JPH027552U - - Google Patents
Info
- Publication number
- JPH027552U JPH027552U JP8692888U JP8692888U JPH027552U JP H027552 U JPH027552 U JP H027552U JP 8692888 U JP8692888 U JP 8692888U JP 8692888 U JP8692888 U JP 8692888U JP H027552 U JPH027552 U JP H027552U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- polarizer
- holding
- base
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8692888U JPH027552U (en:Method) | 1988-06-30 | 1988-06-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8692888U JPH027552U (en:Method) | 1988-06-30 | 1988-06-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH027552U true JPH027552U (en:Method) | 1990-01-18 |
Family
ID=31311568
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8692888U Pending JPH027552U (en:Method) | 1988-06-30 | 1988-06-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH027552U (en:Method) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4879684A (en:Method) * | 1972-01-26 | 1973-10-25 | ||
| JPS61108945A (ja) * | 1984-10-31 | 1986-05-27 | Showa Electric Wire & Cable Co Ltd | 分光分析用試料保持装置 |
-
1988
- 1988-06-30 JP JP8692888U patent/JPH027552U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4879684A (en:Method) * | 1972-01-26 | 1973-10-25 | ||
| JPS61108945A (ja) * | 1984-10-31 | 1986-05-27 | Showa Electric Wire & Cable Co Ltd | 分光分析用試料保持装置 |