JPH0283475U - - Google Patents

Info

Publication number
JPH0283475U
JPH0283475U JP16249788U JP16249788U JPH0283475U JP H0283475 U JPH0283475 U JP H0283475U JP 16249788 U JP16249788 U JP 16249788U JP 16249788 U JP16249788 U JP 16249788U JP H0283475 U JPH0283475 U JP H0283475U
Authority
JP
Japan
Prior art keywords
conductor
position corresponding
insertion hole
surrounding wall
signal connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16249788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16249788U priority Critical patent/JPH0283475U/ja
Publication of JPH0283475U publication Critical patent/JPH0283475U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP16249788U 1988-12-16 1988-12-16 Pending JPH0283475U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16249788U JPH0283475U (enExample) 1988-12-16 1988-12-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16249788U JPH0283475U (enExample) 1988-12-16 1988-12-16

Publications (1)

Publication Number Publication Date
JPH0283475U true JPH0283475U (enExample) 1990-06-28

Family

ID=31446377

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16249788U Pending JPH0283475U (enExample) 1988-12-16 1988-12-16

Country Status (1)

Country Link
JP (1) JPH0283475U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005308558A (ja) * 2004-04-22 2005-11-04 National Institute Of Advanced Industrial & Technology システムインパッケージ試験検査装置および試験検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005308558A (ja) * 2004-04-22 2005-11-04 National Institute Of Advanced Industrial & Technology システムインパッケージ試験検査装置および試験検査方法

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