JPH0291516A - Photoelectric type end part position detecting device - Google Patents
Photoelectric type end part position detecting deviceInfo
- Publication number
- JPH0291516A JPH0291516A JP63243684A JP24368488A JPH0291516A JP H0291516 A JPH0291516 A JP H0291516A JP 63243684 A JP63243684 A JP 63243684A JP 24368488 A JP24368488 A JP 24368488A JP H0291516 A JPH0291516 A JP H0291516A
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- Prior art keywords
- light
- light emitting
- receiving element
- light receiving
- emitting element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000001514 detection method Methods 0.000 claims abstract description 21
- 230000004397 blinking Effects 0.000 claims abstract description 13
- 230000008859 change Effects 0.000 claims description 10
- 239000011521 glass Substances 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 abstract description 8
- 238000005259 measurement Methods 0.000 abstract description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 17
- 238000000034 method Methods 0.000 description 9
- 230000004907 flux Effects 0.000 description 7
- 238000007796 conventional method Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000012937 correction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000003760 hair shine Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000005392 opalescent glass Substances 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
- Geophysics And Detection Of Objects (AREA)
- Switches Operated By Changes In Physical Conditions (AREA)
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Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、可視光又は赤外光を透過しにくい板材やウェ
ブなどの端部位置を検出するもので外乱光に強い光電式
端部位置検出装置に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention detects the end position of a board or web that is difficult to transmit visible light or infrared light, and is a photoelectric end position that is resistant to external light. This invention relates to a detection device.
第７図Ａに示す方式は直流電源１によって光学ランプ２
を点灯することにより、受光素子３で光学ランプ２と受
光素子３間（投受光間隔）１７に介在する測定対象物を
検出するものである。受光素子３の検出電流は直流アン
プ４で増巾され、レベル判別回路５で設定レベルに対す
る判別を行い、測定対象物の有無を出力回路６から出力
信号８を出力する。各回路は電源７でドライブされる。In the system shown in FIG. 7A, an optical lamp 2 is connected to a DC power source 1.
By lighting up, the light-receiving element 3 detects an object to be measured that is present between the optical lamp 2 and the light-receiving element 3 (light emitting/receiving interval) 17. The detection current of the light-receiving element 3 is amplified by a DC amplifier 4, a level discrimination circuit 5 discriminates against a set level, and an output signal 8 is output from an output circuit 6 indicating the presence or absence of the object to be measured. Each circuit is driven by a power supply 7.
この方式は光学ランプ非変調方式といわれ、高速応答性
にすぐれている反面、外乱光に弱く、ランプ寿命がある
。そのため外乱光に対しては検出防止対策として装置周
辺に遮光板を設ける必要があり、その上ランプ交換作業
のタイミングによってはラインの操業に支障を来す場合
もある。This method is called an optical lamp non-modulation method, and although it has excellent high-speed response, it is vulnerable to external light and has a limited lamp life. Therefore, it is necessary to provide a light shielding plate around the device as a measure to prevent detection of ambient light, and depending on the timing of lamp replacement work, line operations may be hindered.
第７図Ｂに示す方式は半導体発光素子ｌｌを用いる場合
で、発光素子１１はドライバー１３でドライブされる。The system shown in FIG. 7B uses a semiconductor light emitting element 11, and the light emitting element 11 is driven by a driver 13.
