JPH025615Y2 - - Google Patents

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Publication number
JPH025615Y2
JPH025615Y2 JP15354984U JP15354984U JPH025615Y2 JP H025615 Y2 JPH025615 Y2 JP H025615Y2 JP 15354984 U JP15354984 U JP 15354984U JP 15354984 U JP15354984 U JP 15354984U JP H025615 Y2 JPH025615 Y2 JP H025615Y2
Authority
JP
Japan
Prior art keywords
circuit
test
switching element
trip coil
current transformer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15354984U
Other languages
Japanese (ja)
Other versions
JPS6168638U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15354984U priority Critical patent/JPH025615Y2/ja
Publication of JPS6168638U publication Critical patent/JPS6168638U/ja
Application granted granted Critical
Publication of JPH025615Y2 publication Critical patent/JPH025615Y2/ja
Expired legal-status Critical Current

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Description

【考案の詳細な説明】 〔産業上の利用分野〕 この考案は漏電しや断器に関するものであり、
特にそのテスト回路の保護に関するものである。
[Detailed explanation of the invention] [Industrial application field] This invention is related to electric leakage and disconnection.
In particular, it concerns the protection of the test circuit.

〔従来の技術〕[Conventional technology]

第2図は従来の漏電しや断器を示す電気結線図
である。第2図において、テストスイツチ12を
閉成すると、負荷側の端子U→抵抗13→テスト
スイツチ12→テスト巻線11→負荷側の端子W
の閉回路が形成され、零相変流器3はその二次巻
線4に所定値以上の出力を生じる。この出力は増
幅器5で増幅され、例えばサイリスタであるスイ
ツチング素子6を導通させる。このスイツチング
素子6が導通すると、負荷側のU端子→トリツプ
コイル8→整流器9→スイツチング素子6→整流
器9→負荷側のW端子の閉回路が形成され、トリ
ツプコイル8を励磁して主接点1を開放し、漏電
しや断器を引外す。このようにして主接点1が開
放すると、負荷側端子U,Wが無電圧となるた
め、テスト巻線11とテストスイツチ12と抵抗
13との直列回路からなるテスト回路10は自動
的に無電圧となる。
FIG. 2 is an electrical wiring diagram showing a conventional leakage and disconnection circuit. In FIG. 2, when the test switch 12 is closed, the terminal U on the load side → the resistor 13 → the test switch 12 → the test winding 11 → the terminal W on the load side.
A closed circuit is formed, and the zero-phase current transformer 3 produces an output of a predetermined value or more in its secondary winding 4. This output is amplified by an amplifier 5 and makes a switching element 6, for example a thyristor, conductive. When this switching element 6 becomes conductive, a closed circuit is formed from the load side U terminal → trip coil 8 → rectifier 9 → switching element 6 → rectifier 9 → load side W terminal, which excites the trip coil 8 and opens the main contact 1. If there is a current leakage, the disconnector will be tripped. When the main contact 1 is opened in this way, the load side terminals U and W become voltage-free, so the test circuit 10 consisting of the series circuit of the test winding 11, the test switch 12, and the resistor 13 automatically becomes voltage-free. becomes.

このように、テスト回路10は、テストスイツ
チ12を閉成して漏電しや断器が引外されると、
自動的に無電圧となるので、テスト回路10を含
めた漏電しや断器の消費電力は、漏電しや断器の
動作時間(0.1秒以内)に必要な消費電力で計算
され、連続定格となつておらず、短時間定格とな
つている。
In this way, the test circuit 10 closes the test switch 12 and when a leak occurs or the disconnector is tripped,
Since there is no voltage automatically, the power consumption of the leakage or disconnection including the test circuit 10 is calculated based on the power consumption required for the operation time (within 0.1 seconds) of the leakage or disconnection, and it is different from the continuous rating. It has not been aged and is rated for a short time.

〔考案が解決しようとする問題点〕[Problem that the invention attempts to solve]

上記のように、漏電しや断器の消費電力は、漏
電しや断器の動作時間(0.1秒以内)を考慮して
設定されているため、次のような問題点があつ
た。(イ)故障等によつて漏電しや断器が不動作の場
合、テストスイツチ12を閉成し続けると、抵抗
13は過熱し断線に至ることがある。(ロ)例えば需
要家において主接点1を誤接続して、第2図にお
いてテスト回路10の主回路2への接続位置より
負荷側に挿入すると、テストスイツチ12を閉成
して主接点1が開放しても、テスト回路10は無
電圧とならない。このためテストスイツチ12を
閉成している時間だけ、漏電しや断器の動作時間
(0.1秒以内)以上にテスト回路10に電流が流
れ、定格動作時間以上に通電するため抵抗13を
劣化させ、かつテストスイツチ12の操作頻度等
によつて断線に至ることがある。
As mentioned above, the power consumption of leakage and disconnection switches is set taking into account the operating time (within 0.1 seconds) of the leakage and disconnection, which causes the following problems. (a) If there is a current leakage or the disconnector is inoperable due to a malfunction or the like, if the test switch 12 is kept closed, the resistor 13 may overheat and become disconnected. (b) For example, if the main contact 1 is connected incorrectly at a consumer and is inserted on the load side from the connection position of the test circuit 10 to the main circuit 2 in FIG. 2, the test switch 12 is closed and the main contact 1 is Even if it is opened, the test circuit 10 does not become voltage-free. Therefore, while the test switch 12 is closed, current flows through the test circuit 10 for longer than the operating time (within 0.1 seconds) for leakage or disconnection, and as the current flows for longer than the rated operating time, the resistor 13 is deteriorated. , and depending on the frequency of operation of the test switch 12, etc., disconnection may occur.

