JPH0257951A - Standard specimen for fluorescent x rays and manufacture thereof - Google Patents

Standard specimen for fluorescent x rays and manufacture thereof

Info

Publication number
JPH0257951A
JPH0257951A JP63209144A JP20914488A JPH0257951A JP H0257951 A JPH0257951 A JP H0257951A JP 63209144 A JP63209144 A JP 63209144A JP 20914488 A JP20914488 A JP 20914488A JP H0257951 A JPH0257951 A JP H0257951A
Authority
JP
Japan
Prior art keywords
filter
standard
specimen
pure water
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63209144A
Other languages
Japanese (ja)
Inventor
Minoru Akimoto
実 秋元
Yoshitake Morikawa
森川 義武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Nippon Atomic Industry Group Co Ltd
Original Assignee
Toshiba Corp
Nippon Atomic Industry Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Nippon Atomic Industry Group Co Ltd filed Critical Toshiba Corp
Priority to JP63209144A priority Critical patent/JPH0257951A/en
Publication of JPH0257951A publication Critical patent/JPH0257951A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent the scattering of a standard specimen when X rays are emitted and to perform measurement whose absolute value is stabilized for a long time by attaching fine powders of one or two or more kinds of metal oxides having a specified amount on a filter, and covering the powder with a macromolecular thin film. CONSTITUTION:Metal oxides reagents shown in the Table are finely crushed. Specified amounts of the reagents are measured. The reagents are put into a measuring flask. Pure water is added, and the level is aligned with a marked line. The powders in the pure water are uniformly dispersed for 15-20min by using an ultrasonic wave cleaner, and a standard liquid is obtained. Then several-ml pure water is added on a specimen filter which is set on a filter device. The specified amount of the standard liquid which is prepared beforehand is accurately dispersed and dropped. After about 1min, filtering operation is performed. A macromolecular compound is blown on the capturing surface of the obtained metal oxide, and a protecting film is provided. The film is dried, and the standard specimen for fluorescent X rays is obtained. Since the metal oxide is used in the same pattern as an actual specimen, an analyzer can be calibrated accurately. The absolute value of the minute metal component in the actual specimen can thus be measured.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、長期間にわたり品質の安定した蛍光X線用標
準試料およびその製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a standard sample for fluorescent X-rays whose quality is stable over a long period of time, and a method for producing the same.

(従来の技術) 従来より、水中の微量金属成分の分析定量法の1つとし
て、蛍光X線分析法が知られている。
(Prior Art) Fluorescence X-ray analysis has been known as one of the methods for analyzing and quantifying trace metal components in water.

この方法においては、微量金属成分をフィルタ上に捕集
し蛍光X線分析装置により分析定量するうえで、装置の
較正のために、長期間品質が安、定し、かつ実際の未知
試料に近い形態の標準試料が求められている。
In this method, trace metal components are collected on a filter and analyzed and quantified using a fluorescence A standard specimen of this morphology is required.

このような標準試料としては、従来より、沈澱物をフィ
ルタ上に捕集し乾燥したDDTC標準試料や、金属酸化
物をホウ酸ナトリウム等の融剤と混合し高温で溶融調合
したガラスビード標準試料等が知られている。
Conventionally, such standard samples include DDTC standard samples in which precipitates are collected on a filter and dried, and glass bead standard samples in which metal oxides are mixed with a fluxing agent such as sodium borate and melted at high temperatures. etc. are known.

(発明が解決しようとする課題) しかしながら、前者のDDTC標準試料は、X線照射時
に機械的衝撃による飛散が大きく、しかも経時変化があ
り、また沈澱物であるため実試料と形態が異なるという
欠点があった。一方、後者のガラスビード標準試料は、
作成が困難なうえ、出来たものは割れやすく、また前者
と同様実試料と形態が異なるという欠点があった。さら
にこれらの標準試料は、いずれも相対値しか測定できな
いという欠点もあった。
(Problem to be Solved by the Invention) However, the former DDTC standard sample has disadvantages in that it is subject to large scattering due to mechanical impact during X-ray irradiation, changes over time, and is a precipitate that differs in form from the actual sample. was there. On the other hand, the latter glass bead standard sample is
Not only was it difficult to create, the resulting product was easily broken, and like the former, it had the disadvantage of differing in form from the actual sample. Furthermore, each of these standard samples had the disadvantage that only relative values could be measured.