他の回路及び機能は第８図Ａ方式と同様である。この方
式は半導体発光素子（ＬＥＤ）非変調方式といわれ、高
速応答には優れているものの、外乱に弱く、更に、発光
素子１１は直流電源１によってドライバー１３を介して
ドライブされる。現在ランプに相当する発光輝度を持つ
ＬＥＤはないので発光輝度が弱く、投、受光間隔１７を
長（とることができない等の欠点を持っている。第７図
Ｃに示す方式は半導体発光素子（ＬＥＤ）１１をパルス
発振回路１２を介してドライバー１３でパルスドライブ
する変調方式であり、現在量も多く用いられ、単に被測
定体の有無、すなわちオン、オフ検出であれば外乱に強
く、高感度にできるので投受光間隔１７を長くできる特
徴があるものの板材やウェブなどの端部位置をアナログ
量として検出する場合には第８図の相対放射強度！□と
周囲温度Ｔａ（”Ｃ）の関係図に示す如く、半導体発光
素子（ＬＥＤ）は周囲温度の影響を受けやすく、例えば
周囲温度２５゛ｃの時に相対放射強度を１とすれば０℃
で約１．３．５０℃では約０．７となるため、温度ドリ
フトを生ずると同時に、ＬＥＤｌｌの経年変化による出
力変化も生じ、検出誤差の原因となる。Other circuits and functions are the same as those of the method shown in FIG. 8A. This method is called a semiconductor light emitting device (LED) non-modulation method, and although it is excellent in high-speed response, it is vulnerable to external disturbances.Furthermore, the light emitting device 11 is driven by the DC power supply 1 via the driver 13. At present, there are no LEDs with a luminance equivalent to that of a lamp, so the luminance is weak, and the method shown in FIG. This is a modulation method in which the LED (LED) 11 is pulse-driven by a driver 13 via a pulse oscillation circuit 12, and is widely used.It is resistant to external disturbances and has high sensitivity when simply detecting the presence or absence of an object to be measured, that is, on or off. Although it has the feature of being able to lengthen the light emitting/receiving interval 17, when detecting the edge position of a plate or web as an analog quantity, the relationship between relative radiant intensity!□ and ambient temperature Ta ("C) in Figure 8 is used. As shown in the figure, semiconductor light emitting devices (LEDs) are easily affected by the ambient temperature. For example, if the relative radiation intensity is 1 at an ambient temperature of 25°C, it is 0°C.
At about 1.3.50° C., it becomes about 0.7, which causes a temperature drift and at the same time causes an output change due to aging of LEDll, causing a detection error.
１４はフィルター、１５は交流アンプ、１６は検波積分
回路である。第９図は第７図Ｃを実装置的に変形したも
のであり、測定対象物２０との関連を示すものである。14 is a filter, 15 is an AC amplifier, and 16 is a detection and integration circuit. FIG. 9 is a modification of FIG. 7C in the form of an actual device, and shows the relationship with the object to be measured 20. FIG.
第１図の概念図に示す如く、投光部９と受光部１０の間
隔を長くして対向設置し、測定対象物２０が投光部９か
らの平行光Ａを遮光Ｂすることにより、その端部を受光
部１０によってアナログ的に検出する装置であって、第
２図に示す如（、遮光量即ち測定対象材の侵入量２１と
受光部出力２２の関係が直線２３となるとともに、分解
能が良いことに加えて外乱光の影響を受けにくく、投受
光間隔１７を長くできること、さらには保守不要である
とともに温度ドリフトが小さく、再現性が良い光電式端
部位置検出装置の提供を目的としている。As shown in the conceptual diagram of FIG. 1, the distance between the light emitting part 9 and the light receiving part 10 is increased and they are installed facing each other, so that the object to be measured 20 blocks the parallel light A from the light emitting part 9. This is a device that detects the edge in an analog manner using a light receiving section 10, as shown in FIG. The purpose of the present invention is to provide a photoelectric end position detection device that is not easily affected by external light, has a long light emitting/receiving interval 17, does not require maintenance, has small temperature drift, and has good reproducibility. There is.
上記目的を達成するために、本発明は第一に周期的に点
滅する発光素子を有する投光部と光電受光素子を有する
受光部の間に被測定物体が入り上記発光素子から上記発
光素子に入る光量が変化することにより、上記受光素子
が発生する電圧の交流成分のみの変化量を検出して、上
記被測定物体の位置を検出する装置において、上記投光
部内に第２の光電受光素子を設けて上記の点滅する発光
素子の光の一部を受光し、第２の受光素子の発生電圧の
交流成分のみの単位時間当たりの時間積分量が一定にな
るように、上記点滅する発光素子の点滅周期を制御する
ものである。In order to achieve the above object, the present invention first provides that an object to be measured enters between a light emitting part having a periodically flashing light emitting element and a light receiving part having a photoelectric light receiving element, and the object is transferred from the light emitting element to the light emitting element. In the apparatus for detecting the position of the object to be measured by detecting the amount of change in only the alternating current component of the voltage generated by the light receiving element due to a change in the amount of incident light, a second photoelectric light receiving element is provided in the light projecting section. is provided to receive a part of the light from the blinking light emitting element, and the blinking light emitting element This controls the blinking cycle of the .
また第二に、前記の点滅する発光素子及び受光素子に近
赤外線用のものを用いるものである。Second, the blinking light-emitting element and light-receiving element are those for near-infrared rays.
