JPH0267918A - Automatic adjusting circuit and automatic adjusting method of optical medium detecting device - Google Patents

Automatic adjusting circuit and automatic adjusting method of optical medium detecting device

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Publication number
JPH0267918A
JPH0267918A JP63220234A JP22023488A JPH0267918A JP H0267918 A JPH0267918 A JP H0267918A JP 63220234 A JP63220234 A JP 63220234A JP 22023488 A JP22023488 A JP 22023488A JP H0267918 A JPH0267918 A JP H0267918A
Authority
JP
Japan
Prior art keywords
medium
circuit
detected
value
absence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63220234A
Other languages
Japanese (ja)
Other versions
JP2582870B2 (en
Inventor
Tsutomu Fukui
努 福井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP63220234A priority Critical patent/JP2582870B2/en
Priority to US07/399,931 priority patent/US4985636A/en
Priority to KR1019890012704A priority patent/KR950015068B1/en
Publication of JPH0267918A publication Critical patent/JPH0267918A/en
Application granted granted Critical
Publication of JP2582870B2 publication Critical patent/JP2582870B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Optical Transform (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Electronic Switches (AREA)

Abstract

PURPOSE:To detect the presence or absence of a medium reliably by providing a storage means for storing a set value of an electric signal and a switching controlling means for controlling a switching means by said set value of electric signal stored in said storage means. CONSTITUTION:When a medium handling unit 14 outputs an instructing signal to start detection of a medium, a controlling circuit 7 generates a voltage VREF as a reference voltage selecting signal SEL3 to a comparison circuit 11. In order to start detection of the medium from an optical sensor S1, a sensor No.N=1 is set. Then, a sampling circuit 10 reads, in response to an instruction by the circuit 7, a variable for a sensor SN stored in a storage means 13 and generates corresponding resistance selecting signals SEL21-SEL2m to a variable resistance circuit 9. The circuit 7 outputs a sensor selecting signal SELIN to a sensor selecting circuit 8, the circuit 10 and a comparison signal latch circuit 12. As a result, after a stable time, the unit 14 becomes able to detect the presence or absence of the medium for the sensor SN.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は光センサを用いて紙葉類等の媒体を検知する光
学式媒体検知装置の出力特性を調整する自動調整回路及
び自動調整方法に関するものである。
Detailed Description of the Invention (Industrial Application Field) The present invention relates to an automatic adjustment circuit and an automatic adjustment method for adjusting the output characteristics of an optical medium detection device that detects a medium such as a paper sheet using an optical sensor. It is something.

(従来の技術) 従来、紙葉類等の媒体を取扱う装置においては、媒体の
走行監視や残留検知を行なうために、例えば発光ダイオ
ードと受光トランジスタを対向させて配置し、透過光の
差異から生ずる受光トランジスタの光電流の変化を電圧
信号に変換し、該電圧信号によって媒体の有無を検知す
る検知方式が用いられている。
(Prior art) Conventionally, in devices that handle media such as paper sheets, in order to monitor the running of media and detect residual media, for example, a light-emitting diode and a light-receiving transistor are placed facing each other to detect the difference in transmitted light. A detection method is used in which a change in the photocurrent of a light-receiving transistor is converted into a voltage signal, and the presence or absence of a medium is detected based on the voltage signal.

第2図は上記の従来の媒体検知回路図である。FIG. 2 is a diagram of the conventional medium detection circuit described above.

同図において゛、1は定電流回路、2は光センサの発光
ダイオードで、発光ダイオード2には定電流回路1から
電流IDが供給される。3は光センサの受光トランジス
タ、RLは可変抵抗、4は演算増幅器よりなる比較器、
5は発光ダイオード2と受光トランジスタ3との間を通
過する被検知媒体であり、受光トランジスタ3は、コレ
クタ側が可変抵抗RLを介してバイアス電圧Vccと接
続され、エミッタ側が接地されていて、発光ダイオード
2側からの受光量に見合った電流XCを出力する。
In the figure, 1 is a constant current circuit, 2 is a light emitting diode of an optical sensor, and the light emitting diode 2 is supplied with a current ID from the constant current circuit 1. 3 is a light receiving transistor of the photosensor, RL is a variable resistor, 4 is a comparator consisting of an operational amplifier,
Reference numeral 5 denotes a medium to be detected that passes between the light emitting diode 2 and the light receiving transistor 3. The light receiving transistor 3 has a collector side connected to a bias voltage Vcc via a variable resistor RL, an emitter side grounded, and a light emitting diode A current XC corresponding to the amount of light received from the second side is output.

比較器4は負入力側に比較基準電圧V REPを受け、
正入力側に受光トランジスタ3のコレクターエミッタ間
電圧VCEを受けていて、電圧VCIEが電圧Vl?E
Pより小さいときは媒体5が介在していないことを示す
ローレベルのオフ信号を、そして電圧VCEが電圧Vl
?BPより大きいときは媒体5が介在していることを示
すハイレベルのオン信号を出力する・。
Comparator 4 receives comparison reference voltage V REP on its negative input side,
The collector-emitter voltage VCE of the light-receiving transistor 3 is received on the positive input side, and the voltage VCIE is the voltage Vl? E
When it is smaller than P, a low-level off signal indicating that the medium 5 is not present is output, and the voltage VCE is lower than the voltage Vl.
? When it is larger than BP, a high-level ON signal indicating that the medium 5 is present is output.

第3図は第2図の回路の出力特性図であり、媒体5が発
光ダイオード2と受光トランジスタ3との間に介在して
いないとき(以降、媒体無しと称す)は、受光トランジ
スタ3の受光量が多いので電流ICが大であり、よって
発光ダイオード2の発光による受光トランジスタ3の電
圧−電流特性は曲線C1となる。そして媒体5が発光ダ
イオード2と受光トランジスタ3の間に介在していると
き(以降、媒体有りと称す)は、受光トランジスタ3の
受光量は媒体5により妨げられるために少なくなり、従
って電流Icが小になって、電圧−電流特性は曲線C2
のようになる。
FIG. 3 is an output characteristic diagram of the circuit shown in FIG. Since the amount of light is large, the current IC is large, and therefore, the voltage-current characteristic of the light receiving transistor 3 due to light emission from the light emitting diode 2 becomes a curve C1. When the medium 5 is interposed between the light emitting diode 2 and the light-receiving transistor 3 (hereinafter referred to as "with medium"), the amount of light received by the light-receiving transistor 3 is reduced because it is blocked by the medium 5, and therefore the current Ic is As the voltage-current characteristic becomes smaller, the voltage-current characteristic becomes curve C2.
become that way.

