JPH0298618A - Positioning detector - Google Patents

Positioning detector

Info

Publication number
JPH0298618A
JPH0298618A JP25131388A JP25131388A JPH0298618A JP H0298618 A JPH0298618 A JP H0298618A JP 25131388 A JP25131388 A JP 25131388A JP 25131388 A JP25131388 A JP 25131388A JP H0298618 A JPH0298618 A JP H0298618A
Authority
JP
Japan
Prior art keywords
laser beam
sample
optical path
reflected light
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25131388A
Other languages
Japanese (ja)
Inventor
Masataka Ashida
芦田 昌登
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP25131388A priority Critical patent/JPH0298618A/en
Publication of JPH0298618A publication Critical patent/JPH0298618A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To separate the movement of a laser spot caused by the positional deviation of a sample from that caused by the tilt of the sample by splitting a laser beam from a light source into two light beams by a beam splitter and conducting one light beam through a polarized light beam splitter and the other light beam through a reflecting mirror to the surface of the sample. CONSTITUTION:The laser beam 3 from the light source part 1 is splitted into a straight advancing light beam 5 and a reflected light beam 11 by the beam splitter 4 and the light beam 5 is conducted to the surface of the sample 2 through the polarized light beam splitter 6, a 1/4 wavelength plate 7 and a lens 8. Meanwhile, the light beam 11 is conducted to the surface of the sample 2 through the reflecting mirror 12. In the case of detecting the level of the surface of the sample 2, the reflected light beam 9 or 15 obtained by reflecting the light beam passing through the lens 8 on the surface of the sample 2 is conducted to a beam angle difference detector 10 so as to adjust the angle of the surface of the sample 2. In the case of detecting the height of the surface of the sample 2, the reflected light 13 or 16 obtained by reflecting the light beam passing through the reflecting mirror 12 on the surface of the sample 2 is conducted to a beam position detector 14 so as to adjust the height of the surface of the sample 2. Thus, the movement of the laser spot caused by the positional deviation of the sample can be separated from that caused by the tilt of the sample.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は位置決め検出器、特に、小型電子部品の位置決
め検出器に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a positioning detector, and in particular to a positioning detector for small electronic components.

〔従来の技術〕[Conventional technology]

従来の位置決め検出器について図面を参照して詳細に説
明する。
A conventional positioning detector will be described in detail with reference to the drawings.

第2図は従来の位置決め検出器の一例を示す光路図であ
る。
FIG. 2 is an optical path diagram showing an example of a conventional positioning detector.

第2図に示す位置決め検出器は、試料17にレーザ光を
照射する光源部1と、試料17からの反射光路上に位置
する一次元ポジションセンサ19と、試料17下に位置
するチップテーブル20とを含んで構成される。
The positioning detector shown in FIG. 2 includes a light source unit 1 that irradiates a sample 17 with laser light, a one-dimensional position sensor 19 located on the reflected optical path from the sample 17, and a chip table 20 located below the sample 17. It consists of:

試料17がΔZまたけ高くなった場合、−次元ポジショ
ンセンサ19の受光位置信号出力により位置ずれが検出
できる。
When the sample 17 becomes higher by ΔZ, a positional shift can be detected by the light receiving position signal output from the -dimensional position sensor 19.

第3図は、第2図の試料17が傾いた場合を示す光路図
である。
FIG. 3 is an optical path diagram showing a case where the sample 17 in FIG. 2 is tilted.

