JPH02168494A - Semiconductor storage circuit - Google Patents
Semiconductor storage circuitInfo
- Publication number
- JPH02168494A JPH02168494A JP63324183A JP32418388A JPH02168494A JP H02168494 A JPH02168494 A JP H02168494A JP 63324183 A JP63324183 A JP 63324183A JP 32418388 A JP32418388 A JP 32418388A JP H02168494 A JPH02168494 A JP H02168494A
- Authority
- JP
- Japan
- Prior art keywords
- word line
- level
- circuit
- state
- word
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 12
- 239000011159 matrix material Substances 0.000 claims abstract description 3
- 102100036462 Delta-like protein 1 Human genes 0.000 abstract 1
- 101000928537 Homo sapiens Delta-like protein 1 Proteins 0.000 abstract 1
- 230000004913 activation Effects 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000009412 basement excavation Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体記憶回路に関し、特にダイナミ、り型の
半導体記憶回路に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a semiconductor memory circuit, and particularly to a dynamic type semiconductor memory circuit.
従来、この種の半導体記憶回路は、第2図に示すように
、トランジスタQ3及びコンデンサCIをそれぞれ備え
てマ) IJクス状に配列形成された複数のメモリセル
31と、これらメモリセル31に接続する複数のワード
線(WL、、 −一−)及びディジット線(DLs 、
−−−)とを含むメモリセルアレイ3と、複数のワード
線(WL+、−−−)のうちの所定のものを選択するた
めのワード線選択信号(Φ1.Φ1t−−−)を発生す
るデコーダ回路1と、ワード線活性化信号Φ2により活
性化状態にあるときに、ワード線選択信号Φ1.Φlに
従って所定のワード線WLlの電位ΦWを選択レベルに
しこのワード線WLlを選択状態とするワード線選択回
路2人とを有する構成となっていた。Conventionally, this type of semiconductor memory circuit, as shown in FIG. A plurality of word lines (WL, -1-) and digit lines (DLs,
---), and a decoder that generates a word line selection signal (Φ1.Φ1t---) for selecting a predetermined one of the plurality of word lines (WL+, ---). When activated by circuit 1 and word line activation signal Φ2, word line selection signal Φ1. The configuration includes two word line selection circuits that set the potential ΦW of a predetermined word line WLl to a selection level in accordance with Φl to bring this word line WLl into a selected state.
次に、この半導体記憶回路の動作について説明する。Next, the operation of this semiconductor memory circuit will be explained.
ワード線選択回路2人は、ワード線活性化信号Φ2の入
力端と接地線との間に直列接続され、ゲートにそれぞれ
ワード線選択信号Φl、Φ1を入力するトランジスタQ
l、Q2を備えて構成されている。The two word line selection circuits include transistors Q connected in series between the input terminal of the word line activation signal Φ2 and the ground line, and inputting the word line selection signals Φl and Φ1 to their gates, respectively.
1 and Q2.
ワード線活性化信号Φ2が高レベルとなシワード線選択
回路2人が活性化状態にあるとき、デコーダ回路lから
高レベルのワード線選択信号Φ1と低レベルのワード線
選択信号Φ1が入力されるト、トランジスタQsはオン
、トランジスタQ。When the word line activation signal Φ2 is at a high level and the two word line selection circuits are in an activated state, a high level word line selection signal Φ1 and a low level word line selection signal Φ1 are input from the decoder circuit l. , transistor Qs is on, transistor Q is on.
はオフとなりワード線WLtの電位ΦWを高レベルにし
、ワード線WL、を選択状態とする。このスタQ1はオ
フ、トランジスタQ2はオンとなってワード線WL1の
電位ΦWを接地線の電位にしワード線WL、を非選択状
態とする。is turned off, the potential ΦW of the word line WLt is set to a high level, and the word line WL is placed in a selected state. The star Q1 is turned off, and the transistor Q2 is turned on, setting the potential ΦW of the word line WL1 to the potential of the ground line, thereby rendering the word line WL in a non-selected state.
なお、ワード線活性化信号Φ2が低レベルの非活性化状
態にあるときは、ワード線WL1は接地線の電位となっ
ている。Note that when the word line activation signal Φ2 is in an inactive state at a low level, the word line WL1 is at the potential of the ground line.