しかして、実際に媒体5の有無検知を行なうための電圧
VCEは、式VCE−VCC−I C−RL ヨリ、I
C−(VCC−VCE) /RLなる直線g1と、各曲
線C1,C2との交点A、Bを電圧VC[Eの軸上に投
影した点VCE (OFF ) 、 vcE (ON)
となる。
Therefore, the voltage VCE for actually detecting the presence or absence of the medium 5 is expressed by the formula VCE-VCC-I C-RL, I
Points VCE (OFF), vcE (ON) are obtained by projecting the intersection points A and B of the straight line g1 of C-(VCC-VCE)/RL and each of the curves C1 and C2 onto the axis of the voltage VC[E].
becomes.

可変抵抗RLの抵抗値を小にすると、直線g1は0点(
1!!流IC−0,iIS圧V CC>を中心として直
線gl°のように急傾斜の特性になり、そして抵抗値を
大にすると直線J71’のように緩やかな傾斜の特性に
なるので、交点A、BはそれぞれA′A’、B’ 、B
’となり、このようにして可変抵抗RLによって媒体無
し或は媒体有りのときの各電圧VCEを所望の電圧値に
調整できるようにしている。
When the resistance value of variable resistor RL is reduced, the straight line g1 becomes 0 point (
1! ! Flow IC-0, iIS pressure V CC > is the center and the characteristic has a steep slope like the straight line gl°, and when the resistance value is increased, the characteristic has a gentle slope like the straight line J71', so the intersection point A , B are A'A', B', B, respectively.
', and in this way, each voltage VCE in the absence of a medium or in the presence of a medium can be adjusted to a desired voltage value by the variable resistor RL.

また、紙葉類等の取扱い装置においては紙粉等による塵
埃によって光センサは甚だしく汚損されることが少なく
ないが、可変抵抗RLによって例えば直線I!tに調整
されたとすると、第3因に示すMが汚損に対する初期マ
ージンをなしている。
In addition, in devices that handle paper sheets, etc., the optical sensor is often severely contaminated by dust caused by paper powder, etc. t, the third factor M constitutes the initial margin against contamination.

何となれば、初めのうちは直線glが曲線C1の非飽和
領域のA点で交わるので電流ICの変化に対して該交点
による電圧VCHの変化はほとんどないが、汚損により
曲線C1の飽和領域の曲線がA点まで下降すると飽和領
域部分と交わるために電圧vCEの変化が急激になるた
めである。よってこの汚損マージンを確保するためには
媒体無しの曲線C1と直線Utは第3図に示す非難飽和
領域で交わる必要がある。ところが、非難飽和領域での
調整においては、可変抵抗RLの変化に対して、電圧V
 CE−V CE (OFF ) f;!殆ど変化せず
、言いかえれば媒体5が発光ダイオード2と受光トラン
ジスタ3との間に介在しないときは、可変抵抗RLの調
整はできない。
Initially, the straight line gl intersects at point A in the non-saturated region of the curve C1, so there is almost no change in the voltage VCH due to the intersection point with respect to changes in the current IC, but due to contamination, the point A in the unsaturated region of the curve C1 This is because when the curve descends to point A, it intersects with the saturation region, so that the voltage vCE changes rapidly. Therefore, in order to secure this contamination margin, the medium-free curve C1 and the straight line Ut must intersect in the non-saturation region shown in FIG. However, in the adjustment in the non-saturation region, the voltage V
CE-V CE (OFF) f;! In other words, when the medium 5 is not interposed between the light emitting diode 2 and the light receiving transistor 3, the variable resistor RL cannot be adjusted.

従って、可変抵抗RLの調整は、媒体5を発光ダイオー
ド2と受光トランジスタ3との間に介在させて、媒体有
りの曲線C2と直IHIとの交点Bによる出力電圧V 
CE−V CE (ON)によって行なうことで対処し
ている。
Therefore, to adjust the variable resistor RL, the medium 5 is interposed between the light emitting diode 2 and the light receiving transistor 3, and the output voltage V is determined by the intersection B of the curve C2 with the medium and the straight line IHI.
This is handled by using CE-V CE (ON).

(発明が解決しようとする課WJ) しかしながら、紙葉類等の媒体を取扱う装置においては
、上記構成の媒体検知装置が複数個必要であり、これら
を調整する際には媒体を介在させて可変抵抗を手動調整
しなければならないという煩雑さがあり、また、調整ミ
スをするおそれもある。更に各可変抵抗は、発光ダイオ
ード及び受光トランジスタとは別の基板上に実装される
ことになるので、その基板の交換や、各ユニットの交換
が発生すると、再度可変抵抗を調整しなければならない
という煩わしさがあった。
(WJ to be solved by the invention) However, in a device that handles media such as paper sheets, a plurality of media detection devices with the above configuration are required, and when adjusting them, the media can be used to intervene. There is the complication of having to manually adjust the resistance, and there is also the risk of making an adjustment error. Furthermore, each variable resistor is mounted on a separate board from the light-emitting diode and light-receiving transistor, so if that board is replaced or each unit is replaced, the variable resistor must be adjusted again. It was annoying.

本発明の第1の目的は、光センサの発光による受光部の
出力特性を自動調整可能にし、第2の目的は光センサが
汚損して感度が変ったときは直ちにその出力特性が適正
に変えられるようにした光学式媒体検知装置の自動調整
回路及び自動調整方法を提供することにある。
The first object of the present invention is to automatically adjust the output characteristics of the light receiving section due to light emission from the optical sensor, and the second object is to adjust the output characteristics appropriately when the optical sensor becomes dirty and its sensitivity changes. An object of the present invention is to provide an automatic adjustment circuit and an automatic adjustment method for an optical medium detection device.

(課題−を解決するための手段) 本発明は前記問題点を解決するために、請求項(1)乃
至請求項(3)の発明においては、発光部と受光部とを
被検知媒体の通路に跨って配置した光センサを用い、被
検知媒体の有無による透過光の差異による受光部の光電
流の変化を電圧信号に変換するための負荷抵抗回路を有
し、該電圧信号の変化により被検知媒体の有無を判別す
る光学式媒体検知装置の自動調整回路において、前記負
荷抵抗回路は、可変抵抗と該可変抵抗の抵抗値を電気信
号の設定値により切替える切替手段とを有し、前記電気
信号の設定値を記憶するための記憶手段と、前記記憶手
段に記憶された電気信号の設定値により前記切替手段を
制御する切替制御手段とを有する自動調整回路とし、或
は、前記被検知媒体の有無を判別するための判別手段は
、前記電圧信号と比較する比較基準値を、被検知媒体の
有無を判別するための第1の比較基準値と該第1の比較
基準値によって被検知媒体無しに判別される領域を設定
した所定の第2と第3の比較基準値とに切替可能にし、
或はまた、前記可変抵抗は複数個の固定抵抗よりなり、
前記切替手段は複数個のスイッチ制御手段よりなり、前
記電気信号の設定値に基づき前記スイッチ制御手段によ
り、該固定抵抗の抵抗値を段階的に切替可能とした。
(Means for Solving the Problem) In order to solve the above-mentioned problems, in the inventions of claims (1) to (3), the light emitting part and the light receiving part are connected to the path of the medium to be detected. It has a load resistance circuit for converting changes in the photocurrent of the light receiving part due to the difference in transmitted light due to the presence or absence of a medium to be detected into a voltage signal. In an automatic adjustment circuit for an optical medium detection device that determines the presence or absence of a detection medium, the load resistance circuit includes a variable resistor and a switching means for switching the resistance value of the variable resistance according to a set value of an electric signal, an automatic adjustment circuit having a storage means for storing a set value of the signal, and a switching control means for controlling the switching means according to the set value of the electric signal stored in the storage means, or the detected medium The determining means for determining the presence or absence of the detected medium is configured to set a comparison reference value to be compared with the voltage signal with a first comparison reference value for determining the presence or absence of the detected medium. It is possible to switch between a predetermined second and third comparison reference value in which a region that is determined as “absent” is set;
Alternatively, the variable resistor is composed of a plurality of fixed resistors,
The switching means includes a plurality of switch control means, and the resistance value of the fixed resistor can be changed stepwise by the switch control means based on the setting value of the electric signal.