第三に、前記発光素子から被測定物体に向かって放射さ
れる光を散乱（乳白色）ガラスを経由させて一様分布さ
せ、かつレンズ系と組合わせて平行光線を得ることによ
り、投光間隔が長くても、被測定物体の位置に対して、
線形出力を得ようとするものである。Thirdly, by uniformly distributing the light emitted from the light emitting element toward the object to be measured via scattering (milky white) glass and combining it with a lens system to obtain parallel rays, the projection interval can be reduced. Even if it is long, relative to the position of the object to be measured,
The aim is to obtain a linear output.
第四に、前記被測定物検出用の受光素子の前に可視光を
カットするフィルタを設置して外光の影響を少なくする
ものである。Fourthly, a filter for cutting visible light is installed in front of the light receiving element for detecting the object to be measured to reduce the influence of external light.
すなわち、第３図に示す如く、半導体発光素子（ＬＥＤ
）１１の発する光を受光素子２６によって受光し、交流
アンプ２７によって、交流成分のみ増巾し、ＡＣ／ＤＣ
交換器２８でＤＣ信号として、光量設定器２９で設定さ
れた値とＤＣ信号を比較し、その偏差が零になるように
制御器３ｏで制御し、その出力をＶ／Ｆ変換器３１へ出
力する。That is, as shown in FIG.
) 11 is received by the light receiving element 26, only the AC component is amplified by the AC amplifier 27, and the AC/DC
The exchanger 28 compares the DC signal with the value set by the light amount setting device 29, and the controller 3o controls the deviation to zero, and outputs the output to the V/F converter 31. do.
Ｖ／Ｆ変換器３１はＬＥＤドライバー１３を介してＬＥ
ＤＩＩを点滅制御し、常に偏差値が零となるようにＬＥ
Ｄの点滅周波数制御するものである。The V/F converter 31 connects to the LED via the LED driver 13.
Control DII blinking and set LE so that the deviation value is always zero.
This controls the blinking frequency of D.
上記構成の本発明検出装置は前述の如く、投受光間に存
在する測定対象物の有無を検出するのではなく、測定対
象物の端部位置をアナログ量として検出するものである
から、半導体発光素子（ＬＥＤ）の輝度変動は誤検出の
原因となるもので、その対策として、第３図のブロック
図に示す如く、半導体発光素子（ＬＥＤ）１１が発生す
る光の一部を受光素子（シリコンフォトダイオード）２
６にて受光し、光電変換してＡＣアンプ２７にてＡＣ成
分のみを増幅し、ＡＣ／ＤＣ交換器２８にてＤＣ信号と
する。そして、ＤＣ信号は光量を設定する設定器２９の
信号と比較され、その偏差値が零になるように制御装置
３０で演算し、■／Ｆ変換器３１の出力周波数を制御す
る。Ｖ／Ｆ変換器３１の出力周波数でＬＥＤドライバー
１３を介して、ＬＥＤＩＩを点滅ドライブし、前述の偏
差値が零になるように制御するものである。As described above, the detection device of the present invention having the above configuration does not detect the presence or absence of the object to be measured existing between the emitting and receiving light, but rather detects the end position of the object to be measured as an analog quantity. Fluctuations in the brightness of the device (LED) can cause false detection, and as a countermeasure, as shown in the block diagram of FIG. Photodiode) 2
6 receives the light, photoelectrically converts it, amplifies only the AC component in an AC amplifier 27, and converts it into a DC signal in an AC/DC exchanger 28. Then, the DC signal is compared with a signal from a setting device 29 that sets the light amount, and a control device 30 calculates the deviation value to zero, thereby controlling the output frequency of the /F converter 31. The LED II is driven to blink at the output frequency of the V/F converter 31 via the LED driver 13, and is controlled so that the deviation value described above becomes zero.
第３図は本発明検出装置の発光部を示すブロック図で、
構成作用については前述した通りであり、周囲温度が上
昇し、半導体発光素子（ＬＥＤ）１１の輝度が低下する
と、受光素子（ＳＰＤ）２６で検出する、発光輝度信号
も当然ながら低下する。この状態は第４図の様になる。FIG. 3 is a block diagram showing the light emitting part of the detection device of the present invention.
The configuration and operation are as described above, and as the ambient temperature rises and the brightness of the semiconductor light emitting device (LED) 11 decreases, the light emission brightness signal detected by the light receiving device (SPD) 26 naturally also decreases. This state is as shown in FIG.