この考案はかかる問題点を解決するためになさ
れたもので、テストスイツチを閉成し続けても、
抵抗の劣化やテスト回路の断線が生じないように
して、テスト回路の保護を目的とした漏電しや断
器を提供するものである。
This idea was made to solve this problem, and even if the test switch is kept closed,
It prevents deterioration of the resistance and disconnection of the test circuit, and provides current leakage and disconnection for the purpose of protecting the test circuit.

〔問題点を解決するための手段〕[Means for solving problems]

この考案に係る漏電しや断器は、導通時にトリ
ツプコイルを励磁するスイツチング素子とテスト
回路とを並列に、かつこの並列回路をトリツプコ
イルに直列に接続したものである。
The current leakage and disconnection device according to this invention has a switching element that excites a trip coil when conductive and a test circuit connected in parallel, and this parallel circuit is connected in series to the trip coil.

〔作用〕[Effect]

この考案においては、スイツチング素子とテス
ト回路とを並列接続し、この並列回路をトリツプ
コイルに直列接続することにより、スイツチング
素子の不導通時にはトリツプコイルとテスト回路
とを直列に接続し、スイツチング素子の導通時に
はテスト回路への電流の流入を防止する。
In this invention, a switching element and a test circuit are connected in parallel, and this parallel circuit is connected in series with a trip coil, so that when the switching element is non-conducting, the trip coil and the test circuit are connected in series, and when the switching element is conducting, the trip coil and the test circuit are connected in series. Prevent current from flowing into the test circuit.

〔実施例〕〔Example〕

第1図はこの考案に係る漏電しや断器の一実施
例を示す電気結線図である。第1図において、主
接点1は主回路2に挿入されており、主回路2は
零相変流器3の中空部に一次巻線として貫通挿入
されている。零相変流器3の二次巻線4は主回路
2の漏電発生時に出力を生じ、増幅器5において
増幅される。スイツチング素子6は例えばサイリ
スタであり、増幅器5の出力が所定値以上のとき
に導通状態となり、コンデンサ7の充電電荷によ
り導通状態が保持される。トリツプコイル8は、
スイツチング素子6の導通時に形成される、負荷
側のU端子→トリツプコイル8→整流器9→スイ
ツチング素子6→整流器9→負荷側のW端子の閉
回路を流れる電流によつて励磁され、主接点1を
開放し、漏電しや断器を引外す。テスト回路10
は零相変流器3に施されたテスト巻線11とテス
トスイツチ12と抵抗13との直列回路で構成さ
れ、その一端はトリツプコイル8と整流器9との
間に、その他端は負荷側のW端子に接続されてい
る。
FIG. 1 is an electrical wiring diagram showing an embodiment of the earth leakage and disconnection circuit according to this invention. In FIG. 1, a main contact 1 is inserted into a main circuit 2, and the main circuit 2 is inserted through the hollow part of a zero-phase current transformer 3 as a primary winding. The secondary winding 4 of the zero-phase current transformer 3 produces an output when a leakage occurs in the main circuit 2, and the output is amplified by the amplifier 5. The switching element 6 is, for example, a thyristor, and becomes conductive when the output of the amplifier 5 exceeds a predetermined value, and is maintained in the conductive state by the charge in the capacitor 7. The trip coil 8 is
The main contact 1 is excited by the current flowing through the closed circuit of the U terminal on the load side → trip coil 8 → rectifier 9 → switching element 6 → rectifier 9 → W terminal on the load side, which is formed when the switching element 6 is conductive. Open it to prevent current leakage and trip the disconnector. Test circuit 10
is composed of a series circuit of a test winding 11, a test switch 12, and a resistor 13 connected to a zero-phase current transformer 3, one end of which is connected between the trip coil 8 and the rectifier 9, and the other end connected to W on the load side. connected to the terminal.

