JPH0219741A - Foreign matter observing system for plastic insulated cable - Google Patents

Foreign matter observing system for plastic insulated cable

Info

Publication number
JPH0219741A
JPH0219741A JP16923088A JP16923088A JPH0219741A JP H0219741 A JPH0219741 A JP H0219741A JP 16923088 A JP16923088 A JP 16923088A JP 16923088 A JP16923088 A JP 16923088A JP H0219741 A JPH0219741 A JP H0219741A
Authority
JP
Japan
Prior art keywords
observation
sample
foreign matter
cleaning
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16923088A
Other languages
Japanese (ja)
Inventor
Keiji Kimura
木村 圭司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP16923088A priority Critical patent/JPH0219741A/en
Publication of JPH0219741A publication Critical patent/JPH0219741A/en
Pending legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)

Abstract

PURPOSE:To observe a foreign matter with high accuracy by executing a work extending from washing to observation of a sample of a thin slice piece of an insulator which has been cut from an insulating cable, in a clean space. CONSTITUTION:A clean chamber 1 is partitioned into three small chambers of primary and secondary washing tank chambers 2, 3 and an observation chamber 4. An observed sample 22 of an insulating cable which has been cut to a slice piece is put into the washing tank chamber 2 from a sample throw-in port 11, and a foreign matter is washed. Subsequently, the sample 22 which has been washed is transferred to the washing tank chamber 3, and also, a foreign matter on the surface is eliminated forcibly. Next, the sample 22 in which foreign matter dust has been eliminated from the surface is transferred to the observation chamber 4, and a foreign matter in an insulator of the sample 22 is observed. In such a way, the foreign matter on the surface of the sample 22 can be observed with high accuracy.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、架橋化ポリエチレン(XLPE)絶縁ケーブ
ル又はポリエチレン(PE)絶縁ケーブル等の絶縁体に
内包される異物・ボイド・水トリー等の観察システムに
関するものである。
Detailed Description of the Invention [Field of Industrial Application] The present invention is a method for observing foreign objects, voids, water trees, etc. contained in an insulator such as a cross-linked polyethylene (XLPE) insulated cable or a polyethylene (PE) insulated cable. It's about systems.

〔従来の技術〕[Conventional technology]

PEやXLPEを絶縁体としたケーブル、特に高圧電カ
ケ−プルでは、その絶縁体中に含まれる異物やボイドの
大きさ、数、形状等を漏べることは、重要な試験項目の
一つである。また、実使用されたケーブルにおいては、
それら絶縁体の中に、水トリーが発生している場合、同
様に大きさ、数、形状等を調査することになる。
For cables with PE or XLPE insulators, especially high-voltage electrical cables, one of the important test items is to detect the size, number, shape, etc. of foreign objects and voids contained in the insulator. It is. In addition, in the cable actually used,
If water trees occur in these insulators, the size, number, shape, etc. will be investigated in the same way.