この場合も、位置すれと同様な受光位置信号が出力され
る。
In this case as well, a light reception position signal similar to that for positional deviation is output.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の位置決め検出器は、試料の位置ずれによ
るレーザスポットの移動と、試料の傾きによるレーザス
ポットの移動とを分離できないという欠点があった。
The above-mentioned conventional positioning detector had a drawback in that it was not possible to separate the movement of the laser spot due to positional deviation of the sample from the movement of the laser spot due to the tilt of the sample.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の位置決め検出器は、 (^)第1の偏光軸を有する、第1の光路の、第1のレ
ーザ光を出力する光源部、 (It)前記第1のレーザ光を、前記第1の光路上を直
進する第2のレーザ光と、前記第1の光路と直角な方向
である第2の光路に進行する第3のレーザ光とに分割す
るビームスプリッタ、(C)前記第2のレーザ光を通過
させ、前記第1の偏光軸と異なる第2の偏光軸を有し、
前記第2のレーザ光と逆方向から送り返される第2の反
射光を第3の光路に屈折させる偏光ビームスプリッタ、 (D)前記偏光ビームスプリッタを通過した前記第2の
レーザ光の偏光軸を回転させて第4のレーザ光を作成し
、第1の反射光の偏光軸を回転させて前記第2の反射光
として、前記偏光ビームスプリッタへ送り返す1/4波
長板、 (E)前記第4のレーザ光を試料面に集束し、前記試料
面からの反射光を前記第1の反射光として、前記1/4
波長板へ送り返すレンズ、(F)前記第3の光路上に置
かれ、前記第1の光路と前記第3の光路との角度差を求
めるビーム角度差検出器、 (G)前記第2の光路上に置かれ、前記第3のレーザ光
を前記試料面に向けて第3の反射光として反射する反射
鏡、 ()l)前記第3の反射光が前記試料面に照射されたこ
とにより生ずる第4の反射光の位置を検出するビーム位
置検出器、 とを含んで構成される。
The positioning detector of the present invention includes: (^) a light source section that outputs a first laser beam in a first optical path having a first polarization axis; (C) a beam splitter that splits the laser beam into a second laser beam that travels straight on an optical path and a third laser beam that travels on a second optical path that is perpendicular to the first optical path; passing a laser beam and having a second polarization axis different from the first polarization axis;
a polarizing beam splitter that refracts a second reflected light sent back from a direction opposite to the second laser beam into a third optical path; (D) rotating a polarization axis of the second laser beam that has passed through the polarizing beam splitter; (E) a quarter-wave plate that rotates the polarization axis of the first reflected light and sends it back to the polarizing beam splitter as the second reflected light; The laser beam is focused on the sample surface, and the reflected light from the sample surface is used as the first reflected light, and the 1/4
(F) a beam angle difference detector placed on the third optical path to determine the angular difference between the first optical path and the third optical path; (G) the second beam; a reflecting mirror that is placed on the road and reflects the third laser beam toward the sample surface as third reflected light; A beam position detector that detects the position of the fourth reflected light.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示す光路図である。FIG. 1 is an optical path diagram showing an embodiment of the present invention.