即ち、受光素子（ＳＰＤ）２６の出力波形は３４の状態
からドリフト６８分だけ低下し、３５の状態となる。That is, the output waveform of the light receiving element (SPD) 26 decreases from the state of 34 by the amount of drift 68, and becomes the state of 35.
当然のことながら、Ａ／Ｃアンプ２７及びＡＣ／ＤＣ変
換器２８の出力ＤＣ信号も低下するので、光量設定ＶＲ
２９の値より、低くなるので偏差が発生し、その偏差値
により制御装置３０で例えばＰＩ演算して、Ｖ／Ｆ変換
器３１に出力し、周波数を上昇させ、ドライバー１３を
介してＬＥＤｌｌを点滅制御する。Naturally, the output DC signal of the A/C amplifier 27 and AC/DC converter 28 also decreases, so the light intensity setting VR
Since it is lower than the value of 29, a deviation occurs, and the control device 30 calculates, for example, PI based on the deviation value, outputs it to the V/F converter 31, increases the frequency, and blinks the LEDll via the driver 13. Control.
点滅周波数が上昇することは、第４図の点灯間隔Ｔが短
くなることであり、Ａ Ｃ／Ｄ Ｃ変換器３１の出力を
上昇させて、偏差が零となる方向に制御する。An increase in the blinking frequency means that the lighting interval T shown in FIG. 4 becomes shorter, and the output of the AC/DC converter 31 is increased to control the deviation to zero.
この発光部９の制御は第４図の斜線部分波形（発光量）
３４．３５の面積が単位時間当たり、一定の面積となる
ように、ＬＥＤＩＩの点滅周波数（周期Ｔ）をフィード
バック制御するものである。３２は発光部の受光素子の
出力であり、３３は時間である。受光部１０は第９図に
示す如く、従来法と変わりない、第９図中２４はレンズ
である。このレンズ２４の組合せで平行光線を得、かつ
乳白色ガラス２５を併用することは、投光間隔１７を大
きくしても、第４図のように被測定対象物の変位に対し
て直線状の出力を得るために重要である。The control of this light emitting unit 9 is shown in the shaded part waveform (light emission amount) in Fig. 4.
The blinking frequency (cycle T) of the LED II is feedback-controlled so that the area of 34.35 becomes a constant area per unit time. 32 is the output of the light receiving element of the light emitting section, and 33 is the time. As shown in FIG. 9, the light receiving section 10 is the same as the conventional method, and 24 in FIG. 9 is a lens. By combining this lens 24 to obtain parallel light beams and also using the milky white glass 25, even if the projection interval 17 is increased, the output is linear with respect to the displacement of the object to be measured, as shown in Fig. 4. It is important to obtain
第５図は受光部１０の受光素子（ＳＰＤ）３の検出出力
波形であり、波形３７は投受光間１７に測定対象物２０
の端面が全（侵入していない時で全光束ｖ１が受光素子
（ＳＰＤ）３に達している状態を示している。波形３８
は光束のｖ８が測定対象物の端面で遮光され１／２の光
束ｖｔが受光素子３に達した状態を示すものである。す
なわち、この斜線部分で示される波形３７．３８の単位
時間当たり面積を演算し、測定対象物２０の端面位置を
検出することになる。FIG. 5 shows the detection output waveform of the light receiving element (SPD) 3 of the light receiving unit 10, and the waveform 37 shows the measurement target 2 between the light emitting and receiving portions 17.
Waveform 38 shows a state in which the entire luminous flux v1 has reached the light receiving element (SPD) 3 when the end face of is not penetrating.
shows a state in which the light flux v8 is blocked by the end face of the object to be measured, and 1/2 of the light flux vt reaches the light receiving element 3. That is, the area per unit time of the waveforms 37 and 38 shown by the hatched portions is calculated to detect the end face position of the measurement target 20.
