JPH0237995B2 - - Google Patents

Info

Publication number
JPH0237995B2
JPH0237995B2 JP58007929A JP792983A JPH0237995B2 JP H0237995 B2 JPH0237995 B2 JP H0237995B2 JP 58007929 A JP58007929 A JP 58007929A JP 792983 A JP792983 A JP 792983A JP H0237995 B2 JPH0237995 B2 JP H0237995B2
Authority
JP
Japan
Prior art keywords
light
shaped recess
detection device
photodetector
angle detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58007929A
Other languages
Japanese (ja)
Other versions
JPS59133477A (en
Inventor
Satoshi Arai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP58007929A priority Critical patent/JPS59133477A/en
Publication of JPS59133477A publication Critical patent/JPS59133477A/en
Publication of JPH0237995B2 publication Critical patent/JPH0237995B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S3/00Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
    • G01S3/78Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Light Receiving Elements (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Description

【発明の詳細な説明】 本発明は、光の入射方向を検出可能な1チツプ
光角度検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a one-chip optical angle detection device capable of detecting the direction of incidence of light.

従来、太陽などの発光源の方向を検出する装置
は、第1図aとbに示すように、複数の異なる傾
斜面を有する支持体5の前記傾斜面の各々に光検
出部1〜4を設置し、前記光検出部1〜4の各々
に入射した光の検出量の比を利用して前記光の入
射方向を検出している。
Conventionally, a device for detecting the direction of a light emitting source such as the sun, as shown in FIGS. The incident direction of the light is detected using the ratio of the detected amounts of light incident on each of the photodetectors 1 to 4.

従つて、高精度な光の入射方向を検出するため
には、前記支持体5の前記傾斜面の各々の相対角
度が高精度である必要がある。さらに、複数個の
光検出部を必要とする欠点を有する。このため、
高精度な光の入射方向検出が可能で、小型、かつ
廉価な光角度検出装置を作成することは、困難で
あつた。
Therefore, in order to detect the incident direction of light with high accuracy, the relative angles of each of the inclined surfaces of the support body 5 need to be highly accurate. Furthermore, it has the disadvantage of requiring a plurality of photodetectors. For this reason,
It has been difficult to create a small, inexpensive optical angle detection device that can detect the direction of incidence of light with high precision.

本発明は、上記の欠点を除去するため、1つの
半導体基板内に、基板主表面と異なる傾斜面を形
成し、前記傾斜面と前記基板主表面に光検出部を
各々形成することにより、光角度検出の高精度化
と光角度検出装置の小型化及び廉価化を実現する
ことを目的としている。
In order to eliminate the above-mentioned drawbacks, the present invention forms an inclined surface different from the main surface of the substrate in one semiconductor substrate, and forms a photodetecting section on the inclined surface and the main surface of the substrate, thereby detecting light. The purpose is to achieve higher accuracy in angle detection and to reduce the size and cost of optical angle detection devices.

以下、本発明の実施例を図面を用いて詳細に説
明する。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図は、本発明の光角度検出装置の断面図で
ある。6は一導伝型半導体基板又は埋込み層、7
は一導伝型エピタキシヤル層、8は前記半導体基
板又は埋込み層6の電極引き出し領域、9は、<
100>面を有する前記エピタキシヤル層7を異方
性エツチング工程を用いて形成したV型凹部、1
0は逆導伝型の不純物拡散層、11は絶縁層、例
えば酸化膜、12は光反射防止膜、例えば窒化
膜、13は配線、15は、左側の前記V型凹部9
の傾斜面に光検出窓を有する光検出部、16は、
前記エピタキシヤル層7の主表面に光検出窓を有
する光検出部、17は、右側の前記V型凹部9の
傾斜面に光検出窓を有する光検出部、14は、前
記光検出部15〜17に入射する光、20は、前
記V型凹部の略中央に位置している半導体チツプ
の境界である。ところで、前記半導体チツプの境
界は、半導体チツプの境界20′で示される位置
でもよい。
FIG. 2 is a sectional view of the optical angle detection device of the present invention. 6 is a single conductivity type semiconductor substrate or buried layer; 7
8 is a conductive type epitaxial layer, 8 is an electrode extraction region of the semiconductor substrate or buried layer 6, and 9 is <
A V-shaped recess formed in the epitaxial layer 7 having a 100> plane using an anisotropic etching process, 1
0 is a reverse conduction type impurity diffusion layer, 11 is an insulating layer, such as an oxide film, 12 is a light antireflection film, such as a nitride film, 13 is a wiring, and 15 is the V-shaped recess 9 on the left side.
The photodetecting section 16 having a photodetecting window on the inclined surface of
A photodetection section 17 has a photodetection window on the main surface of the epitaxial layer 7, a photodetection section 17 has a photodetection window on the inclined surface of the V-shaped recess 9 on the right side, and 14 refers to the photodetection sections 15 to 14. The light incident on 17 and 20 are the boundaries of the semiconductor chip located approximately at the center of the V-shaped recess. Incidentally, the semiconductor chip boundary may be at a position indicated by the semiconductor chip boundary 20'.

