JPH0243670U - - Google Patents
Info
- Publication number
- JPH0243670U JPH0243670U JP12241888U JP12241888U JPH0243670U JP H0243670 U JPH0243670 U JP H0243670U JP 12241888 U JP12241888 U JP 12241888U JP 12241888 U JP12241888 U JP 12241888U JP H0243670 U JPH0243670 U JP H0243670U
- Authority
- JP
- Japan
- Prior art keywords
- leads
- semiconductor device
- measuring
- characteristic measuring
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 2
- 238000005452 bending Methods 0.000 claims 1
- 230000007257 malfunction Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12241888U JPH0243670U (pl) | 1988-09-19 | 1988-09-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12241888U JPH0243670U (pl) | 1988-09-19 | 1988-09-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0243670U true JPH0243670U (pl) | 1990-03-26 |
Family
ID=31370332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12241888U Pending JPH0243670U (pl) | 1988-09-19 | 1988-09-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0243670U (pl) |
-
1988
- 1988-09-19 JP JP12241888U patent/JPH0243670U/ja active Pending
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