これら、異物・ボイド・水トリーの各種測定は、まず、
絶縁体の観察用試料の作成から始める。第2図(a)に
示されるように絶縁体21は、薄いスライス片22に切
り出される0次に第2図Φ)に示すようにスライス片2
2は洗浄槽23に入れられて、表面に付着したゴミが洗
い落される。すなわち、絶縁体内部を透視してみる時、
表面のゴミは、内包される異物と見分けがつきにくく、
これによる誤測定を防止するためである。ここでの洗浄
は界面活性剤を含んだ水溶液が一1的に使用されている
。それは、試料の洗浄の目的と同時にスライス片の表面
に切り出し時にナイフ等によりついた細い傷に界面活性
剤を含んだ水溶液が入り込み、表面を薄い膜でおおうこ
とにより、光の透過率を上げ、また、乱反射を防くとい
う働きを兼ねる。この様にして、表面に付着したゴミが
洗浄され、表面処理されたスライス片22は第2図(C
)に示すように観察台24上におかれ観察装置25によ
り目的とする絶縁体に含まれる異物やボイド、或いは水
トリーの観察が行われる。
To measure these foreign objects, voids, and water trees, first,
Start by creating a specimen for observation of an insulator. As shown in FIG. 2(a), the insulator 21 is cut into thin slices 22. As shown in FIG.
2 is placed in a cleaning tank 23, and dirt adhering to the surface is washed off. In other words, when looking through the inside of an insulator,
Dust on the surface is difficult to distinguish from foreign objects contained within.
This is to prevent erroneous measurements caused by this. For cleaning here, an aqueous solution containing a surfactant is generally used. At the same time as cleaning the sample, an aqueous solution containing a surfactant enters the thin scratches made on the surface of the slice by a knife, etc. during cutting, and by covering the surface with a thin film, it increases the light transmittance. It also serves to prevent diffused reflection. In this way, the dust adhering to the surface is cleaned, and the surface-treated slice piece 22 is shown in Figure 2 (C
), foreign matter, voids, or water trees contained in the target insulator are observed using an observation device 25 placed on an observation table 24.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかながらこの様にして行われる異物・ボイド・水トリ
ー観察(以下異物観察と称す、)では先に述べた洗浄は
、実際には、洗浄槽23の中で大部分のゴミは落せるも
のの、逆に、ゴミは洗浄液の中に混ざり、この汚れた洗
浄液がスライス片22の表面に被膜を作り残されるため
、いくらかのゴミはスライス片22の表面についたまま
観察台24にのることになる。
However, in the observation of foreign objects, voids, and water trees performed in this way (hereinafter referred to as foreign object observation), although the cleaning described above can actually remove most of the dirt in the cleaning tank 23, On the other hand, the dirt gets mixed into the cleaning liquid, and this dirty cleaning liquid leaves behind a film on the surface of the slice piece 22, so some of the dust remains on the observation table 24 while remaining on the surface of the slice piece 22. .

或いは、洗浄槽23から、観察台24への移動中に、若
しくは観察台24の上等で外部からスライス片22に触
れるチャンスが多々あるため、ゴミが表面につくことが
多いという欠点があった。
Alternatively, since there are many opportunities to touch the slice piece 22 from the outside while moving from the cleaning tank 23 to the observation table 24 or on top of the observation table 24, there is a drawback that dust often adheres to the surface. .

本発明の目的は、従来の異物観察上の問題点を解消し、
測定エラーのないプラスチック絶縁ケーブルの異物観察
システムを提供することにある。
The purpose of the present invention is to solve the problems in conventional foreign object observation,
The object of the present invention is to provide a system for observing foreign objects in plastic insulated cables without measurement errors.

(LIUを解決するための手段及び作用)本発明の要旨
は、スライス片の洗浄から観察台へのセツティングまで
を清浄空間内で行い、かつ清浄空間及び洗浄媒体の清浄
化を連続して行うことにより観察試料の表面のゴミ付着
防止を完全に行い、高精度で異物観察を可能にしたもの
である。
(Means and actions for solving LIU) The gist of the present invention is to perform the process from cleaning the slice piece to setting it on the observation table in a clean space, and to continuously clean the clean space and the cleaning medium. This completely prevents dust from adhering to the surface of the observation sample, making it possible to observe foreign objects with high precision.

即ち1本発明の上記目的は、絶縁テープより切り出した
薄い絶縁体のスライス片の洗浄から、該スライス片を観
察装置の試料台にセットするまでの作業を清浄空間内で
行うことを特徴とするプラスチック絶縁ケーブルの異物
観察システムによって、又その清浄空間が仕切られた少
くとも1つの洗浄室と観察室よりなることを特徴とする
請求rII&l)記載のプラスチック絶縁ケーブルの異
物観察装置によって、更にその仕切られた清浄空間が夫
々の連続的清浄手段又は及び連続的洗浄媒体の濾過手段
を具備したことを特徴とする請求項(1)又は(2)の
異物観察システム及び装置によって、更に又その洗浄媒
体が界面活性剤入り水溶液であることを特徴とする請求
項(+1. (21又は(3)記載の異物観察システム
及び装置によって達成される。
Namely, the above object of the present invention is characterized in that the operations from cleaning a thin insulator slice cut out from an insulating tape to setting the slice on a sample stage of an observation device are performed in a clean space. By the system for observing foreign objects in plastic insulated cables, and further by the apparatus for observing foreign objects in plastic insulated cables according to claim rII&l), the clean space of which is partitioned into at least one cleaning chamber and an observation chamber. The foreign object observation system and apparatus according to claim 1 or 2, characterized in that the cleaned space is provided with a respective continuous cleaning means or a continuous cleaning medium filtration means, and furthermore the cleaning medium is (21) is an aqueous solution containing a surfactant.

