JPH02304748A - Master disk exposing device for optical disk - Google Patents

Master disk exposing device for optical disk

Info

Publication number
JPH02304748A
JPH02304748A JP1125614A JP12561489A JPH02304748A JP H02304748 A JPH02304748 A JP H02304748A JP 1125614 A JP1125614 A JP 1125614A JP 12561489 A JP12561489 A JP 12561489A JP H02304748 A JPH02304748 A JP H02304748A
Authority
JP
Japan
Prior art keywords
exposure
exposure amount
signal
intensity
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1125614A
Other languages
Japanese (ja)
Other versions
JP2504188B2 (en
Inventor
Masaru Mukoda
向田 勝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1125614A priority Critical patent/JP2504188B2/en
Publication of JPH02304748A publication Critical patent/JPH02304748A/en
Application granted granted Critical
Publication of JP2504188B2 publication Critical patent/JP2504188B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To eliminate fluctuation in the intensity of exposure beam on a photoresist substrate and to enable exposure by the desired intensity of the exposure beam by detecting the exposure beam by an optical sensor provided on a moving optical system, monitoring and controlling the exposing quantity of head emission. CONSTITUTION:An exposing quantity detection part 12 on a moving optical system A receives exposing quantity monitor beam 11 reflected according to the reflection factor of a photoresist substrate 1. A detected exposing quantity correction part 16 divides an exposing quantity detection signal (c) by a reflection factor monitor signal (d) and calculates the detected exposing quantity when the reflection factor is 1. Then, the calculated quantity is outputted as a corrected detected exposing quantity signal (e). An optical modulator driving part 5 adjusts to outputs an optical modulator driving signal (f) so that an exposing quantity setting signal (b) can be coincident with the corrected detected exposing quantity signal (e). Then, an optical modulator 6 is driven and the intensity of laser beam 3 is adjusted. Thus, there is no fluctuation in the intensity of an exposure beam 7, with which the surface of the photoresist substrate 1 is irradiated, and the exposure can be executed by the desired intensity of the expo sure beam 7.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、光デイスク原盤露光装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to an optical disk master exposure apparatus.

〔従来の技術〕[Conventional technology]

従来の光デイスク原盤露光装置は、露光ビームのパワー
を制御するには、固定光学系上でビームをサンプリング
し、これをモニタして光変調器を制御することが一般的
であった。
In conventional optical disk master exposure apparatuses, in order to control the power of the exposure beam, it is common to sample the beam on a fixed optical system and monitor this to control the optical modulator.

第2図は従来の一例を示すブロック図である。FIG. 2 is a block diagram showing a conventional example.

第2図に示す光デイスク原盤露光装置は、回転するフォ
トレジスト基板1の回転中心軸と移動光学系A′上のヘ
ッドレンズ10の中心軸との距離を検出しヘッド位置検
出信号aを出力するヘッド位置検出部17と、前記ヘッ
ド位置検出信号aに対する露光ビーム強度が露光量設定
信号すとしてあらかじめ設定された露光量設定部4と、
レーザ発振器2から出射されたレーザビーム3の強度を
調整する光変調器6と、この光変調器6の出射すルヒー
ムを固定光学系B′上にてビームサンプラ18でサンプ
ルし得られたモニタ用ビーム20を検出し光センサ出力
信号gを出力する固定光学系B′上の光センサ部19と
、前記露光量設定信号すと前記光センサ出力信号gとが
一致するように光変調器駆動信号fを調整し、光変調器
6を駆動する光変調器駆動部5とを含んで構成される。
The optical disk master exposure apparatus shown in FIG. 2 detects the distance between the rotation center axis of the rotating photoresist substrate 1 and the center axis of the head lens 10 on the moving optical system A', and outputs a head position detection signal a. a head position detection section 17; an exposure amount setting section 4 in which the exposure beam intensity for the head position detection signal a is preset as an exposure amount setting signal;
An optical modulator 6 for adjusting the intensity of the laser beam 3 emitted from the laser oscillator 2, and a monitor sample obtained by sampling the beam emitted from the optical modulator 6 with a beam sampler 18 on a fixed optical system B'. The optical sensor section 19 on the fixed optical system B' which detects the beam 20 and outputs the optical sensor output signal g, and the optical modulator drive signal are applied so that the exposure amount setting signal and the optical sensor output signal g match. The optical modulator driving section 5 adjusts f and drives the optical modulator 6.

