JPH0247486Y2 - - Google Patents
Info
- Publication number
- JPH0247486Y2 JPH0247486Y2 JP19088585U JP19088585U JPH0247486Y2 JP H0247486 Y2 JPH0247486 Y2 JP H0247486Y2 JP 19088585 U JP19088585 U JP 19088585U JP 19088585 U JP19088585 U JP 19088585U JP H0247486 Y2 JPH0247486 Y2 JP H0247486Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- window plate
- infrared
- absorption spectrum
- infrared absorption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000862 absorption spectrum Methods 0.000 claims description 29
- 125000006850 spacer group Chemical group 0.000 claims description 21
- 238000005259 measurement Methods 0.000 claims description 18
- 239000004698 Polyethylene Substances 0.000 claims description 16
- -1 polyethylene Polymers 0.000 claims description 16
- 229920000573 polyethylene Polymers 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 14
- 230000005540 biological transmission Effects 0.000 claims description 3
- IOLCXVTUBQKXJR-UHFFFAOYSA-M potassium bromide Chemical compound [K+].[Br-] IOLCXVTUBQKXJR-UHFFFAOYSA-M 0.000 description 14
- 238000004458 analytical method Methods 0.000 description 11
- 239000011888 foil Substances 0.000 description 8
- 238000010521 absorption reaction Methods 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 150000002148 esters Chemical class 0.000 description 3
- 238000002329 infrared spectrum Methods 0.000 description 3
- 150000002576 ketones Chemical class 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 238000004445 quantitative analysis Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003973 paint Substances 0.000 description 2
- 239000010970 precious metal Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 241000894006 Bacteria Species 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 239000004202 carbamide Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 150000003949 imides Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000004078 waterproofing Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【考案の詳細な説明】
「産業上の利用分野」
本考案は、水分を含むサンプルや高温多湿で養
生するサンプルの赤外吸収スペクトル分析を可能
にする測定治具に関するものである。[Detailed Description of the Invention] "Industrial Application Field" The present invention relates to a measurement jig that enables infrared absorption spectrum analysis of samples containing moisture or samples cured at high temperature and humidity.
「従来の技術」
赤外線領域に現れる吸収スペクトルを検出する
ことによりサンプルの成分分析を行う赤外吸収ス
ペクトル分析装置として従来、第３図に概略構成
を示す装置が知られるとともに、このスペクトル
分析装置に用いられる測定治具として従来、第４
図に示す測定治具Ｂが知られている。``Prior Art'' As an infrared absorption spectrum analyzer that analyzes the components of a sample by detecting the absorption spectrum that appears in the infrared region, an apparatus whose schematic configuration is shown in FIG. Traditionally, the fourth measurement jig was used as a measurement jig.
A measuring jig B shown in the figure is known.
第３図に示す従来の赤外吸収スペクトル分析装
置は、サンプル１を塗布した窓板２を通過させた
赤外線を分光光度計４と検出器５を用いて測定
し、レコーダ６に記録するものであり、このレコ
ーダ６に記録されたデータを基に、サンプル１の
成分分析をなしうるものである。 The conventional infrared absorption spectrum analyzer shown in FIG. 3 uses a spectrophotometer 4 and a detector 5 to measure infrared rays that have passed through a window plate 2 coated with a sample 1, and records the measurements on a recorder 6. Based on the data recorded in the recorder 6, the component analysis of the sample 1 can be performed.
第４図に示す従来の測定治具Ｂは、中央部に透
孔７ａを形成し透孔７ａの周囲の対角位置にねじ
軸７ｂ…を形成した基板７と、窓板２と、中央部
に透孔８ａを形成し、透孔８ａの周囲のコーナ部
側に挿通孔８ｂ…を形成した固定板８と、ナツト
９…からなつている。そして、このサンプル治具
Ｂを使用するには、サンプル１を塗布した窓板２
を基板７の上に重ね、その上に、ねじ軸７ｂを挿
通孔８ｂに通した固定板８を重ね、ねじ軸７ｂに
ナツト９を螺入して窓板２を固定して測定治具Ｂ
を組み立て、この測定治具Ｂを前記赤外吸収スペ
クトル分析装置にセツトして分析操作を行うので
ある。 The conventional measuring jig B shown in FIG. 4 includes a substrate 7 with a through hole 7a formed in the center and screw shafts 7b formed at diagonal positions around the through hole 7a, a window plate 2, and a central portion. It consists of a fixing plate 8 having a through hole 8a formed therein and an insertion hole 8b formed at the corner side around the through hole 8a, and nuts 9. To use this sample jig B, the window plate 2 coated with sample 1 must be
is stacked on top of the substrate 7, and on top of that is the fixing plate 8 with the screw shaft 7b passed through the insertion hole 8b, and the window plate 2 is fixed by screwing the nut 9 into the screw shaft 7b to complete the measurement jig B.
