JPH0255160U - - Google Patents
Info
- Publication number
- JPH0255160U JPH0255160U JP13350288U JP13350288U JPH0255160U JP H0255160 U JPH0255160 U JP H0255160U JP 13350288 U JP13350288 U JP 13350288U JP 13350288 U JP13350288 U JP 13350288U JP H0255160 U JPH0255160 U JP H0255160U
- Authority
- JP
- Japan
- Prior art keywords
- coil
- electromagnetic induction
- flaw detection
- ferromagnetic material
- induction flaw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 10
- 230000005674 electromagnetic induction Effects 0.000 claims description 5
- 230000005284 excitation Effects 0.000 claims description 2
- 239000003302 ferromagnetic material Substances 0.000 claims 3
- 230000005291 magnetic effect Effects 0.000 claims 2
- 230000005415 magnetization Effects 0.000 claims 2
- 229910000831 Steel Inorganic materials 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
第１図は、本考案を適用した、丸棒鋼、鋼管等
の非破壊検査設備の構成を概略的に示す図、第２
図は、第１図の被破壊検査設備における直流励磁
電流の制御を説明するための各波形のタイミング
を示す図、第３図は、従来の電磁誘導探傷による
探傷記録と本考案の電磁誘導探傷による探傷記録
との比較について説明するための図である。
１……被検査材、１０Ａ……入側搬送テーブル
、１０Ｂ……出側搬送テーブル、１１Ａ……入側
ローラコンベヤ、１１Ｂ……出側ローラコンベヤ
、１２Ａ，１２Ｂ……先端検出センサ、１３Ａ，
１３Ｂ……近接センサ、１４Ａ，１４Ｂ……ピン
チロール、１５……シリンダ、１６Ａ，１６Ｂ…
…ピンチロール、１７……シリンダ、１８……磁
化コイル、１９……置台、２０……直流電源装置
、２１……交流供給源端子、２２……関数波形発
生および制御出力回路、２３Ａ……第１タイマー
回路、２３Ｂ……第２タイマー回路、２４，２５
……論理回路。
Figure 1 is a diagram schematically showing the configuration of non-destructive testing equipment for round steel bars, steel pipes, etc. to which the present invention is applied;
The figure shows the timing of each waveform to explain the control of the DC excitation current in the destructive inspection equipment shown in Figure 1. Figure 3 shows the flaw detection record by conventional electromagnetic induction flaw detection and the electromagnetic induction flaw detection of the present invention. It is a figure for explaining the comparison with the flaw detection record by. 1... Material to be inspected, 10A... Inlet conveyance table, 10B... Outlet conveyor table, 11A... Inlet roller conveyor, 11B... Outlet roller conveyor, 12A, 12B... Tip detection sensor, 13A,
13B... Proximity sensor, 14A, 14B... Pinch roll, 15... Cylinder, 16A, 16B...
... Pinch roll, 17 ... Cylinder, 18 ... Magnetizing coil, 19 ... Stand, 20 ... DC power supply device, 21 ... AC supply source terminal, 22 ... Function waveform generation and control output circuit, 23A ... No. 1 timer circuit, 23B...2nd timer circuit, 24, 25
...Logic circuit.
Claims (1)
尺強磁性材を直流磁気飽和または直流磁化させる
ための直流磁気飽和コイルまたは直流磁化コイル
を有した型の電磁誘導探傷装置において、前記定
尺強磁性材の先端が前記コイル内へと進入するタ
イミングを検出するための検出手段と、該検出手
段によつて検出される前記タイミングに合わせて
前記コイルへの励磁電流を所定期間に亘つて所定
量だけ増大させるような制御を行う制御手段とを
備えることを特徴とする電磁誘導探傷装置。 In an electromagnetic induction flaw detection apparatus of a type having a DC magnetic saturation coil or a DC magnetization coil for DC magnetic saturation or DC magnetization of the specified length ferromagnetic material in order to perform electromagnetic induction flaw detection on the specified length ferromagnetic material, a detection means for detecting the timing at which the tip of the ferromagnetic material enters the coil; and an excitation current to the coil for a predetermined period in accordance with the timing detected by the detection means. 1. An electromagnetic induction flaw detection device comprising: control means for controlling the increase by a predetermined amount.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13350288U JPH0720592Y2 (en) | 1988-10-13 | 1988-10-13 | Electromagnetic induction flaw detector that can shorten the dead zone |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13350288U JPH0720592Y2 (en) | 1988-10-13 | 1988-10-13 | Electromagnetic induction flaw detector that can shorten the dead zone |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0255160U true JPH0255160U (en) | 1990-04-20 |
| JPH0720592Y2 JPH0720592Y2 (en) | 1995-05-15 |
Family
ID=31391421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13350288U Expired - Lifetime JPH0720592Y2 (en) | 1988-10-13 | 1988-10-13 | Electromagnetic induction flaw detector that can shorten the dead zone |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0720592Y2 (en) |
-
1988
- 1988-10-13 JP JP13350288U patent/JPH0720592Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0720592Y2 (en) | 1995-05-15 |
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