上述した従来の半導体記憶回路は、非選択状態及び非活
性化状態のときのワード線WLlの電位ΦWが接地線の
電位になっているので、接地線に雑音が混入し、この雑
音のレベルがメモリセル31のトランジスタQ3のしき
い値電圧を越えるとコンデンサCIの電荷がディジット
線DL、へ漏れたり、また雑音のレベルがトランジスタ
Q3のしきい値電圧より低くてもサブスレッショルド電
流が流れるため同様にコンデンサC1の電荷がデイr)
Llに伝達される・
また、ワード線選択信号Φlが低レベル、ワード線選択
信号Φlが高レベルになると、トランジスタ明の目的は
、非選択状態、非活性化状態に、接地線に混入する雑音
によ9.てメモリセルに蓄積されている電荷量が変化す
るのを防止することができる半導体記憶回路を提供する
ことにある。In the conventional semiconductor memory circuit described above, the potential ΦW of the word line WLl in the non-selected state and the non-activated state is the potential of the ground line, so noise is mixed into the ground line, and the level of this noise increases. When the threshold voltage of the transistor Q3 of the memory cell 31 is exceeded, the charge of the capacitor CI leaks to the digit line DL, and even if the noise level is lower than the threshold voltage of the transistor Q3, a subthreshold current flows. The charge on capacitor C1 is day r)
In addition, when the word line selection signal Φl goes low level and the word line selection signal Φl goes high level, the purpose of the transistor light is to put it in a non-selected state, an inactivated state, and eliminate the noise that mixes into the ground line. 9. An object of the present invention is to provide a semiconductor memory circuit that can prevent the amount of charge stored in a memory cell from changing.
本発明の半導体記憶回路は、マトリクス状に配列された
複数のメモリセルと、これらメモリセルに接続する複数
のワード線及びディジット線とを備えたメモリセルアレ
イと、前記複数のワード線のうちの所定のワード線を選
択するためのワード線選択信号を発生するデコーダ回路
と、活性化状態にあるときに前記ワード線選択信号に従
って前記複数のワード線のうちの所定のワード線の電位
を選択レベルにしてこのワード線を選択状態とするワー
ド線選択回路と、このワード線選択回路が非活性状態に
あるときの前記各ワード線及びこのワード線選択回路が
活性化状態にあるときの非選択状態の各ワード線の電位
を前記選択レベルとは逆の符号の所定の電位にするワー
ド線電位制御回路とを有している。The semiconductor memory circuit of the present invention includes a memory cell array including a plurality of memory cells arranged in a matrix, a plurality of word lines and digit lines connected to these memory cells, and a decoder circuit that generates a word line selection signal for selecting a word line; and a decoder circuit that, when in an activated state, sets the potential of a predetermined word line among the plurality of word lines to a selection level according to the word line selection signal. A word line selection circuit that selects a word line by a lever, each of the word lines when this word line selection circuit is in an inactive state, and a non-selected state when this word line selection circuit is in an activated state. and a word line potential control circuit that sets the potential of each word line to a predetermined potential having a sign opposite to the selection level.
次に1本発明の実施例について図面を参照して説明する
。Next, an embodiment of the present invention will be described with reference to the drawings.
第1図は本発明の一実施例を示す回路図である。FIG. 1 is a circuit diagram showing an embodiment of the present invention.
この実施例が第2図に示された従来の半導体記憶回路と
相違する点は、ワード線(WL、、−−−)の選択状態
の電位(この実施例では高レベルのプラス電位)とは逆
の符号(この実施例ではマイナス)の所定の電位の信号
を出力するワード線電位制御回路4を設け、従来、接地
線と接続されているワード線選択回路2の一端をこのワ
ード線電位制御回路4の出力端に接続し、ワード線選択
回路2が非活性状態にあるときの各ワード線(WLl。The difference between this embodiment and the conventional semiconductor memory circuit shown in FIG. 2 is that the selected state potential of the word line (WL, . A word line potential control circuit 4 is provided which outputs a signal with a predetermined potential of the opposite sign (minus in this embodiment), and conventionally, one end of the word line selection circuit 2 connected to the ground line is controlled by the word line potential control circuit 4. It is connected to the output terminal of the circuit 4, and each word line (WLl.
