JPH0245470U - - Google Patents

Info

Publication number
JPH0245470U
JPH0245470U JP12277588U JP12277588U JPH0245470U JP H0245470 U JPH0245470 U JP H0245470U JP 12277588 U JP12277588 U JP 12277588U JP 12277588 U JP12277588 U JP 12277588U JP H0245470 U JPH0245470 U JP H0245470U
Authority
JP
Japan
Prior art keywords
support stand
measured
tem cell
electric field
house
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12277588U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12277588U priority Critical patent/JPH0245470U/ja
Publication of JPH0245470U publication Critical patent/JPH0245470U/ja
Pending legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

図面は本考案の実施例を示し、第1図は一部縦
断概略図、第2図は第1図の横断面図、第3図は
測定方向を示す概略図、第4図は電界強度と測定
方向の関係の測定結果を示すグラフである。 図中1はTEMセル、2は導体、3は信号発生
器、4はダミーロード、5は支持台、6は駆動装
置、7は駆動軸、8は制御器、9は扉、10はポ
ケツトベルである。
The drawings show an embodiment of the present invention, in which Fig. 1 is a partially vertical schematic diagram, Fig. 2 is a cross-sectional view of Fig. 1, Fig. 3 is a schematic diagram showing the measurement direction, and Fig. 4 is a schematic diagram showing the electric field strength. It is a graph which shows the measurement result of the relationship of a measurement direction. In the figure, 1 is a TEM cell, 2 is a conductor, 3 is a signal generator, 4 is a dummy load, 5 is a support stand, 6 is a drive device, 7 is a drive shaft, 8 is a controller, 9 is a door, and 10 is a pager. be.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 内部に電子機器等の被測定物を収容でき、高周
波電力を加えると内部に電界が発生するようにし
たTEMセルがその内部に被測定物用の支持台を
備え、該支持台は回転自在でその回転がTEMセ
ルの外から制御される電気的特性の測定装置。
A TEM cell that can house an object to be measured, such as an electronic device, and generates an electric field inside when high-frequency power is applied, has a support stand for the object to be measured inside, and the support stand is rotatable. An electrical property measuring device whose rotation is controlled from outside the TEM cell.
JP12277588U 1988-09-21 1988-09-21 Pending JPH0245470U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12277588U JPH0245470U (en) 1988-09-21 1988-09-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12277588U JPH0245470U (en) 1988-09-21 1988-09-21

Publications (1)

Publication Number Publication Date
JPH0245470U true JPH0245470U (en) 1990-03-28

Family

ID=31371020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12277588U Pending JPH0245470U (en) 1988-09-21 1988-09-21

Country Status (1)

Country Link
JP (1) JPH0245470U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59133473A (en) * 1983-01-21 1984-07-31 Mitsubishi Electric Corp Antenna supporting device
JPS62284271A (en) * 1986-05-20 1987-12-10 ベ−・ベ−・ツエ−・アクチエンゲゼルシヤフト・ブラウン・ボヴエリ・ウント・コンパニイ Electromagnetic interference inspection device for electronic apparatus with tem waveguide expanding to pyramidal shape

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59133473A (en) * 1983-01-21 1984-07-31 Mitsubishi Electric Corp Antenna supporting device
JPS62284271A (en) * 1986-05-20 1987-12-10 ベ−・ベ−・ツエ−・アクチエンゲゼルシヤフト・ブラウン・ボヴエリ・ウント・コンパニイ Electromagnetic interference inspection device for electronic apparatus with tem waveguide expanding to pyramidal shape

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