露光時に、回転中のフォトレジスト基板1の回転中心軸
とヘッドレンズ10の中心軸との距離をヘッド位置検出
部17は検出する。
During exposure, the head position detection unit 17 detects the distance between the rotation center axis of the rotating photoresist substrate 1 and the center axis of the head lens 10.

露光量設定部4はヘッド位置検出信号aに対する露光量
設定信号すを出力する。レーザ発振器2から出射された
レーザ、ビーム3は、光変調器6により強度が調整され
、固定光学系B′上の光センサ部19は、光変調器6の
出射するビームを固定光学系B′上にてビームサンプラ
18にてサンプルされたモニタ用ビーム20を検出する
The exposure amount setting section 4 outputs an exposure amount setting signal S in response to the head position detection signal a. The intensity of the laser beam 3 emitted from the laser oscillator 2 is adjusted by the optical modulator 6, and the optical sensor unit 19 on the fixed optical system B' converts the beam emitted from the optical modulator 6 into the fixed optical system B'. The monitor beam 20 sampled by the beam sampler 18 above is detected.

光変調器駆動部5は、露光量設定信号すと光センサ出力
信号gとが一致するように、光変調器駆動信号fを調整
し出力し、光変調器6を駆動し、レーザビーム30強度
を調整する。
The light modulator drive section 5 adjusts and outputs the light modulator drive signal f so that the exposure amount setting signal matches the photosensor output signal g, drives the light modulator 6, and adjusts the intensity of the laser beam 30. Adjust.

光変調器6により強度が調整された露光ビーム7は移動
光学系A′上のビームスプリッタ9にて曲げられ、ヘッ
ドレンズ10を透過し、フォトレジスト基板1に照射さ
れ、露光がなされる。
The exposure beam 7 whose intensity has been adjusted by the optical modulator 6 is bent by the beam splitter 9 on the moving optical system A', passes through the head lens 10, and is irradiated onto the photoresist substrate 1 for exposure.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、このような上述した従来の光デイスク原
盤露光装置は、光変調器の出射ビームを固定光学系上に
てモニタし、露光ビームの強度を調整するため、固定光
学系と移動光学系と゛のアライメントのズレによって、
ビームサンプラ?以降の光学系の各光学素子への入射に
ズレが生じたり、あるいは、各光学素子の状態変化など
によって、実際にフォトレジスト基板上に照射される露
光ビームの強度が変動し、所望の露光ビームの強度によ
る露光ができないという欠点がある。
However, in the above-mentioned conventional optical disk master exposure apparatus, the output beam of the optical modulator is monitored on a fixed optical system and the intensity of the exposure beam is adjusted, so it is difficult to align the fixed optical system and the moving optical system. Due to the deviation of
Beam sampler? The intensity of the exposure beam that is actually irradiated onto the photoresist substrate may vary due to deviations in the incidence on each optical element of the optical system or changes in the state of each optical element, and the intensity of the exposure beam actually irradiated onto the photoresist substrate may vary. It has the disadvantage that it cannot be exposed to light at different intensities.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の光デイスク原盤露光装置は、少なくともフォト
レジスト基板上に露光用レーザビームを合焦集光するヘ
ッドを含む光学系を移動光学系として構成する光デイス
ク原盤露光装置において、フォトレジスト基板で反射さ
れた露光ビームを前記移動光学系上で検出する露光量検
出部と、フォトレジスト基板で反射された合焦集光用レ
ーザビームを前記移動光学系上で検出する反射率モニタ
部と、該反射率モニタ部から得られる反射率モニタ信号
で前記露光量検出部から得られる露光量検出信号を補正
する露光量補正部と、ヘッドの位置に対応してあらかじ
め設定された露光量設定部と、該露光量設定部から得ら
れる露光量設定信号と前記検出露光量補正部から得られ
る補正検出露光量信号とが一致するように光変調器を制
御する変調器駆動部とを有して構成される。
The optical disk master exposure apparatus of the present invention is an optical disk master exposure apparatus in which an optical system including a head for focusing at least a laser beam for exposure onto a photoresist substrate is constructed as a moving optical system. an exposure amount detection unit that detects the exposure beam on the moving optical system; a reflectance monitor unit that detects the focusing laser beam reflected by the photoresist substrate on the moving optical system; an exposure amount correction section that corrects the exposure amount detection signal obtained from the exposure amount detection section using the obtained reflectance monitor signal; an exposure amount setting section that is set in advance in accordance with the position of the head; and the exposure amount setting section. and a modulator drive section that controls the optical modulator so that the exposure amount setting signal obtained from the detection exposure amount correction section matches the corrected detected exposure amount signal obtained from the detected exposure amount correction section.