即ち、スイツチング素子6の不導通時には、テ
スト回路10はトリツプコイル8に直列に負荷側
端子U,W間に接続され、テストスイツチ12の
閉成により、負荷側のU端子→トリツプコイル8
→テスト巻線11→テストスイツチ12→抵抗1
3→負荷側のW端子の閉回路が形成される。この
場合、トリツプコイル8の抵抗値(約100Ω)に
比較して、抵抗13の抵抗値(約2.7ΚΩ)は十分
に大きいため、電圧は殆んど抵抗13に加わり、
テストスイツチ12を閉成した瞬時の突入電流に
よつてもトリツプコイル8は動作しない。この状
態でテストスイツチ12を閉成し続けると、やが
て二次巻線4の誘起出力が所定値以上となり、ス
イツチング素子6が導通する。スイツチング素子
6が導通すると、負荷側のU端子→トリツプコイ
ル8→整流器9→スイツチング素子6→整流器9
→負荷側のW端子の閉回路が形成されて、トリツ
プコイル8は励磁されて主接点1を開放する。こ
の場合、テスト回路10は整流器9を介してスイ
ツチング素子6に並列接続され、テストスイツチ
12を閉成し続けてもテスト回路10には電流は
流れない。
That is, when the switching element 6 is non-conductive, the test circuit 10 is connected in series with the trip coil 8 between the load side terminals U and W, and when the test switch 12 is closed, the connection is made from the load side U terminal to the trip coil 8.
→ Test winding 11 → Test switch 12 → Resistor 1
3→A closed circuit of the W terminal on the load side is formed. In this case, since the resistance value of the resistor 13 (approximately 2.7KΩ) is sufficiently large compared to the resistance value of the trip coil 8 (approximately 100Ω), most of the voltage is applied to the resistor 13,
The trip coil 8 does not operate even with the instantaneous rush current that closes the test switch 12. If the test switch 12 is kept closed in this state, the induced output of the secondary winding 4 will eventually exceed a predetermined value, and the switching element 6 will become conductive. When the switching element 6 becomes conductive, the U terminal on the load side → trip coil 8 → rectifier 9 → switching element 6 → rectifier 9
→A closed circuit of the W terminal on the load side is formed, and the trip coil 8 is energized to open the main contact 1. In this case, the test circuit 10 is connected in parallel to the switching element 6 via the rectifier 9, and no current flows through the test circuit 10 even if the test switch 12 is kept closed.

〔考案の効果〕[Effect of idea]

この考案は以上説明したとおり、スイツチング
素子の導通時に、テスト回路はスイツチング素子
に並列接続されるため、テストスイツチを閉成し
続けてもテスト回路が劣化、焼損しない効果があ
る。
As explained above, in this invention, since the test circuit is connected in parallel to the switching element when the switching element is conductive, the test circuit does not deteriorate or burn out even if the test switch is kept closed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案に係る漏電しや断器の一実施
例を示す電気結線図、第2図は従来の漏電しや断
器を示す電気結線図である。 図において、3は零相変流器、6はスイツチン
グ素子、8はトリツプコイル、10はテスト回
路、11はテスト巻線、12はテストスイツチ、
13は抵抗である。なお、各図中同一符号は同一
または相当部分を示す。
FIG. 1 is an electrical wiring diagram showing an embodiment of the current leakage breaker and disconnector according to the present invention, and FIG. 2 is an electrical wiring diagram showing a conventional leakage breaker and breaker. In the figure, 3 is a zero-phase current transformer, 6 is a switching element, 8 is a trip coil, 10 is a test circuit, 11 is a test winding, 12 is a test switch,
13 is a resistance. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 漏電電流を検出する零相変流器、前記零相変流
器の出力が所定値以上になると導通するスイツチ
ング素子、前記スイツチング素子の導通時に励磁
されしや断器を引外すトリツプコイル、及び前記
零相変流器に施されたテスト巻線とテストボタン
と抵抗との直列回路を具えた回路に前記テストス
イツチの閉成時に前記零相変流器に前記所定値以
上の出力を生じさせるテスト回路を備え、前記テ
スト回路を前記スイツチング素子に並列に、かつ
前記スイツチング素子と前記テスト回路との並列
回路が前記トリツプコイルに直列になるよう接続
したことを特徴とする漏電しや断器。
a zero-phase current transformer that detects leakage current; a switching element that becomes conductive when the output of the zero-phase current transformer exceeds a predetermined value; a trip coil that trips the energized circuit breaker when the switching element is conductive; A test circuit that causes the zero-phase current transformer to generate an output of the predetermined value or more when the test switch is closed, in a circuit including a series circuit of a test winding applied to the phase current transformer, a test button, and a resistor. An earth leakage or disconnection device comprising: the test circuit is connected in parallel to the switching element, and the parallel circuit of the switching element and the test circuit is connected in series with the trip coil.
JP15354984U 1984-10-09 1984-10-09 Expired JPH025615Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15354984U JPH025615Y2 (en) 1984-10-09 1984-10-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15354984U JPH025615Y2 (en) 1984-10-09 1984-10-09

Publications (2)

Publication Number Publication Date
JPS6168638U JPS6168638U (en) 1986-05-10
JPH025615Y2 true JPH025615Y2 (en) 1990-02-09

Family

ID=30711561

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15354984U Expired JPH025615Y2 (en) 1984-10-09 1984-10-09

Country Status (1)

Country Link
JP (1) JPH025615Y2 (en)

Also Published As

Publication number Publication date
JPS6168638U (en) 1986-05-10

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