JPH0225881U - - Google Patents

Info

Publication number
JPH0225881U
JPH0225881U JP10385988U JP10385988U JPH0225881U JP H0225881 U JPH0225881 U JP H0225881U JP 10385988 U JP10385988 U JP 10385988U JP 10385988 U JP10385988 U JP 10385988U JP H0225881 U JPH0225881 U JP H0225881U
Authority
JP
Japan
Prior art keywords
semiconductor product
jig
measuring
semiconductor
pressing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10385988U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10385988U priority Critical patent/JPH0225881U/ja
Publication of JPH0225881U publication Critical patent/JPH0225881U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10385988U 1988-08-05 1988-08-05 Pending JPH0225881U (US07943777-20110517-C00090.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10385988U JPH0225881U (US07943777-20110517-C00090.png) 1988-08-05 1988-08-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10385988U JPH0225881U (US07943777-20110517-C00090.png) 1988-08-05 1988-08-05

Publications (1)

Publication Number Publication Date
JPH0225881U true JPH0225881U (US07943777-20110517-C00090.png) 1990-02-20

Family

ID=31335062

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10385988U Pending JPH0225881U (US07943777-20110517-C00090.png) 1988-08-05 1988-08-05

Country Status (1)

Country Link
JP (1) JPH0225881U (US07943777-20110517-C00090.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08172117A (ja) * 1994-12-20 1996-07-02 Nec Corp ベアチップテストキャリア

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08172117A (ja) * 1994-12-20 1996-07-02 Nec Corp ベアチップテストキャリア

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