〔実施例〕〔Example〕

次に、本発明の実施例について、図面を参照して説明す
る。
Next, embodiments of the present invention will be described with reference to the drawings.

一第1図は本発明の一実施例を示すブロック図である。FIG. 1 is a block diagram showing one embodiment of the present invention.

第1図に示す光デイスク原盤露光装置は、回転するフォ
トレジスト基板1の回転中心軸とヘッドレンズ10の中
心軸との距離を検出しヘッド位置検出信号aを出力する
ヘッド位置検出部17と、前記ヘッド位置検出信号aに
対する露光ビームの強度が露光量設定信号すであらかじ
め設定された露光量設定部4と、レーザ発振器2から出
射されたレーザビーム3の強度を調整する光変調器6と
、この光変調器6の出射する露光ビーム7がビームスプ
リッタ9により曲げられヘッドレンズ10を透過しフォ
トレジスト基板1で反射された露光量モニタビーム11
を移動光学系A上にて検出する露光量検出部12と、フ
ォーカス用レーザビーム8がフォトレジスト基板1で反
射され、ダイクロイックミラー13で取りだされた反射
率モニタ用ン ビーム14を移動光学系A上に 検出する反射率モニタ
部15と、該反射率モニタ部15がら得られる反射率モ
ニタ信号dで前記露光量検出部12から得られる露光量
検出信号Cを補正し補正検出露光量信号eを出力する検
出露光量補正部16と、前記露光量設定信号すと前記補
正検出露光量信号eとが一致するように光変調器駆動信
号fを調整し、光変調器6を駆動する光変調器駆動部5
とを含んで構成される。
The optical disk master exposure apparatus shown in FIG. 1 includes a head position detection section 17 that detects the distance between the rotation center axis of the rotating photoresist substrate 1 and the center axis of the head lens 10 and outputs a head position detection signal a; an exposure amount setting unit 4 in which the intensity of the exposure beam with respect to the head position detection signal a is already set in advance by an exposure amount setting signal; an optical modulator 6 that adjusts the intensity of the laser beam 3 emitted from the laser oscillator 2; The exposure beam 7 emitted from the optical modulator 6 is bent by the beam splitter 9, transmitted through the head lens 10, and reflected by the photoresist substrate 1 as an exposure monitor beam 11.
A focus laser beam 8 is reflected by the photoresist substrate 1 and a reflectance monitoring beam 14 taken out by a dichroic mirror 13 is detected by the moving optical system A. The reflectance monitor section 15 detects the reflectance, and the reflectance monitor signal d obtained from the reflectance monitor section 15 corrects the exposure detection signal C obtained from the exposure detection section 12 to obtain a corrected detected exposure signal e. an optical modulator that adjusts the optical modulator drive signal f so that the detected exposure amount correction unit 16 outputs the detected exposure amount signal e matches the exposure amount setting signal and the corrected detected exposure amount signal e, and drives the optical modulator 6; Drive part 5
It consists of:

露光時、回転中のフォトレジスト基板1の回転中心軸と
ヘッドレンズ10の中心軸との距離をヘッド位置検出部
17が検出する。
During exposure, the head position detection unit 17 detects the distance between the rotation center axis of the rotating photoresist substrate 1 and the center axis of the head lens 10 .

露光量設定部4は前記ヘッド位置検出信号aに対する露
光量設定信号すを出力する。このとき、露光量設定信号
すはフォトレジスト基板1でのビームの反射率が1と仮
定したときのものである。
The exposure amount setting section 4 outputs an exposure amount setting signal S corresponding to the head position detection signal a. At this time, the exposure amount setting signal is based on the assumption that the beam reflectance on the photoresist substrate 1 is 1.

レーザ発振器2から出射されたレーザビーム3は、光変
調器6により強度が調整され露光ビーム7となって、移
動光学系A上のビームスプリッタ9で曲げられ1、ヘッ
ドレンズ10を透過し、フォトレジスト基板1に照射さ
れる。
A laser beam 3 emitted from a laser oscillator 2 has its intensity adjusted by an optical modulator 6, becomes an exposure beam 7, is bent by a beam splitter 9 on a moving optical system A, is transmitted through a head lens 10, and is a photo beam. The resist substrate 1 is irradiated.

