JPH0233367U - - Google Patents

Info

Publication number
JPH0233367U
JPH0233367U JP11288488U JP11288488U JPH0233367U JP H0233367 U JPH0233367 U JP H0233367U JP 11288488 U JP11288488 U JP 11288488U JP 11288488 U JP11288488 U JP 11288488U JP H0233367 U JPH0233367 U JP H0233367U
Authority
JP
Japan
Prior art keywords
electronic component
electrode
electrically contacting
testing
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11288488U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11288488U priority Critical patent/JPH0233367U/ja
Publication of JPH0233367U publication Critical patent/JPH0233367U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP11288488U 1988-08-29 1988-08-29 Pending JPH0233367U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11288488U JPH0233367U (ko) 1988-08-29 1988-08-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11288488U JPH0233367U (ko) 1988-08-29 1988-08-29

Publications (1)

Publication Number Publication Date
JPH0233367U true JPH0233367U (ko) 1990-03-02

Family

ID=31352230

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11288488U Pending JPH0233367U (ko) 1988-08-29 1988-08-29

Country Status (1)

Country Link
JP (1) JPH0233367U (ko)

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