JPH0257078U - - Google Patents
Info
- Publication number
- JPH0257078U JPH0257078U JP13565788U JP13565788U JPH0257078U JP H0257078 U JPH0257078 U JP H0257078U JP 13565788 U JP13565788 U JP 13565788U JP 13565788 U JP13565788 U JP 13565788U JP H0257078 U JPH0257078 U JP H0257078U
- Authority
- JP
- Japan
- Prior art keywords
- address
- refresh address
- refresh
- selection circuit
- application device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13565788U JPH0725726Y2 (ja) | 1988-10-17 | 1988-10-17 | 半導体試験装置のアドレス印加装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13565788U JPH0725726Y2 (ja) | 1988-10-17 | 1988-10-17 | 半導体試験装置のアドレス印加装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0257078U true JPH0257078U (zh) | 1990-04-25 |
| JPH0725726Y2 JPH0725726Y2 (ja) | 1995-06-07 |
Family
ID=31395481
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13565788U Expired - Lifetime JPH0725726Y2 (ja) | 1988-10-17 | 1988-10-17 | 半導体試験装置のアドレス印加装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0725726Y2 (zh) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001338497A (ja) * | 2000-05-24 | 2001-12-07 | Fujitsu Ltd | メモリ試験方法 |
-
1988
- 1988-10-17 JP JP13565788U patent/JPH0725726Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0725726Y2 (ja) | 1995-06-07 |