JPH0221549U - - Google Patents
Info
- Publication number
- JPH0221549U JPH0221549U JP9975888U JP9975888U JPH0221549U JP H0221549 U JPH0221549 U JP H0221549U JP 9975888 U JP9975888 U JP 9975888U JP 9975888 U JP9975888 U JP 9975888U JP H0221549 U JPH0221549 U JP H0221549U
- Authority
- JP
- Japan
- Prior art keywords
- sample holder
- guide groove
- sample
- high temperature
- wire guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 claims 1
- 239000012925 reference material Substances 0.000 claims 1
- 238000005452 bending Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9975888U JPH076511Y2 (ja) | 1988-07-29 | 1988-07-29 | Ｘ線回折装置の高温用試料ホルダ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9975888U JPH076511Y2 (ja) | 1988-07-29 | 1988-07-29 | Ｘ線回折装置の高温用試料ホルダ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0221549U true JPH0221549U (cs) | 1990-02-13 |
| JPH076511Y2 JPH076511Y2 (ja) | 1995-02-15 |
Family
ID=31327215
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9975888U Expired - Lifetime JPH076511Y2 (ja) | 1988-07-29 | 1988-07-29 | Ｘ線回折装置の高温用試料ホルダ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH076511Y2 (cs) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1308716A1 (en) * | 2001-10-03 | 2003-05-07 | Avantium International B.V. | Method for performing a transmission diffraction analysis |
| JP4947665B2 (ja) * | 2005-08-30 | 2012-06-06 | 株式会社リガク | Ｘ線回折定量装置 |
-
1988
- 1988-07-29 JP JP9975888U patent/JPH076511Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH076511Y2 (ja) | 1995-02-15 |
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