そして請求項(4)の発明においては、発光部と受光部
とを被検知媒体の通路に跨って配置した光センサをを用
い、被検知媒体の有無による透過光の差異による受光部
の光電流の変化を電圧信号に変換するための負荷抵抗回
路を有し、該電圧信号の変化により被検知媒体の有無を
判別する光学式媒体検知装置の自動調整方法において、
検知動作中でないときに検知媒体なしの状態で、前記電
圧信号と比較する比較基準値として、被検知媒体の有無
を判別するための第1の比較基準値と、該第1の比較基
準値によって被検知媒体無しに判別される領域の所定の
第2と第3の比較基準値とを交互に設定するとともに、
電気信号の設定値により負荷抵抗回路の抵抗値を順次切
替えて、前記電圧信号が前記第2および第3の比較基準
値の範囲内となったときの切替値を記憶し、検知動作中
に、前記記憶された切替値により負荷抵抗回路の抵抗値
を設定するとともに前記電圧信号を前記第1の比較基準
値と比較する自動調整方法とした。
In the invention of claim (4), an optical sensor is used in which a light-emitting part and a light-receiving part are arranged astride the passage of the medium to be detected, and a photocurrent in the light-receiving part is caused by the difference in transmitted light depending on the presence or absence of the medium to be detected. In an automatic adjustment method for an optical medium detection device, which has a load resistance circuit for converting a change in voltage into a voltage signal, and determines the presence or absence of a medium to be detected based on the change in the voltage signal,
A first comparison reference value for determining the presence or absence of a medium to be detected is used as a comparison reference value to be compared with the voltage signal in a state where there is no detection medium when the detection operation is not in progress; Alternately setting predetermined second and third comparison reference values of the area determined without the detected medium;
The resistance value of the load resistance circuit is sequentially switched according to the set value of the electric signal, and the switching value when the voltage signal falls within the range of the second and third comparison reference values is stored, and during the detection operation, The automatic adjustment method sets the resistance value of the load resistance circuit based on the stored switching value and compares the voltage signal with the first comparison reference value.

(作 用) 請求項(1)或は請求項(3)の発明によれば、検知動
作のアイドル時には、検知媒体無しにおける光センサの
受光部の出力特性に応じて、負荷抵抗回路の抵抗値が電
気信号の設定値によってスイッチ制御されて切替られ、
その電気信号の設定値が記憶され、検知動作中には、前
記記憶された設定値によってスイッチ制御されて負荷抵
抗回路の抵抗値が設定される。そして請求項(2)或は
請求項(4)の発明によれば、検知動作のアイドル時に
は、検知媒体無しにおける光センサの受光部の出力特性
に応じて、受光部から取出される電圧信号が第2と第3
との比較基準電圧の範囲内となるように負荷抵抗回路の
抵抗値が電気信号の設定値によってスイッチ制御されて
切替られ、その電気信号の設定値が記憶され、検知動作
中には、前記記憶された設定直によってスイッチ制御さ
れて負荷抵抗回路の抵抗値が設定され、該抵抗値の下で
前記電圧信号が第1の比較基準電圧と比較されて被検知
媒体の有無が判別される。
(Function) According to the invention of claim (1) or claim (3), when the sensing operation is idle, the resistance value of the load resistance circuit is adjusted according to the output characteristics of the light receiving part of the optical sensor without a sensing medium. is switched under switch control by the set value of the electrical signal,
The set value of the electrical signal is stored, and during the detection operation, the resistance value of the load resistance circuit is set by controlling the switch according to the stored set value. According to the invention of claim (2) or claim (4), when the sensing operation is idle, the voltage signal taken out from the light receiving part is adjusted according to the output characteristics of the light receiving part of the optical sensor without a sensing medium. 2nd and 3rd
The resistance value of the load resistance circuit is switched under switch control according to the set value of the electrical signal so that it is within the range of the comparison reference voltage, and the set value of the electrical signal is stored. The resistance value of the load resistor circuit is set by switch control according to the set value, and the voltage signal is compared with the first comparison reference voltage under the resistance value to determine the presence or absence of the medium to be detected.

(実施例) 第1図は本発明の一実施例を示す媒体検知装置の自動:
Ari回路のブロック図である。
(Embodiment) FIG. 1 shows an automatic medium detection device showing an embodiment of the present invention:
FIG. 2 is a block diagram of an Ari circuit.

同図において、5l−3nは発光部としての発光ダイオ
ードD1〜Dnと受光部としての受光トランジスタTr
l−Trnとでそれぞれ対をなしている光センサ、6は
定電流回路で、各発光ダイオードDi =Dnは互いに
直列に接続され、定電流回路6から定電流IDが供給さ
れている。そして各発光ダイオードDi〜Dnと各受光
トランジスタTry−Trnとの相互間はそれぞれの被
検知媒体X1〜Xnの搬送路となっていて、被検知媒体
X1xXnが各相互間に介在したときは、各発光ダイオ
ードDI−Dnから各受光トランジスタTrl−Trn
に至る光が減少するようにしている。
In the same figure, 5l-3n are light-emitting diodes D1 to Dn as light-emitting parts and light-receiving transistors Tr as light-receiving parts.
The light-emitting diodes Di=Dn are connected in series with each other, and a constant current ID is supplied from the constant current circuit 6. The spaces between each of the light emitting diodes Di to Dn and each of the light receiving transistors Try-Trn serve as transport paths for the respective detection media X1 to Xn, and when the detection media X1xXn is interposed between each one, each From the light emitting diode DI-Dn to each light receiving transistor Trl-Trn
This reduces the amount of light that reaches the area.

