JPH02177083A - Semiconductor memory circuit device - Google Patents

Semiconductor memory circuit device

Info

Publication number
JPH02177083A
JPH02177083A JP63331717A JP33171788A JPH02177083A JP H02177083 A JPH02177083 A JP H02177083A JP 63331717 A JP63331717 A JP 63331717A JP 33171788 A JP33171788 A JP 33171788A JP H02177083 A JPH02177083 A JP H02177083A
Authority
JP
Japan
Prior art keywords
circuit
pulse
schmitt trigger
semiconductor memory
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63331717A
Other languages
Japanese (ja)
Inventor
Hiroshi Nakazato
浩 中里
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63331717A priority Critical patent/JPH02177083A/en
Publication of JPH02177083A publication Critical patent/JPH02177083A/en
Pending legal-status Critical Current

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  • Static Random-Access Memory (AREA)

Abstract

PURPOSE:To prevent malfunction of the circuit by constituting a pulse generating circuit with a Schmitt trigger circuit, and blocking the transmission of a deformed pulse to circuits of the post-stage even if the said pulse is inputted. CONSTITUTION:A Schmitt trigger circuit 20 is used for address input as a pulse generating circuit. Even if an irregular pulse is inputted as an address signal, it is not transmitted to a self-synchronizing RAM 10. This is because a logic threshold level is set high in the input and output transmission characteristic of the Schmitt circuit 20 when an input voltage rises and set low when the input voltage is descended. Even if a pulse waveform as an address input signal is inputted, the transmission of an undesired signal is avoided by the provision of the circuit 20. Thus, malfunction of the circuit 10 is avoided.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体記憶回路装置に関し、特にアドレス人力
信号の変化点を検出してパルスを発生し、そのパルスを
用いて自己同期化する回路に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a semiconductor memory circuit device, and more particularly to a circuit that detects a change point in an address input signal, generates a pulse, and self-synchronizes using the pulse. .

[従来の技術] 従来、この種の半導体記憶回路装置、例えば読出し/書
き込み可能な記憶回路(以下、RAMと称す)は、RA
Mセルの共通ビット線をプリチャージしたり、ワード線
を駆動する信号を制御したりするパルスをアドレス入力
信号の変化点を検出して発生していた。これを一般に自
己同期式RAMまたは内部同門方式RAMと呼ぶ。こう
することにより、RAMを使用しである回路を設計する
設計者はRAMの外部から同期用のパルスを入力するた
めのタイミング設計をしなくて済むため設計が容易にな
る。
[Prior Art] Conventionally, this type of semiconductor memory circuit device, for example, a readable/writable memory circuit (hereinafter referred to as RAM) is
Pulses for precharging the common bit lines of M cells and controlling signals for driving word lines were generated by detecting changing points in address input signals. This is generally called a self-synchronous RAM or an internally synchronized RAM. By doing this, a designer who designs a circuit using a RAM does not have to design a timing for inputting a synchronization pulse from outside the RAM, which simplifies the design.

同期パルスを発生する回路としては第5図に示すような
回路がある。アドレス入力ADO’、AD1′、・・・
ADn”の信号を反転ゲート32を4段直列につなげて
遅延させた信号と遅延させない信号とをゲート33で排
他的論理和をとることによりパルスが発生され、さらに
論理がゲート34てとられる。これが同其月パルスとな
り、RAM各部の制御に使われる。
As a circuit for generating synchronizing pulses, there is a circuit as shown in FIG. Address input ADO', AD1',...
A pulse is generated by exclusive ORing a signal delayed by connecting four stages of inverting gates 32 in series and a signal not delayed by a gate 33, and further logic is determined by a gate 34. This becomes the same month pulse and is used to control each part of the RAM.

[発明が解決しようとする問題点コ 上述した従来の半導体記憶回路装置は、単純なゲートに
より同期パルスを発生する構成となっているので、アド
レス人力信号に電源電位まで立ち上がらないようなパル
ス状のアドレス信号が入ると、同期パルスが発生できな
かったり、不所望な中間電位が出力されたりして、RA
Mが誤誤動作するという欠点がある。
[Problems to be Solved by the Invention] The conventional semiconductor memory circuit device described above has a configuration in which a synchronization pulse is generated by a simple gate. When an address signal is input, a synchronization pulse may not be generated or an undesired intermediate potential may be output, causing the RA
There is a drawback that M may malfunction.

[発明の従来技術に対する相違点] 上述した従来の半導体記憶回路装置に対し、本発明はシ
ュミットトリガ回路をアドレス入力部に接続していると
いう相違点を有する。
[Differences between the Invention and the Prior Art] The present invention differs from the conventional semiconductor memory circuit device described above in that a Schmitt trigger circuit is connected to the address input section.

