

Publication number
JPH03110355U
JPH03110355U JP2034390U JP2034390U JPH03110355U JP H03110355 U JPH03110355 U JP H03110355U JP 2034390 U JP2034390 U JP 2034390U JP 2034390 U JP2034390 U JP 2034390U JP H03110355 U JPH03110355 U JP H03110355U
Authority
JP
Japan
Prior art keywords
grips
pair
memory alloy
shape memory
cycle fatigue
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2034390U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2034390U priority Critical patent/JPH03110355U/ja
Publication of JPH03110355U publication Critical patent/JPH03110355U/ja
Pending legal-status Critical Current

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Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案低サイクル疲労試験装置の一実
施例の模式図、第2図は同上における形状記憶合
金製グリツプの形状変化例の説明図、第3図は形
状記憶合金の温度に伴う物性変化を示す説明図で
ある。第4図は従来の低サイクル疲労試験装置の
模式図である。 1……試験片、2a,2b……形状記憶合金製
グリツプ、2c……グリツプ、3……装置枠、4
……ヒーター、5……熱電対、6……ロードセル
、7……変位計、8……波形発振器、9……マイ
クロコンピユーター、10……温度調節器、11
……負荷加振器、12……油圧源。
Figure 1 is a schematic diagram of one embodiment of the low-cycle fatigue testing device of the present invention, Figure 2 is an explanatory diagram of an example of shape change of the grip made of shape memory alloy in the above, and Figure 3 is physical properties of shape memory alloy as a function of temperature. It is an explanatory diagram showing a change. FIG. 4 is a schematic diagram of a conventional low cycle fatigue test device. 1... Test piece, 2a, 2b... Shape memory alloy grip, 2c... Grip, 3... Device frame, 4
... Heater, 5 ... Thermocouple, 6 ... Load cell, 7 ... Displacement meter, 8 ... Waveform oscillator, 9 ... Microcomputer, 10 ... Temperature controller, 11
...Load exciter, 12...Hydraulic power source.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 形状記憶合金で形成され対向する一端が試験片
の両端を挾持するとともに他端がそれぞれ装置枠
に固定された1対のグリツプと、上記各グリツプ
に巻装されるとともに温度調節器に接続されたヒ
ーターとを具えたことを特徴とする低サイクル疲
労試験装置。
A pair of grips made of a shape memory alloy, one end of which faces each other and which holds both ends of the test piece, and the other end of which is fixed to the device frame, respectively, and a pair of grips that are wrapped around each of the grips and connected to a temperature controller. A low cycle fatigue testing device characterized by comprising a heater.
JP2034390U 1990-02-28 1990-02-28 Pending JPH03110355U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2034390U JPH03110355U (en) 1990-02-28 1990-02-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2034390U JPH03110355U (en) 1990-02-28 1990-02-28

Publications (1)

Publication Number Publication Date
JPH03110355U true JPH03110355U (en) 1991-11-12

Family

ID=31523435

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2034390U Pending JPH03110355U (en) 1990-02-28 1990-02-28

Country Status (1)

Country Link
JP (1) JPH03110355U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006064649A (en) * 2004-08-30 2006-03-09 National Institute For Materials Science High-temperature fatigue test method capable of accurate temperature control and measurement using small-sized furnace

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006064649A (en) * 2004-08-30 2006-03-09 National Institute For Materials Science High-temperature fatigue test method capable of accurate temperature control and measurement using small-sized furnace
JP4524369B2 (en) * 2004-08-30 2010-08-18 独立行政法人物質・材料研究機構 High temperature fatigue test method

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