7はこの自動調整回路を後記するプログラムによって制
御する制御回路、8は制御回路7のセンサ選択信号5E
LINによって各センサSl −8nを自動調整或は媒
体検知制御のために選択するセンサ選択回路である。9
は負荷抵抗回路としての可変抵抗回路で、制御回路7の
制御によりて第2図の可変抵抗RLに相当する各抵抗回
路をスイッチ制御により形成して、センサ選択回路8に
よって選択された各センサS1〜Snの各受光トランジ
スタTrl〜Trnの受光量に応じたコレクタ電流と該
抵抗による、バイアス電圧Vccの電圧降下分、即ちコ
レクターエミッタ間電圧VCrICP点の電圧)を調整
する。10はサンプリング回路で、制御回路7のセンサ
選択信号5ELINを受けたとき可変抵抗回路9をスイ
ッチ制御する抵抗選択信号5EL21〜5EL2nを所
定の時系列で送出するとともに、後記する比較信号ラッ
チ回路12にラッチ信号LAを与える。
7 is a control circuit that controls this automatic adjustment circuit by a program to be described later, and 8 is a sensor selection signal 5E of the control circuit 7.
This is a sensor selection circuit that selects each sensor Sl-8n for automatic adjustment or medium detection control using LIN. 9
is a variable resistance circuit as a load resistance circuit, and under the control of the control circuit 7, each resistance circuit corresponding to the variable resistance RL in FIG. 2 is formed by switch control, and each sensor S1 selected by the sensor selection circuit 8 The collector current corresponding to the amount of light received by each of the light receiving transistors Trl to Trn of ~Sn and the voltage drop of the bias voltage Vcc due to the resistor, that is, the voltage at the collector-emitter voltage VCrICP point are adjusted. Reference numeral 10 denotes a sampling circuit which, when receiving the sensor selection signal 5ELIN from the control circuit 7, sends resistance selection signals 5EL21 to 5EL2n for switching the variable resistance circuit 9 in a predetermined time series, and also sends out resistance selection signals 5EL21 to 5EL2n for switching control of the variable resistance circuit 9 to a comparison signal latch circuit 12 to be described later. Provides latch signal LA.

そして検知動作のアイドル中に、制御回路7による後記
する記憶指示信号SMを受けると、後記する記憶部13
にそのときの抵抗選択信号S E L21〜S E L
2mをセンサ選択信号5ELINと対応させて記憶し、
検知動作時にはセンサ選択信号5ELINを受ける毎に
当該各抵抗選択信号S E L21−S E L2mを
読出して可変抵抗回路9に与える。
When the control circuit 7 receives a storage instruction signal SM, which will be described later, during the idle state of the detection operation, the storage section 13, which will be described later,
The resistance selection signal SEL21 to SEL at that time
2m is stored in correspondence with the sensor selection signal 5ELIN,
During the detection operation, each resistance selection signal S E L21 to S E L2m is read out and applied to the variable resistance circuit 9 every time the sensor selection signal 5ELIN is received.

第4図は可変抵抗回路9の一実施例を示す詳細回路図で
ある。R1−Rnは互いに直列に接続されて抵抗値がR
/2.R/2  、R/23 ・・・R2”からなる抵
抗、SW1〜5W11はサンプリング回路10の選択信
号5EL21〜S E L 2+alこよリオン/オフ
してオンのときに各抵抗R1−Rmを短絡するアナログ
スイッチであり、この可変抵抗切替用の切替手段をなす
FIG. 4 is a detailed circuit diagram showing one embodiment of the variable resistance circuit 9. R1-Rn are connected in series with each other and the resistance value is R.
/2. R/2, R/23...R2" resistors, SW1 to 5W11, are the selection signals 5EL21 to SEL2+al of the sampling circuit 10. When on/off, each resistor R1 to Rm is short-circuited. It is an analog switch and serves as a switching means for switching this variable resistance.

本構成によるバイアス電圧(電源)VCCとP点との間
の合成抵抗RLは、スイッチSWI〜SWiのオン時の
抵抗を無視した場合、Ul。
According to this configuration, the combined resistance RL between the bias voltage (power supply) VCC and the point P is Ul, if the resistance when the switches SWI to SWi are on is ignored.

U2.・・・Ullを、各スイッチSWl、SW2 、
・・・SWmがオンのとき′0“、オフのとき′1”と
なる可変数とすると、RL −(Ul /2+U2 /
2+U3 /23+・・・十〇m/2)Rで与えられる
U2. ... Ull, each switch SWl, SW2,
...If SWm is a variable number that is '0'' when it is on and '1' when it is off, then RL - (Ul /2 + U2 /
2+U3/23+...10m/2)R.

従って、可変数U l = U 2− =−−U m 
−0のときに合成抵抗RLはOとなって最小となり、可
変数Ul−U2−・・・−Us−1のときに合成抵抗R
Lは(1−1/2  )Rとなって最大となり、その分
解能はR/2″で与えられる。
Therefore, the variable number U l = U 2- =--U m
-0, the combined resistance RL becomes O, which is the minimum, and when the variable number Ul-U2-...-Us-1, the combined resistance R
L becomes maximum at (1-1/2)R, and its resolution is given by R/2''.

11は判別手段としての比較回路で、基本的には第2図
の比較器4と同等のものであり、制御回路7の基準電圧
選択信号5EL3によって@御されて、検知動作中にお
いては、第1の比較基準電圧として比較器4におけると
同様な電圧V REPを負入力側に受け、正入力側に電
圧VCEを受けて同様にオン/オフによる比較信号CP
を出力し、アイドル中には、第2の基準電圧として電圧
V !?EPより低いレベルの後記する所定の電圧VC
E(A’)と、電圧VCHとを同様に受け、そして第3
の基準電圧として同様な所定の電圧VCE(A’)と、
電圧VCEとを受けてオン/オフ信号を出力する。
Reference numeral 11 denotes a comparison circuit as a discrimination means, which is basically equivalent to the comparator 4 in FIG. A voltage V REP similar to that in comparator 4 is received on the negative input side as a comparison reference voltage of 1, and a voltage VCE is received on the positive input side, and a comparison signal CP is similarly turned on/off.
During idle, the voltage V! is used as the second reference voltage. ? A predetermined voltage VC, which will be described later, is lower than EP.
E(A') and the voltage VCH are similarly received, and the third
A predetermined voltage VCE (A') similar to the reference voltage of
It receives voltage VCE and outputs an on/off signal.

第5図は第1図の回路の出力特性図であり、各曲線CI
、C2と第1の比較基準電圧V REPは第3図におけ
る同符号のものとそれぞれ同等である。
FIG. 5 is an output characteristic diagram of the circuit in FIG. 1, and each curve CI
, C2 and the first comparison reference voltage V REP are respectively equivalent to those having the same symbols in FIG.