[問題点を解決するための手段] 本発明の要旨はアドレス人力信号の電圧変化点を検出し
てパルスを発生するパルス発生回路と、上記パルスによ
り自己同期化されるメモリセル回路とを含む半導体記憶
回路装置において、上記パルス発生回路をシュミットト
リガ回路で構成したことである。
[Means for Solving the Problems] The gist of the present invention is to provide a semiconductor including a pulse generation circuit that detects a voltage change point of an address human input signal and generates a pulse, and a memory cell circuit that is self-synchronized by the pulse. In the memory circuit device, the pulse generating circuit is configured with a Schmitt trigger circuit.

[実施例コ 次に本発明の実施例について図面を参照して説明する。[Example code] Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の第1実施例を示すブロック図である。FIG. 1 is a block diagram showing a first embodiment of the present invention.

10はアドレス入力信号の変化を検出して発生するパル
スADO’、ADI’、  ・・争ADn’で自己同期
化されるRAM、20はアドレス入力信号ADO,AD
I、  ・・・ADnを波形整形するシュミットトリガ
回路、W丁は書き込み許可信号、WDO9WD1.・・
・WDmは書き込みデータ、RDOlRDl、・・・R
Dmは読出しデータである。第2図はシュミットトリガ
回路20をCMOS)ランジスタによって構成した具体
例である。MOS)ランジスタQPI−QP3、QNI
−QN3のゲート幅Wとゲート長りの比を適当に決める
ことにより、第4図の伝達特性に示すように入力電圧が
立ち上がるときには論理スレッシュホールド電圧VTを
高<(VT2)、立ち下がる時には7丁を低く (VT
l)設定することが可能となシュミットトリガ回路20
をアドレス人力に使用すると、ピーク電圧がV、T2に
達しない凸状パルスまたはVTIに達しない凹状パルス
がアドレス入力信号として入ってきても、これを後続す
る自己同期式RAM回路10に伝達しないようにするこ
とが可能となる。
10 is a RAM that is self-synchronized by pulses ADO', ADI', .
I, . . . Schmitt trigger circuit that shapes the waveform of ADn, W is a write enable signal, WDO9WD1...・・・
・WDm is write data, RDOlRDl,...R
Dm is read data. FIG. 2 shows a specific example in which the Schmitt trigger circuit 20 is constructed using a CMOS transistor. MOS) transistor QPI-QP3, QNI
- By appropriately determining the ratio of the gate width W and the gate length of QN3, the logic threshold voltage VT can be set to high (VT2) when the input voltage rises, and 7 when it falls, as shown in the transfer characteristic in Figure 4. Lower the knife (VT
l) Schmitt trigger circuit 20 that can be configured
is used for the address input, even if a convex pulse whose peak voltage does not reach V, T2 or a concave pulse whose peak voltage does not reach VTI enters as an address input signal, it will not be transmitted to the subsequent self-synchronous RAM circuit 10. It becomes possible to

第3図は本発明の第2実施例のシュミットトリガ回路C
MOS)ランジスタで構成した具体例である。QP4.
  QP5とQN4〜QN6のゲートaWとゲート長し
の比を適当に決めることにより第1実施例と同様に論理
スレッシュホールド電圧VTを第4図に示すように立ち
上がり時に高< (VT2)、立ち下がり時に低く (
VTI)設定することが可能となる。このシュミットト
リガ回路をアドレス入力部に使用すればパルス状の入力
電圧に感応しないようにすることができる。この実施例
の利点は第1実施例の回路(第2図)より少ないトラン
ジスタ数で構成できることである。
FIG. 3 shows a Schmitt trigger circuit C according to a second embodiment of the present invention.
This is a specific example composed of transistors (MOS). QP4.
By appropriately determining the ratio of the gate aW to the gate length of QP5 and QN4 to QN6, the logic threshold voltage VT can be set such that the logic threshold voltage VT is high at the rising time and < (VT2) at the falling edge, as shown in FIG. 4, as in the first embodiment. sometimes low (
VTI) can be set. If this Schmitt trigger circuit is used in the address input section, it can be made insensitive to pulsed input voltages. The advantage of this embodiment is that it can be constructed with fewer transistors than the circuit of the first embodiment (FIG. 2).