本発明はこのような従来の標準試料の欠点を解消するた
めになされたものであり、X線照射時に標準試料の飛散
がなく、また絶対値の測定が可能で長期間安定した測定
値の得られる蛍光X線用標準試料を提供することをその
目的とする。
The present invention has been made in order to eliminate these drawbacks of conventional standard samples, and it eliminates the scattering of the standard sample during X-ray irradiation, and also makes it possible to measure absolute values and obtain stable measurement values over a long period of time. The purpose is to provide a standard sample for fluorescent X-rays that can be used.

[発明の構成] (課題を解決す、るための手段) すなわち本発明の蛍光X線用標準試料は、所定量の1種
または2種以上の金属酸化物微粉末をフィルタ上に付着
させ、その上を高分子薄膜で被覆してなることを特徴と
しており、またその製造方法は、純水中に所定量の1f
Iまたは2種以上の金属酸化物微粉末を均一に分散させ
て標準液を調製し、この標準液を試料用フィルタを用い
てろ過することにより一定量の金属酸化物を前記フィル
タ上に均一に捕集した後、前記フィルタの金属酸化物微
粉末の捕集面上に高分子溶液を付着させ乾燥することを
特徴としている。
[Structure of the Invention] (Means for Solving the Problems) That is, the standard sample for fluorescent X-rays of the present invention is prepared by depositing a predetermined amount of one or more metal oxide fine powders on a filter, It is characterized by being coated with a thin polymer film, and its manufacturing method involves adding a predetermined amount of 1f to pure water.
Prepare a standard solution by uniformly dispersing I or two or more types of metal oxide fine powder, and filter this standard solution using a sample filter to uniformly distribute a certain amount of metal oxide on the filter. After collection, a polymer solution is deposited on the collection surface of the metal oxide fine powder of the filter and dried.

純水中に分散されるべき金属酸化物としては、最高純度
の試薬を用い、これを予めメノウ製の乳鉢あるいはメノ
ウ製の粉砕部を有する電動の粉砕機により十分に微粉砕
する。微粉砕された金属酸化物を純水に加え、超音波洗
浄器により超音波を約15〜20分間作用させて、純水
中に均一に分散させる。
As the metal oxide to be dispersed in pure water, a reagent of the highest purity is used, and this is thoroughly pulverized in advance in an agate mortar or an electric pulverizer having an agate pulverizer. The finely ground metal oxide is added to pure water, and ultrasonic waves are applied for about 15 to 20 minutes using an ultrasonic cleaner to uniformly disperse it in the pure water.

また、このようにして得られた標準液の一定量を試料フ
ィルタ上に滴下した後、約1分経過したのちにろ過操作
を行うことにより、金属酸化物がフィルタ上に均一に分
散した状態で捕集される。
In addition, by dropping a certain amount of the standard solution obtained in this way onto the sample filter and performing the filtration operation after about 1 minute, the metal oxide can be uniformly dispersed on the filter. be captured.

なお、この捕集面上に施される保護被膜としては、たと
えば吹き付は高分子膜、あるいはプラスチックフィルム
パウチによるもの等が好適である。
The protective coating to be applied on the collection surface is preferably a sprayed polymer film or a plastic film pouch.

