JPH0267266U - - Google Patents
Info
- Publication number
- JPH0267266U JPH0267266U JP14623088U JP14623088U JPH0267266U JP H0267266 U JPH0267266 U JP H0267266U JP 14623088 U JP14623088 U JP 14623088U JP 14623088 U JP14623088 U JP 14623088U JP H0267266 U JPH0267266 U JP H0267266U
- Authority
- JP
- Japan
- Prior art keywords
- probe card
- measurement
- stacked
- measurement window
- windows
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 22
- 238000005259 measurement Methods 0.000 claims description 9
- 238000005476 soldering Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14623088U JPH0267266U (en18) | 1988-11-09 | 1988-11-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14623088U JPH0267266U (en18) | 1988-11-09 | 1988-11-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0267266U true JPH0267266U (en18) | 1990-05-22 |
Family
ID=31415525
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14623088U Pending JPH0267266U (en18) | 1988-11-09 | 1988-11-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0267266U (en18) |
-
1988
- 1988-11-09 JP JP14623088U patent/JPH0267266U/ja active Pending
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