This measurement jig B is then set in the infrared absorption spectrum analyzer to perform analysis operations.
ところで、第４図に示す従来の測定治具Ｂに用
いられる窓板２に要求されるのは、赤外線領域に
吸収を持たないことである。このため従来の窓板
２は赤外線領域に吸収を持たない臭化カリウム
（KBr）によつて形成されていた。 Incidentally, the window plate 2 used in the conventional measuring jig B shown in FIG. 4 is required to have no absorption in the infrared region. For this reason, the conventional window plate 2 was made of potassium bromide (KBr), which does not absorb in the infrared region.
「考案が解決しようとする問題点」
ところが、前記従来の窓板２を備えた赤外吸収
スペクトル装置にあつては、窓板２が臭化カリウ
ムからなるために、臭化カリウムが吸収しやすい
成分を含有したサンプル、即ち水分を含有したサ
ンプルの分析ができない欠点があつた。また、こ
の臭化カリウムからなる窓板２を使用している従
来の赤外吸収スペクトル装置にあつては、温湿度
を可変したサンプルの連続的な経時変化を捕らえ
るような計測は困難な欠点があつた。``Problems to be solved by the invention'' However, in the case of the conventional infrared absorption spectrometer equipped with the window plate 2, since the window plate 2 is made of potassium bromide, potassium bromide is easily absorbed. There was a drawback that samples containing components, that is, samples containing moisture, could not be analyzed. In addition, conventional infrared absorption spectrometers that use the window plate 2 made of potassium bromide have the disadvantage that it is difficult to perform measurements that capture continuous changes over time in samples with varying temperature and humidity. It was hot.
本考案は前記事情に鑑みてなされたもので、水
分を含有したサンプルは勿論、連続的に温湿度を
可変したサンプルの経時変化を赤外吸収スペクト
ル分析装置で捕らえるようにできる測定治具の提
供を目的とする。 The present invention has been made in view of the above circumstances, and provides a measurement jig that allows an infrared absorption spectrum analyzer to detect changes over time in not only samples containing moisture but also samples whose temperature and humidity are continuously varied. With the goal.
「問題点を解決するための手段」
本考案は、サンプルを装着した窓板を透過した
赤外線とサンプルを装着していない補償側の窓板
を透過した赤外線とを分光して各々の赤外吸収ス
ペクトルをとり、比較してサンプルの分析を行う
赤外吸収スペクトル分析装置に使用される測定治
具であつて、赤外線透過用の透孔を形成した支持
基板と、ポリエチレンからなる窓板と、サンプル
を収納して赤外線を透過させる透孔を形成した薄
板状のスペーサと、透孔を形成した固定板と、前
記支持基板と窓板とスペーサと固定板とを重ねた
状態で係止する固定具とから構成したものであ
る。``Means for solving the problem'' This invention spectrally spectra the infrared rays transmitted through the window plate on which the sample is attached and the infrared rays transmitted through the window plate on the compensating side where the sample is not attached, to determine the infrared absorption of each. This is a measurement jig used in an infrared absorption spectrometer that analyzes samples by taking spectra and comparing them, and it consists of a support substrate with a through hole for infrared transmission, a window plate made of polyethylene, and a sample. a thin plate-like spacer formed with a through hole for housing the infrared rays and transmitting infrared rays, a fixing plate having a through hole formed therein, and a fixing device that locks the supporting substrate, the window plate, the spacer, and the fixing plate in a stacked state. It is composed of.
「作用」
水とほとんど反応しないポリエチレン製の窓板
とサンプルにより得られた赤外吸収スペクトルを
補償側のポリエチレン製の窓板の赤外吸収スペク
トルで消去し、サンプルのみの赤外吸収スペクト
ルを検出すると、水分を含むサンプルの分析、お
よび温湿度を可変して経時変化させたサンプルの
分析が可能となり、ポリエチレンからなる窓板を
用いるために安価に作製でき、スペーサに沿つて
サンプルを薄切りすることによりサンプルを均一
な厚さにできてサンプルの定量分析も実現可能と
なる。"Operation" The infrared absorption spectrum obtained by the polyethylene window plate and sample, which hardly reacts with water, is erased by the infrared absorption spectrum of the polyethylene window plate on the compensating side, and the infrared absorption spectrum of only the sample is detected. This makes it possible to analyze samples that contain moisture, as well as samples that have changed over time by varying the temperature and humidity.The window plate made of polyethylene can be manufactured at low cost, and the sample can be sliced thinly along the spacer. This allows the sample to be made to have a uniform thickness, making it possible to perform quantitative analysis of the sample.