第６図は本実施例の外乱に対する影響を実験した模式図
であり、投受光器９．１０間１７を７００１１ＩＩＩに
セットし、測定対象物２０の端面を１７２の位置で固定
した状態とし、投光部９側に隣接した位置に外乱光とし
て、ＡＣｌｏｏＶ、１００Ｗのタングステン電球３９を
設置し、受光面に向けて点滅させた結果、受光部１０の
出力は２．５Ｖ（全遮光ＯＶ、全入光５■）と安定し、
全く外乱の影響は受けなかった。FIG. 6 is a schematic diagram in which an experiment was conducted to examine the influence of this embodiment on disturbances, with the emitter/receiver 9, 10 and 17 set at 70011III, the end face of the object to be measured 20 fixed at position 172, and the An AClooV, 100W tungsten bulb 39 was installed as a disturbance light in a position adjacent to the light section 9, and as a result of flashing it toward the light receiving surface, the output of the light receiving section 10 was 2.5V (fully shaded OV, fully illuminated). Light 5 ■) and stable,
It was not affected by external disturbances at all.
当然のことながら従来法では著しく外乱の影響を受け、
測定誤差の大きいことが確認された。Naturally, the conventional method is significantly affected by disturbances,
It was confirmed that the measurement error was large.
温度ドリフトについては約２５℃の時受光部１０の出力
信号を５ｖに調整しておき、恒温槽内で影響温度をＯ〜
５０’Ｃまで変化させ、受光部１０の出力信号変化をチ
エツクしたが、０°Ｃのとき５．ＩＶ。Regarding temperature drift, adjust the output signal of the light receiving section 10 to 5V when the temperature is about 25℃, and set the influence temperature to 0~ in a constant temperature bath.
I checked the change in the output signal of the light receiving section 10 by changing the temperature up to 50'C, but when it was 0°C, it was 5. IV.
５０°Ｃのとき４．９ｖとなり、０°Ｃから５０℃間は
リニアに変化した。５１℃差で０．２ｖの変化は端面位
置の変化に換算すると約１．２閣のドリフトなった。At 50°C, it was 4.9v, and it changed linearly from 0°C to 50°C. A change of 0.2V with a difference of 51 degrees Celsius is equivalent to a drift of approximately 1.2V when converted to a change in the position of the end face.
従来法での点検では０℃のとき５．８■、５０°Ｃのと
き３．７ｖとなり、５０°Ｃ差で２．１■の変化は端面
位置の変化に換算すると１２．６ｍ１１となり、本発明
に比し、約１０倍の誤差となった。更に、表面がミラー
のように光る鋼板でテストした結果、本発明では全く誤
検が無く良好な結果を得たが従来法では誤検出が屡々起
こった。In inspection using the conventional method, it was 5.8V at 0℃ and 3.7V at 50℃, and the change of 2.1V due to a difference of 50℃ is converted to a change in the end face position of 12.6m11. The error was about 10 times that of the invention. Furthermore, as a result of testing on a steel plate whose surface shines like a mirror, the present invention had no false positives and good results were obtained, whereas the conventional method frequently caused false positives.
本発明を実施することで、外乱光のある環境、温度変化
のある環境に於いて、ミラーのように光る測定対象物で
も容易に端部位置のアナログ検出が高精度で容易となり
、この種測定装置分野に於ける利益は大きい、又装置コ
ストも従来品に若干の機器を付加する程度であり、利益
に対する付加価値は高く評価できる。By implementing the present invention, analog detection of the edge position of even a shiny measurement object like a mirror can be easily performed with high accuracy in an environment with ambient light or temperature changes, and this type of measurement can be easily performed. The profits in the field of equipment are large, and the equipment cost is only the addition of some equipment to conventional products, so the added value to profits can be highly evaluated.