前記光検出部の製造工程は、普通のバイポーラ
工程に前記異方性エツチング工程と前記光反射防
止膜形成の工程を追加したのみである。
The manufacturing process of the photodetector is simply the addition of the anisotropic etching process and the process of forming the anti-reflection film to the normal bipolar process.

次に、動作原理について説明する。 Next, the principle of operation will be explained.

前記光検出部16に前後方向に垂直な面Sと前
記光14のなす角を入射角θとする。但し、前記
光14が前記垂直面Sの左側から入射する場合、
θ0、右側から入射する場合、θ0と定義す
る。
The angle formed by the light 14 and a plane S perpendicular to the light detection unit 16 in the front-rear direction is an incident angle θ. However, when the light 14 enters from the left side of the vertical surface S,
θ0, and when incident from the right side, it is defined as θ0.

前記入射角θがθ0の時、前記光検出部1
5,16を用いて前記光14の入射角θを検出す
る。検出原理は、前記光検出部15と16の光検
出面の傾斜が約55゜異なることを利用し、入射角
θに対する前記光検出部15の入射光14量と前
記光検出装置16の入射光14量との比Rlが、
次式の関係にあることを利用する。
When the incident angle θ is θ0, the photodetector 1
5 and 16 to detect the incident angle θ of the light 14. The detection principle utilizes the fact that the inclinations of the photodetection surfaces of the photodetectors 15 and 16 are different by about 55 degrees, and the amount of incident light 14 of the photodetector 15 and the incident light of the photodetector 16 are determined with respect to the incident angle θ. The ratio Rl to the amount of 14 is
Use the following relationship.

Rl≒S15/S16・cos(θ−55)/cosθ・η(θ−55)/
η(θ)…(1) ここで、S15は前記光検出部15の受光窓の面
積、S16は前記光検出部16の受光窓の面積、η
は入射角θがθである時の光−電気変換効率であ
る。
Rl≒S 15 /S 16・cos(θ−55)/cosθ・η(θ−55)/
η(θ)...(1) Here, S 15 is the area of the light receiving window of the photodetector 15, S 16 is the area of the light receiving window of the photodetector 16, η
is the light-to-electricity conversion efficiency when the incident angle θ is θ.

同様に、前記入射角θがθ0の時、前記光検
出部17,16を用いて前記光14の入射角θを
検出する。入射角θに対する前記光検出部17の
入射光14量と前記光検出部16の入射光14量
との比Rrが、次式の関係にあることを利用する。
Similarly, when the incident angle θ is θ0, the incident angle θ of the light 14 is detected using the photodetectors 17 and 16. It is utilized that the ratio Rr of the amount of incident light 14 to the photodetector 17 and the amount of incident light 14 to the photodetector 16 with respect to the incident angle θ is in the following relationship.

Rr≒S17/S16・cos(θ+55)/cosθ・η(θ+55)/
η(θ)…(2) ここで、S17は前記光検出部17の受光窓の面
積である。通常、前記受光窓の面積S15とS17は、
等しい面積に設計されている。
Rr≒S 17 /S 16・cos(θ+55)/cosθ・η(θ+55)/
η(θ)...(2) Here, S17 is the area of the light receiving window of the photodetector 17. Usually, the areas S 15 and S 17 of the light receiving windows are:
Designed to have equal area.

次に、第3図のブロツク図を用いて、本発明の
光角度検出装置を使つた集積回路について説明す
る。
Next, an integrated circuit using the optical angle detection device of the present invention will be explained using the block diagram of FIG.