移動光学系A上の露光量検出部12は、フォトレジスト
基板1の反射率に従って反射された露光量モニタビーム
11を受光する。
The exposure amount detection unit 12 on the moving optical system A receives the exposure amount monitor beam 11 reflected according to the reflectance of the photoresist substrate 1.

また、フォーカス用レーザビーム8は、ヘッドレンズ1
0を透過し、フォトレジスト基板1に照射される。移動
光学系A上の反射率モニタ部15は、フォトレジスト基
板1の反射率に従って反射され、ダイクロイックミラー
13で取り出された反射率モニタ用ビーム14を受光し
、フォトレジスト基板1の反射率を算出し出力する。
Further, the focusing laser beam 8 is connected to the head lens 1
0 and is irradiated onto the photoresist substrate 1. The reflectance monitor unit 15 on the moving optical system A receives the reflectance monitoring beam 14 that is reflected according to the reflectance of the photoresist substrate 1 and taken out by the dichroic mirror 13, and calculates the reflectance of the photoresist substrate 1. and output.

検出露光量補正部16は、前記反射率モニタ信号dで前
記露光量検出信号Cを除し、反射率1のときの検出露光
量を算出し、補正検出露光量信号eとして出力する。
The detected exposure amount correction section 16 divides the exposure amount detection signal C by the reflectance monitor signal d, calculates the detected exposure amount when the reflectance is 1, and outputs it as a corrected detected exposure amount signal e.

光変調器駆動部5は、前記露光量設定信号すと前記補正
検出露光量信号eとを一致させるように、光変調器駆動
信号fを調整し出力し、光変調器6を駆動し、レーザビ
ーム3の強度を調整する。
The optical modulator driving section 5 adjusts and outputs the optical modulator driving signal f so that the exposure amount setting signal and the corrected detected exposure amount signal e match, drives the optical modulator 6, and outputs the optical modulator driving signal f. Adjust the intensity of beam 3.

〔発明の効果〕〔Effect of the invention〕

本発明の光デイスク原盤露光装置は、露光時フォトレジ
スト基板から反射してくる露光ビームを移動光学系上に
設けた光センサにて検出し、ヘッド出射の露光量をモニ
タし、制御することによって、アライメントのズレや光
学素子の状態変化によるフォトレジスト基板上での露光
ビームの強度の変動をなくし、所望の露光ビーム強度に
よる露光ができるという効果がある。
The optical disk master exposure apparatus of the present invention detects the exposure beam reflected from the photoresist substrate during exposure using an optical sensor provided on a moving optical system, and monitors and controls the exposure amount emitted from the head. This has the effect of eliminating fluctuations in the intensity of the exposure beam on the photoresist substrate due to misalignment or changes in the state of the optical element, and making it possible to perform exposure with a desired exposure beam intensity.