「実施例」
第１図は、本考案の一実施例の測定治具Ａを示
すもので、測定治具Ａは、支持基板１０と、窓板
１１と、薄板状のスペーサ１２と、固定板１３
と、ナツト１４とからなつている。"Embodiment" FIG. 1 shows a measuring jig A according to an embodiment of the present invention. 13
and Natsuto 14.
前記支持基板１０は、中央部に透孔１５が形成
され、透孔１５の周囲の対角位置に透孔１５を囲
んで４つの接続用ねじ軸１６が立設されたもので
あり、支持基板１０の厚さは例えば１mm程度であ
る。 The support substrate 10 has a through hole 15 formed in the center thereof, and four connection screw shafts 16 are provided upright at diagonal positions around the through hole 15, and the support substrate The thickness of 10 is, for example, about 1 mm.
窓板１１は、ポリエチレン膜からなるもので、
透孔１５の直径より大きな幅と奥行を有し、４つ
のねじ軸１６の間に支持基板１０に重ねて設置で
きる大きさに形成されている。なお、窓板１１の
厚さは、例えば0.2±0.001mm程度のものである。 The window plate 11 is made of polyethylene film,
It has a width and depth larger than the diameter of the through hole 15, and is formed in a size that allows it to be stacked on the support substrate 10 between the four screw shafts 16. Note that the thickness of the window plate 11 is, for example, about 0.2±0.001 mm.
スペーサ１２は、Ni箔からなり、中央部に透
孔１７が形成され、前記窓板１１と同じ幅と奥行
のもので、その厚さは0.05〜0.2mm程度に形成さ
れている。なお、このスペーサ１２の透孔１７
は、その内部に後述するようにサンプル１８が盛
り込まれるもので、スペーサ１２の厚さに合わせ
てサンプル１８を薄切りすることによりサンプル
１８の厚さを均一にできるものである。従つてス
ペーサ１２は、前記した厚さ程度に形成すること
が必要であり、このため本実施例ではNi箔によ
つて形成したが、Ni箔以外の材料で形成するこ
とも自由である。ただし本願考案の考案者が、
種々の材料でスペーサ１２を作製してみたとこ
ろ、前記の厚さのスペーサを形成できる材料は少
なく、Ni箔以外では貴金属箔やアルミ箔や純鉄
箔あるいはステンレス箔等でスペーサを作製でき
るが、アルミ箔のスペーサは後述するように支持
基板１０と固定板１３で挟んだ場合にしわがよつ
て使用できない欠点があり、貴金属や純鉄のスペ
ーサは極めて高価なために使用にはふさわしくな
い。 The spacer 12 is made of Ni foil, has a through hole 17 formed in the center, has the same width and depth as the window plate 11, and has a thickness of about 0.05 to 0.2 mm. Note that the through hole 17 of this spacer 12
As will be described later, the sample 18 is placed therein, and the thickness of the sample 18 can be made uniform by slicing the sample 18 in accordance with the thickness of the spacer 12. Therefore, it is necessary that the spacer 12 be formed to have a thickness approximately as described above, and for this reason, in this embodiment, it is formed of Ni foil, but it may be formed of a material other than Ni foil. However, the inventor of the claimed invention,
When we tried making the spacer 12 using various materials, we found that there are only a few materials that can form a spacer with the above-mentioned thickness.In addition to Ni foil, spacers can be made from precious metal foil, aluminum foil, pure iron foil, stainless steel foil, etc. As will be described later, aluminum foil spacers have the disadvantage that they wrinkle when sandwiched between support substrate 10 and fixing plate 13, making them unusable, and precious metal or pure iron spacers are extremely expensive and therefore unsuitable for use.
固定板１３は前記支持基板１０と同じ厚さを有
する矩形状のもので、前記ねじ軸１６…を挿通可
能な挿通孔２０が各コーナ部に形成され、中央部
には前記透孔１７と同じ直径の透孔２１が形成さ
れている。 The fixing plate 13 has a rectangular shape having the same thickness as the support substrate 10, and has insertion holes 20 formed at each corner, through which the screw shafts 16 can be inserted, and holes 20, which are the same as the through holes 17, in the center. A through hole 21 with a diameter is formed.