−m−)及びワード線選択回路2が活性化状態にあると
きの非選択状態の各ワード線(WLs、−−−)の電位
(ΦW)を、ワード線(WLl、−−−)の選択状態の
電位(プラス電位)とは逆の符号(マイナス)の所定の
電位にするようにした点にある。-m-) and the potential (ΦW) of each unselected word line (WLs, ---) when the word line selection circuit 2 is in the activated state, the selection of the word line (WLl, ---) The point is that a predetermined potential with the opposite sign (minus) to the state potential (plus potential) is set.
ワード線電位制御回路4は、発振回路41と、コンデン
サC2と、トランジスタQ4〜Q6とを備えて構成され
、節点N、の電位は、コンデンサC2を介して発振回路
41の出力信号を受け、トランジスタQsのしきい値電
圧■Tと、−(電源電圧Vcc−VT)の間を振動する
。The word line potential control circuit 4 includes an oscillation circuit 41, a capacitor C2, and transistors Q4 to Q6. It oscillates between the threshold voltage of Qs T and -(power supply voltage Vcc-VT).
トランジスタQ4はダイオードの働きをしてワード線電
位’+tIIJ御回路4の出力信号の電位をマイナス電
位にする。Transistor Q4 functions as a diode and makes the potential of the output signal of word line potential '+tIIJ control circuit 4 negative potential.
ワード線WL、が非選択状態にあるときは、ワード選択
信号Φiが高レベルとなってトランジスタQ2は導通状
態にあるので、ワード線WL、の電位ΦWはマイナス電
位となり、接地線に雑音が混入してもこの雑音から分離
され、かつマイナス電位となっているのでメモリセル3
1に蓄積されている電荷量に変化を与えることがない。When the word line WL is in a non-selected state, the word selection signal Φi is at a high level and the transistor Q2 is in a conductive state, so the potential ΦW of the word line WL becomes a negative potential, and noise is mixed into the ground line. However, since it is isolated from this noise and has a negative potential, memory cell 3
There is no change in the amount of charge stored in 1.
また、ワード線選択回路2が非活性状態にあるときには
、ワード線活性化信号Φ2は低レベルとなっておシ、か
つワード線選択回路2の一端がワード線電位制御回路4
によりマイナス電位になっているので、ワード線WL、
の電位ΦWもマイナス電位となシ、メモリセル31に蓄
積されている電荷量が雑音により変化することはない。Further, when the word line selection circuit 2 is in an inactive state, the word line activation signal Φ2 is at a low level, and one end of the word line selection circuit 2 is connected to the word line potential control circuit 4.
Since the word line WL has a negative potential,
Since the potential ΦW is also a negative potential, the amount of charge stored in the memory cell 31 will not change due to noise.
以上説明したように本発明は、非活性状態のとき、及び
非選択状態にあるワード線の電位を、選択状態のときの
電位とは逆の符号の電位とするワード線電位制御回路を
設けた構成とすることにより、ワード線を接地線に混入
する雑音から分離しかつ逆の符号の電位とするので、メ
モリセルに蓄積されている電荷量が雑音によシ変化する
のを防止することができる効果がある。As explained above, the present invention provides a word line potential control circuit that sets the potential of a word line in an inactive state and a non-selected state to a potential with a sign opposite to the potential in a selected state. With this structure, the word line is separated from the noise mixed in the ground line and the potential is of the opposite sign, so that it is possible to prevent the amount of charge stored in the memory cell from changing due to noise. There is an effect that can be done.
第1図は本発明の一実施例を示す回路図、第2図は従来
の半導体記憶回路の一例を示す回路図である。
l・・・・・・デコーダ回路、2,2A・・°・・°ワ
ード線選択回路、3゛°゛・°゛メモリセルアレイ4°
°°°・°ワード線電位制御回路、31・・・・・・メ
モリセル、41・・・・・・発掘回路、Ql、C,・・
・・・・コンデンサ、DL、・・・・・・ディジ、ト線
、Q1〜Q6・・・・・・トランジスタ、WL、・・・
・・・ワード線。
代理人 弁理士 内 原 音FIG. 1 is a circuit diagram showing an embodiment of the present invention, and FIG. 2 is a circuit diagram showing an example of a conventional semiconductor memory circuit. l...Decoder circuit, 2,2A...°...°word line selection circuit, 3゛°゛・°゛memory cell array 4°
°°°・°Word line potential control circuit, 31... Memory cell, 41... Excavation circuit, Ql, C,...