光14が、光検出部15〜17に入射すると、
各々の前記光検出部15〜17に入射した光量に
比例した電流I15〜I17が差動増幅回路21と可変
増幅回路22に出力される。前記差動増幅回路2
1により前記光検出部15,17の前記電流I15
I17の大小が比較される。前記電流I15が前記電流
I17より大であると判断されると、前記光検出部
16の前記電流I16により、増幅度が制御される
可変増幅回路22の出力に前記光検出部16の前
記電流I16により規格化された前記光検出部15
の前記電流I15の信号電圧が出力され、A/D変
換回路23に印加される。ところで、前記差動増
幅回路21により前記光検出部17の前記電流
I17が前記光検出部15の前記電流I15より大であ
ると判断された場合は、可変増幅回路22の出力
に前記光検出部16の前記電流I16により規格化
された前記光検出部17の前記電流I17の負の信
号電圧が出力され、A/D変換回路23に印加さ
れる。前記符号を有する信号電圧は、A/D変換
回路23により、例えば符号を含む8ビツトのデ
ジタル信号に変換され、角度変換回路24に出力
される。前記角度変換回路24は、前記デジタル
信号に応じたROM25のデータを検索し、前記
デジタル信号に対応した符号を含む例えば、8ビ
ツトのデジタル角度信号を表示変換回路26に出
力する。前記ROM25のデータは、前記(1)、(2)
式により計算されたものである。前記表示変換回
路26は、前記デジタル角度信号を表示信号に変
換し、例えば液晶表示装置27に出力する。ここ
で、15〜17及び21〜26は、同一チツプ上
に形成可能である。
When the light 14 enters the photodetectors 15 to 17,
Currents I 15 to I 17 proportional to the amount of light incident on each of the photodetectors 15 to 17 are output to the differential amplifier circuit 21 and the variable amplifier circuit 22. The differential amplifier circuit 2
1, the current I 15 of the photodetector 15, 17,
The magnitude of I 17 is compared. The current I 15 is the current
If it is determined that the current I 16 of the photodetector 16 is larger than I 17 , the output of the variable amplification circuit 22 whose amplification degree is controlled by the current I 16 of the photodetector 16 is normalized by the current I 16 of the photodetector 16. The photodetector 15
A signal voltage of the current I 15 is outputted and applied to the A/D conversion circuit 23 . By the way, the current of the photodetector 17 is controlled by the differential amplifier circuit 21.
If it is determined that I 17 is larger than the current I 15 of the photodetector 15, the output of the variable amplifier circuit 22 is the photodetector normalized by the current I 16 of the photodetector 16. A negative signal voltage of the current I 17 of 17 is output and applied to the A/D conversion circuit 23 . The signal voltage having the sign is converted by the A/D conversion circuit 23 into, for example, an 8-bit digital signal including the sign, and outputted to the angle conversion circuit 24. The angle conversion circuit 24 retrieves data in the ROM 25 corresponding to the digital signal, and outputs, for example, an 8-bit digital angle signal including a code corresponding to the digital signal to the display conversion circuit 26. The data in the ROM 25 is as described in (1) and (2) above.
It is calculated using the formula. The display conversion circuit 26 converts the digital angle signal into a display signal and outputs it to, for example, a liquid crystal display device 27. Here, 15 to 17 and 21 to 26 can be formed on the same chip.

第4図aとbは、本発明の光角度検出装置の正
面図である。前記光検出部15,17に直交する
配置で光検出部18,19を配置している。前記
光検出部15,16,17によつて得られる角度
信号と前記光検出部16,18,19によつて得
られる角度信号を合成することにより、光14が
前記光角度検出装置の前方のいかなる方向から入
射しても、前記光14の入射方向を検出できる。
Figures 4a and 4b are front views of the optical angle detection device of the present invention. Photodetectors 18 and 19 are arranged perpendicularly to the photodetectors 15 and 17. By combining the angle signals obtained by the light detection units 15, 16, 17 and the angle signals obtained by the light detection units 16, 18, 19, the light 14 is transmitted to the front side of the light angle detection device. The direction of incidence of the light 14 can be detected from any direction.

以上のごとく、本発明によれば、異方性エツチ
ング技術を用いて、同一チツプ上に結晶面の特性
を利用した精確な相対角度を互いに有する傾斜面
を形成し、前記傾斜面の各々に光検出部を配置し
たため、高精度に光の入射方向検出が可能である
とともに、前記光検出部の光−電流変換信号を入
射角情報に変換する回路も、同一チツプ上に搭載
可能であるため、小型でかつ廉価である等の効果
を有する。
As described above, according to the present invention, sloped surfaces having precise relative angles to each other using the characteristics of crystal planes are formed on the same chip using anisotropic etching technology, and each of the sloped surfaces is exposed to light. Because the detection section is arranged, it is possible to detect the incident direction of light with high precision, and the circuit that converts the light-to-current conversion signal of the photodetection section into incident angle information can also be mounted on the same chip. It has advantages such as being small and inexpensive.