ナツト１４…は、前記ねじ軸１６に螺入できる
ものであり、これらナツト１４とねじ軸１６によ
つて固定具が構成される。なお、この固定具は前
述した構成に限らずに公知のクリツプやクランプ
状の構成でも良い。 The nuts 14 can be screwed into the screw shaft 16, and these nuts 14 and the screw shaft 16 constitute a fixture. Note that this fixture is not limited to the above-mentioned configuration, but may be of a known clip or clamp type configuration.
前述の構成の測定治具Ａを組み立てるには、分
析するサンプル（例えば塗料、接着剤、防水材
等）１８をスペーサ１２の透孔１７に塗り込め、
スペーサ１２の厚さに合わせてサンプル１８を薄
切りし、窓板１１と前記スペーサ１２を支持基板
１０の上に重ね、それらに上に、挿通孔２０にね
じ軸１６…を通して固定板１３を重ね、ナツト１
４…をねじ軸１６に螺入して固定板１３と支持基
板１０により窓板１１とスペーサ１２を挾んで組
み立てる。 To assemble the measurement jig A having the above-mentioned configuration, apply the sample to be analyzed (for example, paint, adhesive, waterproof material, etc.) 18 into the through hole 17 of the spacer 12,
The sample 18 is sliced thinly according to the thickness of the spacer 12, the window plate 11 and the spacer 12 are stacked on the support substrate 10, and the fixing plate 13 is stacked on top of them by passing the screw shafts 16 through the insertion holes 20, Natsu 1
4 into the screw shaft 16, and then assemble the window plate 11 and spacer 12 by sandwiching them between the fixing plate 13 and the support substrate 10.
この測定治具Ａを所定の赤外スペクトル分析装
置にセツトして装置を作動させることによりサン
プルの分析ができる。 A sample can be analyzed by setting this measuring jig A in a predetermined infrared spectrum analyzer and operating the apparatus.
前記構成の測定治具Ａがセツトされる赤外吸収
スペクトル分析装置は、例えば第２図に概略構成
を示すものである。 An infrared absorption spectrum analyzer in which the measurement jig A having the above configuration is set has a schematic configuration shown in FIG. 2, for example.
第２図に示す赤外スペクトル分析装置は、第３
図に示す従来の赤外スペクトル分析装置に補償回
路を付設した構成であり、補償回路は測定治具Ａ
の窓板１１と同じ材料（即ちポリエチレン）で構
成された窓板１１と同じ厚さの窓板２５に赤外線
を透過させ、この赤外線を分光器４に送り、サン
プル１８を透過した赤外線と比較して窓板１１に
おける赤外吸収スペクトルを消去してサンプル１
８の赤外吸収スペクトルのみを検出できるもので
ある。 The infrared spectrum analyzer shown in FIG.
It has a configuration in which a compensation circuit is attached to the conventional infrared spectrum analyzer shown in the figure, and the compensation circuit is attached to the measurement jig A.
The infrared rays are transmitted through the window plate 25, which is made of the same material (i.e. polyethylene) as the window plate 11 and has the same thickness as the window plate 11, and the infrared rays are sent to the spectrometer 4 and compared with the infrared rays transmitted through the sample 18. sample 1 by erasing the infrared absorption spectrum in the window plate 11.
Only the infrared absorption spectrum of 8 can be detected.
このような構成の赤外吸収スペクトル分析装置
にサンプル１８を装着した測定治具Ａをセツトし
て分析を行うならば、サンプル１８の赤外吸収ス
ペクトルのみを検出することができてサンプル１
８の分析を行うことができる。この際、測定治具
Ａの窓板１１がポリエチレン製であり、水分を含
有したサンプル１８を使用しても水分とポリエチ
レンとの反応は無視できるほど小さいために、水
分を含むサンプル１８も支障なく分析することが
できる。従つて、高温多湿状態で養生するサンプ
ルの経時変化の計測、例えば、屋根用塗膜防水材
や接着材等の紫外線による経時劣化の解析等が赤
外吸収スペクトル分析を用いて実現できる効果が
ある。なお、ポリエチレンは炭素と水素からなる
エチレンの重合体であり、ケトンたエステル等を
含んでいないために、ポリエチレンからなる窓板
１１を用いて前述の如く分析を行うならば、ケト
ンやエステル等の化合物に見られる赤外線域での
吸収を生じない関係から、これらの化合物を含有
した接着材や防水材の赤外スペクトル分析が可能
である。この点において、窓板１１をポリエチレ
ン以外の高分子化合物で構成すると、ケトンやエ
ステル等における赤外吸収がなされてサンプルの
分析に支障を来すことになり、このため本願考案
では、特に窓板１１をポリエチレンで構成してあ
る。 If measurement jig A with sample 18 attached is set in an infrared absorption spectrum analyzer with such a configuration and analysis is performed, only the infrared absorption spectrum of sample 18 can be detected, and sample 1 can be detected.