VCE(A’)は比較回路11の第2の比較基準電圧、
VCE(A’)は同様に第3の比較基準電圧で、これら
は電圧V REFより低い電圧であって、被検知媒体X
1〜Xnが無しの状態でセンサSl〜Snが汚損してい
ないときの受光トランジスタTri−Trnの電圧−電
流特性C1或は後記する汚損しているときの特性C1’
等の飽和領域における所定の電圧レベル範囲を設定して
いて、アイドル時に電圧V REPに変えて、プログラ
ムによって切替えて与えられる。
VCE (A') is the second comparison reference voltage of the comparison circuit 11,
VCE(A') is also a third comparison reference voltage, which is lower than the voltage V REF and is
Voltage-current characteristics C1 of the light-receiving transistors Tri-Trn when sensors Sl-Sn are not contaminated in the absence of sensors 1-Xn, or characteristics C1' when they are contaminated, which will be described later.
A predetermined voltage level range in the saturation region is set, and the voltage is switched and applied by a program in place of the voltage V REP during idle.

12は比較信号ラッチ回路で、制御回路7のセンサ選択
信号5ELINによって選択された各センサSt〜SI
Iの個々についての比較回路11による比較信号CP(
オン/オフ信号)を、サンプリング回路10のラッチ信
号LAによってラッチして、アイドル中の結果について
は制御回路7に与え、検知動作中の結果については後記
する媒体取扱い装置14に与える。13は制御回路7か
ら下記の記憶指示信号SMを受けたときに当該抵抗選択
信号S E L21−3 E L2mを記憶する記憶部
である。制御回路7は、アイドル中に比較信号ラッチ回
路12の各オン/オフ信号を受けてその結果により、可
変抵抗回路9によって調整された第5図に示す抵抗値の
特性線I11と曲線CIとの交点AIの電圧が各電圧V
CECA’)とVCE(A’)との範囲内にあることを
判4別し、このときサンプリング回路10に記憶指示信
号SMを与えて記憶部13に抵抗選択信号5EL21〜
5EL2a+を記憶させる。14は媒体取扱い装置で、
各被検知媒体X1・・・Xnの搬送制御及びその各処理
等を行なう。
Reference numeral 12 denotes a comparison signal latch circuit, which connects each sensor St to SI selected by the sensor selection signal 5ELIN of the control circuit 7.
The comparison signal CP(
The on/off signal) is latched by the latch signal LA of the sampling circuit 10, and the result during idle is provided to the control circuit 7, and the result during the sensing operation is provided to the medium handling device 14, which will be described later. Reference numeral 13 denotes a storage unit that stores the resistance selection signals S E L21-3 E L2m when receiving the following storage instruction signal SM from the control circuit 7. The control circuit 7 receives each on/off signal from the comparison signal latch circuit 12 during idle, and based on the results, calculates the relationship between the resistance value characteristic line I11 and the curve CI shown in FIG. 5, which are adjusted by the variable resistance circuit 9. The voltage at the intersection AI is each voltage V
CECA') and VCE(A'), and at this time, a storage instruction signal SM is given to the sampling circuit 10 to send the resistance selection signals 5EL21 to 5EL21 to the storage section 13.
5EL2a+ is stored. 14 is a media handling device;
The conveyance control of each medium to be detected X1...Xn and its respective processing are performed.

次に第1図の回路の動作を説明する。第6図はその各動
作を示すタイミングチャート、第7図(A)、第7図(
B)はその動作を示すフローチャートである。
Next, the operation of the circuit shown in FIG. 1 will be explained. Figure 6 is a timing chart showing each operation, Figure 7 (A), Figure 7 (
B) is a flowchart showing the operation.

アイドル状態になると、媒体取扱い装置14によって、
各光センサS1〜Snの搬送路における媒体X1〜Xn
無しの状態となり、、出力特性:J!J整動作が開始さ
れる。光センサS1から出力特性調整を始めるために、
制御回路7がセンサNo、N −1を設定する(ステッ
プpi)。
Once in the idle state, the media handling device 14
Medium X1 to Xn in the transport path of each optical sensor S1 to Sn
Output characteristics: J! J adjustment operation is started. To start adjusting the output characteristics from optical sensor S1,
The control circuit 7 sets sensor No. N-1 (step pi).

そして可変抵抗回路9の合成抵抗RLを最大とするため
にサンプリング回路10が、各スイッチSWI〜SW濁
をオフ1こすべくUl−U2−・・・−Ua=1を設定
する(P2)。制御回路7からセンサ選択信号S E 
L INをセンサ選択回路8、サンプリング回路10、
比較信号ラッチ回路12に出力する(P3)。サンプリ
ング回路10はこれを受けて、ステップP2で設定され
た可変数Ul。
Then, in order to maximize the combined resistance RL of the variable resistance circuit 9, the sampling circuit 10 sets Ul-U2-...-Ua=1 to turn off each switch SWI to SW by 1 (P2). Sensor selection signal S E from control circuit 7
LIN is connected to the sensor selection circuit 8, the sampling circuit 10,
The comparison signal is output to the latch circuit 12 (P3). In response to this, the sampling circuit 10 sets the variable number Ul set in step P2.

U2.・・・Usに従って抵抗選択信号SEL21−S
EL2mをセンサ選択信号5ELINの出力期間中にわ
たって可変抵抗回路9に出力する(P4)。このとき合
成抵抗RLはRL −(1−1/2  ) Rとなる。
U2. ...Resistance selection signal SEL21-S according to Us
EL2m is output to the variable resistance circuit 9 during the output period of the sensor selection signal 5ELIN (P4). At this time, the combined resistance RL becomes RL - (1-1/2) R.

次に、合成抵抗RLが整定されるまでの時間TIを待っ
て制御回路7から基準電圧選択信号5EL(として、第
4図に示す電圧VCE(A’)を供給すべく比較回路1
1に出力する(P5)。
Next, after waiting the time TI until the combined resistance RL is settled, the control circuit 7 supplies the reference voltage selection signal 5EL (as the voltage VCE (A') shown in FIG. 4) to the comparison circuit 1.
1 (P5).

比較回路11は電圧VCHを電圧VCH(A’)と比較
してその結果を比較信号ラッチ回路11に出力する。可
変抵抗回路9と比較回路11の安定時間T2を待って、
サンプリング回路10からラッチ信号LAが出力され、
比較信号ラッチ回路12からセンサS1に対する比較回
路11の比較信号CPが出力される。制御回路7は該信
号CPを読み取り、オン/オフの判定を行なう(P6)
。オフのときは第5図で示す媒体無しの特性曲線C1と
合成抵抗RL −(1−1/2” )Rによる直線g1
との交点A1が電圧VCE(A’)よりも左にあるので
直線ρlの傾斜を直線f11′の傾斜よりも大にして電
圧VCEが交点Al’よりも右になるように、サンプリ
ング回路10が可変数Ul〜Umを減算する(P7)。
Comparison circuit 11 compares voltage VCH with voltage VCH (A') and outputs the result to comparison signal latch circuit 11. Waiting for the stabilization time T2 of the variable resistance circuit 9 and comparison circuit 11,
A latch signal LA is output from the sampling circuit 10,
The comparison signal CP of the comparison circuit 11 for the sensor S1 is output from the comparison signal latch circuit 12. The control circuit 7 reads the signal CP and makes an on/off determination (P6)
. When off, a straight line g1 is formed by the characteristic curve C1 without medium shown in Fig. 5 and the combined resistance RL - (1-1/2") R.
Since the intersection point A1 is to the left of the voltage VCE (A'), the sampling circuit 10 makes the slope of the straight line ρl larger than the slope of the straight line f11' so that the voltage VCE is to the right of the intersection point Al'. The variable numbers Ul to Um are subtracted (P7).