本発明のシステムで用いられる清浄空間とは空間の塵埃
を除去した状態にあることをいう。その具体的手段は例
えば空間内の空気を濾過してW1環する方法によって作
られる0本発明における洗浄媒体としては、液体でも、
気体でも良い。液体としては、例えば従来手段で述べた
界面活性入り水溶液、シリコン油、OF油等の油等があ
げられる。
A clean space used in the system of the present invention refers to a space in which dust has been removed. For example, the cleaning medium in the present invention may be a liquid,
It may be a gas. Examples of the liquid include the surfactant-containing aqueous solution mentioned in the conventional section, and oils such as silicone oil and OF oil.

また、気体としては、空気、窒素ガス等の浸食性や危険
性のない気体なら何でもよい。これらを用いて試料に付
着した異物を洗浄する。
The gas may be any non-erosive or dangerous gas such as air or nitrogen gas. Use these to clean foreign matter adhering to the sample.

本発明における観察装置とは、各種顕微鏡及び顕微鏡用
テレビ、写真機、撮影機などをいう。
The observation device in the present invention refers to various types of microscopes, televisions for microscopes, photographic devices, photographic devices, and the like.

本発明において洗浄空間を仕切ることはそれぞれ異なっ
た目的の空間を乱さないためで例えば洗浄室は空気の流
通が激しくても、観察室はむしろ空気の流通は静かでな
ければならないからである。
In the present invention, the cleaning space is partitioned in order not to disturb the spaces for different purposes.For example, even if the cleaning room has strong air circulation, the observation room must have quiet air circulation.

又清浄度においても差があって良いからである。This is also because there may be a difference in cleanliness.

本発明は上記により、空気中の塵埃の付着及び洗浄液中
の異物の浮遊がなくなり試料に異物の付着を防ぐことが
出来る。
As described above, the present invention eliminates the adhesion of dust in the air and the floating of foreign substances in the cleaning liquid, making it possible to prevent the attachment of foreign substances to the sample.

〔実 施 例) 本発明の1実施例を図を用いて説明するつ1uシ本発明
は本実施例のみに限られるものではない。
[Example] An example of the present invention will be described with reference to the drawings, but the present invention is not limited to this example.

本システムはサンプルの洗浄から観察台までを大きく1
つの密閉された清浄室内1内に置くことが要素である。
This system covers everything from sample cleaning to the observation table in one step.
The key is to place it in one sealed clean room.

またこの清浄室1ば内部が第1次洗浄槽室2、第2次洗
浄槽室3、及び観察室4の3つの小部屋に仕切られてい
る。
The inside of this clean room 1 is partitioned into three small rooms: a primary cleaning tank room 2, a secondary cleaning tank room 3, and an observation room 4.

各部室2,3.4には、それぞれ室内の清浄手段又は及
び洗浄媒体の濾過手段として循環送風機又は循環ポンプ
5,6.7及び空気又は液体用フィルター8.9.10
を備えている様なシステム概要となっている。
Each compartment 2, 3.4 is equipped with a circulation blower or circulation pump 5, 6.7 and an air or liquid filter 8.9.10 as means for cleaning the room or filtering the cleaning medium, respectively.
The outline of the system is such that it is equipped with the following.

次に各々の働きについて以下に詳述する。Next, each function will be explained in detail below.