(作用) このように構成された本発明の蛍光X線用標準試料にお
いては、超音波洗浄器により金属酸化物が、分析される
べき実試料と同様に水中に均一に分散され、さらに実試
料と同様にフィルタ上に均一に捕集されるので、実試料
と標準試料とを同形態とすることができる。さらにフィ
ルタの捕集面上に保護被膜を設けているので、標準試料
の飛散を防止することができる。
(Function) In the fluorescent X-ray standard sample of the present invention configured as described above, metal oxides are uniformly dispersed in water by the ultrasonic cleaner in the same manner as the actual sample to be analyzed, and further Since the sample is collected uniformly on the filter in the same manner as in the above, the actual sample and the standard sample can have the same form. Furthermore, since a protective coating is provided on the collection surface of the filter, it is possible to prevent the standard sample from scattering.

また本発明の方法によれば、このような標準試料を容易
に製作し得る。
Further, according to the method of the present invention, such a standard sample can be easily produced.

(実施例) 以下本発明の実施例について説明する。(Example) Examples of the present invention will be described below.

金属酸化物試薬(Fe;+ 03 、CoO、CuO、
Nl01ZnO’s Cr203 、MnO°2)をそ
れぞれメノウ製の乳鉢により十分に微粉砕し、この微粉
砕された金属酸化物の一定量をセミミクロ天秤を用いて
正確に秤量した。次表に使用した各試薬の純度を示す。
Metal oxide reagent (Fe; + 03 , CoO, CuO,
Nl01ZnO's Cr203, MnO°2) were sufficiently pulverized in an agate mortar, and a certain amount of the pulverized metal oxide was accurately weighed using a semi-microbalance. The following table shows the purity of each reagent used.

(以下余白) (注) :三津和化学社製 本*:関東化学社製 * 秤量されたこれらの金属酸化物微粉末をメスフラスコ中
に入れ、そこに純水を加えて標線に合せた。そして純水
中のこれらの金属酸化物微粉末を、超音波洗浄器を用い
て15〜20分間均一に分散させて標準液を得た。この
とき超音波洗浄器による分散中は、液体の温度が上昇す
ることのないように氷等を用いて冷却することが好まし
い。
(Margin below) (Note): Book bound by Mitsuwa Kagaku Co., Ltd.*: Manufactured by Kanto Kagaku Co., Ltd.* These weighed metal oxide fine powders were placed in a volumetric flask, and pure water was added thereto to match the marked line. Then, these metal oxide fine powders in pure water were uniformly dispersed for 15 to 20 minutes using an ultrasonic cleaner to obtain a standard solution. At this time, during dispersion using an ultrasonic cleaner, it is preferable to cool the liquid using ice or the like so that the temperature of the liquid does not rise.

次に、予めろ過器上にセットした試料用フィルタ上に、
数1の純水を加える。そしてその中に、先に調製した標
準液の一定量を、たとえばエッペンドルフビベット等を
用いて正確に一定量分散して滴下した。約1分間そのま
まの状態を保ち、しかるのちにろ過操作を行った。この
ようにして得られた金属酸化物捕集面の上に、高分子化
合物を吹き付けて保護膜を設けたのち、乾燥して本発明
の蛍光X線用標準試料が得られた。
Next, place it on the sample filter that has been set on the filter in advance.
Add pure water of number 1. Then, a certain amount of the previously prepared standard solution was accurately dispersed and dropped into the solution using, for example, an Eppendorf bivet. The condition was maintained for about 1 minute, and then a filtration operation was performed. A protective film was provided on the metal oxide collecting surface thus obtained by spraying a polymer compound, and then dried to obtain a standard sample for fluorescent X-rays of the present invention.

このようにして得られた蛍光X線用標僧試料は、X線照
射時の機械的衝撃による飛散もみられず長期間の使用に
耐えた。また鉄を例にとって図面に検量線を示すように
、本実施例によれば、実試料に含まれる微量金属成分の
絶対値をn1定することが可能であった。
The thus obtained fluorescent X-ray marker sample endured long-term use without any scattering due to mechanical impact during X-ray irradiation. Further, according to this example, it was possible to determine n1 the absolute value of a trace metal component contained in an actual sample, as shown by the calibration curve in the drawing, taking iron as an example.

