JPH0225817U - - Google Patents
Info
- Publication number
- JPH0225817U JPH0225817U JP10448888U JP10448888U JPH0225817U JP H0225817 U JPH0225817 U JP H0225817U JP 10448888 U JP10448888 U JP 10448888U JP 10448888 U JP10448888 U JP 10448888U JP H0225817 U JPH0225817 U JP H0225817U
- Authority
- JP
- Japan
- Prior art keywords
- plate material
- linear encoder
- main scale
- optical linear
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims 3
- 230000007935 neutral effect Effects 0.000 claims 1
- 238000005452 bending Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Optical Transform (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10448888U JPH0225817U (pl) | 1988-08-06 | 1988-08-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10448888U JPH0225817U (pl) | 1988-08-06 | 1988-08-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0225817U true JPH0225817U (pl) | 1990-02-20 |
Family
ID=31336250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10448888U Pending JPH0225817U (pl) | 1988-08-06 | 1988-08-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0225817U (pl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011237309A (ja) * | 2010-05-12 | 2011-11-24 | Mitsutoyo Corp | 測長スケール、光学式変位検出装置、及び測長スケールの製造方法 |
-
1988
- 1988-08-06 JP JP10448888U patent/JPH0225817U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011237309A (ja) * | 2010-05-12 | 2011-11-24 | Mitsutoyo Corp | 測長スケール、光学式変位検出装置、及び測長スケールの製造方法 |