まず、第1次洗浄槽室は、観察試料のストック及び粗洗
いが目的とされる。スライス片22の様に観察のために
切り出された観察試料は表面にゴミの付いたまま、試料
投入口11から第1次洗浄槽室2に入れられる。洗浄槽
内部には洗浄の為の媒体があり、かつこの媒体は循環ポ
ンプ又はファン5により絶えず速い流れで循環している
ため、当該槽室2に投入されたサンプルは異物は洗い流
され、この流れによりまず簡単に落ちる。洗い流された
異物はフィルター8に集積される。これにより洗浄媒体
の清浄度は常に保たれる。
First, the primary cleaning tank room is used for stocking and rough cleaning of observation samples. An observation sample cut out for observation, such as the slice piece 22, is put into the first cleaning tank chamber 2 through the sample input port 11 with dust still attached to the surface. There is a cleaning medium inside the cleaning tank, and this medium is constantly circulated in a fast flow by the circulation pump or fan 5, so foreign substances are washed away from the sample put into the tank chamber 2, and this flow It falls off easily. The washed away foreign matter is accumulated on the filter 8. This ensures that the cleanliness of the cleaning medium is maintained at all times.

次に、第1?jr、浄槽室2により 洗浄された試料2
2は仕切り壁13を経て第2次洗浄槽室3に、移送され
る。この移送手段としては、マジックハンド12や、自
動移送装置等が用いられる。
Next, the first? jr, sample 2 cleaned by septic tank room 2
2 is transferred to the secondary cleaning tank chamber 3 via the partition wall 13. As this transfer means, a magic hand 12, an automatic transfer device, etc. are used.

第2次洗浄槽室3内では、試料22表面に残り°ζいる
異物ゴミを、表面の拭い落としにより強制的に排除する
。拭い落としの手段は、マジックハンド12による試料
の固定、ブラシ等によるブラッシング、または洗浄媒体
のジェット吹きつけによる吹き飛ばし等が使用される。
In the secondary cleaning tank chamber 3, foreign particles remaining on the surface of the sample 22 are forcibly removed by wiping the surface. As a means for wiping off, fixing the sample with the magic hand 12, brushing with a brush or the like, blowing off with a jet of cleaning medium, etc. are used.

この様にして、試料22の表面より強制的に落とされた
異物ゴミは、第1洗浄槽室2同様、循環ポンプ又は循環
送風機6による流れにのりフィルター9によって除去さ
れる。これにより、同洗浄槽室3内の清浄さは常に保た
れる。
In this way, the foreign particles forcibly dropped from the surface of the sample 22 are removed by the filter 9 along with the flow caused by the circulation pump or circulation blower 6, as in the first cleaning tank chamber 2. Thereby, the cleanliness inside the cleaning tank chamber 3 is always maintained.

以上により表面より異物ゴミの除去された資料22は仕
切り壁14を経て観察室4に移送され、観察台24にセ
ツティングされる。観察室4には空間を清浄化するため
の清浄手段として空気を循環濾過する循環送風機7及び
フィルター10を有しており、これにより、観察台24
の周囲環境の清浄さが保たれることになる。尚、2次洗
浄槽室3から観察室4までの試料の移送ならびに観察台
への試料のセンティングの方法としてはマジックハンド
や、自動移送装置や自動貼付装置などが用いられる。
The material 22 from which foreign matter and dust have been removed from the surface as described above is transferred to the observation room 4 via the partition wall 14 and set on the observation table 24. The observation room 4 has a circulation blower 7 and a filter 10 for circulating and filtering air as a cleaning means for cleaning the space.
The cleanliness of the surrounding environment will be maintained. Note that a magic hand, an automatic transfer device, an automatic pasting device, etc. are used to transfer the sample from the secondary cleaning tank chamber 3 to the observation room 4 and to place the sample on the observation table.

