JPH0252131U - - Google Patents
Info
- Publication number
- JPH0252131U JPH0252131U JP13145388U JP13145388U JPH0252131U JP H0252131 U JPH0252131 U JP H0252131U JP 13145388 U JP13145388 U JP 13145388U JP 13145388 U JP13145388 U JP 13145388U JP H0252131 U JPH0252131 U JP H0252131U
- Authority
- JP
- Japan
- Prior art keywords
- temperature detection
- temperature
- switching element
- inter
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 9
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
- Control Of Combustion (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13145388U JPH0252131U (en, 2012) | 1988-10-07 | 1988-10-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13145388U JPH0252131U (en, 2012) | 1988-10-07 | 1988-10-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0252131U true JPH0252131U (en, 2012) | 1990-04-13 |
Family
ID=31387537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13145388U Pending JPH0252131U (en, 2012) | 1988-10-07 | 1988-10-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0252131U (en, 2012) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011247780A (ja) * | 2010-05-27 | 2011-12-08 | Lapis Semiconductor Co Ltd | 検出装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4917180A (en, 2012) * | 1972-06-02 | 1974-02-15 | ||
| JPS63200079A (ja) * | 1987-02-16 | 1988-08-18 | Canon Inc | 半導体素子の特性測定方式 |
-
1988
- 1988-10-07 JP JP13145388U patent/JPH0252131U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4917180A (en, 2012) * | 1972-06-02 | 1974-02-15 | ||
| JPS63200079A (ja) * | 1987-02-16 | 1988-08-18 | Canon Inc | 半導体素子の特性測定方式 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011247780A (ja) * | 2010-05-27 | 2011-12-08 | Lapis Semiconductor Co Ltd | 検出装置 |