この減算は制御回路7により予め決められたアルゴリズ
ムにより実現され、例えば当初の合成抵抗RLをRLO
とすると順次RL −RLO/2 (−RLI) 、 
RL■RLl/ 2−RLO/4 (−RL2) 、 
・・・とする。このとき減算が可能であったならば(P
8 ”) 、該各減算結果に基づいて前記各ステップP
4〜P8の動作を縁り返し、当初或はその結果、比較信
号CPがオンになったときは制御回路7から基準電圧選
択信号5EL3として、比較回路11に対して電圧VC
E(A′)を供給すべく指定する(P9)。そして前記
ステップP6におけると同様に信号CPのオン/オフの
判定を行い(PIO)、オンのときは、交点A1が電圧
VCE(A’)よりも右にあるので、電圧VCEが交点
A1’ よりも左になるように、可変数Ul−Usを加
算する( P 11)。この加算は、例えば、RL −
(RLO+RLO/2) /2纏3RLO/4 <−R
LI) 、 RL −(RLO+RLl/2) /2−
7RLO/8(■RL2)、・・・とする。このとき加
算が可能であったならば(PI3)、前記同様に各ステ
ーツブP4〜P8、或はP4〜PL2を繰返し、その結
果、比較信号CPがオフになったときは(PIO)、そ
のときの当該光センサSNについての各可変数Ul−U
a+の値を記憶部13に記憶する( P 13)。そし
てセンサNo、NがnになるまでNを加算して(PI4
.  PI3) 、各ステップP2〜P15の動作を繰
返し、Nmnになると(P 14)、その時アイドル中
であると(PiB)、ステップptに戻って前記各動作
を繰返し実行する。
This subtraction is realized by an algorithm predetermined by the control circuit 7. For example, the initial combined resistance RL is
Then, sequentially RL -RLO/2 (-RLI),
RL■RLl/ 2-RLO/4 (-RL2),
...and... If subtraction was possible at this time (P
8''), each step P based on the respective subtraction results.
4 to P8, when the comparison signal CP is turned on initially or as a result, the control circuit 7 outputs the voltage VC to the comparison circuit 11 as the reference voltage selection signal 5EL3.
E(A') is specified to be supplied (P9). Then, in the same way as in step P6, it is determined whether the signal CP is on or off (PIO), and when it is on, since the intersection A1 is to the right of the voltage VCE (A'), the voltage VCE is lower than the intersection A1'. The variable number Ul-Us is added so that Ul-Us is also on the left (P11). This addition, for example, RL −
(RLO+RLO/2) /2 3RLO/4 <-R
LI), RL-(RLO+RLl/2)/2-
7RLO/8 (■RL2), . . . If addition is possible at this time (PI3), each state P4 to P8 or P4 to PL2 is repeated as described above, and as a result, if the comparison signal CP turns off (PIO), then Each variable number Ul-U for the optical sensor SN of
The value of a+ is stored in the storage unit 13 (P13). Then, add N until sensor No. and N become n (PI4
.. PI3), the operations of each step P2 to P15 are repeated, and when Nmn is reached (P14), and if it is idle at that time (PiB), the process returns to step pt and the above-mentioned operations are repeated.

なお、前記ステップP8において、ステップP7による
減算が不能であった場合、即ちその減算の以前に可変数
Ul −U2−・・・UimOであったとき、或いはス
テップP12において、ステップPIOによる加算が不
能であった場合、即ちその加算の以前の可変数0l−U
2−・・・−Us −1であったときは、エラー表示し
て(PI3)、終了する。
In addition, in the step P8, if the subtraction in the step P7 is not possible, that is, before the subtraction, the variable number Ul -U2-...UimO, or in the step P12, the addition in the step PIO is not possible. , that is, the variable number 0l−U before the addition
2--Us -1, an error is displayed (PI3) and the process ends.

次に、前記ステップPlGにおいてアイドル中でなくな
るなどで、媒体取扱い装置14から媒体検知動作開始指
令が出力されると、制御回路7は基準電圧選択信号5E
L3として、電圧V REPを比較回路11に出力する
( P 1B)。そして、光センサS1から媒体検知動
作を始めるために、センサNo、N−1を設定する( 
P 19)。サンプリング回路10は制御回路7の指示
により、記憶部13に記憶されているセンサSNについ
ての可変数Ul。
Next, when the medium handling device 14 outputs a command to start the medium detection operation, such as when it is no longer idle in step PlG, the control circuit 7 outputs the reference voltage selection signal 5E.
As L3, the voltage VREP is output to the comparison circuit 11 (P1B). Then, in order to start the medium detection operation from optical sensor S1, sensor No. N-1 is set (
P19). The sampling circuit 10 receives a variable number Ul for the sensor SN stored in the storage unit 13 according to an instruction from the control circuit 7.

U2.・・・Usを読取り(820)、これに従った抵
抗選択信号5EL21〜S E L 2mを可変抵抗回
路9に出力する( P 21)。そして制御回路7は、
センサ選択信号S E L INをセンサ選択回路8、
サンプリング回路10、比較信号ラッチ回路12に出力
する( P 22)。その結果、前記のステップP8に
おけると同様な安定時間T2が経過後に媒体取扱い装置
14はセンサSHについての媒体有無の検知が可能とな
る。
U2. . . . reads Us (820), and outputs resistance selection signals 5EL21 to SEL2m according to this to the variable resistance circuit 9 (P21). And the control circuit 7 is
The sensor selection signal SELIN is sent to the sensor selection circuit 8,
The signal is output to the sampling circuit 10 and the comparison signal latch circuit 12 (P22). As a result, the medium handling device 14 can detect the presence or absence of the medium with respect to the sensor SH after the stabilization time T2 similar to that in step P8 has elapsed.