上述した実施例では洗浄槽室は2つとしたが、必要に応
し、1つ以上の部屋であればよく、最低1つの部屋に内
在する清浄手段又は及び洗浄媒体を清浄に保つa過循環
機構をもたせておけば、基本的に所期の目的は達せられ
る。
In the above-described embodiment, there are two cleaning tank chambers, but if necessary, there may be one or more chambers, and at least one chamber includes a cleaning means or an overcirculation mechanism for keeping the cleaning medium clean. If you have these, you can basically achieve your intended purpose.

また、洗浄媒体としては、界面活性剤を含んだ水/8液
が簡便で取り扱い上も、また、ケーブル絶縁体の材質と
してのIIE、XLl’F、等へのなじみもよく、最も
適していると言える。
In addition, as a cleaning medium, water/8 liquid containing a surfactant is the most suitable because it is easy to handle, easy to handle, and compatible with cable insulator materials such as IIE and XLl'F. I can say that.

気体を洗浄媒体として使用しても差し支えないが、その
場合、試料の表面の光透過性の向上、乱反射抑止の被膜
処理を洗浄から観察台へのセツティング間に入れる必要
がある。また、静電気が試料に起ると逆にゴミを吸い寄
せることになる為、その際は、静電気防止の為、接地し
た金属ブラシ等を洗浄槽内に設備しておくことが必要と
なる。
Gas may be used as the cleaning medium, but in that case, it is necessary to apply a coating treatment to improve the light transmittance of the surface of the sample and to suppress diffuse reflection between cleaning and setting it on the observation table. Furthermore, if static electricity occurs on the sample, it will attract dust, so in that case, it is necessary to install a grounded metal brush or the like in the cleaning tank to prevent static electricity.

〔発明の効果] 本発明のシステムによりPE、 XLPE等のプラスチ
ック絶縁体の異物観察の際、誤測定の原因となる試料表
面のゴミの除去を確実にし、かつ試料表面の光の透過性
を高め精度の高い観察が可能となる。
[Effects of the Invention] The system of the present invention ensures the removal of dust on the sample surface that causes erroneous measurements when observing foreign objects on plastic insulators such as PE and XLPE, and increases the light transmittance of the sample surface. Highly accurate observation becomes possible.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のプラスチック絶縁ケーブルの異物観察
システムの概念説明図、第2図((資)、 (bl。 [C1は、従来のプラスチック絶縁ケーブルの絶縁体の
スライス片の切り出しから観察するまでの異物観察シス
テムの説明図である。 ■ ・・清浄空間 2・・・第1次洗浄槽室 3・・・第2次洗浄槽室 4・・・観察室 5.6.7・・・循環ポンプ又は送風機8.9.10・
・・液体又は気体用フィルター11・・・試料投入口 12・・・マジックハンド 13.14・・・仕切り壁 21・・・絶縁体 22・・・スライス片(試料) 23・・・洗浄槽   24・・・観察台25 ・ ・観察装置 冨 り 第 図
Figure 1 is a conceptual explanatory diagram of the system for observing foreign objects in plastic insulated cables according to the present invention, and Figure 2 is a conceptual illustration of the system for observing foreign objects in plastic insulated cables according to the present invention. It is an explanatory diagram of the foreign matter observation system up to the following steps.■...Clean space 2...Primary cleaning tank room 3...Second cleaning tank room 4...Observation room 5.6.7... Circulation pump or blower 8.9.10・
... Liquid or gas filter 11 ... Sample input port 12 ... Magic hand 13.14 ... Partition wall 21 ... Insulator 22 ... Slice piece (sample) 23 ... Washing tank 24 ... Observation stand 25 ... Observation device wealth chart

Claims (4)