第１図は投受光器と測定対象物、光束との関係を示す検
出装置の概念図、第２図は遮光量と受光部出力との関係
を示す線図、第３図は本発明装置の発光部を示すブロッ
ク図、第４図は発光部の受光素子出力波形とドリフトの
関係を示す線図、第５図は発光部の受光素子出力波形と
端部検出位置との関係を示す線図、第６図は本発明の装
置を用いて外乱の影響を調査するための概略図、第７図
Ａは従来法の光学ランプを用いた非変調方式を示すブロ
ック図、第７図Ｂは従来法の半導体発光素子（ＬＥＤ）
を用いた非変調方式を示すブロック図、第７図Ｃは従来
法の半導体発光素子（ＬＥＤ）を用いた変調方式を示す
ブロック図、第８図は周辺温度の変化に対する相対放射
強度の変化を示す線図、第９図は従来法の第７図Ｃの実
装装置のブロック図である。
１１・・・半導体発光素子（ＬＥＤ）
１３・・・ＬＥＤドライバー
２５・・・散乱（乳白色）ガラス
２６・・・受光素子
２７・・・交流アンプ
２８・−・ＡＣ／ＤＣ交換器
２９・・・光量設定器
３０・・・制御器
３１・・・ｖ／Ｆ変換器
図
第２図
第４図
時間
第５図
第３ 図
時間
第６図
３１・・・Ｖ／Ｆ変換器
第
図
第
図
（６） 明細書第１０頁第１８行目のｒ５１”ｃ差」
との記載をｒ ｓ ｏ ’ｃの温度差」と補正する。
（７）図面中第２図、第４図および第５図を別紙補正図
面の通り補正する。
８、添付書類の目録
（１） 補正図面 １ 通第
第４図
時間
１、事件の表示
昭和６３年 特 許 願 第２４３６８４号２、発明の
名称
光電式端部位置検出装置
３、補正をする者
事件との関係 特許出願人
住 所 東京都八王子市石川町２９５１番地４名称株式
会社 ニ し コ
代表者久保１）勝寿
４、代理人〒１０５
住 所 東京都港区浜松町２丁目２番１５号７、補正の
内容
（１） 明細書第６頁第７行目の「投光間隔」との記
載を「投受光間隔」と補正する。
（２）明細書第９頁第１行目および第２行目の記載を下
記の通り補正する。
「この発光部９の制御は第４図に示す波形３４゜３５部
分の面積が単位時間当り、」
（３）明細書第９頁第９行目の記載を下記の通り補正す
る。
「つ第３図に示す乳白色ガラス２５を併用することは投
受光間隔」
（４）明細書第９頁第１０行目の「第４図」との記載を
「第２図」と補正する。
（５）明細書第９頁第１６行目乃至第１９行目の記載を
下記の通り補正する。
「全光束が受光素子（ＳＰＤ）３に達し電気信号へ変換
した状態ｖＩを示している。波形３８は光束が測定対象
物の端面で遮光され１／２の光束が受光素子３に達し電
気信号へ変換した状態Ｖ２を示すものである。すなわち
、こ」（６）明細書第１０頁第１８行目の「５１°Ｃ差
」との記載をｒ５０″Ｃの温度差」と補正する。
（７）図面中筒２因、第４図および第５図を別紙補正図
面の通り補正する。
８、添付書類の目録
（１） 補正図面 ｌ 通第
図
＾−一
弔
図
Ａ≠−
第
図Figure 1 is a conceptual diagram of the detection device showing the relationship between the light emitter/receiver, the object to be measured, and the luminous flux, Figure 2 is a diagram showing the relationship between the amount of light shielding and the output of the light receiver, and Figure 3 is a diagram of the device of the present invention. A block diagram showing the light emitting section, FIG. 4 is a line diagram showing the relationship between the light receiving element output waveform of the light emitting section and drift, and FIG. 5 is a line diagram showing the relationship between the light receiving element output waveform of the light emitting section and the end detection position. , FIG. 6 is a schematic diagram for investigating the influence of disturbance using the device of the present invention, FIG. 7A is a block diagram showing a conventional non-modulation method using an optical lamp, and FIG. 7B is a conventional method. Legal semiconductor light emitting device (LED)
Figure 7C is a block diagram showing a non-modulation method using a conventional semiconductor light emitting device (LED), and Figure 8 shows changes in relative radiation intensity with respect to changes in ambient temperature. The diagram shown in FIG. 9 is a block diagram of the conventional mounting apparatus shown in FIG. 7C. 11... Semiconductor light emitting device (LED) 13... LED driver 25... Scattering (milky white) glass 26... Light receiving element 27... AC amplifier 28... AC/DC exchanger 29... Light amount setting device 30... Controller 31... V/F converter diagram Figure 2 Figure 4 Time Figure 5 Figure 3 Time Figure 6 Figure 31... V/F converter diagram Figure ( 6) r51”c difference on page 10, line 18 of the specification”
The description of ``temperature difference between r s o 'c'' is corrected. (7) Figures 2, 4, and 5 of the drawings will be corrected as shown in the attached correction drawings. 8. List of attached documents (1) Amended drawings 1 copy Figure 4 Time 1. Indication of the incident 1988 Patent Application No. 243684 2. Name of the invention Photoelectric end position detection device 3. Person making the amendment Relationship to the case Patent applicant address: 2951 Ishikawa-cho, Hachioji-shi, Tokyo 4 Name: Nishiko Co., Ltd. Representative: Kubo 1) Katsutoshi 4, Agent: 105 Address: 2-2-15 Hamamatsucho, Minato-ku, Tokyo 7. Contents of the amendment (1) The description of "light emission interval" on page 6, line 7 of the specification will be corrected to "light emission/reception interval." (2) The statements in the first and second lines of page 9 of the specification are amended as follows. ``This control of the light emitting section 9 is such that the area of the 34°35 portion of the waveform shown in FIG. ``Using the opalescent glass 25 shown in FIG. 3 in combination means the light emitting/receiving interval.'' (4) The