そしてセンサNo、NがnになるまでNを加算して(P
23. ?24) 、各ステップP21〜P24の動作
を繰返し、N−nになると(P23)、このとき媒体取
扱い装置14の指示により、媒体検出動作が継続中なら
ば(P25)、各ステップP19〜P25の動作を繰返
し実行する。そして媒体検知動作が終了ならばステツブ
P1B以後の動作を実行する。
Then, add N until sensor No. and N become n (P
23. ? 24) Repeat the operations of each step P21 to P24, and when reaching N-n (P23), if the medium detection operation is continuing according to an instruction from the medium handling device 14 (P25), each step P19 to P25 is performed. Perform an action repeatedly. When the medium detection operation is completed, the operations after step P1B are executed.

第8図は第1図の回路において光センサの汚損有無によ
る出力特性の変化を示す図であり、光センサS1〜Sn
が紙粉等で汚損されると媒体無しの特性は曲線C1から
曲線CI’へ移行し、媒体有りの特性は曲線C2から曲
線C2’へと移行するが、その場合は第5図の特性によ
って直線、Qlに調整されたと同様にして、アイドル中
に所定の1圧範囲VCE(A’ )、VCE(A’ )
によッテ交点A2が定まり、直線g2に調整される。
FIG. 8 is a diagram showing changes in output characteristics depending on whether or not the optical sensors are contaminated in the circuit of FIG.
When the is soiled with paper dust etc., the characteristics without a medium shift from curve C1 to curve CI', and the characteristics with medium shift from curve C2 to curve C2', but in that case, according to the characteristics shown in Fig. 5. In the same way as when adjusted to straight line, Ql, the predetermined 1 pressure range VCE(A'), VCE(A') during idling.
The intersection point A2 is determined and adjusted to a straight line g2.

なお、本実施例においては、WS2図におけるような演
算増幅器の構成による比較器を用いた例を説明したが、
比較回路11の代りに各電圧V CE。
In addition, in this example, an example using a comparator with an operational amplifier configuration as shown in Fig. WS2 was explained.
Each voltage VCE instead of the comparator circuit 11.

VCE (A’ ) 、 VCIE (A’ ) 、 
VREF等をアナログ−ディジタル変換して、これらの
数値をプログラムによって比較し、且つその比較結果に
より比較信号CPを送出するようにしてもよい。
VCE (A'), VCIE (A'),
VREF or the like may be converted into analog-to-digital data, these numerical values may be compared by a program, and the comparison signal CP may be sent out based on the comparison result.

さらに、可変抵抗回路9は、実施例のみによらず、同様
の効果があるものであれば、その構成、接続方法は種々
類推できることはいうまでもない。
Furthermore, it goes without saying that the configuration and connection method of the variable resistance circuit 9 can be inferred in various ways, not only according to the embodiments, but as long as they have similar effects.

(発明の効果) 以上説明したように本発明によれば、検知動作のアイド
ル時に、被検知媒体無しの状態で受光部の負荷抵抗回路
の抵抗値を電気信号の設定値により切替え、その切替値
を記憶し、検知動作中においては、記憶された切替値を
もとに、前記負荷抵抗回路の抵抗値を設定可能としたの
で、媒体有無の判別をするための光センサの出力特性が
適正に自動調整可能となる。また光センサが汚損した場
合でも、その汚損に応じて出力特性を追従可能としたの
で、媒体の有無を確実に検知することができる。
(Effects of the Invention) As explained above, according to the present invention, when the detection operation is idle, the resistance value of the load resistance circuit of the light receiving section is switched in a state where there is no medium to be detected, according to the set value of the electric signal, and the switching value is stored, and during the detection operation, the resistance value of the load resistance circuit can be set based on the stored switching value, so that the output characteristics of the optical sensor for determining the presence or absence of a medium can be set appropriately. Automatic adjustment is possible. Furthermore, even if the optical sensor is soiled, the output characteristics can be tracked in accordance with the soiling, so the presence or absence of the medium can be reliably detected.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例を示す媒体検知装置の自動調整
回路のブロック図、第2図は従来の媒体検知回路図、第
3図は第2図の回路の出力特性図、第4図は可変抵抗回
路の詳細回路図、第5図は第1図の回路の動作特性図、
第6図は第1図の回路の動作を示すタイミングチャート
、第7図(A)、第7図CB)は第1図の回路の動作を
示すフローチャート、第8図は第1図の回路において光
センサの汚損有無による出力特性図である。 7・・・制御回路、9・・・可変抵抗回路、10・・・
サンプリング回路、11・・・比較回路、13・・・記
憶部、XI−Xn・・・被検知媒体、S1〜Sn・・・
光センサ、SWI−8Wm・・・アナログスイッチ。 特許出願人  沖電気工業株式会社 代理人 弁理士  吉 1)精 孝 第1図の口語の出力T千1生図 第5図 第6図
Fig. 1 is a block diagram of an automatic adjustment circuit of a medium detection device showing an embodiment of the present invention, Fig. 2 is a conventional medium detection circuit diagram, Fig. 3 is an output characteristic diagram of the circuit of Fig. 2, and Fig. 4 is a detailed circuit diagram of the variable resistance circuit, Figure 5 is a diagram of the operating characteristics of the circuit in Figure 1,
6 is a timing chart showing the operation of the circuit in FIG. 1, FIG. 7 (A), FIG. 7 CB) is a flowchart showing the operation of the circuit in FIG. It is an output characteristic diagram depending on whether the optical sensor is contaminated or not. 7... Control circuit, 9... Variable resistance circuit, 10...
Sampling circuit, 11... Comparison circuit, 13... Storage section, XI-Xn... Medium to be detected, S1-Sn...
Optical sensor, SWI-8Wm...analog switch. Patent Applicant Oki Electric Industry Co., Ltd. Agent Patent Attorney Yoshi 1) Takashi Sei Figure 1 Colloquial Output T11 Live Diagram 5 Figure 6

Claims (4)