【特許請求の範囲】[Claims] (1)絶縁ケーブルより切り出した絶縁体の薄いスライ
ス片の洗浄から、そのスライス片を観察装置の試料台に
セットするまでの作業を清浄空間内で行うことを特徴と
するプラスチック絶縁ケーブルの物観察システム。
(1) Observation of plastic insulated cables characterized by the process of cleaning thin slices of insulator cut out from insulated cables and setting the slices on the sample stage of an observation device in a clean space. system.
(2)その清浄空間が、仕切られた少くとも1つの洗浄
室と、観察室とよりなることを特徴とする請求項1記載
のプラスチック絶縁ケーブルの異物観察装置。
(2) The apparatus for observing foreign matter in a plastic insulated cable according to claim 1, wherein the clean space comprises at least one partitioned cleaning chamber and an observation chamber.
(3)その仕切られた清浄空間が夫々の連続的清浄手段
又は及び連続的洗浄媒体の濾過手段を具備したことを特
徴とする請求項(1)又は(2)の異物観察システム及
び装置。
(3) The foreign object observation system and apparatus according to claim 1 or 2, wherein the partitioned clean space is provided with respective continuous cleaning means or continuous cleaning medium filtration means.
(4)その洗浄媒体が界面活性剤入り水溶液であること
を特徴とする請求項(1)、(2)又は(3)記載の異
物観察システム及び装置。
(4) The foreign matter observation system and device according to claim (1), (2) or (3), wherein the cleaning medium is an aqueous solution containing a surfactant.
JP16923088A 1988-07-07 1988-07-07 Foreign matter observing system for plastic insulated cable Pending JPH0219741A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16923088A JPH0219741A (en) 1988-07-07 1988-07-07 Foreign matter observing system for plastic insulated cable

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16923088A JPH0219741A (en) 1988-07-07 1988-07-07 Foreign matter observing system for plastic insulated cable

Publications (1)

Publication Number Publication Date
JPH0219741A true JPH0219741A (en) 1990-01-23

Family

ID=15882641

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16923088A Pending JPH0219741A (en) 1988-07-07 1988-07-07 Foreign matter observing system for plastic insulated cable

Country Status (1)

Country Link
JP (1) JPH0219741A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013143575A1 (en) * 2012-03-27 2013-10-03 Abb Technology Ltd Method for determining an electrical property of cable insulation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013143575A1 (en) * 2012-03-27 2013-10-03 Abb Technology Ltd Method for determining an electrical property of cable insulation
CN104220884A (en) * 2012-03-27 2014-12-17 Abb技术有限公司 Method for determining an electrical property of cable insulation
US9482715B2 (en) 2012-03-27 2016-11-01 Abb Schweiz Ag Method for determining an electrical property of cable insulation

Similar Documents

Publication Publication Date Title
US6632598B1 (en) Deparaffinization compositions and methods for their use
CA2259171C (en) Microscope slide with removable layer and method
KR960026110A (en) Apparatus and method for cleaning a photomask
Kornfeld Frictional electrification
US9964480B2 (en) Test film for detecting surface particles in clean room
Amosov Comparative analysis of requirements for industrial cleanliness in mechanical engineering
JPH0219741A (en) Foreign matter observing system for plastic insulated cable
US3099584A (en) Method for the removal of magnetic sound track from movie film
US3510194A (en) Particle count membrane filter mount
CN110295011B (en) Polishing solution for KDP crystal and preparation method and application thereof
AU3432589A (en) A method of effecting nir-analyses of successive material samples, and a system for carrying out the method
Wünsche et al. Electrochemical impedance spectroscopy and corrosion point counting on metal sheet edges with different cathodic dip coat materials
Bennett How to clean surfaces
JP2003226893A (en) Method for cleaning cell of biochemical analyzer
JP5685591B2 (en) Apparatus and method for setting visual residue limit criteria
McCrone et al. Clean Room Microscopy
JP2760735B2 (en) Particle inspection equipment for semiconductor wafers
Onions et al. Measurement of fibre diameter variation by optical diffraction
Eipper Comparative Examinations of Cleaned Paint Surfaces
Williams et al. Observation and control of thin-film defects using in-situ total-internal-reflection microscopy
GB2197949A (en) Slide treatment apparatus
Welling et al. A new settling method for preparing quantitative radiolarian slides from plankton, sediment trap and deep-sea sediment samples
CN113514386A (en) Method for measuring under-film expanding corrosion width of automobile sheet coating sample
Harvey et al. Hardware cleanliness methodology and certification
Barrick et al. Experiments using First Contact polymer as a final cleaning step for aluminizing