8 analyzes can be performed. At this time, the window plate 11 of measurement jig A is made of polyethylene, and even if sample 18 containing moisture is used, the reaction between moisture and polyethylene is so small that it can be ignored, so sample 18 containing moisture can also be used without any problem. can be analyzed. Therefore, infrared absorption spectrum analysis can be used to measure changes over time in samples that are cured in high temperature and humidity conditions, for example, to analyze the deterioration of roof coatings and adhesives over time due to ultraviolet rays. . Note that polyethylene is a polymer of ethylene made of carbon and hydrogen, and does not contain ketones, esters, etc., so if the analysis is performed as described above using the window plate 11 made of polyethylene, ketones, esters, etc. Since these compounds do not cause absorption in the infrared region, it is possible to perform infrared spectral analysis of adhesives and waterproof materials containing these compounds. In this regard, if the window plate 11 is made of a polymer compound other than polyethylene, infrared absorption in ketones, esters, etc. will occur, which will interfere with sample analysis. 11 is made of polyethylene.
なお、同様な理由から前記測定治具Ａを用いて
行う分析によつて、尿素結合を有する化合物、イ
ミド、ウレタン結合を有する化合物、アゾ化合物
等の高分子化合物の分析も可能であり、更に、大
腸菌類群数の測定等も実施できる。 For the same reason, it is also possible to analyze high-molecular compounds such as compounds having urea bonds, imides, compounds having urethane bonds, and azo compounds by using the measurement jig A. It is also possible to measure the number of coliform bacteria.
また、サンプル１８をスペーサ１２の厚さと同
じ厚さに薄切りすることによりその厚さを均一に
するならば、サンプル１８の定量分析が可能にな
る効果もある。更に、窓板１１はポリエチレン製
であり、臭化カリウムからなる従来の窓板よりも
安価なために、測定治具Ａは従来治具よりも低コ
ストとなる。 Further, if the sample 18 is sliced to the same thickness as the spacer 12 to make the thickness uniform, there is an effect that quantitative analysis of the sample 18 becomes possible. Further, since the window plate 11 is made of polyethylene and is cheaper than a conventional window plate made of potassium bromide, the measuring jig A is lower in cost than the conventional jig.
「考案の効果」
以上説明したように本考案は、サンプルを装着
する窓板を水との反応性の小さいポリエチレンか
ら構成したものであるために、補償側のポリエチ
レンの窓板を通過させた赤外吸収スペクトルとサ
ンプルを装着した窓板を通過させた赤外吸収スペ
クトルとを比較して窓板での赤外吸収スペクトル
を消去する能力を有する赤外吸収スペクトル分析
装着にセツトすることによりサンプルのみの赤外
吸収スペクトルを求めてサンプルの分析を行うこ
とができる。即ち、従来では実現しえなかつた水
分を含むサンプルの赤外吸収スペクトル分析をな
しうることができ、従来は不可能であつた温湿度
を経時的に可変したサンプルの経時的分析を実施
できる効果がある。したがつて本考案の測定治具
を赤外吸収スペクトル分析装置にセツトして赤外
吸収スペクトル分析を行うことにより、例えば、
塗料、接着材、防水材等の高分子化合物の紫外線
による経時変化を赤外吸収スペクトル分析で解析
できるようになる効果がある。またポリエチレン
からなる窓板は臭化カリウムからなる従来の窓板
に比較してはるかに安いために、本考案の測定治
具は低コストな特長がある。更に、スペーサの透
孔にサンプルを塗り込めてスペーサに沿つてサン
プルを薄切りすることによりサンプルを均一の厚
さにすることができ、赤外吸収スペクトル分析に
よつて定量分析も実現できる効果がある。``Effects of the invention'' As explained above, in this invention, the window plate on which the sample is mounted is made of polyethylene, which has low reactivity with water. By comparing the external absorption spectrum with the infrared absorption spectrum passed through the window plate on which the sample is attached, and by setting it in an infrared absorption spectrum analyzer that has the ability to erase the infrared absorption spectrum at the window plate, only the sample can be detected. A sample can be analyzed by obtaining its infrared absorption spectrum. In other words, it is possible to perform infrared absorption spectrum analysis of samples containing moisture, which was not possible in the past, and it is also possible to perform time-course analysis of samples with temperature and humidity varied over time, which was not possible in the past. There is. Therefore, by setting the measuring jig of the present invention in an infrared absorption spectrum analyzer and performing infrared absorption spectrum analysis, for example,
This has the effect of making it possible to analyze changes over time due to ultraviolet rays in polymer compounds such as paints, adhesives, waterproofing materials, etc. using infrared absorption spectrum analysis. Furthermore, since the window plate made of polyethylene is much cheaper than the conventional window plate made of potassium bromide, the measurement jig of the present invention has the advantage of being low cost. Furthermore, by applying the sample into the through hole of the spacer and slicing the sample along the spacer, the sample can be made to have a uniform thickness, and quantitative analysis can also be performed using infrared absorption spectroscopy. .