【特許請求の範囲】[Claims] (1)発光部と受光部とを被検知媒体の通路に跨って配
置した光センサを用い、被検知媒体の有無による透過光
の差異による受光部の光電流の変化を電圧信号に変換す
るための負荷抵抗回路を有し、該電圧信号の変化により
被検知媒体の有無を判別する光学式媒体検知装置の自動
調整回路において、前記負荷抵抗回路は、可変抵抗と該
可変抵抗の抵抗値を電気信号の設定値により切替える切
替手段とを有し、 前記電気信号の設定値を記憶するための記憶手段と、 前記記憶手段に記憶された電気信号の設定値により前記
切替手段を制御する切替制御手段とを有した ことを特徴とする光学式媒体検知装置の自動調整回路。
(1) Using an optical sensor in which a light-emitting part and a light-receiving part are placed across the path of the detected medium, the change in the photocurrent of the light-receiving part due to the difference in transmitted light depending on the presence or absence of the detected medium is converted into a voltage signal. In an automatic adjustment circuit for an optical medium detection device that has a load resistance circuit and determines the presence or absence of a medium to be detected based on a change in the voltage signal, the load resistance circuit has a variable resistor and a resistance value of the variable resistor that is electrically adjusted. a switching means that switches according to a set value of the signal, a storage means for storing the set value of the electric signal, and a switching control means that controls the switching means according to the set value of the electric signal stored in the storage means. An automatic adjustment circuit for an optical medium detection device, comprising:
(2)前記被検知媒体の有無を判別するための判別手段
は、前記電圧信号と比較する比較基準値を、被検知媒体
の有無を判別するための第1の比較基準値と該第1の比
較基準値によって被検知媒体無しに判別される領域を設
定した所定の第2と第3の比較基準値とに切替可能にし
た ことを特徴とする請求項(1)記載の光学式媒体検知装
置の自動調整回路。
(2) The determining means for determining the presence or absence of the detected medium is configured to set a comparison reference value to be compared with the voltage signal to a first comparison reference value for determining the presence or absence of the detected medium. The optical medium detection device according to claim 1, characterized in that the optical medium detection device according to claim 1 is capable of switching between predetermined second and third comparison reference values in which a region determined as having no medium to be detected is set based on the comparison reference value. automatic adjustment circuit.
(3)前記可変抵抗は複数個の固定抵抗よりなり、前記
切替手段は複数個のスイッチ制御手段よりなり、前記電
気信号の設定値に基づき前記スイッチ制御手段により、
該固定抵抗の抵抗値を段階的に切替可能とした ことを特徴とする請求項(1)記載の光学式媒体検知装
置の自動調整回路。
(3) The variable resistor is composed of a plurality of fixed resistors, the switching means is composed of a plurality of switch control means, and the switch control means, based on the set value of the electric signal,
The automatic adjustment circuit for an optical medium detection device according to claim 1, wherein the resistance value of the fixed resistor can be changed in stages.
(4)発光部と受光部とを被検知媒体の通路に跨って配
置した光センサをを用い、被検知媒体の有無による透過
光の差異による受光部の光電流の変化を電圧信号に変換
するための負荷抵抗回路を有し、該電圧信号の変化によ
り被検知媒体の有無を判別する光学式媒体検知装置の自
動調整方法において、検知動作中でないときに検知媒体
なしの状態で、前記電圧信号と比較する比較基準値とし
て、被検知媒体の有無を判別するための第1の比較基準
値と、該第1の比較基準値によって被検知媒体無しに判
別される領域の所定の第2と第3の比較基準値とを交互
に設定するとともに、電気信号の設定値により負荷抵抗
回路の抵抗値を順次切替えて、前記電圧信号が前記第2
および第3の比較基準値の範囲内となったときの切替値
を記憶し、 検知動作中に、前記記憶された切替値により負荷抵抗回
路の抵抗値を設定するとともに前記電圧信号を前記第1
の比較基準値と比較することにより、被検知媒体の有無
を判別ならしめる ことを特徴とする光学式媒体検知装置の自動調整方法。
(4) Using an optical sensor in which a light emitting part and a light receiving part are placed across the path of the medium to be detected, changes in the photocurrent of the light receiving part due to differences in transmitted light due to the presence or absence of the medium to be detected are converted into voltage signals. In an automatic adjustment method for an optical medium detection device, which has a load resistance circuit for detecting a medium and determines the presence or absence of a medium to be detected based on a change in the voltage signal, the voltage signal A first comparison reference value for determining the presence or absence of a detected medium, and a predetermined second and second comparison value of an area determined to be free of a detected medium by the first comparison reference value. 3 are set alternately, and the resistance value of the load resistance circuit is sequentially switched according to the set value of the electric signal, so that the voltage signal is set as the second comparison reference value.
and a third comparison reference value, and during the detection operation, the resistance value of the load resistance circuit is set according to the stored switching value, and the voltage signal is set to the first
1. An automatic adjustment method for an optical medium detection device, characterized in that the presence or absence of a medium to be detected is determined by comparing with a comparison reference value.
JP63220234A 1988-09-02 1988-09-02 Automatic adjustment circuit and automatic adjustment method for optical medium detection device Expired - Fee Related JP2582870B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP63220234A JP2582870B2 (en) 1988-09-02 1988-09-02 Automatic adjustment circuit and automatic adjustment method for optical medium detection device
US07/399,931 US4985636A (en) 1988-09-02 1989-08-29 Medium detecting system with automatic compensation for sensor variations
KR1019890012704A KR950015068B1 (en) 1988-09-02 1989-09-02 Medium detecting system with automatic compensation for senso bariatons

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63220234A JP2582870B2 (en) 1988-09-02 1988-09-02 Automatic adjustment circuit and automatic adjustment method for optical medium detection device

Publications (2)

Publication Number Publication Date
JPH0267918A true JPH0267918A (en) 1990-03-07
JP2582870B2 JP2582870B2 (en) 1997-02-19

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ID=16747990

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
JP (1) JP2582870B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0424591A (en) * 1990-05-18 1992-01-28 Oki Electric Ind Co Ltd Medium detection device
JPH0424589A (en) * 1990-05-18 1992-01-28 Oki Electric Ind Co Ltd Detecting device of medium
JPH04144855A (en) * 1990-10-04 1992-05-19 Oki Electric Ind Co Ltd Medium detecting device
JPH0496090U (en) * 1991-01-14 1992-08-20
JPH04340492A (en) * 1991-05-16 1992-11-26 Oki Electric Ind Co Ltd Medium detecting device
JP2002100811A (en) * 2000-09-21 2002-04-05 Fujitsu Kiden Ltd Light-emitting current control circuit of light-emitting sensor
JP2010085254A (en) * 2008-09-30 2010-04-15 Olympus Corp Encoder
JP2012159516A (en) * 2012-05-14 2012-08-23 Hitachi High-Technologies Corp Foreign matter inspection device for semiconductor wafer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6269178U (en) * 1985-10-22 1987-04-30
JPS6377938U (en) * 1986-11-11 1988-05-23

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6269178U (en) * 1985-10-22 1987-04-30
JPS6377938U (en) * 1986-11-11 1988-05-23

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0424591A (en) * 1990-05-18 1992-01-28 Oki Electric Ind Co Ltd Medium detection device
JPH0424589A (en) * 1990-05-18 1992-01-28 Oki Electric Ind Co Ltd Detecting device of medium
JPH04144855A (en) * 1990-10-04 1992-05-19 Oki Electric Ind Co Ltd Medium detecting device
JPH0496090U (en) * 1991-01-14 1992-08-20
JPH04340492A (en) * 1991-05-16 1992-11-26 Oki Electric Ind Co Ltd Medium detecting device
JP2002100811A (en) * 2000-09-21 2002-04-05 Fujitsu Kiden Ltd Light-emitting current control circuit of light-emitting sensor
JP2010085254A (en) * 2008-09-30 2010-04-15 Olympus Corp Encoder
JP2012159516A (en) * 2012-05-14 2012-08-23 Hitachi High-Technologies Corp Foreign matter inspection device for semiconductor wafer

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