JPH0217463A - Testing apparatus - Google Patents

Abstract

PURPOSE:To make it possible to know easily changes with years of an object device by providing a means to store the results of tests different in point of testing time and a means to compare the stored results of tests to prepare data on the changes with years and by outputting these data. CONSTITUTION:A present test (n), i.e. an nth periodical inspection test, is inputted from an input device. Simultaneously when a test of a object device is executed and the result 103 of the test is stored in a storage device, the result of an (n-1)th test is read in, comparison-judgment 104 of the results of the (n-1)th and (n)th tests is executed and the result (n-1) 106 of comparison is obtained. In the storage device, data on changes with years obtained until the (n-1)th test are arranged and stored on a time-series basis. Accordingly, these time-series data on changes with years are read in, the result (n-1) 106 of comparison is integrated 107 therewith, and these integrated time-series data on changes with years are written for updating in the storage device. These data are tabulated 108 and displayed or printed out. These operations are repeated by the number of items for comparison.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a test device that can determine the aging of a device to be tested, such as a device constituting a plant.

[Conventional technology]

Figure 1 shows, for example, the magazine RFC Engineer No. 4 (Showa 6).
FIG. 1 is a schematic configuration diagram showing the test device shown on pages 22 to 26 of the publication published in December 2013. In the figure, (1
) consists of a CRT display device αυ, a keyboard input device (6), and a 70-tube disk storage device (6).
(2) is a recording unit with a printer, (3) is a test target device such as a part of equipment that constitutes a plant, and (4) is a test target device (
3) is a signal generating section that provides input signals for testing. υ is composed of voltage, current, and waveform signal sources. (5
) is a measurement unit that measures the output signal from the device under test (3), and is equipped with a digital voltmeter (5) for measuring voltage and resistance.
1) and a universal counter (52) that measures frequency, pulse width, pulse height, phase difference, etc.

(6) is a signal switching unit that switches input/output signals according to commands from the control unit (1), (7) is a system power supply that supplies power to the device under test (3), and (8) is a control unit ( 1) is a transmission path such as a bus from GP- to transmit command signals etc. from GP to each part.

Next, the operation will be explained. A test signal output from the signal generating section (4) in response to a command from the control section (1) is input to the device under test (3) via the signal switching (6). As a result, the output signal outputted from the device under test (3) is sent to the measurement section (5) via the signal switching section (6) and measured. The measured value 8113 determined by this measurement unit (5) is used by the control unit (1) to determine the quality of the test target device (3), and is displayed as a test result on the display device αυ and printed out from the recording unit (2). Acted 0 is also stored in the storage device 0 in the control section (1).

[Problem to be solved by the invention]

Conventional testing equipment is configured as described above, so it is possible to obtain test results that determine the quality of the equipment under test, but there is a problem in that it is not possible to know the changes over time. When trying to take measures such as estimating the state of deterioration and updating it, the process involved collecting and analyzing all past printouts.

This invention was made to eliminate the above-mentioned confusion, and aims to provide a testing device that allows easy identification of aging of the device to be tested.

[Means to solve the problem]

The test device according to the present invention includes a storage means for storing a plurality of test results at different test times, a data creation means for creating aging data by comparing the test results stored in the storage means, and a data creation means for the data creation means. This system is equipped with an output means for outputting the secular change data created in the above.

[Effect]

The test device according to the present invention creates and outputs aging data that compares a plurality of test results at different test times.

[Embodiments of the invention]

An embodiment of the present invention will be described below with reference to the drawings. The general structure of the device is the same as the conventional device shown in FIG. 1, and therefore a description thereof will be omitted. FIG. 2 is an explanatory diagram showing a data processing method according to an embodiment of the invention, and FIG. 3 is a flowchart showing a processing procedure according to an embodiment of the invention, which is processed in the control section (1).

In Figure 2, (101) is the test result obtained from the first periodic inspection test (hereinafter referred to as periodic inspection), (102) is the test result obtained from the second periodic inspection, and (103) is n
These are the test results obtained during the second periodic inspection. First, the test results of the first regular inspection (Eng. 01) and the test results of the second regular inspection (10
2) is compared and judged (104) and the comparison result 1 (105
) is obtained. In the same way, if you compare and judge (1oc) sequentially up to the test result of n [g] regular examination (103),
n-1 comparison results up to comparison result n-1 (106) are obtained. By arranging n-1 comparison results from comparison result 1 (105) to comparison result n-1 (106) in chronological order, υ secular change data is aggregated (1o
t) L, Chart (10 days) and output.

Next, the processing procedure will be explained with reference to FIG. In step 21, the number n of the current regular inspection is inputted from the input device (2).

This n may be automatically set by the control unit (1). In step 22, the test target device (3) is tested in the same manner as in the conventional method described above, and the test results are stored in the storage device (to), and in step 23, the previous (n-1th) test result is is read, and in step 24, the test results of the previous and current tests are compared and judged, and secular change data from the previous regular test to the current regular test is created. On the other hand, the storage device (to) stores the previous aging data organized in chronological order. In step 25, this chronological aging data is read from the storage device 0, and in step 26, The secular change data created in step 24 is integrated into time-series secular change data, and in step 27, this integrated time-series secular change data is updated by writing it into the storage device (6) and storing it. In step 28, the time-series aging data is graphed and displayed on the display device 0υ or output as a printout from the recording section (2). In step 2, the operations from step 22 to step 2 are repeated by the number of comparison items.

In addition, in the above embodiment, a case was explained in which the storage device @ stores chronological aging data, but if necessary, it may be created from all past test results, but it would be a waste of processing time. will occur. Furthermore, in the above embodiment, a case was explained in which the chart is automatically created and outputted for each routine inspection, but it goes without saying that it may be outputted by giving an instruction from the input device (b) as necessary. do not have.

〔Effect of the invention〕

As described above, according to the present invention, since the test device is configured to include a means for creating aging data, it is possible to easily know the aging changes of the device to be tested.

[Brief explanation of the drawing]

FIG. 1 is a schematic configuration diagram showing a test device according to an embodiment of the present invention, FIG. 2 is an explanatory diagram showing a data processing method of the test device according to an embodiment of the present invention, and FIG. 3 is an embodiment of the present invention. 3 is a flowchart illustrating a processing procedure of a test device according to an example. In the figure, (1) is a control unit, (2) is a recording unit, αυ is a display device, and a (a) is a recording device. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

[Claims] A storage means for storing a plurality of test results at different test times, a data creation means for creating secular change data by comparing the test results stored in this storage means, and outputting the secular change data created by this data creation means. test equipment equipped with output means for