【図面の簡単な説明】[Brief explanation of drawings]

第1図aは従来の光角度検出器の正面図、第1
図bは従来の光角度検出器の側面図、第2図は、
本発明の光角度検出装置の断面図、第3図は、本
発明の光角度検出装置を使つた集積回路の実施例
のブロツク図、第4図aとbは、本発明の光角度
検出装置の正面図である。 1〜14,15〜19……光検出部、5……支
持体、6……半導体基板又は埋込み層、7……エ
ピタキシヤル層、8……電極引き出し領域、9…
…V型凹部、10……不純物拡散層、11……絶
縁層、12……光反射防止膜、13……配線、1
4……光、20,20′……半導体チツプの境界、
21……差動増幅回路、22……可変増幅回路、
23……A/D変換回路、24……角度変換回
路、25……ROM、26……表示変換回路、2
7……液晶表示装置、θ……入射角、S……垂直
な面。
Figure 1a is a front view of a conventional optical angle detector;
Figure b is a side view of a conventional optical angle detector, and Figure 2 is a side view of a conventional optical angle detector.
FIG. 3 is a block diagram of an embodiment of an integrated circuit using the optical angle detection device of the present invention, and FIGS. 4a and 4b show the optical angle detection device of the present invention. FIG. 1-14, 15-19...Photodetection section, 5...Support, 6...Semiconductor substrate or buried layer, 7...Epitaxial layer, 8...Electrode extraction region, 9...
... V-shaped recess, 10 ... Impurity diffusion layer, 11 ... Insulating layer, 12 ... Anti-reflection film, 13 ... Wiring, 1
4...Light, 20,20'...Boundary of semiconductor chip,
21... Differential amplifier circuit, 22... Variable amplifier circuit,
23...A/D conversion circuit, 24...Angle conversion circuit, 25...ROM, 26...Display conversion circuit, 2
7...Liquid crystal display device, θ...Incidence angle, S...Vertical surface.

Claims (1)

【特許請求の範囲】 1 主表面が<100>である半導体基板と、前記
主表面部分に設けた光検出部と、前記基板の表面
部分に異方性エツチング技術で形成したV型凹部
と、前記V型凹部の側面に設けた光検出部とから
なる光角度検出装置。 2 基板主表面部分にV型凹部が互いに平行の位
置関係で複数個存在し、前記V型凹部のいくつか
は、前記V型凹部の一方の側面にのみ第1の光検
出部を有し、残りの前記V型凹部のいくつかは、
前記一方の側面に対向する位置関係にある側面に
のみ第2の光検出部を有することを特徴とする特
許請求の範囲第1項記載の光角度検出装置。 3 V型凹部に設けた光検出部群に直交する位置
関係で、さらに他のV型凹部と前記他の凹部に設
けた光検出部の群を有することを特徴とする特許
請求の範囲第2項記載の光角度検出装置。 4 V型凹部の底面が隣接チツプとの境界にある
ことを特徴とする特許請求の範囲第1項から第3
項までのいずれか記載の光角度検出装置。
[Scope of Claims] 1. A semiconductor substrate whose main surface is <100>; a photodetector provided on the main surface; a V-shaped recess formed on the surface of the substrate by an anisotropic etching technique; An optical angle detection device comprising a photodetector provided on a side surface of the V-shaped recess. 2. A plurality of V-shaped recesses are present in a mutually parallel positional relationship on the main surface portion of the substrate, and some of the V-shaped recesses have a first photodetecting portion only on one side of the V-shaped recess, Some of the remaining V-shaped recesses are
2. The optical angle detection device according to claim 1, further comprising a second light detection section only on a side surface that is in a positional relationship opposite to said one side surface. 3. Claim 2, further comprising another V-shaped recess and a group of photo-detecting parts provided in the other recess, in a positional relationship perpendicular to the group of photo-detecting parts provided in the V-shaped recess. Optical angle detection device as described in . 4. Claims 1 to 3, characterized in that the bottom surface of the V-shaped recess is located at the boundary with the adjacent chip.
2. The optical angle detection device according to any of the preceding paragraphs.
JP58007929A 1983-01-20 1983-01-20 Optical angle detector Granted JPS59133477A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58007929A JPS59133477A (en) 1983-01-20 1983-01-20 Optical angle detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58007929A JPS59133477A (en) 1983-01-20 1983-01-20 Optical angle detector

Publications (2)

Publication Number Publication Date
JPS59133477A JPS59133477A (en) 1984-07-31
JPH0237995B2 true JPH0237995B2 (en) 1990-08-28

Family

ID=11679209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58007929A Granted JPS59133477A (en) 1983-01-20 1983-01-20 Optical angle detector

Country Status (1)

Country Link
JP (1) JPS59133477A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0695013B2 (en) * 1990-10-15 1994-11-24 防衛庁技術研究本部長 Relative angle detector
EP2205988A2 (en) * 2007-10-26 2010-07-14 Koninklijke Philips Electronics N.V. A light angle selecting light detector device

Also Published As

Publication number Publication date
JPS59133477A (en) 1984-07-31

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