JPH026523U - - Google Patents

Info

Publication number
JPH026523U
JPH026523U JP8594688U JP8594688U JPH026523U JP H026523 U JPH026523 U JP H026523U JP 8594688 U JP8594688 U JP 8594688U JP 8594688 U JP8594688 U JP 8594688U JP H026523 U JPH026523 U JP H026523U
Authority
JP
Japan
Prior art keywords
lid
glass
adhesive
thick plate
plate glass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8594688U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8594688U priority Critical patent/JPH026523U/ja
Publication of JPH026523U publication Critical patent/JPH026523U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Closures For Containers (AREA)
JP8594688U 1988-06-29 1988-06-29 Pending JPH026523U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8594688U JPH026523U (enrdf_load_stackoverflow) 1988-06-29 1988-06-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8594688U JPH026523U (enrdf_load_stackoverflow) 1988-06-29 1988-06-29

Publications (1)

Publication Number Publication Date
JPH026523U true JPH026523U (enrdf_load_stackoverflow) 1990-01-17

Family

ID=31310599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8594688U Pending JPH026523U (enrdf_load_stackoverflow) 1988-06-29 1988-06-29

Country Status (1)

Country Link
JP (1) JPH026523U (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6035026B2 (ja) * 1979-09-08 1985-08-12 株式会社 堀場製作所 超低濃度イオン測定装置の校正方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6035026B2 (ja) * 1979-09-08 1985-08-12 株式会社 堀場製作所 超低濃度イオン測定装置の校正方法

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