JPH0277677U - - Google Patents

Info

Publication number
JPH0277677U
JPH0277677U JP15584788U JP15584788U JPH0277677U JP H0277677 U JPH0277677 U JP H0277677U JP 15584788 U JP15584788 U JP 15584788U JP 15584788 U JP15584788 U JP 15584788U JP H0277677 U JPH0277677 U JP H0277677U
Authority
JP
Japan
Prior art keywords
tab10
tester
test
reel
stamp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15584788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15584788U priority Critical patent/JPH0277677U/ja
Publication of JPH0277677U publication Critical patent/JPH0277677U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15584788U 1988-11-30 1988-11-30 Pending JPH0277677U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15584788U JPH0277677U (enrdf_load_stackoverflow) 1988-11-30 1988-11-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15584788U JPH0277677U (enrdf_load_stackoverflow) 1988-11-30 1988-11-30

Publications (1)

Publication Number Publication Date
JPH0277677U true JPH0277677U (enrdf_load_stackoverflow) 1990-06-14

Family

ID=31433843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15584788U Pending JPH0277677U (enrdf_load_stackoverflow) 1988-11-30 1988-11-30

Country Status (1)

Country Link
JP (1) JPH0277677U (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53104177A (en) * 1977-02-23 1978-09-11 Hitachi Ltd Characteristic discrimination classification method for electronic parts
JPS5834062B2 (ja) * 1979-06-04 1983-07-23 日本電信電話株式会社 時分割多重信号分岐插入装置
JPS63206672A (ja) * 1987-02-23 1988-08-25 Nec Corp Ｔａｂｉｃのハンドリング装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53104177A (en) * 1977-02-23 1978-09-11 Hitachi Ltd Characteristic discrimination classification method for electronic parts
JPS5834062B2 (ja) * 1979-06-04 1983-07-23 日本電信電話株式会社 時分割多重信号分岐插入装置
JPS63206672A (ja) * 1987-02-23 1988-08-25 Nec Corp Ｔａｂｉｃのハンドリング装置

Similar Documents

Publication Publication Date Title
JPS6428109U (enrdf_load_stackoverflow)
JPH0277677U (enrdf_load_stackoverflow)
JPH0358765U (enrdf_load_stackoverflow)
JPS63107599U (enrdf_load_stackoverflow)
JPS59146089U (ja) 封筒収納装置
JPS59192278U (ja) コンタクトプロ−ブ
JPS6068455U (ja) 蝶番キヤツチ力検査機
JPS59133553U (ja) フイルムの終端検出装置
JPS5820914Y2 (ja) 標点打刻器
JPS60176181U (ja) Ｉｃ接触装置
JPS60162552U (ja) 自力戸閉じ力測定用具
JPS6093951U (ja) 曲げ試験装置
JPS6036200U (ja) ホチキス付穴明パンチ器
JPS6090638U (ja) 温度測定治具
JPH0310274U (enrdf_load_stackoverflow)
JPS5879245U (ja) 微量液体定量保持器
JPS60187969U (ja) 作業時間分析装置
JPS607942U (ja) ワ−クの過剰状態検出装置
JPH0247793U (enrdf_load_stackoverflow)
JPS60150437U (ja) ケ−ブル送り出し装置のベルト張力検査装置
JPS59176800U (ja) シ−ト体穿孔装置
JPS59969U (ja) コ−ドリ−ルの導通試験装置
JPH0164198U (enrdf_load_stackoverflow)
JPS6258676U (enrdf_load_stackoverflow)
JPS6453979U (enrdf_load_stackoverflow)