JPH0299301U - - Google Patents

Info

Publication number
JPH0299301U
JPH0299301U JP778589U JP778589U JPH0299301U JP H0299301 U JPH0299301 U JP H0299301U JP 778589 U JP778589 U JP 778589U JP 778589 U JP778589 U JP 778589U JP H0299301 U JPH0299301 U JP H0299301U
Authority
JP
Japan
Prior art keywords
detector
measured
circumferential surface
specific position
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP778589U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP778589U priority Critical patent/JPH0299301U/ja
Publication of JPH0299301U publication Critical patent/JPH0299301U/ja
Pending legal-status Critical Current

Links

Landscapes

  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP778589U 1989-01-26 1989-01-26 Pending JPH0299301U (nl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP778589U JPH0299301U (nl) 1989-01-26 1989-01-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP778589U JPH0299301U (nl) 1989-01-26 1989-01-26

Publications (1)

Publication Number Publication Date
JPH0299301U true JPH0299301U (nl) 1990-08-08

Family

ID=31213095

Family Applications (1)

Application Number Title Priority Date Filing Date
JP778589U Pending JPH0299301U (nl) 1989-01-26 1989-01-26

Country Status (1)

Country Link
JP (1) JPH0299301U (nl)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100509344B1 (ko) * 2001-12-29 2005-08-22 학교법인 한마학원 진원도 측정용 치구
KR100530188B1 (ko) * 2003-04-30 2005-11-23 벤다선광공업 주식회사 엔진구동용링기어의 진원도 자동조정장치
JP2013108757A (ja) * 2011-11-17 2013-06-06 Tokyo Seimitsu Co Ltd 真円度測定装置
JP2014077765A (ja) * 2012-10-12 2014-05-01 Tokyo Seimitsu Co Ltd 真円度測定装置
JP2015083986A (ja) * 2014-12-22 2015-04-30 株式会社東京精密 真円度測定装置
JP2015179093A (ja) * 2015-05-15 2015-10-08 株式会社東京精密 真円度測定装置および真円度測定方法
JP2016080436A (ja) * 2014-10-14 2016-05-16 日本精工株式会社 表面性状測定装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4730825U (nl) * 1971-04-28 1972-12-07
JPS5146153A (en) * 1974-08-21 1976-04-20 Rank Organisation Ltd Shinendosokuteihoho oyobisochi

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4730825U (nl) * 1971-04-28 1972-12-07
JPS5146153A (en) * 1974-08-21 1976-04-20 Rank Organisation Ltd Shinendosokuteihoho oyobisochi

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100509344B1 (ko) * 2001-12-29 2005-08-22 학교법인 한마학원 진원도 측정용 치구
KR100530188B1 (ko) * 2003-04-30 2005-11-23 벤다선광공업 주식회사 엔진구동용링기어의 진원도 자동조정장치
JP2013108757A (ja) * 2011-11-17 2013-06-06 Tokyo Seimitsu Co Ltd 真円度測定装置
JP2014077765A (ja) * 2012-10-12 2014-05-01 Tokyo Seimitsu Co Ltd 真円度測定装置
JP2016080436A (ja) * 2014-10-14 2016-05-16 日本精工株式会社 表面性状測定装置
JP2015083986A (ja) * 2014-12-22 2015-04-30 株式会社東京精密 真円度測定装置
JP2015179093A (ja) * 2015-05-15 2015-10-08 株式会社東京精密 真円度測定装置および真円度測定方法

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