第１図は本考案の一実施例の測定治具を示す分
解斜視図、第２図は本考案の一実施例の測定治具
を使用する赤外吸収スペクトル分析装置の概略構
成図、第３図は従来の測定治具を使用する赤外吸
収スペクトル分析装置の概略構成図、第４図は従
来の測定治具を示す分解斜視図である。
Ａ……測定治具、１０……支持基板、１１……
窓板、１２……スペーサ、１３……固定板、１４
……ナツト、１５，１７，２１……透孔、１８…
…サンプル。
FIG. 1 is an exploded perspective view showing a measuring jig according to an embodiment of the present invention, FIG. 2 is a schematic configuration diagram of an infrared absorption spectrum analyzer using a measuring jig according to an embodiment of the present invention, and FIG. The figure is a schematic configuration diagram of an infrared absorption spectrum analyzer using a conventional measuring jig, and FIG. 4 is an exploded perspective view showing the conventional measuring jig. A...Measuring jig, 10...Support substrate, 11...
Window plate, 12...Spacer, 13...Fixing plate, 14
...Natsuto, 15, 17, 21... Throughhole, 18...
…sample.
Claims (1)
ンプルを装着していない補償側の窓板を透過した
赤外線とを分光して各々の赤外吸収スペクトルを
とり、比較してサンプルの分析を行う赤外吸収ス
ペクトル分析装置に使用される測定治具であつ
て、赤外線透過用の透孔が形成された支持基板
と、ポリエチレンからなる窓板と、サンプル収納
用および赤外線透過用の透孔が形成された薄板状
のスペーサと、赤外線透過用の透孔が形成された
固定板と、前記支持基板と窓板とスペーサと固定
板とを相互に重ねた状態で係止する固定具とから
なることを特徴とする赤外吸収スペクトル分析装
置用測定治具。 The infrared rays transmitted through the window plate with the sample attached and the infrared rays transmitted through the window plate on the compensating side without the sample attached are separated, and the infrared absorption spectra of each are taken and compared to analyze the sample. A measurement jig used in an absorption spectrum analyzer, which includes a support substrate with a through hole for infrared transmission, a window plate made of polyethylene, and a through hole for storing a sample and for infrared transmission. It is characterized by comprising a thin plate-like spacer, a fixing plate having a through hole for transmitting infrared rays, and a fixing device that locks the supporting substrate, the window plate, the spacer, and the fixing plate in a stacked state. A measurement jig for an infrared absorption spectrum analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19088585U JPH0247486Y2 (en) | 1985-12-11 | 1985-12-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19088585U JPH0247486Y2 (en) | 1985-12-11 | 1985-12-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6297944U JPS6297944U (en) | 1987-06-22 |
| JPH0247486Y2 true JPH0247486Y2 (en) | 1990-12-13 |
Family
ID=31144513
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19088585U Expired JPH0247486Y2 (en) | 1985-12-11 | 1985-12-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0247486Y2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0524204Y2 (en) * | 1987-08-10 | 1993-06-21 | ||
| JPH0612533Y2 (en) * | 1988-11-30 | 1994-03-30 | 日本分光株式会社 | Cell holder for spectroscopic analysis |
-
1985
- 1985-12-11 JP JP19088585U patent/JPH0247486Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6297944U (en) | 1987-06-22 |
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