第1図に示す位置決め検出器は、 (A)第1の偏光軸を有する、第1の光路の、第1のレ
ーザ光3を出力する光源部1、 (B)レーザ光3を、前記第1の光路上を直進する第2
のレーザ光5と、前記第1の光路と直角な方向である第
2の光路に進行する第3のレーザ光11とに分割するビ
ームスプリッタ4、(C)レーザ光5を通過させ、前記
第1の偏光軸と異なる第2の偏光軸を有し、レーザ光5
と逆方向から送り返される第2の反射光33を第3の光
路に屈折させる偏光ビームスプリッタ6、(ロ)偏光ビ
ームスプリッタ6を通過したレーザ光の偏光軸を回転さ
せて第4のレーザ光41を作成し、第1の反射光32の
偏光軸を回転させて反射光33として、偏光ビームスプ
リッタ6へ送り返す1/4波長板7、 (E)レーザ光41を試料面2に集束し、試料面2から
の反射光31を第1の反射光32として、1/4波長板
7へ送り返すレンズ8、 (F)前記第3の光路上に置かれ、前記第1の光路と前
記第3の光路との角度差を求めるビーム角度差検出器1
0、 (G)前記第2の光路上に置かれ、レーザ光11を試料
面2に向けて第3の反射光51として反射する反射鏡1
2、 ()I)反射光51が試料面2に照射されたことにより
生ずる第4の反射光13の位置を検出するビーム位置検
出器14、 とを含んで構成される。
The positioning detector shown in FIG. The second light beam goes straight on the optical path of the first light beam.
(C) a beam splitter 4 that splits the laser beam 5 into a third laser beam 11 that travels to a second optical path that is perpendicular to the first optical path; The laser beam 5 has a second polarization axis different from the first polarization axis.
(b) a polarizing beam splitter 6 that refracts the second reflected light 33 sent back from the opposite direction to a third optical path; (b) a fourth laser beam 41 that rotates the polarization axis of the laser beam that has passed through the polarizing beam splitter 6; (E) Focuses the laser beam 41 onto the sample surface 2, and rotates the polarization axis of the first reflected light 32 and sends it back to the polarizing beam splitter 6 as reflected light 33. A lens 8 that sends the reflected light 31 from the surface 2 as the first reflected light 32 to the quarter-wave plate 7, (F) is placed on the third optical path and connects the first optical path and the third Beam angle difference detector 1 for determining the angle difference with the optical path
0, (G) a reflecting mirror 1 placed on the second optical path and reflecting the laser beam 11 toward the sample surface 2 as third reflected light 51;
2. ()I) A beam position detector 14 that detects the position of the fourth reflected light 13 generated when the sample surface 2 is irradiated with the reflected light 51.

本発明の詳細な説明する。The present invention will be described in detail.

最初に、試料面2の水平を出す。First, level the sample surface 2.

試料面2が傾いている場合はレーザ光15が、傾いてい
ない場合はレーザ光9が、ビーム角度差検出器10に入
射される。
When the sample surface 2 is inclined, the laser beam 15 is incident on the beam angle difference detector 10, and when it is not inclined, the laser beam 9 is incident on the beam angle difference detector 10.

そこで、ビーム角度差検出器10上のレーザ光の位置が
、レーザ光9の光路と一致するように、すなわちレーザ
光9を検出したビーム角度差検出器10の画素のある位
置にレーザ光5が反射されてくるように試料面2の角度
を調整する。
Therefore, the position of the laser beam on the beam angle difference detector 10 coincides with the optical path of the laser beam 9, that is, the laser beam 5 is placed at the position of the pixel of the beam angle difference detector 10 that detected the laser beam 9. Adjust the angle of the sample surface 2 so that the light is reflected.

次に、試料面2の高さを出す。Next, calculate the height of the sample surface 2.

試料面2が低い場合はレーザ光16が、正規の高さの場
合はレーザ光13が、ビーム位置検出器14に入射され
る。
When the sample surface 2 is low, the laser beam 16 is incident on the beam position detector 14, and when the sample surface 2 is at a normal height, the laser beam 13 is incident on the beam position detector 14.

そこで、ビーム位置検出器14上のレーザ光の位1が、
レーザ光13の光路と一致するように、ずなわちレーザ
光13を検出したビーム位置検出器14の画素のある位
置にレーザ光11が反射されてくるように試料面2の高
さを調整する。
Therefore, the position of the laser beam on the beam position detector 14 is
The height of the sample surface 2 is adjusted so that it matches the optical path of the laser beam 13, that is, so that the laser beam 11 is reflected at a certain position of the pixel of the beam position detector 14 that detected the laser beam 13. .

レンズ8を設けることにより、ビーム角度差検出器10
をレンズ8の後焦点以後に配置できるため、試料面2と
ビーム角度差検出器10との間隔が長くできるので、ビ
ーム角度差検出器10の配置自由度が大きくできる。
By providing the lens 8, the beam angle difference detector 10
Since the beam angle difference detector 10 can be placed after the back focal point of the lens 8, the distance between the sample surface 2 and the beam angle difference detector 10 can be increased, and the degree of freedom in the arrangement of the beam angle difference detector 10 can be increased.