・・・Capacitor, DL, ・・・Digital, G line, Q1 to Q6 ・・・Transistor, WL, ・・・
...word line. Agent Patent Attorney Oto Uchihara
Claims (1)
メモリセルに接続する複数のワード線及びディジット線
とを備えたメモリセルアレイと、前記複数のワード線の
うちの所定のワード線を選択するためのワード線選択信
号を発生するデコーダ回路と、活性化状態にあるときに
前記ワード線選択信号に従って前記複数のワード線のう
ちの所定のワード線の電位を選択レベルにしてこのワー
ド線を選択状態とするワード線選択回路と、このワード
線選択回路が非活性状態にあるときの前記各ワード線及
びこのワード線選択回路が活性化状態にあるときの非選
択状態の各ワード線の電位を前記選択レベルとは逆の符
号の所定の電位にするワード線電位制御回路とを有する
ことを特徴とする半導体記憶回路。A memory cell array comprising a plurality of memory cells arranged in a matrix, a plurality of word lines and digit lines connected to these memory cells, and a memory cell array for selecting a predetermined word line from the plurality of word lines. a decoder circuit that generates a word line selection signal; and a decoder circuit that, when in an activated state, sets the potential of a predetermined word line among the plurality of word lines to a selection level in accordance with the word line selection signal to place this word line in a selected state. a word line selection circuit to select the potential of each word line when this word line selection circuit is in an inactive state, and each word line in an unselected state when this word line selection circuit is in an activated state; 1. A semiconductor memory circuit comprising: a word line potential control circuit that sets a predetermined potential to a predetermined potential with a sign opposite to the level.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63324183A JPH02168494A (en) | 1988-12-21 | 1988-12-21 | Semiconductor storage circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63324183A JPH02168494A (en) | 1988-12-21 | 1988-12-21 | Semiconductor storage circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02168494A true JPH02168494A (en) | 1990-06-28 |
Family
ID=18163010
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63324183A Pending JPH02168494A (en) | 1988-12-21 | 1988-12-21 | Semiconductor storage circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02168494A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04278285A (en) * | 1991-02-05 | 1992-10-02 | Internatl Business Mach Corp <Ibm> | Word-line driving circuit |
JPH0589673A (en) * | 1991-03-14 | 1993-04-09 | Samsung Electron Co Ltd | Driver circuit for word line in semiconductor memory device |
JPH05198176A (en) * | 1991-10-03 | 1993-08-06 | Internatl Business Mach Corp <Ibm> | Voltage supplying circuit, voltage generating and supplying circuit, voltage regulator and band-gap-voltage-reference generator |
US5299154A (en) * | 1991-07-02 | 1994-03-29 | Kabushiki Kaisha Toshiba | MOS semiconductor device with memory cells each having storage capacitor and transfer transistor |
JP2011210362A (en) * | 1995-05-05 | 2011-10-20 | Texas Instruments Inc <Ti> | Row decoder with level translator |
WO2012029637A1 (en) * | 2010-09-03 | 2012-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
-
1988
- 1988-12-21 JP JP63324183A patent/JPH02168494A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04278285A (en) * | 1991-02-05 | 1992-10-02 | Internatl Business Mach Corp <Ibm> | Word-line driving circuit |
JPH0589673A (en) * | 1991-03-14 | 1993-04-09 | Samsung Electron Co Ltd | Driver circuit for word line in semiconductor memory device |
US5299154A (en) * | 1991-07-02 | 1994-03-29 | Kabushiki Kaisha Toshiba | MOS semiconductor device with memory cells each having storage capacitor and transfer transistor |
JPH05198176A (en) * | 1991-10-03 | 1993-08-06 | Internatl Business Mach Corp <Ibm> | Voltage supplying circuit, voltage generating and supplying circuit, voltage regulator and band-gap-voltage-reference generator |
JP2011210362A (en) * | 1995-05-05 | 2011-10-20 | Texas Instruments Inc <Ti> | Row decoder with level translator |
WO2012029637A1 (en) * | 2010-09-03 | 2012-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
US8654566B2 (en) | 2010-09-03 | 2014-02-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
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