description ``FIG. 4'' on page 9, line 10 of the specification is corrected to ``FIG. 2''. (5) The statement on page 9, line 16 to line 19 of the specification is amended as follows. "The state vI is shown in which the total luminous flux reaches the light receiving element (SPD) 3 and is converted into an electrical signal. The waveform 38 shows that the luminous flux is blocked by the end face of the object to be measured, and 1/2 of the luminous flux reaches the light receiving element 3 and is converted into an electrical signal. In other words, (6) The statement "51°C difference" on page 10, line 18 of the specification is corrected to "temperature difference of r50"C. (7) The two cylinders in the drawing, Figures 4 and 5 will be corrected as shown in the attached correction drawings. 8. List of attached documents (1) Amended drawings l Figure ＾ - Funeral map A ≠ - Figure
Claims (4)
受光素子を有する受光部の間に被測定物体が入り上記発
光素子から上記受光素子に入る光量が変化することによ
り、上記受光素子が点滅光により発生する電圧の交流成
分のみの変化量を検出して、上記被測定物体の位置を検
出する光電式端部位置検出装置において、 上記投光部内に第２の光電受光素子を設けて上記の点滅
する発光素子の光の一部を受光し、第２の受光素子の発
生電圧の交流成分のみの単位時間当たりの時間積分量が
一定になるように、上記の点滅する発光素子の点滅周期
を制御することを特徴とする光電式端部位置検出装置。(1) An object to be measured enters between a light emitting part having a periodically flashing light emitting element and a light receiving part having a photoelectric light receiving element, and the amount of light entering the light receiving element from the light emitting element changes, causing the light receiving element to change. In a photoelectric end position detection device that detects the position of the object to be measured by detecting the amount of change in only the alternating current component of the voltage generated by the flashing light, a second photoelectric light receiving element is provided in the light projecting part. to receive a part of the light from the blinking light emitting element, and the blinking light emitting element A photoelectric end position detection device characterized by controlling a blinking cycle.
のものを用いることを特徴とする請求項１記載の光電式
端部位置検出装置。(2) The photoelectric end position detection device according to claim 1, wherein the blinking light emitting element and light receiving element are for near infrared rays.
る光を散乱ガラスを経由させること特徴とする請求項１
記載の光電式端部位置検出装置。(3) Claim 1 characterized in that the light emitted from the light emitting element toward the object to be measured is passed through a scattering glass.
The photoelectric end position detection device described.
ットするフィルタを設置することを特徴とする請求項２
記載の光電式端部位置検出装置。(4) Claim 2 characterized in that a filter for cutting visible light is installed in front of the light receiving element for detecting the object to be measured.
The photoelectric end position detection device described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63243684A JPH0640013B2 (en) | 1988-09-28 | 1988-09-28 | Photoelectric end position detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63243684A JPH0640013B2 (en) | 1988-09-28 | 1988-09-28 | Photoelectric end position detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0291516A true JPH0291516A (en) | 1990-03-30 |
| JPH0640013B2 JPH0640013B2 (en) | 1994-05-25 |
Family
ID=17107449
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63243684A Expired - Fee Related JPH0640013B2 (en) | 1988-09-28 | 1988-09-28 | Photoelectric end position detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0640013B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007000599A (en) * | 2005-05-24 | 2007-01-11 | Yoshiharu Otani | Handpiece for dentistry |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60263813A (en) * | 1984-06-11 | 1985-12-27 | Brother Ind Ltd | Rotary angle detecting device |
-
1988
- 1988-09-28 JP JP63243684A patent/JPH0640013B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60263813A (en) * | 1984-06-11 | 1985-12-27 | Brother Ind Ltd | Rotary angle detecting device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007000599A (en) * | 2005-05-24 | 2007-01-11 | Yoshiharu Otani | Handpiece for dentistry |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0640013B2 (en) | 1994-05-25 |
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