[発明の効果] 以上説明したように、本発明の蛍光X線用標準試料は、
実試料と同様の形態で金属酸化物が使用されているので
、蛍光X線分析装置の較正をより正確に行うことができ
る。したがって本発明によれば、実試料に含まれる微量
金属成分の絶対値を測定することが可能となる。さらに
標準試料の表面に、測定値に影響を及ぼすおそれのない
材質からなる保護膜を設けているので、長期にわたって
安定した品質を保つことが可能となる。また、本発明の
方法によれば、このような標準試料を容易に製造するこ
とができる。
[Effects of the Invention] As explained above, the standard sample for fluorescent X-rays of the present invention has the following properties:
Since the metal oxide is used in a form similar to that of the actual sample, the X-ray fluorescence spectrometer can be calibrated more accurately. Therefore, according to the present invention, it is possible to measure the absolute value of trace metal components contained in an actual sample. Furthermore, since a protective film made of a material that does not affect measured values is provided on the surface of the standard sample, stable quality can be maintained over a long period of time. Further, according to the method of the present invention, such a standard sample can be easily manufactured.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は、本発明の一実施例を使用して得られた鉄に関す
る検量線である。 出願人 日本原子力事業株式会社
The figure is a calibration curve for iron obtained using one embodiment of the present invention. Applicant Japan Atomic Energy Corporation

Claims (2)

【特許請求の範囲】[Claims] (1)所定量の1種または2種以上の金属酸化物微粉末
をフィルタ上に付着させ、その上を高分子薄膜で被覆し
てなることを特徴とする蛍光X線用標準試料。
(1) A standard sample for fluorescent X-rays, characterized in that a predetermined amount of one or more metal oxide fine powders is deposited on a filter, and the filter is coated with a thin polymer film.
(2)純水中に所定量の1種または2種以上の金属酸化
物微粉末を均一に分散させて標準液を調製し、この標準
液を試料用フィルタを用いてろ過することにより一定量
の金属酸化物を前記フィルタ上に均一に捕集した後、前
記フィルタの金属酸化物微粉末の捕集面上に高分子溶液
を付着させ乾燥することを特徴とする蛍光X線用標準試
料の製造方法。
(2) Prepare a standard solution by uniformly dispersing a predetermined amount of one or more metal oxide fine powders in pure water, and filter this standard solution using a sample filter to obtain a fixed amount. A standard sample for fluorescence Production method.
JP63209144A 1988-08-23 1988-08-23 Standard specimen for fluorescent x rays and manufacture thereof Pending JPH0257951A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63209144A JPH0257951A (en) 1988-08-23 1988-08-23 Standard specimen for fluorescent x rays and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63209144A JPH0257951A (en) 1988-08-23 1988-08-23 Standard specimen for fluorescent x rays and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH0257951A true JPH0257951A (en) 1990-02-27

Family

ID=16568038

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63209144A Pending JPH0257951A (en) 1988-08-23 1988-08-23 Standard specimen for fluorescent x rays and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH0257951A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010204087A (en) * 2009-02-05 2010-09-16 Rigaku Corp Drift correction sample for fluorescent x-ray analysis, fluorescent x-ray analysis method using the same, and method of manufacturing the same
JP2013088216A (en) * 2011-10-17 2013-05-13 Rigaku Corp Calibration sample for fluorescent x-ray analysis, fluorescent x-ray analyzer with the same and fluorescent x-ray analysis method using the same
JP2015219197A (en) * 2014-05-20 2015-12-07 株式会社堀場製作所 Analyzer and calibration method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010204087A (en) * 2009-02-05 2010-09-16 Rigaku Corp Drift correction sample for fluorescent x-ray analysis, fluorescent x-ray analysis method using the same, and method of manufacturing the same
JP2013088216A (en) * 2011-10-17 2013-05-13 Rigaku Corp Calibration sample for fluorescent x-ray analysis, fluorescent x-ray analyzer with the same and fluorescent x-ray analysis method using the same
JP2015219197A (en) * 2014-05-20 2015-12-07 株式会社堀場製作所 Analyzer and calibration method

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