また、このときフォトレジスト基板から反射してくるフ
ォーカス用ビームの一部を、反射率モニタ用ビームとし
て移動光学系上に設けた光センサにて検出し、フォトレ
ジスト基板の反射率を算出し、前記フォトレジスト基板
から反射してくる露光ビーム強度を除すことにより、フ
ォトレジスト膜厚等によるフォトレジスト基板の反射率
変動のための、前記露光ビーム強度の変動をなくし、ヘ
ッド出射の露光量を正確にモニタできるという効果もあ
る。
Also, at this time, a part of the focusing beam reflected from the photoresist substrate is detected as a reflectance monitoring beam by an optical sensor provided on the moving optical system, and the reflectance of the photoresist substrate is calculated. By subtracting the exposure beam intensity reflected from the photoresist substrate, variations in the exposure beam intensity due to variations in reflectance of the photoresist substrate due to photoresist film thickness, etc. are eliminated, and the exposure amount emitted from the head can be reduced. It also has the effect of allowing accurate monitoring.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すブロック図、第2図は
従来の一例を示すブロック図である。 1・・・・・・フォトレジスト基板、2・・・・・・レ
ーザ発振器、3・・・・・・レーザビーム、4・・・・
・・露光量設定部、5・・・・・・光変調器駆動部、6
・・・・・・光変調器、7・・・・・・露光ビーム、8
・・・・・・フォーカス用レーザビーム、9・・・・・
・ビームスプリッタ、10・・・・・・ヘッドレンズ、
11・・・・・・露光量モニタビーム、12・・・・・
・露光量検出部、13・・・・・・ダイクロイックミラ
ー、14・・・・・・反射率モニタ用ビーム、15・・
・・・・反射率モニタ部、16・・・・・・検出露光量
補正部、17・・・・・・ヘッド位置f 検出部、18・・・・・・ビームVンプラ、19・・・
・・・光センサ部、20・・・・・・モニタ用ビーム、
a・・・・・・ヘッド位置検出信号、b・・・・・・露
光量設定信号、C・・・・・・露光量検出信号、d・・
・・・・反射率モニタ信号、e・・・・・・補正検出露
光量信号、f・・・・・・光変調器駆動信号、g・・・
・・・光センサ出力信号、A、A’・・・・・・移動光
学系、B、B’・・・・・・固定光学系。
FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a block diagram showing a conventional example. 1... Photoresist substrate, 2... Laser oscillator, 3... Laser beam, 4...
...Exposure amount setting unit, 5...Light modulator drive unit, 6
......Light modulator, 7...Exposure beam, 8
...Focusing laser beam, 9...
・Beam splitter, 10...Head lens,
11... Exposure monitor beam, 12...
・Exposure amount detection unit, 13... Dichroic mirror, 14... Reflectance monitor beam, 15...
...Reflectance monitor section, 16...Detected exposure amount correction section, 17...Head position f detection section, 18...Beam V amplifier, 19...
... Optical sensor section, 20 ... Monitoring beam,
a...head position detection signal, b...exposure setting signal, C...exposure detection signal, d...
...Reflectance monitor signal, e...Correction detection exposure amount signal, f...Light modulator drive signal, g...
... Optical sensor output signal, A, A'... Moving optical system, B, B'... Fixed optical system.

Claims (1)

【特許請求の範囲】[Claims] 少なくともフォトレジスト基板上に露光用レーザビーム
を合焦集光し前記フォトレジスト基板で反射された露光
ビームを移動光学系上で検出する露光量検出部と、前記
フォトレジスト基板で反射された合焦集光用レーザビー
ムを前記移動光学系上で検出する反射率モニタ部と、前
記反射率モニタ部から得られる反射率モニタ信号で前記
露光量検出部から得られる露光量検出信号を補正する検
出露光量補正部と、ヘッドの位置に対応してあらかじめ
設定された露光量設定部と、前記露光量設定部から得ら
れる露光量設定信号と前記検出露光量補正部から得られ
る補正検出露光量信号とが一致するような光変調器を制
御する変調器駆動部とを含むことを特徴とする光ディス
ク原盤露光装置。
an exposure amount detection unit that focuses an exposure laser beam onto at least the photoresist substrate and detects the exposure beam reflected by the photoresist substrate on a moving optical system; and a focusing laser beam reflected by the photoresist substrate. a reflectance monitor section that detects the beam on the moving optical system; and a detected exposure amount correction section that corrects the exposure amount detection signal obtained from the exposure amount detection section using the reflectance monitor signal obtained from the reflectance monitor section. , an exposure amount setting section that is set in advance in accordance with the position of the head, and an exposure amount setting signal obtained from the exposure amount setting section and a corrected detected exposure amount signal obtained from the detected exposure amount correction section. 1. An optical disk master exposure apparatus comprising: a modulator drive unit that controls an optical modulator.
JP1125614A 1989-05-18 1989-05-18 Optical disc master exposure device Expired - Lifetime JP2504188B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1125614A JP2504188B2 (en) 1989-05-18 1989-05-18 Optical disc master exposure device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1125614A JP2504188B2 (en) 1989-05-18 1989-05-18 Optical disc master exposure device

Publications (2)

Publication Number Publication Date
JPH02304748A true JPH02304748A (en) 1990-12-18
JP2504188B2 JP2504188B2 (en) 1996-06-05

Family

ID=14914443

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1125614A Expired - Lifetime JP2504188B2 (en) 1989-05-18 1989-05-18 Optical disc master exposure device

Country Status (1)

Country Link
JP (1) JP2504188B2 (en)

Also Published As

Publication number Publication date
JP2504188B2 (en) 1996-06-05

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