[発明の効果コ 以上説明したように本発明は、アドレス入力信号の変化
点を検出することによってパルスを発生し、このパルス
によって自己同期化する半導体記憶回路装置のアドレス
入力にシュミットトリガ回路を付加することにより、ア
ドレス入力信号としてパルス状の波形が入力されても不
要な信号の伝搬によって回路が誤動作しないようにする
ことができる顕著な効果がある。
[Effects of the Invention] As explained above, the present invention generates a pulse by detecting a change point in an address input signal, and adds a Schmitt trigger circuit to the address input of a semiconductor memory circuit device that self-synchronizes with this pulse. This has the remarkable effect of preventing the circuit from malfunctioning due to propagation of unnecessary signals even if a pulse-like waveform is input as an address input signal.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の半導体記憶回路装置の第1実施例を示
すブロック図、第2図は第1実施例のシュミットトリガ
回路をCMOS)ランジスタで構成した具体例を示す回
路図、第3図は第2実施例のシュミットトリガ回路をC
MOS)ランジスタで構成した具体例を示す回路図、第
4図はシュミットトリガ回路の入出力伝達特性を表すグ
ラフ、第5図はアドレス入力信号の変化点を検出して各
部回路の制御に使われる同期パルス発生回路の従来例の
ブロック図である。 10 ・ ・ ・ ・ 20 ・ ・ ・ φ 30 ・ ・ ・ − 31拳 ・ ・ ・ 32 φ ・ 参 ・ 33 Φ ・ ◆ 番 34 ・ ・ ・ ・ QPI〜QP5・ QNI〜QN6・ ・・・自己同期式RAM、 ・・・シュミットトリガ回路、 ・・・同期パルス発生回路、 ・・・反転ゲート、 ・・・遅延ゲート、 ・・・排他的論理和ゲート、 ・・・論理和ゲート、 PチャネルMOS)ランジスタ、 NチャネルMOS)ランジスタ。
FIG. 1 is a block diagram showing a first embodiment of the semiconductor memory circuit device of the present invention, FIG. 2 is a circuit diagram showing a specific example in which the Schmitt trigger circuit of the first embodiment is configured with a CMOS transistor, and FIG. is the Schmitt trigger circuit of the second embodiment.
MOS) A circuit diagram showing a specific example configured with transistors, Figure 4 is a graph showing the input/output transfer characteristics of a Schmitt trigger circuit, and Figure 5 is used to detect changing points of address input signals and control various circuits. FIG. 2 is a block diagram of a conventional example of a synchronous pulse generation circuit. 10... , ...Schmitt trigger circuit, ...synchronous pulse generation circuit, ...inversion gate, ...delay gate, ...exclusive OR gate, ...OR gate, P-channel MOS) transistor, N-channel MOS) transistor.

Claims (1)

【特許請求の範囲】 アドレス入力信号の電圧変化点を検出してパルスを発生
するパルス発生回路と、上記パルスにより自己同期化さ
れるメモリセル回路とを含む半導体記憶回路装置におい
て、 上記パルス発生回路をシュミットトリガ回路で構成した
ことを特徴とする半導体記憶回路装置。
[Scope of Claims] A semiconductor memory circuit device including a pulse generation circuit that detects a voltage change point of an address input signal and generates a pulse, and a memory cell circuit that is self-synchronized by the pulse, the pulse generation circuit as described above. A semiconductor memory circuit device comprising: a Schmitt trigger circuit.
JP63331717A 1988-12-27 1988-12-27 Semiconductor memory circuit device Pending JPH02177083A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63331717A JPH02177083A (en) 1988-12-27 1988-12-27 Semiconductor memory circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63331717A JPH02177083A (en) 1988-12-27 1988-12-27 Semiconductor memory circuit device

Publications (1)

Publication Number Publication Date
JPH02177083A true JPH02177083A (en) 1990-07-10

Family

ID=18246804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63331717A Pending JPH02177083A (en) 1988-12-27 1988-12-27 Semiconductor memory circuit device

Country Status (1)

Country Link
JP (1) JPH02177083A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58215134A (en) * 1982-06-08 1983-12-14 Mitsubishi Electric Corp Inverter circuit
JPS60187993A (en) * 1984-03-06 1985-09-25 Toshiba Corp Address transition detector circuit
JPS62120717A (en) * 1985-11-20 1987-06-02 Mitsubishi Electric Corp Semiconductor circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58215134A (en) * 1982-06-08 1983-12-14 Mitsubishi Electric Corp Inverter circuit
JPS60187993A (en) * 1984-03-06 1985-09-25 Toshiba Corp Address transition detector circuit
JPS62120717A (en) * 1985-11-20 1987-06-02 Mitsubishi Electric Corp Semiconductor circuit

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