JPH0222559U - - Google Patents
Info
- Publication number
- JPH0222559U JPH0222559U JP10105788U JP10105788U JPH0222559U JP H0222559 U JPH0222559 U JP H0222559U JP 10105788 U JP10105788 U JP 10105788U JP 10105788 U JP10105788 U JP 10105788U JP H0222559 U JPH0222559 U JP H0222559U
- Authority
- JP
- Japan
- Prior art keywords
- cartridge
- recess
- holder
- covering
- passage hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims description 3
- 239000012520 frozen sample Substances 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
Description
第１図及び第３図は本考案の一実施例を説明す
るための装置構成図、第２図は動作を説明するた
めの図、第４図及び第５図は他の実施例を説明す
るための図である。
１：カートリツジ、２：凹部、３：メツシユ、
４：凍結試料切片、５ａ：上部蓋体、５ｂ：下部
蓋体、６：切り欠き部、７：試料ホルダー、８：
カートリツジ受け部、９：駆動棒、１０：電子顕
微鏡筐体、ｈ，Ｈ：電子線通過孔。
1 and 3 are device configuration diagrams for explaining one embodiment of the present invention, FIG. 2 is a diagram for explaining the operation, and FIGS. 4 and 5 are diagrams for explaining other embodiments. This is a diagram for 1: cartridge, 2: recess, 3: mesh,
4: Frozen sample section, 5a: Upper lid, 5b: Lower lid, 6: Notch, 7: Sample holder, 8:
Cartridge receiving part, 9: Drive rod, 10: Electron microscope housing, h, H: Electron beam passage hole.
Claims (1)
凹部を有するカートリツジと、該凹部の底面を貫
通して該カートリツジに設けられた電子線通過孔
と、夫々該カートリツジに取り付けられ前記凹部
を上側から覆うための蓋体及び下側から該電子線
通過孔を覆うための蓋体と、前記カートリツジを
載置するための受け部を有する試料ホルダーと、
該ホルダーに設けられ前記ホルダーに載置された
カートリツジの前記両蓋体を外すための機構とを
備えることを特徴とする電子顕微鏡の凍結試料用
装置。 A cartridge having a recess for holding a frozen sample for a transmission electron microscope, an electron beam passage hole provided in the cartridge passing through the bottom of the recess, and each attached to the cartridge and covering the recess from above. a sample holder having a lid for covering the electron beam passage hole from below, and a receiving portion for placing the cartridge;
1. A frozen sample apparatus for an electron microscope, comprising: a mechanism provided on the holder for removing both lids of a cartridge placed on the holder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10105788U JPH0222559U (en) | 1988-07-29 | 1988-07-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10105788U JPH0222559U (en) | 1988-07-29 | 1988-07-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0222559U true JPH0222559U (en) | 1990-02-15 |
Family
ID=31329700
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10105788U Pending JPH0222559U (en) | 1988-07-29 | 1988-07-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0222559U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010092747A1 (en) * | 2009-02-16 | 2010-08-19 | 株式会社 日立ハイテクノロジーズ | Electron beam device and sample holding device for electron beam device |
| JP2015060772A (en) * | 2013-09-20 | 2015-03-30 | 株式会社メルビル | Cartridge, sample holder tip part, and sample holder having sample holder tip part |
| JP2017084672A (en) * | 2015-10-29 | 2017-05-18 | 株式会社メルビル | Sample holder tip and sample holder having sample holder tip |
-
1988
- 1988-07-29 JP JP10105788U patent/JPH0222559U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010092747A1 (en) * | 2009-02-16 | 2010-08-19 | 株式会社 日立ハイテクノロジーズ | Electron beam device and sample holding device for electron beam device |
| JP2015060772A (en) * | 2013-09-20 | 2015-03-30 | 株式会社メルビル | Cartridge, sample holder tip part, and sample holder having sample holder tip part |
| JP2017084672A (en) * | 2015-10-29 | 2017-05-18 | 株式会社メルビル | Sample holder tip and sample holder having sample holder tip |
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