〔発明の効果〕〔Effect of the invention〕

本発明の位置決め検出器は、第2の光学系を追加するこ
とにより、試料の位置ずれによるレーザスポットの移動
と、試料の傾きによるレーザスポットの移動とを分離で
きるという効果がある。
By adding the second optical system, the positioning detector of the present invention has the advantage that movement of the laser spot due to positional deviation of the sample and movement of the laser spot due to tilt of the sample can be separated.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す光路図、第2図は従来
の一例を示す光路図、第3図は第2図の試料が傾いた場
合を示す光路図である。 1・・・・・・光源部、2・・・・・・試料面、4・・
・・・・ビームスプリッタ、6・・・・・・偏光ビーム
スプリッタ、7・・・・・・1/4波長板、8・・・・
・・レンズ、10・・・・・・ビーム角度差検出器、1
2・・・・・・反射鏡、14・・・・・・ビーム位置検
出器。 代理人 弁理士  内 原  晋 !PJ1図 あ 国 殆
FIG. 1 is an optical path diagram showing an embodiment of the present invention, FIG. 2 is an optical path diagram showing a conventional example, and FIG. 3 is an optical path diagram showing a case where the sample in FIG. 2 is tilted. 1...Light source section, 2...Sample surface, 4...
...Beam splitter, 6...Polarizing beam splitter, 7...1/4 wavelength plate, 8...
...Lens, 10...Beam angle difference detector, 1
2... Reflector, 14... Beam position detector. Agent: Susumu Uchihara, patent attorney! PJ1 map country most

Claims (1)

【特許請求の範囲】 (A)第1の偏光軸を有する、第1の光路の、第1のレ
ーザ光を出力する光源部、 (B)前記第1のレーザ光を、前記第1の光路上を直進
する第2のレーザ光と、前記第1の光路と直角な方向で
ある第2の光路に進行する第3のレーザ光とに分割する
ビームスプリッタ、 (C)前記第2のレーザ光を通過させ、前記第1の偏光
軸と異なる第2の偏光軸を有し、前記第2のレーザ光と
逆方向から送り返される第2の反射光を第3の光路に屈
折させる偏光ビームスプリッタ、 (D)前記偏光ビームスプリッタを通過した前記第2の
レーザ光の偏光軸を回転させて第4のレーザ光を作成し
、第1の反射光の偏光軸を回転させて前記第2の反射光
として、前記偏光ビームスプリッタへ送り返す1/4波
長板、 (E)前記第4のレーザ光を試料面に集束し、前記試料
面からの反射光を前記第1の反射光として、前記1/4
波長板へ送り返すレンズ、 (F)前記第3の光路上に置かれ、前記第1の光路と前
記第3の光路との角度差を求めるビーム角度差検出器、 (G)前記第2の光路上に置かれ、前記第3のレーザ光
を前記試料面に向けて第3の反射光として反射する反射
鏡、 (H)前記第3の反射光が前記試料面に照射されたこと
により生ずる第4の反射光の位置を検出するビーム位置
検出器、 とを含むことを特徴とする位置決め検出器。
Scope of Claims: (A) a light source unit that outputs a first laser beam in a first optical path having a first polarization axis; (B) a light source unit that outputs a first laser beam having a first polarization axis; a beam splitter that splits the second laser beam into a second laser beam that travels straight on the road and a third laser beam that travels in a second optical path that is perpendicular to the first optical path; (C) the second laser beam; a polarizing beam splitter that allows the second laser beam to pass therethrough, has a second polarization axis different from the first polarization axis, and refracts the second reflected light sent back from the direction opposite to the second laser beam into a third optical path; (D) A fourth laser beam is created by rotating the polarization axis of the second laser beam that has passed through the polarizing beam splitter, and a fourth laser beam is created by rotating the polarization axis of the first reflected light. (E) focusing the fourth laser beam on the sample surface and using the reflected light from the sample surface as the first reflected light;
a lens that sends the light back to the wave plate; (F) a beam angle difference detector placed on the third optical path to determine the angular difference between the first optical path and the third optical path; (G) the second beam; a reflecting mirror placed on the road and reflecting the third laser beam toward the sample surface as third reflected light; A beam position detector for detecting the position of the reflected light of No. 4.
JP25131388A 1988-10-04 1988-10-04 Positioning detector Pending JPH0298618A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25131388A JPH0298618A (en) 1988-10-04 1988-10-04 Positioning detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25131388A JPH0298618A (en) 1988-10-04 1988-10-04 Positioning detector

