JPH0215734U - - Google Patents

Info

Publication number
JPH0215734U
JPH0215734U JP9429188U JP9429188U JPH0215734U JP H0215734 U JPH0215734 U JP H0215734U JP 9429188 U JP9429188 U JP 9429188U JP 9429188 U JP9429188 U JP 9429188U JP H0215734 U JPH0215734 U JP H0215734U
Authority
JP
Japan
Prior art keywords
fixed card
fixed
prober
testers
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9429188U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9429188U priority Critical patent/JPH0215734U/ja
Publication of JPH0215734U publication Critical patent/JPH0215734U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9429188U 1988-07-15 1988-07-15 Pending JPH0215734U (US07943777-20110517-C00090.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9429188U JPH0215734U (US07943777-20110517-C00090.png) 1988-07-15 1988-07-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9429188U JPH0215734U (US07943777-20110517-C00090.png) 1988-07-15 1988-07-15

Publications (1)

Publication Number Publication Date
JPH0215734U true JPH0215734U (US07943777-20110517-C00090.png) 1990-01-31

Family

ID=31318800

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9429188U Pending JPH0215734U (US07943777-20110517-C00090.png) 1988-07-15 1988-07-15

Country Status (1)

Country Link
JP (1) JPH0215734U (US07943777-20110517-C00090.png)

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