Publications (1)

Publication Number Publication Date
JPH0298618A true JPH0298618A (en) 1990-04-11

Family

ID=17220949

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25131388A Pending JPH0298618A (en) 1988-10-04 1988-10-04 Positioning detector

Country Status (1)

Country Link
JP (1) JPH0298618A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06221853A (en) * 1993-01-25 1994-08-12 Agency Of Ind Science & Technol Position detector
JP2007064670A (en) * 2005-08-29 2007-03-15 Tokyo Seimitsu Co Ltd Device for measuring surface shape
JP2012181151A (en) * 2011-03-02 2012-09-20 Pulstec Industrial Co Ltd Device for measuring thickness of translucent plate-like object
CN103033148A (en) * 2012-12-12 2013-04-10 东华大学 Device and method for angle measurement based on inlaid graphic information processing technology

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6153510A (en) * 1984-08-23 1986-03-17 Canon Inc Apparatus for detecting position
JPS62218802A (en) * 1986-03-20 1987-09-26 Hitachi Maxell Ltd Optical type distance and inclination measuring apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6153510A (en) * 1984-08-23 1986-03-17 Canon Inc Apparatus for detecting position
JPS62218802A (en) * 1986-03-20 1987-09-26 Hitachi Maxell Ltd Optical type distance and inclination measuring apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06221853A (en) * 1993-01-25 1994-08-12 Agency Of Ind Science & Technol Position detector
JP2007064670A (en) * 2005-08-29 2007-03-15 Tokyo Seimitsu Co Ltd Device for measuring surface shape
JP2012181151A (en) * 2011-03-02 2012-09-20 Pulstec Industrial Co Ltd Device for measuring thickness of translucent plate-like object
CN103033148A (en) * 2012-12-12 2013-04-10 东华大学 Device and method for angle measurement based on inlaid graphic information processing technology
CN103033148B (en) * 2012-12-12 2015-07-08 东华大学 Device and method for angle measurement based on inlaid graphic information processing technology

Similar Documents

Publication Publication Date Title
KR840001719A (en) Off-axis Optical Beam Defect Detector
KR980004513A (en) Optical pickup device
JPH0298618A (en) Positioning detector
KR930008762A (en) Optical pickup
JP2002005617A (en) Optical measurement device
KR920010908B1 (en) Mirror detection head
JPH07182666A (en) Light pickup system
JP2808713B2 (en) Optical micro displacement measuring device
JPH02191314A (en) Pattern detector
JPH07134026A (en) Target reflective object detector
JP2625209B2 (en) Optical micro displacement measuring device
KR100200830B1 (en) Reverse phase generating method and the generator thereof and focus error detection method and the device using them
US5905254A (en) Compact sized optical pickup system
JP2001133232A (en) Measuring apparatus for inclination of object to be inspected
JP2564799Y2 (en) 3D shape measuring device
JPH0275488A (en) Automatic focusing device
JPS63172905A (en) Method and device for separating diffracted light
JPS62205546A (en) Optical head
JPH02147816A (en) Scale reader
JP2002116024A (en) Parallel-light adjusting device
JPH0329123A (en) Optical head device
JPS63191322A (en) Optical system for optical pickup
JPH0560558A (en) Optical micro displacement measuring apparatus
JPH01298533A (en) Optical pickup
JPS63224042A (en) Optical head